Integrated Development 4.0

CORDIS oferuje możliwość skorzystania z odnośników do publicznie dostępnych publikacji i rezultatów projektów realizowanych w ramach programów ramowych HORYZONT.

Odnośniki do rezultatów i publikacji związanych z poszczególnymi projektami 7PR, a także odnośniki do niektórych konkretnych kategorii wyników, takich jak zbiory danych i oprogramowanie, są dynamicznie pobierane z systemu OpenAIRE .

Rezultaty

4.3.2.1 Report on Zero-Failur Culture

The report deals with the developed and verified model to analyze the effects of process improvements and analyze its dynamic behavior for manufacturing and the supply chain

D5.1.3.1 Publishable Use Case Report

Publishable descriptions of the industrial Use Cases defined

D7.1.3.1 Report on signal preprocessing for Machine Learning/Deep Leaning data analysis and feature extraction

Report on signal preprocessing for Machine Learning/Deep Leaning data analysis and feature extraction

D3.2.1.2 Lead time based pricing (UC16)

Publishable summary of UC16

D4.1.2.3 Virtual production with autonomous mobile industrial robots and interaction and training of operators (UC17)

Publishable summary of UC17.

D7.1.1.2 Report on security improvements in hardware and software implementation in a production area

Speed tests

D4.1.1.4 Enabling a human-centered education, training and knowledge-management system (UC18)

Publishable summary of UC18

D7.2.1.1 Efficient modelling of electro-thermo-mechanical stress during fast power cycling operation of an IC

The deliverable reports on proposed techniques for an efficient modelling of electro-thermo-mechanical stress during fast power cycling Operation.

"D2.1.4.1 Context base data provision ""virtual factory"", cyber-physical collaboration (UC7)"

Publishable summary of UC7

D1.3.3.1 Data-driven root cause investigation for variation in semiconductor manufacturing quality (UC1)

Publishable summary of UC1

D7.1.3.2 Report on classification algorithms

Report on classification algorithms

D4.1.2.1 Concept for digitally augmenting human work

A holistic concept for digitally augmenting human work is presented and agreed on with the stakeholders.

D7.1.1.1 Report on AES implementation with speed and side-channel immunity improvements

Speed tests

D4.2.2.1 Report on socio-organizational implications of digtial twins

Socioorganizational implications of digital twin Use Cases are investigated and documented

D7.2.2.2 IC yield prediction with knowledge-based modelling (UC4)

Publishable summary of UC4

D4.1.3.2 Final Report of Documentation and verification of smart knowledge management in different applications

Documentation and verification of smart knowledge management in different applications take place

D3.1.1.3 Remote Experiments on high-performance DC-DC converter (UC15)

Publishable summary of UC15

D7.6: D7.2.2.1 Yield estimation and prediction figures of merit and yield detracting factors’ determination

The deliverable reports advanced methods for multifactor pre- and post-silicon yield estimation and prediction, detection of yield detractors and root cause discovery.

D2.1.4.3 Base Architectures for Virtual/Physical Computing (UC9)

Publishable summary of UC9.

D2.1.1.2 Applying Discrete-event simulation framework and agent based simulation for planning in semiconductor value chains (UC12)

Publishable summary of UC12

D7.1.2.1 Report on virtual prototyping rules for DFM Optimization

Virtual prototyping rules for DFM Optimization

D6.1.1.1 Press Release: Launching the iDev40 project

A Press Release about the launch of iDev40 is published.

D6.2.1.1 Project website

The iDev40 website goes public.

D4.3.1.1 Demonstrator and report of decision support system (for complexity management)

A demonstrator about the analysis of complex demands in work systems for decision and planning support on the shop floor and management level is presented

Publikacje

Wie innovative Logistik die zukunftssichere und nachhaltige Gestaltung der Automatisierung und Digitalisierung der Halbleiterindustrie unterstützt

Autorzy: Germar Schneider; Jacob Lohmer
Opublikowane w: Logistik in Wissenschaft und Praxis, Numer 2, 2021
Wydawca: Gabler Verlag
DOI: 10.5281/zenodo.4687042

RTAMT: Online Robustness Monitors from STL

Autorzy: Dejan Ničković, Tomoya Yamaguchi
Opublikowane w: Automated Technology for Verification and Analysis - 18th International Symposium, ATVA 2020, Hanoi, Vietnam, October 19–23, 2020, Proceedings, Numer 12302, 2020, Strona(/y) 564-571, ISBN 978-3-030-59151-9
Wydawca: Springer International Publishing
DOI: 10.1007/978-3-030-59152-6_34

Wie innovative Logistik die zukunftssichere und nachhaltige Gestaltung der Automatisierung und Digitalisierung der Halbleiterindustrie unterstützt

Autorzy: Germar Schneider; Jacob Lohmer
Opublikowane w: Logistik in Wissenschaft und Praxis - Von der Datenanalyse zur Gestaltung komplexer Logistikprozesse, Numer 7, 2021, ISBN 978-3-658-33479-6
Wydawca: Springer Gabler
DOI: 10.1007/978-3-658-33480-2_22

Rückwärtssimulation als Instrument zur Produktionsplanung – Erkenntnisse aus einer praxisbezogenen Fallstudie

Autorzy: Christoph Laroque, Madlene Leißau, Wolfgang Scholl, Germar Schneider
Opublikowane w: Simulation in Produktion und Logistik 2021, 2021
Wydawca: Jörg Franke, Peter Schuderer

A Text Extraction-Based Smart Knowledge Graph Composition for Integrating Lessons Learned During the Microchip Design

Autorzy: Hasan Abu Rasheed, Christian Weber, Johannes Zenkert, Peter Czerner, Roland Krumm, Madjid Fathi
Opublikowane w: Intelligent Systems and Applications - Proceedings of the 2020 Intelligent Systems Conference (IntelliSys) Volume 2, Numer 1251, 2021, Strona(/y) 594-610, ISBN 978-3-030-55186-5
Wydawca: Springer International Publishing
DOI: 10.1007/978-3-030-55187-2_43

Trustworthy Smart Autonomous Systems-of-Systems - Resilient Technology, Economy and Society

Autorzy: Schoitsch Erwin
Opublikowane w: IDIMT-2021 - 29th Interdisciplinary Information Management Talks, 2021
Wydawca: Trauner Verlag - Universität
DOI: 10.5281/zenodo.5828352

Control of heterogenous AMHS in semiconductor industry under consideration of dynamic transport carrier transfers

Autorzy: Wagner, T., Seitz, J., Schneider, G.
Opublikowane w: International Conference on Industrial Technology, 2021
Wydawca: IEEE

Adversarial Training is Not Ready for Robot Learning

Autorzy: Mathias Lechner, Ramin Hasani, Radu Grosu, Daniela Rus, Thomas A. Henzinger
Opublikowane w: IEEE 2021 International Conference on Robotics and Automation (ICRA), 2021, 2021
Wydawca: IEEE

AIT Cyber Range - Flexible Cyber Security Environment for Exercises, Training and Research

Autorzy: Maria Leitner, Maximilian Frank, Wolfgang Hotwagner, Gregor Langner, Oliver Maurhart, Timea Pahi, Lenhard Reuter, Florian Skopik, Paul Smith, Manuel Warum
Opublikowane w: Proceedings of the European Interdisciplinary Cybersecurity Conference, 2020, Strona(/y) 1-6, ISBN 9781450375993
Wydawca: ACM
DOI: 10.1145/3424954.3424959

Digital Reference: a quasi-standard for digitalization in the domain of semiconductor supply chains

Autorzy: Hans Ehm, Erwin Schoitsch, Jan Wytze van der Weit, Nour Ramzy, Lanyingzhu Luo, Daniel Louis Gruetzner
Opublikowane w: 2020 IEEE Conference on Industrial Cyberphysical Systems (ICPS), 2020, Strona(/y) 563-570, ISBN 978-1-7281-6389-5
Wydawca: IEEE
DOI: 10.1109/icps48405.2020.9274750

Smart Collaboration - Mitarbeiter-zentrierte Informationssysteme in der Produktentstehung

Autorzy: Rosenberger, Manfred, Fellmann Michael, Richter Alexander, Stocker Alexander, Schmeja Michael, Damalas Stelios Andreas
Opublikowane w: Mensch und Computer 2020 - Workshopband, 2020
Wydawca: Gesellschaft für Informatik
DOI: 10.18420/muc2020-ws116

The Sound of Silence - Mining Security Vulnerabilities from Secret Integration Channels in Open-Source Projects

Autorzy: Ralf Ramsauer, Lukas Bulwahn, Daniel Lohmann, Wolfgang Mauerer
Opublikowane w: Proceedings of the 2020 ACM SIGSAC Conference on Cloud Computing Security Workshop, 2020, Strona(/y) 147-157, ISBN 9781450380843
Wydawca: ACM
DOI: 10.1145/3411495.3421360

The Impact of Intelligent Process Automation on Purchasing and Supply Management – Initial Insights from a Multiple Case Study

Autorzy: Flechsig, Christian
Opublikowane w: Logistics Management, 2021
Wydawca: Springer
DOI: 10.1007/978-3-030-85843-8_5

Human-Robot Assembly: Methodical Design and Assessment of an Immersive Virtual Environment for Real-World Significance

Autorzy: Johannes Hocherl, Andreas Adam, Thomas Schlegl, Britta Wrede
Opublikowane w: 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2020, Strona(/y) 549-556, ISBN 978-1-7281-8956-7
Wydawca: IEEE
DOI: 10.1109/etfa46521.2020.9212039

A Review of the Key Success Factors for the Implementation of Digital Technologies in the Context of Industry 4.0

Autorzy: Alexander Stocker, Manfred Rosenberger, Michael Schmeja, Germar Schneider
Opublikowane w: IFIP/IEEE IM 2021 Workshop: 2nd Workshop on Management for Industry 4.0 (MFI4.0), 2021
Wydawca: IEEE

Silentium! Run-Analyse-Eradicate the Noise out of the DB/OS Stack

Autorzy: Mauerer, Wolfgang; Ramsauer, Ralf; Lucas, Edson R. F.; Scherzinger, Stefanie
Opublikowane w: Lecture Notes in Informatics (LNI), Numer 1, 2021
Wydawca: Gesellschaft für Informatik

HEURISTICS FOR ORDER-LOT PEGGING IN MULTI-FAB SETTINGS

Autorzy: Lars Mönch, Liji Shen, John W. Fowler
Opublikowane w: Proceedings of the 2020 Winter Simulation Conference, 2020
Wydawca: IEEE

Experimental Analysis of a Stochastic Backward Simulation Approach Under the Specifics of Semiconductor Manufacturing

Autorzy: Christoph Laroque, Madlene Leißau, Wolfgang Scholl, Germar Schneider
Opublikowane w: Procedia CIRP, Numer Volume 107, 2022, ISSN 2212-8271
Wydawca: Elsevier B.V
DOI: 10.1016/j.procir.2022.05.154

Using accuracy measurements to evaluate simulation model simplification

Autorzy: Igor Stogniy, Wolfgang Scholl
Opublikowane w: Proceedings of the 2020 Winter Simulation Conference, 2020
Wydawca: IEEE

An unsupervised methodology for online drift detection in multivariate industrial datasets

Autorzy: Sarah Klein, Mathias Verbeke
Opublikowane w: 2020 International Conference on Data Mining Workshops (ICDMW), 2020, Strona(/y) 392-399, ISBN 978-1-7281-9012-9
Wydawca: IEEE
DOI: 10.1109/icdmw51313.2020.00061

On-Off Center-Surround Receptive Fields for Accurate and Robust Image Classification

Autorzy: Zahra Babaiee, Ramin Hasani, Mathias Lechner, Daniela Rus, Radu Grosu
Opublikowane w: 2021 2nd International Conference on Leadership and Management, 2021
Wydawca: ICLM

A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification

Autorzy: Andrei Gaita, Georgian Nicolae, Emilian C. David, Andi Buzo, Corneliu Burileanu, Georg Pelz
Opublikowane w: 2020 IEEE European Test Symposium (ETS), 2020, Strona(/y) 1-2, ISBN 978-1-7281-4312-5
Wydawca: IEEE
DOI: 10.1109/ets48528.2020.9131599

Multi-factory Job Shop Scheduling With Due Date Objective

Autorzy: Jacob Lohmer, Daniel Spengler, Rainer Lasch
Opublikowane w: 2020 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), 2020, Strona(/y) 79-84, ISBN 978-1-5386-7220-4
Wydawca: IEEE
DOI: 10.1109/ieem45057.2020.9309905

Explainable Graph-based Search for Lessons-Learned Documents in the Semiconductor Industry

Autorzy: Hasan Abu-Rasheed, Christian Weber, Johannes Zenkert, Roland Krumm, Madjid Fathi
Opublikowane w: Computing Conference 2021, 2021
Wydawca: Computing Conference

Key Expansion in Cryptographic Systems

Autorzy: Sorin Chiţu, Daniel Ciprian Vasile, Ionuţ Daniel Trămândan, Paul Svasta
Opublikowane w: 2020 IEEE 26th International Symposium for Design and Technology in Electronic Packaging (SIITME), 2020
Wydawca: IEEE
DOI: 10.1109/siitme50350.2020.9292242

Benefits of Digitalization for Business Processes in Semiconductor Manufacturing

Autorzy: Germar Schneider, Sophia Keil, Fabian Lindner
Opublikowane w: 2021 22nd IEEE International Conference on Industrial Technology (ICIT), 2021, Strona(/y) 1027-1033, ISBN 978-1-7281-5730-6
Wydawca: IEEE
DOI: 10.1109/icit46573.2021.9453611

An Industry 4.0 Production Workplace Enhanced by Using Mixed Reality Assembly Instructions with Microsoft HoloLens

Autorzy: Hebenstreit M., Spitzer M., Eder M., Ramsauer C.
Opublikowane w: Mensch und Computer 2020 - Workshopband, 2020
Wydawca: Gesellschaft für Informatik e.V
DOI: 10.18420/muc2020-ws116-005

Learning Long-Term Dependencies in Irregularly-Sampled Time Series

Autorzy: Lechner, Mathias; Hasani, Ramin
Opublikowane w: Neural Information Processing Systems (NIPS), Numer 2, 2020
Wydawca: Neural Information Processing Systems Foundation

Order Release Methods in Semiconductor Manufacturing: State-of-the-Art in Science and Lessons from Industry

Autorzy: Jacob Lohmer, Christian Flechsig, Rainer Lasch, Konstantin Schmidt, Benjamin Zettler, Germar Schneider
Opublikowane w: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2020, Strona(/y) 1-6, ISBN 978-1-7281-5876-1
Wydawca: IEEE
DOI: 10.1109/ASMC49169.2020.9185201

1MHz Gate Driver in Power Technology for Fast Switching Applications

Autorzy: Roberto Di Lorenzo, Andrea Baschirotto, Albino Pidutti, Paolo Del Croce
Opublikowane w: IEEE 27th International Conference on Mixed Design of Integrated Circuits and System (MIXDES), 2020
Wydawca: IEEE

On The Verification of Neural ODEs with Stochastic Guarantees

Autorzy: Gruenbacher, Sophie; Hasani, Ramin; Lechner, Mathias; Cyranka, Jacek; Smolka, Scott A.; Grosu, Radu
Opublikowane w: Thirty-Fifth AAAI Conference on Artificial Intelligence, Numer 4, 2021
Wydawca: AAAI

Liquid Time-constant Networks

Autorzy: Hasani, Ramin; Lechner, Mathias; Amini, Alexander; Rus, Daniela; Grosu, Radu
Opublikowane w: Proceedings of the AAAI Conference on Artificial Intelligence, 2021
Wydawca: AAAI

Branch selection and data optimization for selecting machines for processes in semiconductor manufacturing using AI-based predictions

Autorzy: Peter Stich, Rebecca Busch, Michael Wahl, Christian Weber, Madjid Fathi
Opublikowane w: 2021 IEEE International Conference on Electro Information Technology (EIT), 2021, Strona(/y) 1-6, ISBN 978-1-6654-1846-1
Wydawca: IEEE
DOI: 10.1109/eit51626.2021.9491836

Correlating electrical and process parameters for yield detractors’ detection

Autorzy: Ingrid Kovacs, Marina Topa, Ciprian Pop, Elena-Diana Sandru, Andi Buzo, Georg Pelz
Opublikowane w: 2020 International Symposium on Electronics and Telecommunications (ISETC), 2020, Strona(/y) 1-4, ISBN 978-1-7281-9513-1
Wydawca: IEEE
DOI: 10.1109/isetc50328.2020.9301121

Backward Simulation for Production Planning - Recent Advances in a Real-World Use-Case

Autorzy: Christoph Laroque, Madlene Leißau, Wolfgang Scholl, Germar Schneider
Opublikowane w: 2021 Winter Simulation Conference (WSC), 2021
Wydawca: IEEE

Electro-Thermal Simulation of Power DMOS Devices Operating under Fast Thermal Cycling

Autorzy: Ciprian Florea, Vasile Ţopa, Dan Simon
Opublikowane w: International Symposium for Design and Technology of Electronics Packages (SIITME), 2020
Wydawca: IEEE
DOI: 10.1109/siitme50350.2020.9292143

Smart Platform for Rapid Prototyping: Solutions in the dilemma of flexibility and standardization

Autorzy: Sabrina Anger, Felix Klingert, Volker Häublein, Markus Pfeffer, Martin Schellenberger
Opublikowane w: International Conference on Industrial Technology, 2021
Wydawca: IEEE

Simulation-based Evaluation of Lot Release Policies in a Power Semiconductor Facility - A Case Study

Autorzy: Allgeier, Henriette; Flechsig, Christian; Lohmer, Jacob; Lasch, Rainer; Schneider, Germar; Zettler, Benjamin
Opublikowane w: Proceedings of the 2020 Winter Simulation Conference, 2020
Wydawca: IEEE
DOI: 10.5281/zenodo.4011587

Investigation of Predictive Maintenance for Semiconductor Manufacturing and its Impacts on the Supply Chain

Autorzy: Daniel Fischer, Patrick Moder, Hans Ehm
Opublikowane w: 2021 22nd IEEE International Conference on Industrial Technology (ICIT), 2021, Strona(/y) 1409-1416, ISBN 978-1-7281-5730-6
Wydawca: IEEE
DOI: 10.1109/icit46573.2021.9453481

Service-based Semiconductor Manufacturing using the Digital Reference Ontology for Global Service Discovery

Autorzy: Hartwig Baumgaertel Patrick Moder Nour Ramzy Hans Ehm
Opublikowane w: IEEE IECON 2020 conference special session on IoT Automation Technologies, Tools and Applications, 2020
Wydawca: IEEE

High-Voltage Double-Domain Low-Dropout regulator for rapidly changing output loads

Autorzy: Osvaldo Gasparri; Bozic Aleksandar; Paolo del Croce; Andrea Baschirotto
Opublikowane w: IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2022
Wydawca: IEEE
DOI: 10.1109/icecs53924.2021.9665584

A Natural lottery Ticket Winner: Reinforcement Learning with Ordinary Neural Circuits

Autorzy: Ramin Hasani, Mathias Lechner, Alexander Amini,Daniela Rus, Radu Grosu
Opublikowane w: International Conference on Machine Learning (ICML), 2020
Wydawca: ICML

Cryptographic Key Derivation from an Anti-Tamper Solution

Autorzy: Daniel-Ciprian Vasile, Sorin Chitu, Paul Svasta
Opublikowane w: 2020 IEEE 8th Electronics System-Integration Technology Conference (ESTC), 2020, Strona(/y) 1-6, ISBN 978-1-7281-6293-5
Wydawca: IEEE
DOI: 10.1109/estc48849.2020.9229844

Strategic Approaches for Further Development of SiC Rapid Prototype Production

Autorzy: Sabrina Anger, Volker Häublein, Markus Pfeffer, Martin Schellenberger
Opublikowane w: European Advanced Process Control and Manufacturing Conference (apc|m), 2022
Wydawca: apc|m

Human-centered workplaces in the digital transformation of the semiconductor industry – a step towards high and intelligent automation (HIA)

Autorzy: Schneider, Germar; Lindner, Fabian; Keil, Sophia; Von Der Weth, Rüdiger
Opublikowane w: 6th World Conference on Production and Operations Management, Numer 1, 2022
Wydawca: Japanese Operations Management and Strategy Association (JOMSA)
DOI: 10.5281/zenodo.7244541

Smart Systems Everywhere – Intelligence, Autonomy, Technology and Society

Autorzy: Schoitsch Erwin
Opublikowane w: Proceedings of IDIMT 2018, Strategic Modeling in Management, Economy and Society, 2018, Strona(/y) 153-165, ISBN 978-3-99062-339-8
Wydawca: Trauner Verlag
DOI: 10.5281/zenodo.2590948

A Planning Approach for an Effective Digitalization of Processes in Mature Semiconductor Production Facilities

Autorzy: Sophia Keil, Fabian Lindner, Germar Schneider, Tobias Jakubowitz
Opublikowane w: 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2019, Strona(/y) 1-6, ISBN 978-1-5386-7601-1
Wydawca: IEEE
DOI: 10.1109/asmc.2019.8791830

Response Characterization for Auditing Cell Dynamics in Long Short-term Memory Networks

Autorzy: Ramin Hasani, Alexander Amini, Mathias Lechner, Felix Naser, Radu Grosu, Daniela Rus
Opublikowane w: 2019 International Joint Conference on Neural Networks (IJCNN), 2019, Strona(/y) 1-8, ISBN 978-1-7281-1985-4
Wydawca: IEEE
DOI: 10.1109/ijcnn.2019.8851954

The List is the Process: Reliable Pre-Integration Tracking of Commits on Mailing Lists

Autorzy: Ralf Ramsauer, Daniel Lohmann, Wolfgang Mauerer
Opublikowane w: 2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE), 2019, Strona(/y) 807-818, ISBN 978-1-7281-0869-8
Wydawca: IEEE
DOI: 10.1109/icse.2019.00088

Novel challenges for root cause investigation in semiconductor manufacturing

Autorzy: Pleschberger, Martin; Zernig, Anja; Kaestner, Andre
Opublikowane w: 19th European Advanced Process Control and Manufacturing Conference (apc/m), Numer 3, 2019
Wydawca: European Advanced Process Control and manufacturing Conference
DOI: 10.5281/zenodo.3247340

A Formally Robust Time Series Distance Metric

Autorzy: Maximilian Toller, Berhard C. Geiger, Roman Kern
Opublikowane w: MileTS'19: 5th KDD Workshop on Mining and Learning from Time Series, 2019
Wydawca: ACM

A Machine Learning Suite for Machine Components’ Health-Monitoring

Autorzy: Ramin Hasani, Guodong Wang, Radu Grosu
Opublikowane w: Proceedings of the AAAI Conference on Artificial Intelligence, Numer 33, 2019, Strona(/y) 9472-9477, ISSN 2374-3468
Wydawca: Association for the Advancement of Artificial Intelligence
DOI: 10.1609/aaai.v33i01.33019472

Realizing the full potential of Robotic Process Automation through a combination with BPM

Autorzy: Flechsig, Christian; Lohmer, Jacob; Lasch, Rainer
Opublikowane w: Logistics Management, Numer 1, 2019, Strona(/y) 104-119
Wydawca: Springer
DOI: 10.1007/978-3-030-29821-0_8

A Research Agenda to Deploy Technology Enhanced Learning with Augmented Reality in Industry

Autorzy: Spitzer, Michael; Gsellmann, Inge; Hebenstreit, Matthias; Damalas, Stelios; Ebner, Martin
Opublikowane w: Mensch und Computer 2019 - Workshopband, 2019
Wydawca: Gesellschaft für Informatik e.V

Smart Collaboration - Mitarbeiter-zentriete Informationssysteme in der Produktentstehung

Autorzy: Manfred Rosenberger, Michael Fellmann, Alexander Richter, Alexander Stocker, Michael Schmeja, Christian Kaiser
Opublikowane w: Mensch und Computer 2019 - Workshopband, 2019
Wydawca: Gesellschaft für Informatik e.V

Human Work Activity Recognition for Working Cells in Industrial Production Contexts

Autorzy: Clemens Pohlt, Thomas Schlegl, Sven Wachsmuth
Opublikowane w: 2019 IEEE International Conference on Systems, Man and Cybernetics (SMC), 2019, Strona(/y) 4225-4230, ISBN 978-1-7281-4569-3
Wydawca: IEEE
DOI: 10.1109/smc.2019.8913873

Designing Worm-inspired Neural Networks for Interpretable Robotic Control

Autorzy: Mathias Lechner, Ramin Hasani, Manuel Zimmer, Thomas A. Henzinger, Radu Grosu
Opublikowane w: 2019 International Conference on Robotics and Automation (ICRA), 2019, Strona(/y) 87-94, ISBN 978-1-5386-6027-0
Wydawca: IEEE
DOI: 10.1109/icra.2019.8793840

Security Chain Tool for IoT Secure Applications

Autorzy: Schmittner C., Abdelkader M.S.,
Opublikowane w: 2nd International Workshop on Embedded Software for Industrial IoT, 2019, Strona(/y) 27-29
Wydawca: ESIIT

Information Holism – a New Way to Close the Information Gap

Autorzy: Gerhard Luhn, Agnes Oszuszky
Opublikowane w: 2019 3rd International Conference on Advanced Information and Communications Technologies (AICT), 2019, Strona(/y) 101-107, ISBN 978-1-7281-2399-8
Wydawca: IEEE
DOI: 10.1109/aiact.2019.8847757

Ontology-Based Model for Automotive Security Verification and Validation

Autorzy: Abdelkader Magdy Shaaban, Christoph Schmittner, Thomas Gruber, A. Baith Mohamed, Gerald Quirchmayr, Erich Schikuta
Opublikowane w: Proceedings of the 21st International Conference on Information Integration and Web-based Applications & Services, 2019, Strona(/y) 73-82, ISBN 9781-450371797
Wydawca: ACM
DOI: 10.1145/3366030.3366070

BEYOND SMART SYSTEMS – CREATING A SOCIETY OF THE FUTURE (5.0) RESOLVING DISRUPTIVE CHANGES AND SOCIAL CHALLENGES

Autorzy: Schoitsch, Erwin
Opublikowane w: Proceedings of IDIMT 2019, Innovation and Transformation in a Digital World, Numer 2, 2019, Strona(/y) 387-400, ISBN 978-3-99062-590-3
Wydawca: Traun Verlag
DOI: 10.5281/zenodo.3605686

On-Chip Power Stage and Gate Driver for Fast Switching Applications

Autorzy: Roberto di Lorenzo, Osvaldo Gasparri, Albino Pidutti, Paolo del Croce, Andrea Baschirotto
Opublikowane w: 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2019, Strona(/y) 266-269, ISBN 978-1-7281-0996-1
Wydawca: IEEE
DOI: 10.1109/icecs46596.2019.8965103

Variable off-Time Peak Current Mode Control (VoT-PCMC) as method for average current regulation in Buck Converter Drivers

Autorzy: Osvaldo Gasparri, Roberto di Lorenzo, Paolo Del Croce, Albino Pidutti, Andrea Baschirotto
Opublikowane w: 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2019, Strona(/y) 258-261, ISBN 978-1-7281-0996-1
Wydawca: IEEE
DOI: 10.1109/icecs46596.2019.8964979

Using Delays for Process flow Simplification

Autorzy: Igor Stogniy, Wolfgang Scholl
Opublikowane w: 2019 Winter Simulation Conference (WSC), 2019, Strona(/y) 2372-2383, ISBN 978-1-7281-3283-9
Wydawca: IEEE
DOI: 10.1109/wsc40007.2019.9004724

A New High-Volume/Low-Mix Simulation Testbed for Semiconductor Manufacturing

Autorzy: Michael Hassoun, Denny Kopp, Lars Monch, Adar Kalir
Opublikowane w: 2019 Winter Simulation Conference (WSC), 2019, Strona(/y) 2419-2428, ISBN 978-1-7281-3283-9
Wydawca: IEEE
DOI: 10.1109/wsc40007.2019.9004654

Integrated Planning of Production and Engineering Activities in Semiconductor Supply Chains: A Simulation Study

Autorzy: Timm Ziarnetzky, Lars Monch, Thomas Ponsignon, Hans Ehm
Opublikowane w: 2019 Winter Simulation Conference (WSC), 2019, Strona(/y) 2324-2335, ISBN 978-1-7281-3283-9
Wydawca: IEEE
DOI: 10.1109/wsc40007.2019.9004721

Interpretable Neuronal Circuit Policies for Reinforcement Learning Environments

Autorzy: Matthias Lechner, Ramin M. Hasani, Radu Grosu
Opublikowane w: IJCAI/ECAI Workshop on Explainable Artificial Intelligence (XAI), 2018
Wydawca: XAI

A Holistic Digital Twin Based on Semantic Web Technologies to Accelerate Digitalization

Autorzy: Patrick Moder, Hans Ehm, Eva Jofer
Opublikowane w: Digital Transformation in Semiconductor Manufacturing, 2020
Wydawca: Springer

Framework for Simulation-Based Decision Making in Semiconductor Value Chains

Autorzy: Lars Mönch1, Hans Ehm, Thomas Ponsignon
Opublikowane w: Digital Transformation in Semiconductor Manufacturing, 2020
Wydawca: Springer

Digital Twin for Plan and Make Using Semantic Web Technologies – Extending the JESSI/SEMATECH MIMAC Standard to the Digital Reference

Autorzy: Patrick Moder, Hans Ehm, Nour Ramzy
Opublikowane w: Digital Transformation in Semiconductor Manufacturing, 2020
Wydawca: Springer

Enhancing Prediction Quality of Fab Simulation by Advanced Cycle Time Modelling

Autorzy: Maximilian Dilefeld, Sebastian Rank, Thorsten Schmidt
Opublikowane w: Digital Transformation in Semiconductor Manufacturing, 2020
Wydawca: Springer

Visualization of Automated Material Handling System Components in Semiconductor Industry over the Lifecycle

Autorzy: Patrick Boden, Sebastian Rank, Thorsten Schmidt, Martin Däumler
Opublikowane w: Digital Transformation in Semiconductor Manufacturing, 2020
Wydawca: Springer

A System Dynamics Approach for Modeling Return on Quality for ECS Industry

Autorzy: Bernhard Oberegger, Andreas Felsberger, Gerald Reiner
Opublikowane w: Digital Transformation in Semiconductor Manufacturing, 2020
Wydawca: Springer

Automation of Cross-Factory Decision-Making Within Administrative Processes to Enhance Data Quality for Production

Autorzy: Jacob Lohmer , Christian Flechsig, Rainer Lasch, Germar Schneider, Dietrich Eberts, Benjamin Zettler2
Opublikowane w: Digital Transformation in Semiconductor Manufacturing, 2020
Wydawca: Springer

A Novel Software Architecture for Mixed Criticality Systems

Autorzy: Ralf Ramsauer, Jan Kiszka, Wolfgang Mauerer
Opublikowane w: Digital Transformation in Semiconductor Manufacturing, 2020
Wydawca: Springer

Digitizing Human Work Places in Manufacturing Through Augmented and Mixed Reality

Autorzy: Michael Spitzer, Manfred Rosenberger, Alexander Stocker, Inge Gsellmann, Matthias Hebenstreit, and Michael Schmeja
Opublikowane w: Digital Transformation in Semiconductor Manufacturing, 2020
Wydawca: Springer

Training the Human-in-the-Loop in Industrial Cyber Ranges

Autorzy: Stela Kucek, Maria Leitner
Opublikowane w: Digital Transformation in Semiconductor Manufacturing, 2020
Wydawca: Springer

PCMC DC-DC Converter Development Methodology by Means of dSPACE

Autorzy: Osvaldo Gasparri, Roberto Di Lorenzo, Paolo Del Croce, Andrea Baschirotto
Opublikowane w: Digital Transformation in Semiconductor Manufacturing, 2020
Wydawca: Springer

Smart Platform for Rapid Prototyping: A First Solution Approach to Improve Time-to-Market and Process Control in Low-Volume Device Fabrication

Autorzy: Martin Schellenberger, Sabrina Anger, Markus Pfeffer, Volker Häublein, Georg Roeder, Anton Bauer
Opublikowane w: Digital Transformation in Semiconductor Manufacturing, 2020
Wydawca: Springer

Competency Requirements at Digitalized Workplaces in the Semiconductor Industry

Autorzy: Sophia Keil, Fabian Lindner, Josef Moser, Rüdiger von der Weth, Germar Schneider
Opublikowane w: Digital Transformation in Semiconductor Manufacturing, 2020
Wydawca: Springer

A Natural lottery Ticket Winner: Reinforcement Learning with Ordinary Neural Circuits

Autorzy: Ramin Hasani, Mathias Lechner, Alexander Amini, Daniela Rus, Radu Grosu
Opublikowane w: International Conference on Machine Learning, 2020
Wydawca: ICML

Gershgorin Loss Stabilizes the Recurrent Neural Network Compartment of an End-to-end Robot Learning Scheme

Autorzy: Mathias Lechner, Ramin Hasani, Daniela Rus, Radu Grosu
Opublikowane w: International Conference on Robotics and Automation 2020 (ICRA), 2020
Wydawca: IEEE

Integrating critical queue time constraints into SMT2020 simulation models

Autorzy: Denny Kopp, Michael Hassoun, Adar Kalir, Lars Mönch
Opublikowane w: Proceedings of the 2020 Winter Simulation Conference, 2020
Wydawca: IEEE

Algorithm to Design Conductive Mesh for Tamperproof Envelope

Autorzy: Sorin Chiţu, Daniel Ciprian Vasile, Tudor Ioan Honceriu, Paul Svasta
Opublikowane w: International Symposium for Design and Technology of Electronics Packages (SIITME), 2020
Wydawca: IEEE
DOI: 10.1109/siitme50350.2020.9292275

Yield prediction in semiconductor manufacturing using an AI-based cascading classification system

Autorzy: Peter Stich, Michael Wahl, Peter Czerner, Christian Weber, Madjid Fathi
Opublikowane w: 2020 IEEE International Conference on Electro Information Technology (EIT), 2020, Strona(/y) 609-614, ISBN 978-1-7281-5317-9
Wydawca: IEEE
DOI: 10.1109/eit48999.2020.9208250

Towards a Resilient Society – Technology 5.0, Risks and Ethics

Autorzy: Schoitsch Erwin
Opublikowane w: IDIMT 2020, Numer 9, 2020
Wydawca: Trauner Verlag
DOI: 10.5281/zenodo.4000984

Weakly-Supervised Learning for Multimodal Human Activity Recognition in Human-Robot Collaboration Scenarios

Autorzy: Clemens Pohlt, homas Schlegl, Sven Wachsmuth
Opublikowane w: IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS), 2020
Wydawca: IEEE

Erfolgsfaktoren bei der Einführung Digitaler Technologien im Kontext von Industrie 4.0

Autorzy: Stocker Alexander, Rosenberger Manfred, Resztej Mirjam, Damalas Stelios Andreas
Opublikowane w: Mensch und Computer 2020 - Workshopband, 2020
Wydawca: Gesellschaft für Informatik e.V
DOI: 10.18420/muc2020-ws116-006

Visual Analytics for Data-Driven Analysis in Semiconductor Manufacturing

Autorzy: Patrick Boden, Sebastian Rank, Thorsten Schmidt
Opublikowane w: ASIM Fachtagung - 25. Symposium Simulationstechnik, 2020
Wydawca: ASIM - Arbeitsgemeinschaft Simulation
DOI: 10.11128/arep.59.a59019

Chip and Board Scale Transient Thermal Simulations for Power MOS Devices Reliability Analysis

Autorzy: Madalin Vasile Moise, Paul Svasta, Norocel Codreanu, Ciprian Ionescu, Mihaela Pantazica, Alexandru Vasile, Bogdan Mihailescu, Cristian Boianceanu
Opublikowane w: 2021 44th International Spring Seminar on Electronics Technology (ISSE), 2021, Strona(/y) 1-4, ISBN 978-1-6654-1477-7
Wydawca: IEEE
DOI: 10.1109/isse51996.2021.9467624

Development and Evaluation of a Blockchain Concept for Production Planning and Control in the Semiconductor Industry

Autorzy: Herrgoß, Laura; Lohmer, Jacob; Schneider, Germar; Lasch, Rainer
Opublikowane w: IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), 2020
Wydawca: IEEE
DOI: 10.5281/zenodo.4003638

Challenges in Smart Health Applications using Wearable Medical Internet of Things – A Review

Autorzy: Benedikt Schnell, Patrick Moder, Hans Ehm, Marcel Konstantinov, Mahmoud Ismail
Opublikowane w: ICICT 2021 – 6th International Congress on Information and Communication Technology, 2021
Wydawca: Infineon Technologies AG

Using representative process flows for simulation model simplification

Autorzy: Igor Stogniy, Wolfgang Scholl
Opublikowane w: International Conference on Industrial Technology, 2021
Wydawca: IEEE

SMACD / PRIME 2021; International Conference on SMACD and 16th Conference on PRIME

Autorzy: Davide Severin; Giovanni Capodivacca; Bernard Blaise Tchodjie Tchamabe; Andi Buzo; Cristian-Vasile Diaconu
Opublikowane w: SMACD / PRIME 2021; International Conference on SMACD and 16th Conference on PRIME, 2021, ISBN 978-3-8007-5588-2
Wydawca: IEEE

Adversarial Training is Not Ready for Robot Learning

Autorzy: Lechner, Mathias; Hasani, Ramin; Grosu, Radu; Rus, Daniela; Henzinger, Thomas A.
Opublikowane w: IEEE International Conference on Robotics and Automation (ICRA), 2021
Wydawca: IEEE
DOI: 10.1109/icra48506.2021.9561036

Einsatzmöglichkeiten der Rückwärtssimulation zur Produktionsplanung in der Halbleiterfertigung

Autorzy: Christoph Laroque, Christoph Löffler, Wolfgang Scholl, Germar Schneider
Opublikowane w: Proceedings ASIM SST 2020, 2020, Strona(/y) 397-401, ISBN 9783901608933
Wydawca: ARGESIM Publisher Vienna
DOI: 10.11128/arep.59.a59055

A Low-Dropout Regulator for One Time Programmable (OTP) Memories in Automotive Applications

Autorzy: Osvaldo Gasparri; Bozic Aleksandar; Paolo del Croce; Andrea Baschirotto
Opublikowane w: International Conference on Electronics, Circuits and Systems (ICECS), 2022
Wydawca: IEEE
DOI: 10.1109/icecs53924.2021.9665607

Automated and Optimized Lot-To-Order Matching in 300 mm Semiconductor Facilities

Autorzy: Christian Flechsig, Jacob Lohmer, Rainer Lasch, Benjamin Zettler, Germar Scheider, Dietrich Eberts
Opublikowane w: 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2021, Strona(/y) 1-6, ISBN 978-1-7281-8645-0
Wydawca: IEEE
DOI: 10.1109/ASMC51741.2021.9435730

Visual Analytics for Data-Driven Analysis in Semiconductor Manufacturing

Autorzy: Boden, Patrick; Rank, Sebastian; Schmidt, Thorsten
Opublikowane w: Proceedings ASIM SST 2020, Numer 1, 2020, ISBN 9783901608933
Wydawca: Arbeitsgemeinschaft Simuluation

SIMULATION MODEL SIMPLIFICATION FOR CHANGING PRODUCT MIX SCENARIO

Autorzy: Igor Stogniy, Wolfgang Scholl, Hans Ehm
Opublikowane w: Proceedings of the 2021 Winter Simulation Conferenc, 2021
Wydawca: IEEE

DC-DC Buck Converter with Constant Off-Time Peak Current Mode Control

Autorzy: Osvaldo Gasparri, Roberto Di Lorenzo, Albino Pidutti, Paolo Del Croce, Andrea Baschirotto
Opublikowane w: 2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2020
Wydawca: IEEE
DOI: 10.1109/icecs49266.2020.9294913

Assessing the Impact of Information Assistance Systems on a Worker Level - A Pre-Study towards an Evaluation Framework

Autorzy: Lindner Fabian, Winkler Daniel, Müller Arvid, Mühlan Kevin, Keil Sophia
Opublikowane w: Mensch und Computer - Workshopband 2020, 2020
Wydawca: Gesellschaft für Informatik
DOI: 10.18420/muc2020-ws116-001

A DISCRETE-EVENT HEURISTIC FOR MAKESPAN OPTIMIZATION IN MULTI-SERVERFLOW-SHOP PROBLEMS WITH MACHINE RE-ENTERING

Autorzy: Angel A. Juan, Pedro Copado, Javier Panadero, Christoph Laroque, Rocio de la Torre
Opublikowane w: Proceedings of the 2020 Winter Simulation Conference, 2020
Wydawca: IEEE

Model-based versus Model-free Deep Reinforcement Learning for Autonomous Racing Cars

Autorzy: Brunnbauer, Axel; Berducci, Luigi; Brandstätter, Andreas; Lechner, Mathias; Hasani, Ramin; Rus, Daniela; Grosu, Radu
Opublikowane w: preprint, Numer 1, 2021
Wydawca: TU Vienna

Poster: Smart Virtual Collaboration to Optimize the Development Process in Semiconductor Industry

Autorzy: Germar Schneider, Fabian Lindner, Sophia Keil
Opublikowane w: EUROPEAN ADVANCED PROCESS CONTROL AND MANUFACTURING (APC|M) CONFERENCE, 2021
Wydawca: apc/m

Machine Learning based Indicators to Enhance Process Monitoring by Pattern Recognition

Autorzy: Schrunner, Stefan; Scheiber, Michael; Jenul, Anna; Zernig, Anja; Kästner, Andre; Kern, Roman
Opublikowane w: preprint, Numer 2, 2021
Wydawca: Know Center

Development and evaluation of a Blockchain concept for the IFD 300 mm Pre-Assembly Line

Autorzy: Germar Schneider; Laura Herrgoß; Jacob Lohmer; Rainer Lasch
Opublikowane w: apcm, Numer 2, 2021
Wydawca: apcm
DOI: 10.5281/zenodo.4686629

Variable Selection Using Nearest Neighbor Gaussian Processes

Autorzy: Posch, Konstantin; Arbeiter, Maximilian; Pleschberger, Martin; Pilz, Juergen
Opublikowane w: preprint, Numer 1, 2021
Wydawca: University Klagenfurt

Presentation: Investigation of the Airborne Molecular Contamination Behavior in 300 mm Semiconductor Front - End Manufacturing

Autorzy: Germar Schneider, Laura Herrgoß, Jacob Lohmer, Rainer Lasch
Opublikowane w: EUROPEAN ADVANCED PROCESS CONTROL AND MANUFACTURING (APC|M) CONFERENCE, 2021
Wydawca: APC/M

Poster: Chances & Challenges of Digitization in Semiconductor Fabs and Success Factors during the Implementation

Autorzy: Schneider G., Herrgoß L, Lindner F., Keil S.
Opublikowane w: 19th European Advanced Process Control and Manufacturing Conference (apc|m), 2019
Wydawca: European Advanced Process Control and Manufacturing Conference

Poster: An experimental proof of the different granularity levels of automated-generated long-term simulation model

Autorzy: Igor Stogniy, Wolfgang Scholl
Opublikowane w: 19th European Advanced Process Control and Manufacturing Conference (apc|m), 2019
Wydawca: 19th European Advanced Process Control and Manufacturing Conference (apc|m)

Presentation: New defect classification methodology with regard to causal modeling, supervised by engineers (SME)

Autorzy: Andre Schaaf-Ledermüller
Opublikowane w: APC 2018: Advanced Process Control Conference, 2018
Wydawca: apc conference

Presentation: On the deep nature of human knowledge (part II): Physical information, knowledge and language

Autorzy: Gerhard Luhn, Germar Schneider, Gerald Huether
Opublikowane w: APC 2018: Advanced Process Control Conference, 2018
Wydawca: apc conference

Presentation: On the deep nature of human knowledge (part I): Neuroscience, quantum physics and the imaginary

Autorzy: Gerhard Luhn, Germar Schneider, Gerald Hüther
Opublikowane w: APC 2018: Advanced Process Control Conference, 2018
Wydawca: apc conference

Liquid Time-constant Recurrent Neural Networks as Universal Approximators

Autorzy: Hasani, Ramin M.; Lechner, Mathias; Amini, Alexander; Rus, Daniela; Grosu, Radu
Opublikowane w: preprint, Numer 1, 2018
Wydawca: arxiv.org

Re-purposing Compact Neuronal Circuit Policies to Govern Reinforcement Learning Tasks

Autorzy: Hasani, Ramin M.; Lechner, Mathias; Amini, Alexander; Rus, Daniela; Grosu, Radu
Opublikowane w: preprint, Numer 1, 2018
Wydawca: arix.org

Presentation: The List is Our Process! An analysis of the kernel's email-based development process

Autorzy: Ralf Ramsauer, Sebastian Duda, Lukas Bulwahn, Wolfgang Mauerer
Opublikowane w: Embedded Linux Conference Europe, 2019
Wydawca: ELCE

"Presentation: Quicker from R&D to Line - A ""Smart Experiments"" Approach"

Autorzy: S. Anger, M. Schellenberger, M. Pfeffer, V. Häublein, G. Roeder, A. Bauer
Opublikowane w: Workshop of GMM-Fachgruppe 1.2.3 Abscheide- und Ätzverfahren, 2019
Wydawca: GMM

"Presentation: Digitale Kompetenzen in der Hochschullehre - ""10.000 Schritte in den Fußstapfen eines 'Pickers'"""

Autorzy: Keil S., Mühlan K., Winkler D., Lindner F.
Opublikowane w: 14th Regional Conference for Engineering Pedagogy, 2019
Wydawca: HSZG

Poster: An Advanced Further Education Framework for Industry 4.0 - Developing a Certification Program for Digital Transformation

Autorzy: Sophia Keil, Fabian Lidner, Kevin Mühlan, Daniel Winkler
Opublikowane w: 2019
Wydawca: HSZG
DOI: 10.13140/rg.2.2.11557.96480

Presentation: A Planning Approach for an Effective Digitalization of Processes in Mature Semiconductor Production Facilities

Autorzy: Keil S., Schneider G., Lindner F., Jakubowitz T.
Opublikowane w: 2019
Wydawca: HSZG

"Poster: Die Bedeutung ""klassischer"" Kompetenzen in der digitalen Transformation"

Autorzy: Lindner F., Mühlan K., Winkler D., Naumann F., Keil S.
Opublikowane w: Workshop on E-Learning, 2019
Wydawca: HSZG
DOI: 10.13140/rg.2.2.35748.83846

Presentation: Statistical Modelling and Design for Quality Control and Reliability Analysis in Power Semiconductor Manufacturing Processes

Autorzy: Jürgen Pilz, Daniel Kurz, Natalie Vollert
Opublikowane w: DAGSTAT Conference, 2019
Wydawca: DAGSTAT

Presentation: Two Worlds - Common Concept?

Autorzy: A. Zernig, K. Krebs, F. D. Frumosu, D. Surmann
Opublikowane w: European Network for Business and Industrial Statistics, 2019
Wydawca: ENBIS

Presentation: The impact of supply chain design options on performance measures in the semiconductor industry

Autorzy: Bernhard Oberegger, Andreas Felsberger, Boualem Rabta, Gerald Reiner
Opublikowane w: 30th European Conference on Operational Research (EURO), 2019
Wydawca: EURO

Presentation: Modeling an Ontology for Planning and Control Tasks in Semiconductor Value Chains

Autorzy: Sebastian Arens, Lars Moench
Opublikowane w: European Conference on Operational Research, 2019
Wydawca: European Conference on Operational Research

Real-time Electrical Power Prediction in a Combined Cycle Power Plant

Autorzy: Lobo, Jesus L.; Ballesteros, Igor; Oregi, Izaskun; Del Ser, Javier
Opublikowane w: preprint, 2019
Wydawca: Tecnalia
DOI: 10.13140/rg.2.2.21137.99680

Presentation: Experimentelle Untersuchung der Auswirkungen digitalisierter Arbeitsplätze auf Menschen in der Industrie 4.0 Modellfabrik.

Autorzy: Rinat Saifoulline, Sabine Friese, Tobias Jakubowitz, Dirk Reichelt, Rüdiger von der Weth
Opublikowane w: AOW Tagung 2019, 2019
Wydawca: AOW

Presentation: Computersimulation komplexer Arbeitsanforderungen als Werkzeug für Qualifikation und prospektive Arbeitsgestaltung.

Autorzy: Rüdiger von der Weth, Tobias Jakubowitz, Sabine Friese, Rinat Saifoulline
Opublikowane w: 11. Tagung der Fachgruppe Arbeits-, Organisations- und Wirtschaftspsychologie der Deutschen Gesellschaft für Psychologie, 2019
Wydawca: AOW

Presentation: Correlated Parameters to Accurately Measure Uncertainty in Deep Neural Networks

Autorzy: Konstantin Posch, Jürgen Pilz
Opublikowane w: 10th International Workshop on Simulation and Statistics, 2019
Wydawca: ÖSG

Can a Compact Neuronal Circuit Policy be Re-purposed to Learn Simple Robotic Control?

Autorzy: Ramin Hasani, Mathias Lechner, Alexander Amin, Daniela Rus, Radu Grosu
Opublikowane w: preprint, 2018
Wydawca: TU Wien

On Information Plane Analyses of Neural Network Classifiers -- A Review

Autorzy: Geiger, Bernhard C.
Opublikowane w: preprint, Numer 1, 2020
Wydawca: Know Center

A Novel Multi-Scale Method for Thermo-Mechanical Simulation of Power Integrated Circuit

Autorzy: A. Bojita, M. Purcar, D. Simon, C. Florea, C. Boianceanu and V. Topa
Opublikowane w: IEEE Journal of the Electron Devices Society, 2022, ISSN 2168-6734
Wydawca: Institute of Electrical and Electronics Engineers Inc.
DOI: 10.1109/jeds.2022.3144530

LUNAR: Cellular automata for drifting data streams

Autorzy: Jesus L. Lobo, Javier Del Ser, Francisco Herrera
Opublikowane w: Information Sciences, Numer 543, 2021, Strona(/y) 467-487, ISSN 0020-0255
Wydawca: Elsevier BV
DOI: 10.1016/j.ins.2020.08.064

Learn to Shape the Digital Transformation: The Design Approach of a Learning Factory for Industrial Engineers

Autorzy: Fabian Lindner, Daniel Winkler, Kevin Mühlan, Uwe Wendt, Sophia Keil
Opublikowane w: SSRN Electronic Journal, 2021, ISSN 1556-5068
Wydawca: Elsevier
DOI: 10.2139/ssrn.3858409

Unexpected applause for the human mind. The limitations of deterministic approaches in neuroscience - allowing us to become who we are

Autorzy: Gerhard Luhn, Gerald Hüther
Opublikowane w: International Journal of Foresight and Innovation Policy, 2021, ISSN 1740-2816
Wydawca: Inderscience Publishers

DC-DC Buck Converter Driver with Variable Off-Time Peak Current Mode Control

Autorzy: svaldo Gasparri, Paolo Del Croce, Andrea Baschirotto
Opublikowane w: Advances in Science, Technology and Engineering Systems Journal, 2020, ISSN 2415-6698
Wydawca: ASTES
DOI: 10.25046/aj050642

Test Structure Design for Defect Detection during Active Thermal Cycling

Autorzy: Ciprian Florea; Dan Simon; Adrian Bojiță; Marius Purcar; Cristian Boianceanu; Vasile Țopa
Opublikowane w: Sensors; Volume 22; Numer 19; Pages: 7223, Numer 2, 2022, ISSN 1424-8220
Wydawca: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/s22197223

Ultra-thin oxide breakdown for OTP development in power technologies

Autorzy: Osvaldo Gasparri, Mirko Bernardoni, Paolo Del Croce, Andrea Baschirotto
Opublikowane w: e & i Elektrotechnik und Informationstechnik, Numer 138/1, 2021, Strona(/y) 44-47, ISSN 0932-383X
Wydawca: Springer Verlag
DOI: 10.1007/s00502-020-00838-1

A Comparison of Variational Bounds for the Information Bottleneck Functional

Autorzy: Bernhard C. Geiger, Ian S. Fischer
Opublikowane w: Entropy, Numer 22/11, 2020, Strona(/y) 1229, ISSN 1099-4300
Wydawca: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/e22111229

Streamlining Semiconductor Manufacturing of 200 mm and 300 mm Wafers: A Longitudinal Case Study on the Lot-To-Order-Matching Process

Autorzy: Christian Flechsig; Jacob Lohmer; Rainer Lasch; Benjamin Zettler; Germar Schneider; Dietrich Eberts
Opublikowane w: Transactions on Semiconductor Manufacturing, Numer 3, 2022, ISSN 0894-6507
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/TSM.2022.3184041

Transformation of semantic knowledge into simulation-based decision support

Autorzy: Wiking Jurasky, Patrick Moder, Michael Milde, Hans Ehm, Gunther Reinhart
Opublikowane w: Robotics and Computer-Integrated Manufacturing, Numer 71, 2021, Strona(/y) 102174, ISSN 0736-5845
Wydawca: Pergamon Press Ltd.
DOI: 10.1016/j.rcim.2021.102174

Zur Messung des Einflusses von „Augmented Reality“ auf die individuelle Produktivität bei Montagearbeiten

Autorzy: Manfred Rosenberger, Michael Fellmann, Fabienne Lambusch, Michael Poppe, Michael Spitzer
Opublikowane w: HMD Praxis der Wirtschaftsinformatik, Numer 57/3, 2020, Strona(/y) 451-464, ISSN 1436-3011
Wydawca: SpringerLink
DOI: 10.1365/s40702-020-00620-z

Cluster Purging: Efficient Outlier Detection based on Rate-Distortion Theory

Autorzy: Maximilian Bernhard Toller, Bernhard Claus Geiger, Roman Kern
Opublikowane w: IEEE Transactions on Knowledge and Data Engineering, 2021, Strona(/y) 1-1, ISSN 1041-4347
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tkde.2021.3103571

On Information Plane Analyses of Neural Network Classifiers – A Review

Autorzy: Bernhard C. Geiger
Opublikowane w: IEEE Transactions on Neural Networks and Learning Systems, 2021, ISSN 2162-2388
Wydawca: IEEE
DOI: 10.1109/tnnls.2021.3089037

CURIE: A Cellular Automaton for Concept Drift Detection

Autorzy: Lobo, Jesus L.; Del Ser, Javier; Osaba, Eneko; Bifet, Albert; Herrera, Francisco
Opublikowane w: Data Mining and Knowledge Discovery, Numer Special Numer of the Journal Track of ECML PKDD 2021, 2020, ISSN 1573-756X
Wydawca: Springer
DOI: 10.1007/s10618-021-00776-2

Measuring the Uncertainty of Predictions in Deep Neural Networks with Variational Inference.

Autorzy: Jan Steinbrener; Konstantin Posch; Jürgen Pilz
Opublikowane w: Numer 21, Numer 3, 2020, ISSN 1424-8220
Wydawca: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/s20216011

SMT2020—A Semiconductor Manufacturing Testbed

Autorzy: Denny Kopp, Michael Hassoun, Adar Kalir, Lars Monch
Opublikowane w: IEEE Transactions on Semiconductor Manufacturing, 2020, Strona(/y) 1-1, ISSN 0894-6507
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tsm.2020.3001933

Modeling the Dependency of Analog Circuit Performance Parameters on Manufacturing Process Variations with Applications in Sensitivity Analysis and Yield Prediction

Autorzy: Elena-Diana Sandru, Emilian David, Ingrid Kovacs, Andi Buzo, Corneliu Burileanu, Georg Pelz
Opublikowane w: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2021, Strona(/y) 1-1, ISSN 0278-0070
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tcad.2021.3054804

Transferrable Framework Based on Knowledge Graphs for Generating Explainable Results in Domain-Specific, Intelligent Information Retrieval

Autorzy: Hasan Abu-Rasheed, Christian Weber, Johannes Zenkert , Mareike Dornhöfer and Madjid Fathi
Opublikowane w: Journal informatics, 2022, ISSN 2227-9709
Wydawca: MDPI
DOI: 10.3390/informatics9010006

Production planning and scheduling in multi-factory production networks: a systematic literature review

Autorzy: Jacob Lohmer, Rainer Lasch
Opublikowane w: International Journal of Production Research, 2020, Strona(/y) 1-27, ISSN 0020-7543
Wydawca: Taylor & Francis
DOI: 10.1080/00207543.2020.1797207

Investigation of the Airborne Molecular Contamination Behavior in 300 mm Semiconductor Front - End Manufacturing

Autorzy: Peter Franze, Germar Schneider, Clara Zaengle, Markus Pfeffer, Stefan Kaskel
Opublikowane w: International Journal of Materials Science and Applications, Numer 9/1, 2020, Strona(/y) 14, ISSN 2327-2635
Wydawca: Science Publishing Group
DOI: 10.11648/j.ijmsa.20200901.13

Understanding Neural Networks and Individual Neuron Importance via Information-Ordered Cumulative Ablation

Autorzy: Rana Ali Amjad, Kairen Liu, Bernhard C. Geiger
Opublikowane w: IEEE Transactions on Neural Networks and Learning Systems, 2021, Strona(/y) 1-11, ISSN 2162-237X
Wydawca: IEEE Computational Intelligence Society
DOI: 10.1109/tnnls.2021.3088685

A Geometric Perspective on Information Plane Analysis

Autorzy: Mina Basirat, Bernhard C. Geiger, Peter M. Roth
Opublikowane w: Entropy, Numer 23/6, 2021, Strona(/y) 711, ISSN 1099-4300
Wydawca: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/e23060711

AUTOMATED ONTOLOGY-BASED SECURITY REQUIREMENTSIDENTIFICATION FOR THE VEHICULAR DOMAIN

Autorzy: Abdelkader Magdy Shaaban, Christoph Schmittner, Thomas Gruber, A. Baith Mohamed, Gerald Quirchmayr, and Erich Schikuta
Opublikowane w: Journal of Data Intelligence,, 2020, ISSN 2577-610X
Wydawca: rintonpress

A novel Bayesian approach for variable selection in linear regression models

Autorzy: Konstantin Posch, Maximilian Arbeiter, Juergen Pilz
Opublikowane w: Computational Statistics & Data Analysis, Numer 144, 2020, Strona(/y) 106881, ISSN 0167-9473
Wydawca: Elsevier BV
DOI: 10.1016/j.csda.2019.106881

SAZED: parameter-free domain-agnostic season length estimation in time series data

Autorzy: Maximilian Toller, Tiago Santos, Roman Kern
Opublikowane w: Data Mining and Knowledge Discovery, 2019, ISSN 1384-5810
Wydawca: Kluwer Academic Publishers
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