Skip to main content
Ir a la página de inicio de la Comisión Europea (se abrirá en una nueva ventana)
español español
CORDIS - Resultados de investigaciones de la UE
CORDIS

Integrated Development 4.0

CORDIS proporciona enlaces a los documentos públicos y las publicaciones de los proyectos de los programas marco HORIZONTE.

Los enlaces a los documentos y las publicaciones de los proyectos del Séptimo Programa Marco, así como los enlaces a algunos tipos de resultados específicos, como conjuntos de datos y «software», se obtienen dinámicamente de OpenAIRE .

Resultado final

4.3.2.1 Report on Zero-Failur Culture (se abrirá en una nueva ventana)

The report deals with the developed and verified model to analyze the effects of process improvements and analyze its dynamic behavior for manufacturing and the supply chain

D5.1.3.1 Publishable Use Case Report (se abrirá en una nueva ventana)

Publishable descriptions of the industrial Use Cases defined

D7.1.3.1 Report on signal preprocessing for Machine Learning/Deep Leaning data analysis and feature extraction (se abrirá en una nueva ventana)

Report on signal preprocessing for Machine Learning/Deep Leaning data analysis and feature extraction

D3.2.1.2 Lead time based pricing (UC16) (se abrirá en una nueva ventana)

Publishable summary of UC16

D4.1.2.3 Virtual production with autonomous mobile industrial robots and interaction and training of operators (UC17) (se abrirá en una nueva ventana)

Publishable summary of UC17.

D7.1.1.2 Report on security improvements in hardware and software implementation in a production area (se abrirá en una nueva ventana)

Speed tests

D4.1.1.4 Enabling a human-centered education, training and knowledge-management system (UC18) (se abrirá en una nueva ventana)

Publishable summary of UC18

D7.2.1.1 Efficient modelling of electro-thermo-mechanical stress during fast power cycling operation of an IC (se abrirá en una nueva ventana)

The deliverable reports on proposed techniques for an efficient modelling of electro-thermo-mechanical stress during fast power cycling Operation.

"D2.1.4.1 Context base data provision ""virtual factory"", cyber-physical collaboration (UC7)" (se abrirá en una nueva ventana)

Publishable summary of UC7

D1.3.3.1 Data-driven root cause investigation for variation in semiconductor manufacturing quality (UC1) (se abrirá en una nueva ventana)

Publishable summary of UC1

D7.1.3.2 Report on classification algorithms (se abrirá en una nueva ventana)

Report on classification algorithms

D4.1.2.1 Concept for digitally augmenting human work (se abrirá en una nueva ventana)

A holistic concept for digitally augmenting human work is presented and agreed on with the stakeholders.

D7.1.1.1 Report on AES implementation with speed and side-channel immunity improvements (se abrirá en una nueva ventana)

Speed tests

D4.2.2.1 Report on socio-organizational implications of digtial twins (se abrirá en una nueva ventana)

Socioorganizational implications of digital twin Use Cases are investigated and documented

D7.2.2.2 IC yield prediction with knowledge-based modelling (UC4) (se abrirá en una nueva ventana)

Publishable summary of UC4

D4.1.3.2 Final Report of Documentation and verification of smart knowledge management in different applications (se abrirá en una nueva ventana)

Documentation and verification of smart knowledge management in different applications take place

D3.1.1.3 Remote Experiments on high-performance DC-DC converter (UC15) (se abrirá en una nueva ventana)

Publishable summary of UC15

D7.6: D7.2.2.1 Yield estimation and prediction figures of merit and yield detracting factors’ determination (se abrirá en una nueva ventana)

The deliverable reports advanced methods for multifactor pre- and post-silicon yield estimation and prediction, detection of yield detractors and root cause discovery.

D2.1.4.3 Base Architectures for Virtual/Physical Computing (UC9) (se abrirá en una nueva ventana)

Publishable summary of UC9.

D2.1.1.2 Applying Discrete-event simulation framework and agent based simulation for planning in semiconductor value chains (UC12) (se abrirá en una nueva ventana)

Publishable summary of UC12

D7.1.2.1 Report on virtual prototyping rules for DFM Optimization (se abrirá en una nueva ventana)

Virtual prototyping rules for DFM Optimization

D4.3.1.1 Demonstrator and report of decision support system (for complexity management) (se abrirá en una nueva ventana)

A demonstrator about the analysis of complex demands in work systems for decision and planning support on the shop floor and management level is presented

Publicaciones

Wie innovative Logistik die zukunftssichere und nachhaltige Gestaltung der Automatisierung und Digitalisierung der Halbleiterindustrie unterstützt (se abrirá en una nueva ventana)

Autores: Germar Schneider; Jacob Lohmer
Publicado en: Logistik in Wissenschaft und Praxis, Edición 2, 2021
Editor: Gabler Verlag
DOI: 10.5281/zenodo.4687042

RTAMT: Online Robustness Monitors from STL (se abrirá en una nueva ventana)

Autores: Dejan Ničković, Tomoya Yamaguchi
Publicado en: Automated Technology for Verification and Analysis - 18th International Symposium, ATVA 2020, Hanoi, Vietnam, October 19–23, 2020, Proceedings, Edición 12302, 2020, Página(s) 564-571, ISBN 978-3-030-59151-9
Editor: Springer International Publishing
DOI: 10.1007/978-3-030-59152-6_34

Wie innovative Logistik die zukunftssichere und nachhaltige Gestaltung der Automatisierung und Digitalisierung der Halbleiterindustrie unterstützt (se abrirá en una nueva ventana)

Autores: Germar Schneider; Jacob Lohmer
Publicado en: Logistik in Wissenschaft und Praxis - Von der Datenanalyse zur Gestaltung komplexer Logistikprozesse, Edición 7, 2021, ISBN 978-3-658-33479-6
Editor: Springer Gabler
DOI: 10.1007/978-3-658-33480-2_22

Rückwärtssimulation als Instrument zur Produktionsplanung – Erkenntnisse aus einer praxisbezogenen Fallstudie

Autores: Christoph Laroque, Madlene Leißau, Wolfgang Scholl, Germar Schneider
Publicado en: Simulation in Produktion und Logistik 2021, 2021
Editor: Jörg Franke, Peter Schuderer

A Text Extraction-Based Smart Knowledge Graph Composition for Integrating Lessons Learned During the Microchip Design (se abrirá en una nueva ventana)

Autores: Hasan Abu Rasheed, Christian Weber, Johannes Zenkert, Peter Czerner, Roland Krumm, Madjid Fathi
Publicado en: Intelligent Systems and Applications - Proceedings of the 2020 Intelligent Systems Conference (IntelliSys) Volume 2, Edición 1251, 2021, Página(s) 594-610, ISBN 978-3-030-55186-5
Editor: Springer International Publishing
DOI: 10.1007/978-3-030-55187-2_43

Trustworthy Smart Autonomous Systems-of-Systems - Resilient Technology, Economy and Society (se abrirá en una nueva ventana)

Autores: Schoitsch Erwin
Publicado en: IDIMT-2021 - 29th Interdisciplinary Information Management Talks, 2021
Editor: Trauner Verlag - Universität
DOI: 10.5281/zenodo.5828352

Control of heterogenous AMHS in semiconductor industry under consideration of dynamic transport carrier transfers

Autores: Wagner, T., Seitz, J., Schneider, G.
Publicado en: International Conference on Industrial Technology, 2021
Editor: IEEE

Adversarial Training is Not Ready for Robot Learning

Autores: Mathias Lechner, Ramin Hasani, Radu Grosu, Daniela Rus, Thomas A. Henzinger
Publicado en: IEEE 2021 International Conference on Robotics and Automation (ICRA), 2021, 2021
Editor: IEEE

AIT Cyber Range - Flexible Cyber Security Environment for Exercises, Training and Research (se abrirá en una nueva ventana)

Autores: Maria Leitner, Maximilian Frank, Wolfgang Hotwagner, Gregor Langner, Oliver Maurhart, Timea Pahi, Lenhard Reuter, Florian Skopik, Paul Smith, Manuel Warum
Publicado en: Proceedings of the European Interdisciplinary Cybersecurity Conference, 2020, Página(s) 1-6, ISBN 9781450375993
Editor: ACM
DOI: 10.1145/3424954.3424959

Digital Reference: a quasi-standard for digitalization in the domain of semiconductor supply chains (se abrirá en una nueva ventana)

Autores: Hans Ehm, Erwin Schoitsch, Jan Wytze van der Weit, Nour Ramzy, Lanyingzhu Luo, Daniel Louis Gruetzner
Publicado en: 2020 IEEE Conference on Industrial Cyberphysical Systems (ICPS), 2020, Página(s) 563-570, ISBN 978-1-7281-6389-5
Editor: IEEE
DOI: 10.1109/icps48405.2020.9274750

Smart Collaboration - Mitarbeiter-zentrierte Informationssysteme in der Produktentstehung (se abrirá en una nueva ventana)

Autores: Rosenberger, Manfred, Fellmann Michael, Richter Alexander, Stocker Alexander, Schmeja Michael, Damalas Stelios Andreas
Publicado en: Mensch und Computer 2020 - Workshopband, 2020
Editor: Gesellschaft für Informatik
DOI: 10.18420/muc2020-ws116

The Sound of Silence - Mining Security Vulnerabilities from Secret Integration Channels in Open-Source Projects (se abrirá en una nueva ventana)

Autores: Ralf Ramsauer, Lukas Bulwahn, Daniel Lohmann, Wolfgang Mauerer
Publicado en: Proceedings of the 2020 ACM SIGSAC Conference on Cloud Computing Security Workshop, 2020, Página(s) 147-157, ISBN 9781450380843
Editor: ACM
DOI: 10.1145/3411495.3421360

The Impact of Intelligent Process Automation on Purchasing and Supply Management – Initial Insights from a Multiple Case Study (se abrirá en una nueva ventana)

Autores: Flechsig, Christian
Publicado en: Logistics Management, 2021
Editor: Springer
DOI: 10.1007/978-3-030-85843-8_5

Human-Robot Assembly: Methodical Design and Assessment of an Immersive Virtual Environment for Real-World Significance (se abrirá en una nueva ventana)

Autores: Johannes Hocherl, Andreas Adam, Thomas Schlegl, Britta Wrede
Publicado en: 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2020, Página(s) 549-556, ISBN 978-1-7281-8956-7
Editor: IEEE
DOI: 10.1109/etfa46521.2020.9212039

A Review of the Key Success Factors for the Implementation of Digital Technologies in the Context of Industry 4.0

Autores: Alexander Stocker, Manfred Rosenberger, Michael Schmeja, Germar Schneider
Publicado en: IFIP/IEEE IM 2021 Workshop: 2nd Workshop on Management for Industry 4.0 (MFI4.0), 2021
Editor: IEEE

Silentium! Run-Analyse-Eradicate the Noise out of the DB/OS Stack

Autores: Mauerer, Wolfgang; Ramsauer, Ralf; Lucas, Edson R. F.; Scherzinger, Stefanie
Publicado en: Lecture Notes in Informatics (LNI), Edición 1, 2021
Editor: Gesellschaft für Informatik

HEURISTICS FOR ORDER-LOT PEGGING IN MULTI-FAB SETTINGS

Autores: Lars Mönch, Liji Shen, John W. Fowler
Publicado en: Proceedings of the 2020 Winter Simulation Conference, 2020
Editor: IEEE

Experimental Analysis of a Stochastic Backward Simulation Approach Under the Specifics of Semiconductor Manufacturing (se abrirá en una nueva ventana)

Autores: Christoph Laroque, Madlene Leißau, Wolfgang Scholl, Germar Schneider
Publicado en: Procedia CIRP, Edición Volume 107, 2022, ISSN 2212-8271
Editor: Elsevier B.V
DOI: 10.1016/j.procir.2022.05.154

Using accuracy measurements to evaluate simulation model simplification

Autores: Igor Stogniy, Wolfgang Scholl
Publicado en: Proceedings of the 2020 Winter Simulation Conference, 2020
Editor: IEEE

An unsupervised methodology for online drift detection in multivariate industrial datasets (se abrirá en una nueva ventana)

Autores: Sarah Klein, Mathias Verbeke
Publicado en: 2020 International Conference on Data Mining Workshops (ICDMW), 2020, Página(s) 392-399, ISBN 978-1-7281-9012-9
Editor: IEEE
DOI: 10.1109/icdmw51313.2020.00061

On-Off Center-Surround Receptive Fields for Accurate and Robust Image Classification

Autores: Zahra Babaiee, Ramin Hasani, Mathias Lechner, Daniela Rus, Radu Grosu
Publicado en: 2021 2nd International Conference on Leadership and Management, 2021
Editor: ICLM

A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification (se abrirá en una nueva ventana)

Autores: Andrei Gaita, Georgian Nicolae, Emilian C. David, Andi Buzo, Corneliu Burileanu, Georg Pelz
Publicado en: 2020 IEEE European Test Symposium (ETS), 2020, Página(s) 1-2, ISBN 978-1-7281-4312-5
Editor: IEEE
DOI: 10.1109/ets48528.2020.9131599

Multi-factory Job Shop Scheduling With Due Date Objective (se abrirá en una nueva ventana)

Autores: Jacob Lohmer, Daniel Spengler, Rainer Lasch
Publicado en: 2020 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), 2020, Página(s) 79-84, ISBN 978-1-5386-7220-4
Editor: IEEE
DOI: 10.1109/ieem45057.2020.9309905

Explainable Graph-based Search for Lessons-Learned Documents in the Semiconductor Industry

Autores: Hasan Abu-Rasheed, Christian Weber, Johannes Zenkert, Roland Krumm, Madjid Fathi
Publicado en: Computing Conference 2021, 2021
Editor: Computing Conference

Key Expansion in Cryptographic Systems (se abrirá en una nueva ventana)

Autores: Sorin Chiţu, Daniel Ciprian Vasile, Ionuţ Daniel Trămândan, Paul Svasta
Publicado en: 2020 IEEE 26th International Symposium for Design and Technology in Electronic Packaging (SIITME), 2020
Editor: IEEE
DOI: 10.1109/siitme50350.2020.9292242

Benefits of Digitalization for Business Processes in Semiconductor Manufacturing (se abrirá en una nueva ventana)

Autores: Germar Schneider, Sophia Keil, Fabian Lindner
Publicado en: 2021 22nd IEEE International Conference on Industrial Technology (ICIT), 2021, Página(s) 1027-1033, ISBN 978-1-7281-5730-6
Editor: IEEE
DOI: 10.1109/icit46573.2021.9453611

An Industry 4.0 Production Workplace Enhanced by Using Mixed Reality Assembly Instructions with Microsoft HoloLens (se abrirá en una nueva ventana)

Autores: Hebenstreit M., Spitzer M., Eder M., Ramsauer C.
Publicado en: Mensch und Computer 2020 - Workshopband, 2020
Editor: Gesellschaft für Informatik e.V
DOI: 10.18420/muc2020-ws116-005

Learning Long-Term Dependencies in Irregularly-Sampled Time Series

Autores: Lechner, Mathias; Hasani, Ramin
Publicado en: Neural Information Processing Systems (NIPS), Edición 2, 2020
Editor: Neural Information Processing Systems Foundation

Order Release Methods in Semiconductor Manufacturing: State-of-the-Art in Science and Lessons from Industry (se abrirá en una nueva ventana)

Autores: Jacob Lohmer, Christian Flechsig, Rainer Lasch, Konstantin Schmidt, Benjamin Zettler, Germar Schneider
Publicado en: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2020, Página(s) 1-6, ISBN 978-1-7281-5876-1
Editor: IEEE
DOI: 10.1109/ASMC49169.2020.9185201

1MHz Gate Driver in Power Technology for Fast Switching Applications

Autores: Roberto Di Lorenzo, Andrea Baschirotto, Albino Pidutti, Paolo Del Croce
Publicado en: IEEE 27th International Conference on Mixed Design of Integrated Circuits and System (MIXDES), 2020
Editor: IEEE

On The Verification of Neural ODEs with Stochastic Guarantees

Autores: Gruenbacher, Sophie; Hasani, Ramin; Lechner, Mathias; Cyranka, Jacek; Smolka, Scott A.; Grosu, Radu
Publicado en: Thirty-Fifth AAAI Conference on Artificial Intelligence, Edición 4, 2021
Editor: AAAI

Liquid Time-constant Networks

Autores: Hasani, Ramin; Lechner, Mathias; Amini, Alexander; Rus, Daniela; Grosu, Radu
Publicado en: Proceedings of the AAAI Conference on Artificial Intelligence, 2021
Editor: AAAI

Branch selection and data optimization for selecting machines for processes in semiconductor manufacturing using AI-based predictions (se abrirá en una nueva ventana)

Autores: Peter Stich, Rebecca Busch, Michael Wahl, Christian Weber, Madjid Fathi
Publicado en: 2021 IEEE International Conference on Electro Information Technology (EIT), 2021, Página(s) 1-6, ISBN 978-1-6654-1846-1
Editor: IEEE
DOI: 10.1109/eit51626.2021.9491836

Correlating electrical and process parameters for yield detractors’ detection (se abrirá en una nueva ventana)

Autores: Ingrid Kovacs, Marina Topa, Ciprian Pop, Elena-Diana Sandru, Andi Buzo, Georg Pelz
Publicado en: 2020 International Symposium on Electronics and Telecommunications (ISETC), 2020, Página(s) 1-4, ISBN 978-1-7281-9513-1
Editor: IEEE
DOI: 10.1109/isetc50328.2020.9301121

Backward Simulation for Production Planning - Recent Advances in a Real-World Use-Case

Autores: Christoph Laroque, Madlene Leißau, Wolfgang Scholl, Germar Schneider
Publicado en: 2021 Winter Simulation Conference (WSC), 2021
Editor: IEEE

Electro-Thermal Simulation of Power DMOS Devices Operating under Fast Thermal Cycling (se abrirá en una nueva ventana)

Autores: Ciprian Florea, Vasile Ţopa, Dan Simon
Publicado en: International Symposium for Design and Technology of Electronics Packages (SIITME), 2020
Editor: IEEE
DOI: 10.1109/siitme50350.2020.9292143

Smart Platform for Rapid Prototyping: Solutions in the dilemma of flexibility and standardization

Autores: Sabrina Anger, Felix Klingert, Volker Häublein, Markus Pfeffer, Martin Schellenberger
Publicado en: International Conference on Industrial Technology, 2021
Editor: IEEE

Simulation-based Evaluation of Lot Release Policies in a Power Semiconductor Facility - A Case Study (se abrirá en una nueva ventana)

Autores: Allgeier, Henriette; Flechsig, Christian; Lohmer, Jacob; Lasch, Rainer; Schneider, Germar; Zettler, Benjamin
Publicado en: Proceedings of the 2020 Winter Simulation Conference, 2020
Editor: IEEE
DOI: 10.5281/zenodo.4011587

Investigation of Predictive Maintenance for Semiconductor Manufacturing and its Impacts on the Supply Chain (se abrirá en una nueva ventana)

Autores: Daniel Fischer, Patrick Moder, Hans Ehm
Publicado en: 2021 22nd IEEE International Conference on Industrial Technology (ICIT), 2021, Página(s) 1409-1416, ISBN 978-1-7281-5730-6
Editor: IEEE
DOI: 10.1109/icit46573.2021.9453481

Service-based Semiconductor Manufacturing using the Digital Reference Ontology for Global Service Discovery

Autores: Hartwig Baumgaertel Patrick Moder Nour Ramzy Hans Ehm
Publicado en: IEEE IECON 2020 conference special session on IoT Automation Technologies, Tools and Applications, 2020
Editor: IEEE

High-Voltage Double-Domain Low-Dropout regulator for rapidly changing output loads (se abrirá en una nueva ventana)

Autores: Osvaldo Gasparri; Bozic Aleksandar; Paolo del Croce; Andrea Baschirotto
Publicado en: IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2022
Editor: IEEE
DOI: 10.1109/icecs53924.2021.9665584

A Natural lottery Ticket Winner: Reinforcement Learning with Ordinary Neural Circuits

Autores: Ramin Hasani, Mathias Lechner, Alexander Amini,Daniela Rus, Radu Grosu
Publicado en: International Conference on Machine Learning (ICML), 2020
Editor: ICML

Cryptographic Key Derivation from an Anti-Tamper Solution (se abrirá en una nueva ventana)

Autores: Daniel-Ciprian Vasile, Sorin Chitu, Paul Svasta
Publicado en: 2020 IEEE 8th Electronics System-Integration Technology Conference (ESTC), 2020, Página(s) 1-6, ISBN 978-1-7281-6293-5
Editor: IEEE
DOI: 10.1109/estc48849.2020.9229844

Strategic Approaches for Further Development of SiC Rapid Prototype Production

Autores: Sabrina Anger, Volker Häublein, Markus Pfeffer, Martin Schellenberger
Publicado en: European Advanced Process Control and Manufacturing Conference (apc|m), 2022
Editor: apc|m

Human-centered workplaces in the digital transformation of the semiconductor industry – a step towards high and intelligent automation (HIA) (se abrirá en una nueva ventana)

Autores: Schneider, Germar; Lindner, Fabian; Keil, Sophia; Von Der Weth, Rüdiger
Publicado en: 6th World Conference on Production and Operations Management, Edición 1, 2022
Editor: Japanese Operations Management and Strategy Association (JOMSA)
DOI: 10.5281/zenodo.7244541

Smart Systems Everywhere – Intelligence, Autonomy, Technology and Society (se abrirá en una nueva ventana)

Autores: Schoitsch Erwin
Publicado en: Proceedings of IDIMT 2018, Strategic Modeling in Management, Economy and Society, 2018, Página(s) 153-165, ISBN 978-3-99062-339-8
Editor: Trauner Verlag
DOI: 10.5281/zenodo.2590948

A Planning Approach for an Effective Digitalization of Processes in Mature Semiconductor Production Facilities (se abrirá en una nueva ventana)

Autores: Sophia Keil, Fabian Lindner, Germar Schneider, Tobias Jakubowitz
Publicado en: 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2019, Página(s) 1-6, ISBN 978-1-5386-7601-1
Editor: IEEE
DOI: 10.1109/asmc.2019.8791830

Response Characterization for Auditing Cell Dynamics in Long Short-term Memory Networks (se abrirá en una nueva ventana)

Autores: Ramin Hasani, Alexander Amini, Mathias Lechner, Felix Naser, Radu Grosu, Daniela Rus
Publicado en: 2019 International Joint Conference on Neural Networks (IJCNN), 2019, Página(s) 1-8, ISBN 978-1-7281-1985-4
Editor: IEEE
DOI: 10.1109/ijcnn.2019.8851954

The List is the Process: Reliable Pre-Integration Tracking of Commits on Mailing Lists (se abrirá en una nueva ventana)

Autores: Ralf Ramsauer, Daniel Lohmann, Wolfgang Mauerer
Publicado en: 2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE), 2019, Página(s) 807-818, ISBN 978-1-7281-0869-8
Editor: IEEE
DOI: 10.1109/icse.2019.00088

Novel challenges for root cause investigation in semiconductor manufacturing (se abrirá en una nueva ventana)

Autores: Pleschberger, Martin; Zernig, Anja; Kaestner, Andre
Publicado en: 19th European Advanced Process Control and Manufacturing Conference (apc/m), Edición 3, 2019
Editor: European Advanced Process Control and manufacturing Conference
DOI: 10.5281/zenodo.3247340

A Formally Robust Time Series Distance Metric

Autores: Maximilian Toller, Berhard C. Geiger, Roman Kern
Publicado en: MileTS'19: 5th KDD Workshop on Mining and Learning from Time Series, 2019
Editor: ACM

A Machine Learning Suite for Machine Components’ Health-Monitoring (se abrirá en una nueva ventana)

Autores: Ramin Hasani, Guodong Wang, Radu Grosu
Publicado en: Proceedings of the AAAI Conference on Artificial Intelligence, Edición 33, 2019, Página(s) 9472-9477, ISSN 2374-3468
Editor: Association for the Advancement of Artificial Intelligence
DOI: 10.1609/aaai.v33i01.33019472

Realizing the full potential of Robotic Process Automation through a combination with BPM (se abrirá en una nueva ventana)

Autores: Flechsig, Christian; Lohmer, Jacob; Lasch, Rainer
Publicado en: Logistics Management, Edición 1, 2019, Página(s) 104-119
Editor: Springer
DOI: 10.1007/978-3-030-29821-0_8

A Research Agenda to Deploy Technology Enhanced Learning with Augmented Reality in Industry

Autores: Spitzer, Michael; Gsellmann, Inge; Hebenstreit, Matthias; Damalas, Stelios; Ebner, Martin
Publicado en: Mensch und Computer 2019 - Workshopband, 2019
Editor: Gesellschaft für Informatik e.V

Smart Collaboration - Mitarbeiter-zentriete Informationssysteme in der Produktentstehung

Autores: Manfred Rosenberger, Michael Fellmann, Alexander Richter, Alexander Stocker, Michael Schmeja, Christian Kaiser
Publicado en: Mensch und Computer 2019 - Workshopband, 2019
Editor: Gesellschaft für Informatik e.V

Human Work Activity Recognition for Working Cells in Industrial Production Contexts (se abrirá en una nueva ventana)

Autores: Clemens Pohlt, Thomas Schlegl, Sven Wachsmuth
Publicado en: 2019 IEEE International Conference on Systems, Man and Cybernetics (SMC), 2019, Página(s) 4225-4230, ISBN 978-1-7281-4569-3
Editor: IEEE
DOI: 10.1109/smc.2019.8913873

Designing Worm-inspired Neural Networks for Interpretable Robotic Control (se abrirá en una nueva ventana)

Autores: Mathias Lechner, Ramin Hasani, Manuel Zimmer, Thomas A. Henzinger, Radu Grosu
Publicado en: 2019 International Conference on Robotics and Automation (ICRA), 2019, Página(s) 87-94, ISBN 978-1-5386-6027-0
Editor: IEEE
DOI: 10.1109/icra.2019.8793840

Security Chain Tool for IoT Secure Applications

Autores: Schmittner C., Abdelkader M.S.,
Publicado en: 2nd International Workshop on Embedded Software for Industrial IoT, 2019, Página(s) 27-29
Editor: ESIIT

Information Holism – a New Way to Close the Information Gap (se abrirá en una nueva ventana)

Autores: Gerhard Luhn, Agnes Oszuszky
Publicado en: 2019 3rd International Conference on Advanced Information and Communications Technologies (AICT), 2019, Página(s) 101-107, ISBN 978-1-7281-2399-8
Editor: IEEE
DOI: 10.1109/aiact.2019.8847757

Ontology-Based Model for Automotive Security Verification and Validation (se abrirá en una nueva ventana)

Autores: Abdelkader Magdy Shaaban, Christoph Schmittner, Thomas Gruber, A. Baith Mohamed, Gerald Quirchmayr, Erich Schikuta
Publicado en: Proceedings of the 21st International Conference on Information Integration and Web-based Applications & Services, 2019, Página(s) 73-82, ISBN 9781-450371797
Editor: ACM
DOI: 10.1145/3366030.3366070

BEYOND SMART SYSTEMS – CREATING A SOCIETY OF THE FUTURE (5.0) RESOLVING DISRUPTIVE CHANGES AND SOCIAL CHALLENGES (se abrirá en una nueva ventana)

Autores: Schoitsch, Erwin
Publicado en: Proceedings of IDIMT 2019, Innovation and Transformation in a Digital World, Edición 2, 2019, Página(s) 387-400, ISBN 978-3-99062-590-3
Editor: Traun Verlag
DOI: 10.5281/zenodo.3605686

On-Chip Power Stage and Gate Driver for Fast Switching Applications (se abrirá en una nueva ventana)

Autores: Roberto di Lorenzo, Osvaldo Gasparri, Albino Pidutti, Paolo del Croce, Andrea Baschirotto
Publicado en: 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2019, Página(s) 266-269, ISBN 978-1-7281-0996-1
Editor: IEEE
DOI: 10.1109/icecs46596.2019.8965103

Variable off-Time Peak Current Mode Control (VoT-PCMC) as method for average current regulation in Buck Converter Drivers (se abrirá en una nueva ventana)

Autores: Osvaldo Gasparri, Roberto di Lorenzo, Paolo Del Croce, Albino Pidutti, Andrea Baschirotto
Publicado en: 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2019, Página(s) 258-261, ISBN 978-1-7281-0996-1
Editor: IEEE
DOI: 10.1109/icecs46596.2019.8964979

Using Delays for Process flow Simplification (se abrirá en una nueva ventana)

Autores: Igor Stogniy, Wolfgang Scholl
Publicado en: 2019 Winter Simulation Conference (WSC), 2019, Página(s) 2372-2383, ISBN 978-1-7281-3283-9
Editor: IEEE
DOI: 10.1109/wsc40007.2019.9004724

A New High-Volume/Low-Mix Simulation Testbed for Semiconductor Manufacturing (se abrirá en una nueva ventana)

Autores: Michael Hassoun, Denny Kopp, Lars Monch, Adar Kalir
Publicado en: 2019 Winter Simulation Conference (WSC), 2019, Página(s) 2419-2428, ISBN 978-1-7281-3283-9
Editor: IEEE
DOI: 10.1109/wsc40007.2019.9004654

Integrated Planning of Production and Engineering Activities in Semiconductor Supply Chains: A Simulation Study (se abrirá en una nueva ventana)

Autores: Timm Ziarnetzky, Lars Monch, Thomas Ponsignon, Hans Ehm
Publicado en: 2019 Winter Simulation Conference (WSC), 2019, Página(s) 2324-2335, ISBN 978-1-7281-3283-9
Editor: IEEE
DOI: 10.1109/wsc40007.2019.9004721

Interpretable Neuronal Circuit Policies for Reinforcement Learning Environments

Autores: Matthias Lechner, Ramin M. Hasani, Radu Grosu
Publicado en: IJCAI/ECAI Workshop on Explainable Artificial Intelligence (XAI), 2018
Editor: XAI

A Holistic Digital Twin Based on Semantic Web Technologies to Accelerate Digitalization

Autores: Patrick Moder, Hans Ehm, Eva Jofer
Publicado en: Digital Transformation in Semiconductor Manufacturing, 2020
Editor: Springer

Framework for Simulation-Based Decision Making in Semiconductor Value Chains

Autores: Lars Mönch1, Hans Ehm, Thomas Ponsignon
Publicado en: Digital Transformation in Semiconductor Manufacturing, 2020
Editor: Springer

Digital Twin for Plan and Make Using Semantic Web Technologies – Extending the JESSI/SEMATECH MIMAC Standard to the Digital Reference

Autores: Patrick Moder, Hans Ehm, Nour Ramzy
Publicado en: Digital Transformation in Semiconductor Manufacturing, 2020
Editor: Springer

Enhancing Prediction Quality of Fab Simulation by Advanced Cycle Time Modelling

Autores: Maximilian Dilefeld, Sebastian Rank, Thorsten Schmidt
Publicado en: Digital Transformation in Semiconductor Manufacturing, 2020
Editor: Springer

Visualization of Automated Material Handling System Components in Semiconductor Industry over the Lifecycle

Autores: Patrick Boden, Sebastian Rank, Thorsten Schmidt, Martin Däumler
Publicado en: Digital Transformation in Semiconductor Manufacturing, 2020
Editor: Springer

A System Dynamics Approach for Modeling Return on Quality for ECS Industry

Autores: Bernhard Oberegger, Andreas Felsberger, Gerald Reiner
Publicado en: Digital Transformation in Semiconductor Manufacturing, 2020
Editor: Springer

Automation of Cross-Factory Decision-Making Within Administrative Processes to Enhance Data Quality for Production

Autores: Jacob Lohmer , Christian Flechsig, Rainer Lasch, Germar Schneider, Dietrich Eberts, Benjamin Zettler2
Publicado en: Digital Transformation in Semiconductor Manufacturing, 2020
Editor: Springer

A Novel Software Architecture for Mixed Criticality Systems

Autores: Ralf Ramsauer, Jan Kiszka, Wolfgang Mauerer
Publicado en: Digital Transformation in Semiconductor Manufacturing, 2020
Editor: Springer

Digitizing Human Work Places in Manufacturing Through Augmented and Mixed Reality

Autores: Michael Spitzer, Manfred Rosenberger, Alexander Stocker, Inge Gsellmann, Matthias Hebenstreit, and Michael Schmeja
Publicado en: Digital Transformation in Semiconductor Manufacturing, 2020
Editor: Springer

Training the Human-in-the-Loop in Industrial Cyber Ranges

Autores: Stela Kucek, Maria Leitner
Publicado en: Digital Transformation in Semiconductor Manufacturing, 2020
Editor: Springer

PCMC DC-DC Converter Development Methodology by Means of dSPACE

Autores: Osvaldo Gasparri, Roberto Di Lorenzo, Paolo Del Croce, Andrea Baschirotto
Publicado en: Digital Transformation in Semiconductor Manufacturing, 2020
Editor: Springer

Smart Platform for Rapid Prototyping: A First Solution Approach to Improve Time-to-Market and Process Control in Low-Volume Device Fabrication

Autores: Martin Schellenberger, Sabrina Anger, Markus Pfeffer, Volker Häublein, Georg Roeder, Anton Bauer
Publicado en: Digital Transformation in Semiconductor Manufacturing, 2020
Editor: Springer

Competency Requirements at Digitalized Workplaces in the Semiconductor Industry

Autores: Sophia Keil, Fabian Lindner, Josef Moser, Rüdiger von der Weth, Germar Schneider
Publicado en: Digital Transformation in Semiconductor Manufacturing, 2020
Editor: Springer

A Natural lottery Ticket Winner: Reinforcement Learning with Ordinary Neural Circuits

Autores: Ramin Hasani, Mathias Lechner, Alexander Amini, Daniela Rus, Radu Grosu
Publicado en: International Conference on Machine Learning, 2020
Editor: ICML

Gershgorin Loss Stabilizes the Recurrent Neural Network Compartment of an End-to-end Robot Learning Scheme

Autores: Mathias Lechner, Ramin Hasani, Daniela Rus, Radu Grosu
Publicado en: International Conference on Robotics and Automation 2020 (ICRA), 2020
Editor: IEEE

Integrating critical queue time constraints into SMT2020 simulation models

Autores: Denny Kopp, Michael Hassoun, Adar Kalir, Lars Mönch
Publicado en: Proceedings of the 2020 Winter Simulation Conference, 2020
Editor: IEEE

Algorithm to Design Conductive Mesh for Tamperproof Envelope (se abrirá en una nueva ventana)

Autores: Sorin Chiţu, Daniel Ciprian Vasile, Tudor Ioan Honceriu, Paul Svasta
Publicado en: International Symposium for Design and Technology of Electronics Packages (SIITME), 2020
Editor: IEEE
DOI: 10.1109/siitme50350.2020.9292275

Yield prediction in semiconductor manufacturing using an AI-based cascading classification system (se abrirá en una nueva ventana)

Autores: Peter Stich, Michael Wahl, Peter Czerner, Christian Weber, Madjid Fathi
Publicado en: 2020 IEEE International Conference on Electro Information Technology (EIT), 2020, Página(s) 609-614, ISBN 978-1-7281-5317-9
Editor: IEEE
DOI: 10.1109/eit48999.2020.9208250

Towards a Resilient Society – Technology 5.0, Risks and Ethics (se abrirá en una nueva ventana)

Autores: Schoitsch Erwin
Publicado en: IDIMT 2020, Edición 9, 2020
Editor: Trauner Verlag
DOI: 10.5281/zenodo.4000984

Weakly-Supervised Learning for Multimodal Human Activity Recognition in Human-Robot Collaboration Scenarios

Autores: Clemens Pohlt, homas Schlegl, Sven Wachsmuth
Publicado en: IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS), 2020
Editor: IEEE

Erfolgsfaktoren bei der Einführung Digitaler Technologien im Kontext von Industrie 4.0 (se abrirá en una nueva ventana)

Autores: Stocker Alexander, Rosenberger Manfred, Resztej Mirjam, Damalas Stelios Andreas
Publicado en: Mensch und Computer 2020 - Workshopband, 2020
Editor: Gesellschaft für Informatik e.V
DOI: 10.18420/muc2020-ws116-006

Visual Analytics for Data-Driven Analysis in Semiconductor Manufacturing (se abrirá en una nueva ventana)

Autores: Patrick Boden, Sebastian Rank, Thorsten Schmidt
Publicado en: ASIM Fachtagung - 25. Symposium Simulationstechnik, 2020
Editor: ASIM - Arbeitsgemeinschaft Simulation
DOI: 10.11128/arep.59.a59019

Chip and Board Scale Transient Thermal Simulations for Power MOS Devices Reliability Analysis (se abrirá en una nueva ventana)

Autores: Madalin Vasile Moise, Paul Svasta, Norocel Codreanu, Ciprian Ionescu, Mihaela Pantazica, Alexandru Vasile, Bogdan Mihailescu, Cristian Boianceanu
Publicado en: 2021 44th International Spring Seminar on Electronics Technology (ISSE), 2021, Página(s) 1-4, ISBN 978-1-6654-1477-7
Editor: IEEE
DOI: 10.1109/isse51996.2021.9467624

Development and Evaluation of a Blockchain Concept for Production Planning and Control in the Semiconductor Industry (se abrirá en una nueva ventana)

Autores: Herrgoß, Laura; Lohmer, Jacob; Schneider, Germar; Lasch, Rainer
Publicado en: IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), 2020
Editor: IEEE
DOI: 10.5281/zenodo.4003638

Challenges in Smart Health Applications using Wearable Medical Internet of Things – A Review

Autores: Benedikt Schnell, Patrick Moder, Hans Ehm, Marcel Konstantinov, Mahmoud Ismail
Publicado en: ICICT 2021 – 6th International Congress on Information and Communication Technology, 2021
Editor: Infineon Technologies AG

Using representative process flows for simulation model simplification

Autores: Igor Stogniy, Wolfgang Scholl
Publicado en: International Conference on Industrial Technology, 2021
Editor: IEEE

SMACD / PRIME 2021; International Conference on SMACD and 16th Conference on PRIME

Autores: Davide Severin; Giovanni Capodivacca; Bernard Blaise Tchodjie Tchamabe; Andi Buzo; Cristian-Vasile Diaconu
Publicado en: SMACD / PRIME 2021; International Conference on SMACD and 16th Conference on PRIME, 2021, ISBN 978-3-8007-5588-2
Editor: IEEE

Adversarial Training is Not Ready for Robot Learning (se abrirá en una nueva ventana)

Autores: Lechner, Mathias; Hasani, Ramin; Grosu, Radu; Rus, Daniela; Henzinger, Thomas A.
Publicado en: IEEE International Conference on Robotics and Automation (ICRA), 2021
Editor: IEEE
DOI: 10.1109/icra48506.2021.9561036

Einsatzmöglichkeiten der Rückwärtssimulation zur Produktionsplanung in der Halbleiterfertigung (se abrirá en una nueva ventana)

Autores: Christoph Laroque, Christoph Löffler, Wolfgang Scholl, Germar Schneider
Publicado en: Proceedings ASIM SST 2020, 2020, Página(s) 397-401, ISBN 9783901608933
Editor: ARGESIM Publisher Vienna
DOI: 10.11128/arep.59.a59055

A Low-Dropout Regulator for One Time Programmable (OTP) Memories in Automotive Applications (se abrirá en una nueva ventana)

Autores: Osvaldo Gasparri; Bozic Aleksandar; Paolo del Croce; Andrea Baschirotto
Publicado en: International Conference on Electronics, Circuits and Systems (ICECS), 2022
Editor: IEEE
DOI: 10.1109/icecs53924.2021.9665607

Automated and Optimized Lot-To-Order Matching in 300 mm Semiconductor Facilities (se abrirá en una nueva ventana)

Autores: Christian Flechsig, Jacob Lohmer, Rainer Lasch, Benjamin Zettler, Germar Scheider, Dietrich Eberts
Publicado en: 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2021, Página(s) 1-6, ISBN 978-1-7281-8645-0
Editor: IEEE
DOI: 10.1109/ASMC51741.2021.9435730

Visual Analytics for Data-Driven Analysis in Semiconductor Manufacturing

Autores: Boden, Patrick; Rank, Sebastian; Schmidt, Thorsten
Publicado en: Proceedings ASIM SST 2020, Edición 1, 2020, ISBN 9783901608933
Editor: Arbeitsgemeinschaft Simuluation

SIMULATION MODEL SIMPLIFICATION FOR CHANGING PRODUCT MIX SCENARIO

Autores: Igor Stogniy, Wolfgang Scholl, Hans Ehm
Publicado en: Proceedings of the 2021 Winter Simulation Conferenc, 2021
Editor: IEEE

DC-DC Buck Converter with Constant Off-Time Peak Current Mode Control (se abrirá en una nueva ventana)

Autores: Osvaldo Gasparri, Roberto Di Lorenzo, Albino Pidutti, Paolo Del Croce, Andrea Baschirotto
Publicado en: 2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2020
Editor: IEEE
DOI: 10.1109/icecs49266.2020.9294913

Assessing the Impact of Information Assistance Systems on a Worker Level - A Pre-Study towards an Evaluation Framework (se abrirá en una nueva ventana)

Autores: Lindner Fabian, Winkler Daniel, Müller Arvid, Mühlan Kevin, Keil Sophia
Publicado en: Mensch und Computer - Workshopband 2020, 2020
Editor: Gesellschaft für Informatik
DOI: 10.18420/muc2020-ws116-001

A DISCRETE-EVENT HEURISTIC FOR MAKESPAN OPTIMIZATION IN MULTI-SERVERFLOW-SHOP PROBLEMS WITH MACHINE RE-ENTERING

Autores: Angel A. Juan, Pedro Copado, Javier Panadero, Christoph Laroque, Rocio de la Torre
Publicado en: Proceedings of the 2020 Winter Simulation Conference, 2020
Editor: IEEE

Model-based versus Model-free Deep Reinforcement Learning for Autonomous Racing Cars

Autores: Brunnbauer, Axel; Berducci, Luigi; Brandstätter, Andreas; Lechner, Mathias; Hasani, Ramin; Rus, Daniela; Grosu, Radu
Publicado en: preprint, Edición 1, 2021
Editor: TU Vienna

Poster: Smart Virtual Collaboration to Optimize the Development Process in Semiconductor Industry

Autores: Germar Schneider, Fabian Lindner, Sophia Keil
Publicado en: EUROPEAN ADVANCED PROCESS CONTROL AND MANUFACTURING (APC|M) CONFERENCE, 2021
Editor: apc/m

Machine Learning based Indicators to Enhance Process Monitoring by Pattern Recognition

Autores: Schrunner, Stefan; Scheiber, Michael; Jenul, Anna; Zernig, Anja; Kästner, Andre; Kern, Roman
Publicado en: preprint, Edición 2, 2021
Editor: Know Center

Development and evaluation of a Blockchain concept for the IFD 300 mm Pre-Assembly Line (se abrirá en una nueva ventana)

Autores: Germar Schneider; Laura Herrgoß; Jacob Lohmer; Rainer Lasch
Publicado en: apcm, Edición 2, 2021
Editor: apcm
DOI: 10.5281/zenodo.4686629

Variable Selection Using Nearest Neighbor Gaussian Processes

Autores: Posch, Konstantin; Arbeiter, Maximilian; Pleschberger, Martin; Pilz, Juergen
Publicado en: preprint, Edición 1, 2021
Editor: University Klagenfurt

Presentation: Investigation of the Airborne Molecular Contamination Behavior in 300 mm Semiconductor Front - End Manufacturing

Autores: Germar Schneider, Laura Herrgoß, Jacob Lohmer, Rainer Lasch
Publicado en: EUROPEAN ADVANCED PROCESS CONTROL AND MANUFACTURING (APC|M) CONFERENCE, 2021
Editor: APC/M

Poster: Chances & Challenges of Digitization in Semiconductor Fabs and Success Factors during the Implementation

Autores: Schneider G., Herrgoß L, Lindner F., Keil S.
Publicado en: 19th European Advanced Process Control and Manufacturing Conference (apc|m), 2019
Editor: European Advanced Process Control and Manufacturing Conference

Poster: An experimental proof of the different granularity levels of automated-generated long-term simulation model

Autores: Igor Stogniy, Wolfgang Scholl
Publicado en: 19th European Advanced Process Control and Manufacturing Conference (apc|m), 2019
Editor: 19th European Advanced Process Control and Manufacturing Conference (apc|m)

Presentation: New defect classification methodology with regard to causal modeling, supervised by engineers (SME)

Autores: Andre Schaaf-Ledermüller
Publicado en: APC 2018: Advanced Process Control Conference, 2018
Editor: apc conference

Presentation: On the deep nature of human knowledge (part II): Physical information, knowledge and language

Autores: Gerhard Luhn, Germar Schneider, Gerald Huether
Publicado en: APC 2018: Advanced Process Control Conference, 2018
Editor: apc conference

Presentation: On the deep nature of human knowledge (part I): Neuroscience, quantum physics and the imaginary

Autores: Gerhard Luhn, Germar Schneider, Gerald Hüther
Publicado en: APC 2018: Advanced Process Control Conference, 2018
Editor: apc conference

Liquid Time-constant Recurrent Neural Networks as Universal Approximators

Autores: Hasani, Ramin M.; Lechner, Mathias; Amini, Alexander; Rus, Daniela; Grosu, Radu
Publicado en: preprint, Edición 1, 2018
Editor: arxiv.org

Re-purposing Compact Neuronal Circuit Policies to Govern Reinforcement Learning Tasks

Autores: Hasani, Ramin M.; Lechner, Mathias; Amini, Alexander; Rus, Daniela; Grosu, Radu
Publicado en: preprint, Edición 1, 2018
Editor: arix.org

Presentation: The List is Our Process! An analysis of the kernel's email-based development process

Autores: Ralf Ramsauer, Sebastian Duda, Lukas Bulwahn, Wolfgang Mauerer
Publicado en: Embedded Linux Conference Europe, 2019
Editor: ELCE

"Presentation: Quicker from R&D to Line - A ""Smart Experiments"" Approach"

Autores: S. Anger, M. Schellenberger, M. Pfeffer, V. Häublein, G. Roeder, A. Bauer
Publicado en: Workshop of GMM-Fachgruppe 1.2.3 Abscheide- und Ätzverfahren, 2019
Editor: GMM

"Presentation: Digitale Kompetenzen in der Hochschullehre - ""10.000 Schritte in den Fußstapfen eines 'Pickers'"""

Autores: Keil S., Mühlan K., Winkler D., Lindner F.
Publicado en: 14th Regional Conference for Engineering Pedagogy, 2019
Editor: HSZG

Poster: An Advanced Further Education Framework for Industry 4.0 - Developing a Certification Program for Digital Transformation (se abrirá en una nueva ventana)

Autores: Sophia Keil, Fabian Lidner, Kevin Mühlan, Daniel Winkler
Publicado en: 2019
Editor: HSZG
DOI: 10.13140/rg.2.2.11557.96480

Presentation: A Planning Approach for an Effective Digitalization of Processes in Mature Semiconductor Production Facilities

Autores: Keil S., Schneider G., Lindner F., Jakubowitz T.
Publicado en: 2019
Editor: HSZG

"Poster: Die Bedeutung ""klassischer"" Kompetenzen in der digitalen Transformation" (se abrirá en una nueva ventana)

Autores: Lindner F., Mühlan K., Winkler D., Naumann F., Keil S.
Publicado en: Workshop on E-Learning, 2019
Editor: HSZG
DOI: 10.13140/rg.2.2.35748.83846

Presentation: Statistical Modelling and Design for Quality Control and Reliability Analysis in Power Semiconductor Manufacturing Processes

Autores: Jürgen Pilz, Daniel Kurz, Natalie Vollert
Publicado en: DAGSTAT Conference, 2019
Editor: DAGSTAT

Presentation: Two Worlds - Common Concept?

Autores: A. Zernig, K. Krebs, F. D. Frumosu, D. Surmann
Publicado en: European Network for Business and Industrial Statistics, 2019
Editor: ENBIS

Presentation: The impact of supply chain design options on performance measures in the semiconductor industry

Autores: Bernhard Oberegger, Andreas Felsberger, Boualem Rabta, Gerald Reiner
Publicado en: 30th European Conference on Operational Research (EURO), 2019
Editor: EURO

Presentation: Modeling an Ontology for Planning and Control Tasks in Semiconductor Value Chains

Autores: Sebastian Arens, Lars Moench
Publicado en: European Conference on Operational Research, 2019
Editor: European Conference on Operational Research

Real-time Electrical Power Prediction in a Combined Cycle Power Plant (se abrirá en una nueva ventana)

Autores: Lobo, Jesus L.; Ballesteros, Igor; Oregi, Izaskun; Del Ser, Javier
Publicado en: preprint, 2019
Editor: Tecnalia
DOI: 10.13140/rg.2.2.21137.99680

Presentation: Experimentelle Untersuchung der Auswirkungen digitalisierter Arbeitsplätze auf Menschen in der Industrie 4.0 Modellfabrik.

Autores: Rinat Saifoulline, Sabine Friese, Tobias Jakubowitz, Dirk Reichelt, Rüdiger von der Weth
Publicado en: AOW Tagung 2019, 2019
Editor: AOW

Presentation: Computersimulation komplexer Arbeitsanforderungen als Werkzeug für Qualifikation und prospektive Arbeitsgestaltung.

Autores: Rüdiger von der Weth, Tobias Jakubowitz, Sabine Friese, Rinat Saifoulline
Publicado en: 11. Tagung der Fachgruppe Arbeits-, Organisations- und Wirtschaftspsychologie der Deutschen Gesellschaft für Psychologie, 2019
Editor: AOW

Presentation: Correlated Parameters to Accurately Measure Uncertainty in Deep Neural Networks

Autores: Konstantin Posch, Jürgen Pilz
Publicado en: 10th International Workshop on Simulation and Statistics, 2019
Editor: ÖSG

Can a Compact Neuronal Circuit Policy be Re-purposed to Learn Simple Robotic Control?

Autores: Ramin Hasani, Mathias Lechner, Alexander Amin, Daniela Rus, Radu Grosu
Publicado en: preprint, 2018
Editor: TU Wien

On Information Plane Analyses of Neural Network Classifiers -- A Review

Autores: Geiger, Bernhard C.
Publicado en: preprint, Edición 1, 2020
Editor: Know Center

A Novel Multi-Scale Method for Thermo-Mechanical Simulation of Power Integrated Circuit (se abrirá en una nueva ventana)

Autores: A. Bojita, M. Purcar, D. Simon, C. Florea, C. Boianceanu and V. Topa
Publicado en: IEEE Journal of the Electron Devices Society, 2022, ISSN 2168-6734
Editor: Institute of Electrical and Electronics Engineers Inc.
DOI: 10.1109/jeds.2022.3144530

LUNAR: Cellular automata for drifting data streams (se abrirá en una nueva ventana)

Autores: Jesus L. Lobo, Javier Del Ser, Francisco Herrera
Publicado en: Information Sciences, Edición 543, 2021, Página(s) 467-487, ISSN 0020-0255
Editor: Elsevier BV
DOI: 10.1016/j.ins.2020.08.064

Learn to Shape the Digital Transformation: The Design Approach of a Learning Factory for Industrial Engineers (se abrirá en una nueva ventana)

Autores: Fabian Lindner, Daniel Winkler, Kevin Mühlan, Uwe Wendt, Sophia Keil
Publicado en: SSRN Electronic Journal, 2021, ISSN 1556-5068
Editor: Elsevier
DOI: 10.2139/ssrn.3858409

Unexpected applause for the human mind. The limitations of deterministic approaches in neuroscience - allowing us to become who we are

Autores: Gerhard Luhn, Gerald Hüther
Publicado en: International Journal of Foresight and Innovation Policy, 2021, ISSN 1740-2816
Editor: Inderscience Publishers

DC-DC Buck Converter Driver with Variable Off-Time Peak Current Mode Control (se abrirá en una nueva ventana)

Autores: svaldo Gasparri, Paolo Del Croce, Andrea Baschirotto
Publicado en: Advances in Science, Technology and Engineering Systems Journal, 2020, ISSN 2415-6698
Editor: ASTES
DOI: 10.25046/aj050642

Test Structure Design for Defect Detection during Active Thermal Cycling (se abrirá en una nueva ventana)

Autores: Ciprian Florea; Dan Simon; Adrian Bojiță; Marius Purcar; Cristian Boianceanu; Vasile Țopa
Publicado en: Sensors; Volume 22; Edición 19; Pages: 7223, Edición 2, 2022, ISSN 1424-8220
Editor: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/s22197223

Ultra-thin oxide breakdown for OTP development in power technologies (se abrirá en una nueva ventana)

Autores: Osvaldo Gasparri, Mirko Bernardoni, Paolo Del Croce, Andrea Baschirotto
Publicado en: e & i Elektrotechnik und Informationstechnik, Edición 138/1, 2021, Página(s) 44-47, ISSN 0932-383X
Editor: Springer Verlag
DOI: 10.1007/s00502-020-00838-1

A Comparison of Variational Bounds for the Information Bottleneck Functional (se abrirá en una nueva ventana)

Autores: Bernhard C. Geiger, Ian S. Fischer
Publicado en: Entropy, Edición 22/11, 2020, Página(s) 1229, ISSN 1099-4300
Editor: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/e22111229

Streamlining Semiconductor Manufacturing of 200 mm and 300 mm Wafers: A Longitudinal Case Study on the Lot-To-Order-Matching Process (se abrirá en una nueva ventana)

Autores: Christian Flechsig; Jacob Lohmer; Rainer Lasch; Benjamin Zettler; Germar Schneider; Dietrich Eberts
Publicado en: Transactions on Semiconductor Manufacturing, Edición 3, 2022, ISSN 0894-6507
Editor: Institute of Electrical and Electronics Engineers
DOI: 10.1109/TSM.2022.3184041

Transformation of semantic knowledge into simulation-based decision support (se abrirá en una nueva ventana)

Autores: Wiking Jurasky, Patrick Moder, Michael Milde, Hans Ehm, Gunther Reinhart
Publicado en: Robotics and Computer-Integrated Manufacturing, Edición 71, 2021, Página(s) 102174, ISSN 0736-5845
Editor: Pergamon Press Ltd.
DOI: 10.1016/j.rcim.2021.102174

Zur Messung des Einflusses von „Augmented Reality“ auf die individuelle Produktivität bei Montagearbeiten (se abrirá en una nueva ventana)

Autores: Manfred Rosenberger, Michael Fellmann, Fabienne Lambusch, Michael Poppe, Michael Spitzer
Publicado en: HMD Praxis der Wirtschaftsinformatik, Edición 57/3, 2020, Página(s) 451-464, ISSN 1436-3011
Editor: SpringerLink
DOI: 10.1365/s40702-020-00620-z

Cluster Purging: Efficient Outlier Detection based on Rate-Distortion Theory (se abrirá en una nueva ventana)

Autores: Maximilian Bernhard Toller, Bernhard Claus Geiger, Roman Kern
Publicado en: IEEE Transactions on Knowledge and Data Engineering, 2021, Página(s) 1-1, ISSN 1041-4347
Editor: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tkde.2021.3103571

On Information Plane Analyses of Neural Network Classifiers – A Review (se abrirá en una nueva ventana)

Autores: Bernhard C. Geiger
Publicado en: IEEE Transactions on Neural Networks and Learning Systems, 2021, ISSN 2162-2388
Editor: IEEE
DOI: 10.1109/tnnls.2021.3089037

CURIE: A Cellular Automaton for Concept Drift Detection (se abrirá en una nueva ventana)

Autores: Lobo, Jesus L.; Del Ser, Javier; Osaba, Eneko; Bifet, Albert; Herrera, Francisco
Publicado en: Data Mining and Knowledge Discovery, Edición Special Edición of the Journal Track of ECML PKDD 2021, 2020, ISSN 1573-756X
Editor: Springer
DOI: 10.1007/s10618-021-00776-2

Measuring the Uncertainty of Predictions in Deep Neural Networks with Variational Inference. (se abrirá en una nueva ventana)

Autores: Jan Steinbrener; Konstantin Posch; Jürgen Pilz
Publicado en: Edición 21, Edición 3, 2020, ISSN 1424-8220
Editor: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/s20216011

SMT2020—A Semiconductor Manufacturing Testbed (se abrirá en una nueva ventana)

Autores: Denny Kopp, Michael Hassoun, Adar Kalir, Lars Monch
Publicado en: IEEE Transactions on Semiconductor Manufacturing, 2020, Página(s) 1-1, ISSN 0894-6507
Editor: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tsm.2020.3001933

Modeling the Dependency of Analog Circuit Performance Parameters on Manufacturing Process Variations with Applications in Sensitivity Analysis and Yield Prediction (se abrirá en una nueva ventana)

Autores: Elena-Diana Sandru, Emilian David, Ingrid Kovacs, Andi Buzo, Corneliu Burileanu, Georg Pelz
Publicado en: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2021, Página(s) 1-1, ISSN 0278-0070
Editor: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tcad.2021.3054804

Transferrable Framework Based on Knowledge Graphs for Generating Explainable Results in Domain-Specific, Intelligent Information Retrieval (se abrirá en una nueva ventana)

Autores: Hasan Abu-Rasheed, Christian Weber, Johannes Zenkert , Mareike Dornhöfer and Madjid Fathi
Publicado en: Journal informatics, 2022, ISSN 2227-9709
Editor: MDPI
DOI: 10.3390/informatics9010006

Production planning and scheduling in multi-factory production networks: a systematic literature review (se abrirá en una nueva ventana)

Autores: Jacob Lohmer, Rainer Lasch
Publicado en: International Journal of Production Research, 2020, Página(s) 1-27, ISSN 0020-7543
Editor: Taylor & Francis
DOI: 10.1080/00207543.2020.1797207

Investigation of the Airborne Molecular Contamination Behavior in 300 mm Semiconductor Front - End Manufacturing (se abrirá en una nueva ventana)

Autores: Peter Franze, Germar Schneider, Clara Zaengle, Markus Pfeffer, Stefan Kaskel
Publicado en: International Journal of Materials Science and Applications, Edición 9/1, 2020, Página(s) 14, ISSN 2327-2635
Editor: Science Publishing Group
DOI: 10.11648/j.ijmsa.20200901.13

Understanding Neural Networks and Individual Neuron Importance via Information-Ordered Cumulative Ablation (se abrirá en una nueva ventana)

Autores: Rana Ali Amjad, Kairen Liu, Bernhard C. Geiger
Publicado en: IEEE Transactions on Neural Networks and Learning Systems, 2021, Página(s) 1-11, ISSN 2162-237X
Editor: IEEE Computational Intelligence Society
DOI: 10.1109/tnnls.2021.3088685

A Geometric Perspective on Information Plane Analysis (se abrirá en una nueva ventana)

Autores: Mina Basirat, Bernhard C. Geiger, Peter M. Roth
Publicado en: Entropy, Edición 23/6, 2021, Página(s) 711, ISSN 1099-4300
Editor: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/e23060711

AUTOMATED ONTOLOGY-BASED SECURITY REQUIREMENTSIDENTIFICATION FOR THE VEHICULAR DOMAIN

Autores: Abdelkader Magdy Shaaban, Christoph Schmittner, Thomas Gruber, A. Baith Mohamed, Gerald Quirchmayr, and Erich Schikuta
Publicado en: Journal of Data Intelligence,, 2020, ISSN 2577-610X
Editor: rintonpress

A novel Bayesian approach for variable selection in linear regression models (se abrirá en una nueva ventana)

Autores: Konstantin Posch, Maximilian Arbeiter, Juergen Pilz
Publicado en: Computational Statistics & Data Analysis, Edición 144, 2020, Página(s) 106881, ISSN 0167-9473
Editor: Elsevier BV
DOI: 10.1016/j.csda.2019.106881

SAZED: parameter-free domain-agnostic season length estimation in time series data (se abrirá en una nueva ventana)

Autores: Maximilian Toller, Tiago Santos, Roman Kern
Publicado en: Data Mining and Knowledge Discovery, 2019, ISSN 1384-5810
Editor: Kluwer Academic Publishers
DOI: 10.1007/s10618-019-00645-z

Spiking Neural Networks and online learning: an overview and perspectives (se abrirá en una nueva ventana)

Autores: Jesus L. Lobo, Javier Del Ser, Albert Bifet, Nikola Kasabov
Publicado en: Neural Networks, 2020, Página(s) 88-100, ISSN 0893-6080
Editor: Pergamon Press Ltd.
DOI: 10.1016/j.neunet.2019.09.004

Correlated Parameters to Accurately Measure Uncertainty in Deep Neural Networks (se abrirá en una nueva ventana)

Autores: Konstantin Posch, Juergen Pilz
Publicado en: IEEE Transactions on Neural Networks and Learning Systems, 2020, Página(s) 1-15, ISSN 2162-237X
Editor: IEEE Computational Intelligence Society
DOI: 10.1109/tnnls.2020.2980004

An Empirical Survey of Functions and Configurations of Open-Source Capture the Flag (CTF) Environments (se abrirá en una nueva ventana)

Autores: Stela Kucek, Maria Leitner
Publicado en: Journal of Network and Computer Applications, Edición 151, 2020, Página(s) 102470, ISSN 1084-8045
Editor: Academic Press
DOI: 10.1016/j.jnca.2019.102470

Exploiting the stimuli encoding scheme of evolving Spiking Neural Networks for stream learning (se abrirá en una nueva ventana)

Autores: Jesus L. Lobo, Izaskun Oregi, Albert Bifet, Javier Del Ser
Publicado en: Neural Networks, Edición 123, 2020, Página(s) 118-133, ISSN 0893-6080
Editor: Pergamon Press Ltd.
DOI: 10.1016/j.neunet.2019.11.021

Stream Learning in Energy IoT Systems: A Case Study in Combined Cycle Power Plants (se abrirá en una nueva ventana)

Autores: Jesus L. Lobo, Igor Ballesteros, Izaskun Oregi, Javier Del Ser, Sancho Salcedo-Sanz
Publicado en: Energies, Edición 13/3, 2020, Página(s) 740, ISSN 1996-1073
Editor: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/en13030740

Transferability of a Battery Cell End-of-Life Prediction Model Using Survival Analysis (se abrirá en una nueva ventana)

Autores: Maya Santhira Sekeran; Milan Živadinović; Myra Spiliopoulou
Publicado en: Energies; Volume 15; Edición 8; Pages: 2930, Edición 3, 2022, ISSN 1996-1073
Editor: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/en15082930

Experimental Wafer Carrier Contamination Analysis and Monitoring in Fully Automated 300 mm Power Production Lines (se abrirá en una nueva ventana)

Autores: Clara Zängle, Markus Pfeffer, Peter Franze, Germar Schneider, Anton Bauer
Publicado en: Solid State Phenomena, Edición 314, 2021, Página(s) 34-40, ISSN 1662-9779
Editor: Scientific.net
DOI: 10.4028/www.scientific.net/ssp.314.34

A Fast Switching Current Controlled DC/DC Converter for Automotive Applications (se abrirá en una nueva ventana)

Autores: Osvaldo Gasparri, Albino Pidutti, Paolo Del Croce, Andrea Baschirotto
Publicado en: Journal of Electrical and Electronic Engineering, Edición 9/4, 2021, Página(s) 123, ISSN 2329-1613
Editor: Science Publishing Group
DOI: 10.11648/j.jeee.20210904.14

Robotic Process Automation in purchasing and supply management: A multiple case study on potentials, barriers, and implementation (se abrirá en una nueva ventana)

Autores: Flechsig, Christian; Anslinger, Franziska; Lasch, Rainer
Publicado en: Journal of Purchasing and Supply Management, 2021, ISSN 1478-4092
Editor: Pergamon Press Ltd.
DOI: 10.1016/j.pursup.2021.100718

Neural circuit policies enabling auditable autonomy (se abrirá en una nueva ventana)

Autores: Mathias Lechner, Ramin Hasani, Alexander Amini, Thomas A. Henzinger, Daniela Rus, Radu Grosu
Publicado en: Nature Machine Intelligence, Edición 2/10, 2020, Página(s) 642-652, ISSN 2522-5839
Editor: Springer Nature
DOI: 10.1038/s42256-020-00237-3

In Search of Socio-Technical Congruence: A Large-Scale Longitudinal Study (se abrirá en una nueva ventana)

Autores: Wolfgang Mauerer; Mitchell Joblin; Damian Andrew Andrew Tamburri; Carlos Paradis; Rick Kazman; Sven Apel
Publicado en: IEEE Transactions on Software Engineering, 2021, ISSN 0098-5589
Editor: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tse.2021.3082074

Information Bottleneck: Theory and Applications in Deep Learning (se abrirá en una nueva ventana)

Autores: Bernhard C. Geiger, Gernot Kubin
Publicado en: Entropy, 2020, ISSN 1099-4300
Editor: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/e22121408

SECURITY SYSTEM FOR DETECTING TAMPERING AND THERMAL SIDE CHANNEL ATTACKS

Autores: Daniel Ciprian Vasile, Paul Svasta
Publicado en: UPB Scientific Bulletin, Series C: Electrical Engineering and Computer Science, 2020, ISSN 1454-234X
Editor: Universitatea Politehnica Bucuresti

Digital Transformation in Semiconductor Manufacturing - Proceedings of the 1st and 2nd European Advances in Digital Transformation Conference, EADTC 2018, Zittau, Germany and EADTC 2019, Milan, Italy (se abrirá en una nueva ventana)

Autores: Sophia Keil, Fabian Lindner, Rainer Lasch, Jacob Lohmer (Editors)
Publicado en: Lecture Notes in Electrical Engineering, 2020, ISBN 978-3-030-48602-0
Editor: Springer
DOI: 10.1007/978-3-030-48602-0

Interpretable Recurrent Neural Networks in Continuous-time Control Environments

Autores: Ramin Hasani
Publicado en: Interpretable Recurrent Neural Networks in Continuous-time Control Environments, 2020
Editor: Technische Universiät Wien

Computationally Efficient Simulation Methods of Thermo-Mechanical Processes in Power Integrated Circuits

Autores: ADRIAN BOJITA
Publicado en: PhD Thesis / Book / Abstract, 2022
Editor: UTCN

Buscando datos de OpenAIRE...

Se ha producido un error en la búsqueda de datos de OpenAIRE

No hay resultados disponibles

Mi folleto 0 0