Integrated Development 4.0

CORDIS fournit des liens vers les livrables publics et les publications des projets HORIZON.

Les liens vers les livrables et les publications des projets du 7e PC, ainsi que les liens vers certains types de résultats spécifiques tels que les jeux de données et les logiciels, sont récupérés dynamiquement sur OpenAIRE .

Livrables

4.3.2.1 Report on Zero-Failur Culture

The report deals with the developed and verified model to analyze the effects of process improvements and analyze its dynamic behavior for manufacturing and the supply chain

D5.1.3.1 Publishable Use Case Report

Publishable descriptions of the industrial Use Cases defined

D7.1.3.1 Report on signal preprocessing for Machine Learning/Deep Leaning data analysis and feature extraction

Report on signal preprocessing for Machine Learning/Deep Leaning data analysis and feature extraction

D3.2.1.2 Lead time based pricing (UC16)

Publishable summary of UC16

D4.1.2.3 Virtual production with autonomous mobile industrial robots and interaction and training of operators (UC17)

Publishable summary of UC17.

D7.1.1.2 Report on security improvements in hardware and software implementation in a production area

Speed tests

D4.1.1.4 Enabling a human-centered education, training and knowledge-management system (UC18)

Publishable summary of UC18

D7.2.1.1 Efficient modelling of electro-thermo-mechanical stress during fast power cycling operation of an IC

The deliverable reports on proposed techniques for an efficient modelling of electro-thermo-mechanical stress during fast power cycling Operation.

"D2.1.4.1 Context base data provision ""virtual factory"", cyber-physical collaboration (UC7)"

Publishable summary of UC7

D1.3.3.1 Data-driven root cause investigation for variation in semiconductor manufacturing quality (UC1)

Publishable summary of UC1

D7.1.3.2 Report on classification algorithms

Report on classification algorithms

D4.1.2.1 Concept for digitally augmenting human work

A holistic concept for digitally augmenting human work is presented and agreed on with the stakeholders.

D7.1.1.1 Report on AES implementation with speed and side-channel immunity improvements

Speed tests

D4.2.2.1 Report on socio-organizational implications of digtial twins

Socioorganizational implications of digital twin Use Cases are investigated and documented

D7.2.2.2 IC yield prediction with knowledge-based modelling (UC4)

Publishable summary of UC4

D4.1.3.2 Final Report of Documentation and verification of smart knowledge management in different applications

Documentation and verification of smart knowledge management in different applications take place

D3.1.1.3 Remote Experiments on high-performance DC-DC converter (UC15)

Publishable summary of UC15

D7.6: D7.2.2.1 Yield estimation and prediction figures of merit and yield detracting factors’ determination

The deliverable reports advanced methods for multifactor pre- and post-silicon yield estimation and prediction, detection of yield detractors and root cause discovery.

D2.1.4.3 Base Architectures for Virtual/Physical Computing (UC9)

Publishable summary of UC9.

D2.1.1.2 Applying Discrete-event simulation framework and agent based simulation for planning in semiconductor value chains (UC12)

Publishable summary of UC12

D7.1.2.1 Report on virtual prototyping rules for DFM Optimization

Virtual prototyping rules for DFM Optimization

D6.1.1.1 Press Release: Launching the iDev40 project

A Press Release about the launch of iDev40 is published.

D6.2.1.1 Project website

The iDev40 website goes public.

D4.3.1.1 Demonstrator and report of decision support system (for complexity management)

A demonstrator about the analysis of complex demands in work systems for decision and planning support on the shop floor and management level is presented

Publications

Wie innovative Logistik die zukunftssichere und nachhaltige Gestaltung der Automatisierung und Digitalisierung der Halbleiterindustrie unterstützt

Auteurs: Germar Schneider; Jacob Lohmer
Publié dans: Logistik in Wissenschaft und Praxis, Numéro 2, 2021
Éditeur: Gabler Verlag
DOI: 10.5281/zenodo.4687042

RTAMT: Online Robustness Monitors from STL

Auteurs: Dejan Ničković, Tomoya Yamaguchi
Publié dans: Automated Technology for Verification and Analysis - 18th International Symposium, ATVA 2020, Hanoi, Vietnam, October 19–23, 2020, Proceedings, Numéro 12302, 2020, Page(s) 564-571, ISBN 978-3-030-59151-9
Éditeur: Springer International Publishing
DOI: 10.1007/978-3-030-59152-6_34

Wie innovative Logistik die zukunftssichere und nachhaltige Gestaltung der Automatisierung und Digitalisierung der Halbleiterindustrie unterstützt

Auteurs: Germar Schneider; Jacob Lohmer
Publié dans: Logistik in Wissenschaft und Praxis - Von der Datenanalyse zur Gestaltung komplexer Logistikprozesse, Numéro 7, 2021, ISBN 978-3-658-33479-6
Éditeur: Springer Gabler
DOI: 10.1007/978-3-658-33480-2_22

Rückwärtssimulation als Instrument zur Produktionsplanung – Erkenntnisse aus einer praxisbezogenen Fallstudie

Auteurs: Christoph Laroque, Madlene Leißau, Wolfgang Scholl, Germar Schneider
Publié dans: Simulation in Produktion und Logistik 2021, 2021
Éditeur: Jörg Franke, Peter Schuderer

A Text Extraction-Based Smart Knowledge Graph Composition for Integrating Lessons Learned During the Microchip Design

Auteurs: Hasan Abu Rasheed, Christian Weber, Johannes Zenkert, Peter Czerner, Roland Krumm, Madjid Fathi
Publié dans: Intelligent Systems and Applications - Proceedings of the 2020 Intelligent Systems Conference (IntelliSys) Volume 2, Numéro 1251, 2021, Page(s) 594-610, ISBN 978-3-030-55186-5
Éditeur: Springer International Publishing
DOI: 10.1007/978-3-030-55187-2_43

Trustworthy Smart Autonomous Systems-of-Systems - Resilient Technology, Economy and Society

Auteurs: Schoitsch Erwin
Publié dans: IDIMT-2021 - 29th Interdisciplinary Information Management Talks, 2021
Éditeur: Trauner Verlag - Universität
DOI: 10.5281/zenodo.5828352

Control of heterogenous AMHS in semiconductor industry under consideration of dynamic transport carrier transfers

Auteurs: Wagner, T., Seitz, J., Schneider, G.
Publié dans: International Conference on Industrial Technology, 2021
Éditeur: IEEE

Adversarial Training is Not Ready for Robot Learning

Auteurs: Mathias Lechner, Ramin Hasani, Radu Grosu, Daniela Rus, Thomas A. Henzinger
Publié dans: IEEE 2021 International Conference on Robotics and Automation (ICRA), 2021, 2021
Éditeur: IEEE

AIT Cyber Range - Flexible Cyber Security Environment for Exercises, Training and Research

Auteurs: Maria Leitner, Maximilian Frank, Wolfgang Hotwagner, Gregor Langner, Oliver Maurhart, Timea Pahi, Lenhard Reuter, Florian Skopik, Paul Smith, Manuel Warum
Publié dans: Proceedings of the European Interdisciplinary Cybersecurity Conference, 2020, Page(s) 1-6, ISBN 9781450375993
Éditeur: ACM
DOI: 10.1145/3424954.3424959

Digital Reference: a quasi-standard for digitalization in the domain of semiconductor supply chains

Auteurs: Hans Ehm, Erwin Schoitsch, Jan Wytze van der Weit, Nour Ramzy, Lanyingzhu Luo, Daniel Louis Gruetzner
Publié dans: 2020 IEEE Conference on Industrial Cyberphysical Systems (ICPS), 2020, Page(s) 563-570, ISBN 978-1-7281-6389-5
Éditeur: IEEE
DOI: 10.1109/icps48405.2020.9274750

Smart Collaboration - Mitarbeiter-zentrierte Informationssysteme in der Produktentstehung

Auteurs: Rosenberger, Manfred, Fellmann Michael, Richter Alexander, Stocker Alexander, Schmeja Michael, Damalas Stelios Andreas
Publié dans: Mensch und Computer 2020 - Workshopband, 2020
Éditeur: Gesellschaft für Informatik
DOI: 10.18420/muc2020-ws116

The Sound of Silence - Mining Security Vulnerabilities from Secret Integration Channels in Open-Source Projects

Auteurs: Ralf Ramsauer, Lukas Bulwahn, Daniel Lohmann, Wolfgang Mauerer
Publié dans: Proceedings of the 2020 ACM SIGSAC Conference on Cloud Computing Security Workshop, 2020, Page(s) 147-157, ISBN 9781450380843
Éditeur: ACM
DOI: 10.1145/3411495.3421360

The Impact of Intelligent Process Automation on Purchasing and Supply Management – Initial Insights from a Multiple Case Study

Auteurs: Flechsig, Christian
Publié dans: Logistics Management, 2021
Éditeur: Springer
DOI: 10.1007/978-3-030-85843-8_5

Human-Robot Assembly: Methodical Design and Assessment of an Immersive Virtual Environment for Real-World Significance

Auteurs: Johannes Hocherl, Andreas Adam, Thomas Schlegl, Britta Wrede
Publié dans: 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2020, Page(s) 549-556, ISBN 978-1-7281-8956-7
Éditeur: IEEE
DOI: 10.1109/etfa46521.2020.9212039

A Review of the Key Success Factors for the Implementation of Digital Technologies in the Context of Industry 4.0

Auteurs: Alexander Stocker, Manfred Rosenberger, Michael Schmeja, Germar Schneider
Publié dans: IFIP/IEEE IM 2021 Workshop: 2nd Workshop on Management for Industry 4.0 (MFI4.0), 2021
Éditeur: IEEE

Silentium! Run-Analyse-Eradicate the Noise out of the DB/OS Stack

Auteurs: Mauerer, Wolfgang; Ramsauer, Ralf; Lucas, Edson R. F.; Scherzinger, Stefanie
Publié dans: Lecture Notes in Informatics (LNI), Numéro 1, 2021
Éditeur: Gesellschaft für Informatik

HEURISTICS FOR ORDER-LOT PEGGING IN MULTI-FAB SETTINGS

Auteurs: Lars Mönch, Liji Shen, John W. Fowler
Publié dans: Proceedings of the 2020 Winter Simulation Conference, 2020
Éditeur: IEEE

Experimental Analysis of a Stochastic Backward Simulation Approach Under the Specifics of Semiconductor Manufacturing

Auteurs: Christoph Laroque, Madlene Leißau, Wolfgang Scholl, Germar Schneider
Publié dans: Procedia CIRP, Numéro Volume 107, 2022, ISSN 2212-8271
Éditeur: Elsevier B.V
DOI: 10.1016/j.procir.2022.05.154

Using accuracy measurements to evaluate simulation model simplification

Auteurs: Igor Stogniy, Wolfgang Scholl
Publié dans: Proceedings of the 2020 Winter Simulation Conference, 2020
Éditeur: IEEE

An unsupervised methodology for online drift detection in multivariate industrial datasets

Auteurs: Sarah Klein, Mathias Verbeke
Publié dans: 2020 International Conference on Data Mining Workshops (ICDMW), 2020, Page(s) 392-399, ISBN 978-1-7281-9012-9
Éditeur: IEEE
DOI: 10.1109/icdmw51313.2020.00061

On-Off Center-Surround Receptive Fields for Accurate and Robust Image Classification

Auteurs: Zahra Babaiee, Ramin Hasani, Mathias Lechner, Daniela Rus, Radu Grosu
Publié dans: 2021 2nd International Conference on Leadership and Management, 2021
Éditeur: ICLM

A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification

Auteurs: Andrei Gaita, Georgian Nicolae, Emilian C. David, Andi Buzo, Corneliu Burileanu, Georg Pelz
Publié dans: 2020 IEEE European Test Symposium (ETS), 2020, Page(s) 1-2, ISBN 978-1-7281-4312-5
Éditeur: IEEE
DOI: 10.1109/ets48528.2020.9131599

Multi-factory Job Shop Scheduling With Due Date Objective

Auteurs: Jacob Lohmer, Daniel Spengler, Rainer Lasch
Publié dans: 2020 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), 2020, Page(s) 79-84, ISBN 978-1-5386-7220-4
Éditeur: IEEE
DOI: 10.1109/ieem45057.2020.9309905

Explainable Graph-based Search for Lessons-Learned Documents in the Semiconductor Industry

Auteurs: Hasan Abu-Rasheed, Christian Weber, Johannes Zenkert, Roland Krumm, Madjid Fathi
Publié dans: Computing Conference 2021, 2021
Éditeur: Computing Conference

Key Expansion in Cryptographic Systems

Auteurs: Sorin Chiţu, Daniel Ciprian Vasile, Ionuţ Daniel Trămândan, Paul Svasta
Publié dans: 2020 IEEE 26th International Symposium for Design and Technology in Electronic Packaging (SIITME), 2020
Éditeur: IEEE
DOI: 10.1109/siitme50350.2020.9292242

Benefits of Digitalization for Business Processes in Semiconductor Manufacturing

Auteurs: Germar Schneider, Sophia Keil, Fabian Lindner
Publié dans: 2021 22nd IEEE International Conference on Industrial Technology (ICIT), 2021, Page(s) 1027-1033, ISBN 978-1-7281-5730-6
Éditeur: IEEE
DOI: 10.1109/icit46573.2021.9453611

An Industry 4.0 Production Workplace Enhanced by Using Mixed Reality Assembly Instructions with Microsoft HoloLens

Auteurs: Hebenstreit M., Spitzer M., Eder M., Ramsauer C.
Publié dans: Mensch und Computer 2020 - Workshopband, 2020
Éditeur: Gesellschaft für Informatik e.V
DOI: 10.18420/muc2020-ws116-005

Learning Long-Term Dependencies in Irregularly-Sampled Time Series

Auteurs: Lechner, Mathias; Hasani, Ramin
Publié dans: Neural Information Processing Systems (NIPS), Numéro 2, 2020
Éditeur: Neural Information Processing Systems Foundation

Order Release Methods in Semiconductor Manufacturing: State-of-the-Art in Science and Lessons from Industry

Auteurs: Jacob Lohmer, Christian Flechsig, Rainer Lasch, Konstantin Schmidt, Benjamin Zettler, Germar Schneider
Publié dans: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2020, Page(s) 1-6, ISBN 978-1-7281-5876-1
Éditeur: IEEE
DOI: 10.1109/ASMC49169.2020.9185201

1MHz Gate Driver in Power Technology for Fast Switching Applications

Auteurs: Roberto Di Lorenzo, Andrea Baschirotto, Albino Pidutti, Paolo Del Croce
Publié dans: IEEE 27th International Conference on Mixed Design of Integrated Circuits and System (MIXDES), 2020
Éditeur: IEEE

On The Verification of Neural ODEs with Stochastic Guarantees

Auteurs: Gruenbacher, Sophie; Hasani, Ramin; Lechner, Mathias; Cyranka, Jacek; Smolka, Scott A.; Grosu, Radu
Publié dans: Thirty-Fifth AAAI Conference on Artificial Intelligence, Numéro 4, 2021
Éditeur: AAAI

Liquid Time-constant Networks

Auteurs: Hasani, Ramin; Lechner, Mathias; Amini, Alexander; Rus, Daniela; Grosu, Radu
Publié dans: Proceedings of the AAAI Conference on Artificial Intelligence, 2021
Éditeur: AAAI

Branch selection and data optimization for selecting machines for processes in semiconductor manufacturing using AI-based predictions

Auteurs: Peter Stich, Rebecca Busch, Michael Wahl, Christian Weber, Madjid Fathi
Publié dans: 2021 IEEE International Conference on Electro Information Technology (EIT), 2021, Page(s) 1-6, ISBN 978-1-6654-1846-1
Éditeur: IEEE
DOI: 10.1109/eit51626.2021.9491836

Correlating electrical and process parameters for yield detractors’ detection

Auteurs: Ingrid Kovacs, Marina Topa, Ciprian Pop, Elena-Diana Sandru, Andi Buzo, Georg Pelz
Publié dans: 2020 International Symposium on Electronics and Telecommunications (ISETC), 2020, Page(s) 1-4, ISBN 978-1-7281-9513-1
Éditeur: IEEE
DOI: 10.1109/isetc50328.2020.9301121

Backward Simulation for Production Planning - Recent Advances in a Real-World Use-Case

Auteurs: Christoph Laroque, Madlene Leißau, Wolfgang Scholl, Germar Schneider
Publié dans: 2021 Winter Simulation Conference (WSC), 2021
Éditeur: IEEE

Electro-Thermal Simulation of Power DMOS Devices Operating under Fast Thermal Cycling

Auteurs: Ciprian Florea, Vasile Ţopa, Dan Simon
Publié dans: International Symposium for Design and Technology of Electronics Packages (SIITME), 2020
Éditeur: IEEE
DOI: 10.1109/siitme50350.2020.9292143

Smart Platform for Rapid Prototyping: Solutions in the dilemma of flexibility and standardization

Auteurs: Sabrina Anger, Felix Klingert, Volker Häublein, Markus Pfeffer, Martin Schellenberger
Publié dans: International Conference on Industrial Technology, 2021
Éditeur: IEEE

Simulation-based Evaluation of Lot Release Policies in a Power Semiconductor Facility - A Case Study

Auteurs: Allgeier, Henriette; Flechsig, Christian; Lohmer, Jacob; Lasch, Rainer; Schneider, Germar; Zettler, Benjamin
Publié dans: Proceedings of the 2020 Winter Simulation Conference, 2020
Éditeur: IEEE
DOI: 10.5281/zenodo.4011587

Investigation of Predictive Maintenance for Semiconductor Manufacturing and its Impacts on the Supply Chain

Auteurs: Daniel Fischer, Patrick Moder, Hans Ehm
Publié dans: 2021 22nd IEEE International Conference on Industrial Technology (ICIT), 2021, Page(s) 1409-1416, ISBN 978-1-7281-5730-6
Éditeur: IEEE
DOI: 10.1109/icit46573.2021.9453481

Service-based Semiconductor Manufacturing using the Digital Reference Ontology for Global Service Discovery

Auteurs: Hartwig Baumgaertel Patrick Moder Nour Ramzy Hans Ehm
Publié dans: IEEE IECON 2020 conference special session on IoT Automation Technologies, Tools and Applications, 2020
Éditeur: IEEE

High-Voltage Double-Domain Low-Dropout regulator for rapidly changing output loads

Auteurs: Osvaldo Gasparri; Bozic Aleksandar; Paolo del Croce; Andrea Baschirotto
Publié dans: IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2022
Éditeur: IEEE
DOI: 10.1109/icecs53924.2021.9665584

A Natural lottery Ticket Winner: Reinforcement Learning with Ordinary Neural Circuits

Auteurs: Ramin Hasani, Mathias Lechner, Alexander Amini,Daniela Rus, Radu Grosu
Publié dans: International Conference on Machine Learning (ICML), 2020
Éditeur: ICML

Cryptographic Key Derivation from an Anti-Tamper Solution

Auteurs: Daniel-Ciprian Vasile, Sorin Chitu, Paul Svasta
Publié dans: 2020 IEEE 8th Electronics System-Integration Technology Conference (ESTC), 2020, Page(s) 1-6, ISBN 978-1-7281-6293-5
Éditeur: IEEE
DOI: 10.1109/estc48849.2020.9229844

Strategic Approaches for Further Development of SiC Rapid Prototype Production

Auteurs: Sabrina Anger, Volker Häublein, Markus Pfeffer, Martin Schellenberger
Publié dans: European Advanced Process Control and Manufacturing Conference (apc|m), 2022
Éditeur: apc|m

Human-centered workplaces in the digital transformation of the semiconductor industry – a step towards high and intelligent automation (HIA)

Auteurs: Schneider, Germar; Lindner, Fabian; Keil, Sophia; Von Der Weth, Rüdiger
Publié dans: 6th World Conference on Production and Operations Management, Numéro 1, 2022
Éditeur: Japanese Operations Management and Strategy Association (JOMSA)
DOI: 10.5281/zenodo.7244541

Smart Systems Everywhere – Intelligence, Autonomy, Technology and Society

Auteurs: Schoitsch Erwin
Publié dans: Proceedings of IDIMT 2018, Strategic Modeling in Management, Economy and Society, 2018, Page(s) 153-165, ISBN 978-3-99062-339-8
Éditeur: Trauner Verlag
DOI: 10.5281/zenodo.2590948

A Planning Approach for an Effective Digitalization of Processes in Mature Semiconductor Production Facilities

Auteurs: Sophia Keil, Fabian Lindner, Germar Schneider, Tobias Jakubowitz
Publié dans: 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2019, Page(s) 1-6, ISBN 978-1-5386-7601-1
Éditeur: IEEE
DOI: 10.1109/asmc.2019.8791830

Response Characterization for Auditing Cell Dynamics in Long Short-term Memory Networks

Auteurs: Ramin Hasani, Alexander Amini, Mathias Lechner, Felix Naser, Radu Grosu, Daniela Rus
Publié dans: 2019 International Joint Conference on Neural Networks (IJCNN), 2019, Page(s) 1-8, ISBN 978-1-7281-1985-4
Éditeur: IEEE
DOI: 10.1109/ijcnn.2019.8851954

The List is the Process: Reliable Pre-Integration Tracking of Commits on Mailing Lists

Auteurs: Ralf Ramsauer, Daniel Lohmann, Wolfgang Mauerer
Publié dans: 2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE), 2019, Page(s) 807-818, ISBN 978-1-7281-0869-8
Éditeur: IEEE
DOI: 10.1109/icse.2019.00088

Novel challenges for root cause investigation in semiconductor manufacturing

Auteurs: Pleschberger, Martin; Zernig, Anja; Kaestner, Andre
Publié dans: 19th European Advanced Process Control and Manufacturing Conference (apc/m), Numéro 3, 2019
Éditeur: European Advanced Process Control and manufacturing Conference
DOI: 10.5281/zenodo.3247340

A Formally Robust Time Series Distance Metric

Auteurs: Maximilian Toller, Berhard C. Geiger, Roman Kern
Publié dans: MileTS'19: 5th KDD Workshop on Mining and Learning from Time Series, 2019
Éditeur: ACM

A Machine Learning Suite for Machine Components’ Health-Monitoring

Auteurs: Ramin Hasani, Guodong Wang, Radu Grosu
Publié dans: Proceedings of the AAAI Conference on Artificial Intelligence, Numéro 33, 2019, Page(s) 9472-9477, ISSN 2374-3468
Éditeur: Association for the Advancement of Artificial Intelligence
DOI: 10.1609/aaai.v33i01.33019472

Realizing the full potential of Robotic Process Automation through a combination with BPM

Auteurs: Flechsig, Christian; Lohmer, Jacob; Lasch, Rainer
Publié dans: Logistics Management, Numéro 1, 2019, Page(s) 104-119
Éditeur: Springer
DOI: 10.1007/978-3-030-29821-0_8

A Research Agenda to Deploy Technology Enhanced Learning with Augmented Reality in Industry

Auteurs: Spitzer, Michael; Gsellmann, Inge; Hebenstreit, Matthias; Damalas, Stelios; Ebner, Martin
Publié dans: Mensch und Computer 2019 - Workshopband, 2019
Éditeur: Gesellschaft für Informatik e.V

Smart Collaboration - Mitarbeiter-zentriete Informationssysteme in der Produktentstehung

Auteurs: Manfred Rosenberger, Michael Fellmann, Alexander Richter, Alexander Stocker, Michael Schmeja, Christian Kaiser
Publié dans: Mensch und Computer 2019 - Workshopband, 2019
Éditeur: Gesellschaft für Informatik e.V

Human Work Activity Recognition for Working Cells in Industrial Production Contexts

Auteurs: Clemens Pohlt, Thomas Schlegl, Sven Wachsmuth
Publié dans: 2019 IEEE International Conference on Systems, Man and Cybernetics (SMC), 2019, Page(s) 4225-4230, ISBN 978-1-7281-4569-3
Éditeur: IEEE
DOI: 10.1109/smc.2019.8913873

Designing Worm-inspired Neural Networks for Interpretable Robotic Control

Auteurs: Mathias Lechner, Ramin Hasani, Manuel Zimmer, Thomas A. Henzinger, Radu Grosu
Publié dans: 2019 International Conference on Robotics and Automation (ICRA), 2019, Page(s) 87-94, ISBN 978-1-5386-6027-0
Éditeur: IEEE
DOI: 10.1109/icra.2019.8793840

Security Chain Tool for IoT Secure Applications

Auteurs: Schmittner C., Abdelkader M.S.,
Publié dans: 2nd International Workshop on Embedded Software for Industrial IoT, 2019, Page(s) 27-29
Éditeur: ESIIT

Information Holism – a New Way to Close the Information Gap

Auteurs: Gerhard Luhn, Agnes Oszuszky
Publié dans: 2019 3rd International Conference on Advanced Information and Communications Technologies (AICT), 2019, Page(s) 101-107, ISBN 978-1-7281-2399-8
Éditeur: IEEE
DOI: 10.1109/aiact.2019.8847757

Ontology-Based Model for Automotive Security Verification and Validation

Auteurs: Abdelkader Magdy Shaaban, Christoph Schmittner, Thomas Gruber, A. Baith Mohamed, Gerald Quirchmayr, Erich Schikuta
Publié dans: Proceedings of the 21st International Conference on Information Integration and Web-based Applications & Services, 2019, Page(s) 73-82, ISBN 9781-450371797
Éditeur: ACM
DOI: 10.1145/3366030.3366070

BEYOND SMART SYSTEMS – CREATING A SOCIETY OF THE FUTURE (5.0) RESOLVING DISRUPTIVE CHANGES AND SOCIAL CHALLENGES

Auteurs: Schoitsch, Erwin
Publié dans: Proceedings of IDIMT 2019, Innovation and Transformation in a Digital World, Numéro 2, 2019, Page(s) 387-400, ISBN 978-3-99062-590-3
Éditeur: Traun Verlag
DOI: 10.5281/zenodo.3605686

On-Chip Power Stage and Gate Driver for Fast Switching Applications

Auteurs: Roberto di Lorenzo, Osvaldo Gasparri, Albino Pidutti, Paolo del Croce, Andrea Baschirotto
Publié dans: 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2019, Page(s) 266-269, ISBN 978-1-7281-0996-1
Éditeur: IEEE
DOI: 10.1109/icecs46596.2019.8965103

Variable off-Time Peak Current Mode Control (VoT-PCMC) as method for average current regulation in Buck Converter Drivers

Auteurs: Osvaldo Gasparri, Roberto di Lorenzo, Paolo Del Croce, Albino Pidutti, Andrea Baschirotto
Publié dans: 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2019, Page(s) 258-261, ISBN 978-1-7281-0996-1
Éditeur: IEEE
DOI: 10.1109/icecs46596.2019.8964979

Using Delays for Process flow Simplification

Auteurs: Igor Stogniy, Wolfgang Scholl
Publié dans: 2019 Winter Simulation Conference (WSC), 2019, Page(s) 2372-2383, ISBN 978-1-7281-3283-9
Éditeur: IEEE
DOI: 10.1109/wsc40007.2019.9004724

A New High-Volume/Low-Mix Simulation Testbed for Semiconductor Manufacturing

Auteurs: Michael Hassoun, Denny Kopp, Lars Monch, Adar Kalir
Publié dans: 2019 Winter Simulation Conference (WSC), 2019, Page(s) 2419-2428, ISBN 978-1-7281-3283-9
Éditeur: IEEE
DOI: 10.1109/wsc40007.2019.9004654

Integrated Planning of Production and Engineering Activities in Semiconductor Supply Chains: A Simulation Study

Auteurs: Timm Ziarnetzky, Lars Monch, Thomas Ponsignon, Hans Ehm
Publié dans: 2019 Winter Simulation Conference (WSC), 2019, Page(s) 2324-2335, ISBN 978-1-7281-3283-9
Éditeur: IEEE
DOI: 10.1109/wsc40007.2019.9004721

Interpretable Neuronal Circuit Policies for Reinforcement Learning Environments

Auteurs: Matthias Lechner, Ramin M. Hasani, Radu Grosu
Publié dans: IJCAI/ECAI Workshop on Explainable Artificial Intelligence (XAI), 2018
Éditeur: XAI

A Holistic Digital Twin Based on Semantic Web Technologies to Accelerate Digitalization

Auteurs: Patrick Moder, Hans Ehm, Eva Jofer
Publié dans: Digital Transformation in Semiconductor Manufacturing, 2020
Éditeur: Springer

Framework for Simulation-Based Decision Making in Semiconductor Value Chains

Auteurs: Lars Mönch1, Hans Ehm, Thomas Ponsignon
Publié dans: Digital Transformation in Semiconductor Manufacturing, 2020
Éditeur: Springer

Digital Twin for Plan and Make Using Semantic Web Technologies – Extending the JESSI/SEMATECH MIMAC Standard to the Digital Reference

Auteurs: Patrick Moder, Hans Ehm, Nour Ramzy
Publié dans: Digital Transformation in Semiconductor Manufacturing, 2020
Éditeur: Springer

Enhancing Prediction Quality of Fab Simulation by Advanced Cycle Time Modelling

Auteurs: Maximilian Dilefeld, Sebastian Rank, Thorsten Schmidt
Publié dans: Digital Transformation in Semiconductor Manufacturing, 2020
Éditeur: Springer

Visualization of Automated Material Handling System Components in Semiconductor Industry over the Lifecycle

Auteurs: Patrick Boden, Sebastian Rank, Thorsten Schmidt, Martin Däumler
Publié dans: Digital Transformation in Semiconductor Manufacturing, 2020
Éditeur: Springer

A System Dynamics Approach for Modeling Return on Quality for ECS Industry

Auteurs: Bernhard Oberegger, Andreas Felsberger, Gerald Reiner
Publié dans: Digital Transformation in Semiconductor Manufacturing, 2020
Éditeur: Springer

Automation of Cross-Factory Decision-Making Within Administrative Processes to Enhance Data Quality for Production

Auteurs: Jacob Lohmer , Christian Flechsig, Rainer Lasch, Germar Schneider, Dietrich Eberts, Benjamin Zettler2
Publié dans: Digital Transformation in Semiconductor Manufacturing, 2020
Éditeur: Springer

A Novel Software Architecture for Mixed Criticality Systems

Auteurs: Ralf Ramsauer, Jan Kiszka, Wolfgang Mauerer
Publié dans: Digital Transformation in Semiconductor Manufacturing, 2020
Éditeur: Springer

Digitizing Human Work Places in Manufacturing Through Augmented and Mixed Reality

Auteurs: Michael Spitzer, Manfred Rosenberger, Alexander Stocker, Inge Gsellmann, Matthias Hebenstreit, and Michael Schmeja
Publié dans: Digital Transformation in Semiconductor Manufacturing, 2020
Éditeur: Springer

Training the Human-in-the-Loop in Industrial Cyber Ranges

Auteurs: Stela Kucek, Maria Leitner
Publié dans: Digital Transformation in Semiconductor Manufacturing, 2020
Éditeur: Springer

PCMC DC-DC Converter Development Methodology by Means of dSPACE

Auteurs: Osvaldo Gasparri, Roberto Di Lorenzo, Paolo Del Croce, Andrea Baschirotto
Publié dans: Digital Transformation in Semiconductor Manufacturing, 2020
Éditeur: Springer

Smart Platform for Rapid Prototyping: A First Solution Approach to Improve Time-to-Market and Process Control in Low-Volume Device Fabrication

Auteurs: Martin Schellenberger, Sabrina Anger, Markus Pfeffer, Volker Häublein, Georg Roeder, Anton Bauer
Publié dans: Digital Transformation in Semiconductor Manufacturing, 2020
Éditeur: Springer

Competency Requirements at Digitalized Workplaces in the Semiconductor Industry

Auteurs: Sophia Keil, Fabian Lindner, Josef Moser, Rüdiger von der Weth, Germar Schneider
Publié dans: Digital Transformation in Semiconductor Manufacturing, 2020
Éditeur: Springer

A Natural lottery Ticket Winner: Reinforcement Learning with Ordinary Neural Circuits

Auteurs: Ramin Hasani, Mathias Lechner, Alexander Amini, Daniela Rus, Radu Grosu
Publié dans: International Conference on Machine Learning, 2020
Éditeur: ICML

Gershgorin Loss Stabilizes the Recurrent Neural Network Compartment of an End-to-end Robot Learning Scheme

Auteurs: Mathias Lechner, Ramin Hasani, Daniela Rus, Radu Grosu
Publié dans: International Conference on Robotics and Automation 2020 (ICRA), 2020
Éditeur: IEEE

Integrating critical queue time constraints into SMT2020 simulation models

Auteurs: Denny Kopp, Michael Hassoun, Adar Kalir, Lars Mönch
Publié dans: Proceedings of the 2020 Winter Simulation Conference, 2020
Éditeur: IEEE

Algorithm to Design Conductive Mesh for Tamperproof Envelope

Auteurs: Sorin Chiţu, Daniel Ciprian Vasile, Tudor Ioan Honceriu, Paul Svasta
Publié dans: International Symposium for Design and Technology of Electronics Packages (SIITME), 2020
Éditeur: IEEE
DOI: 10.1109/siitme50350.2020.9292275

Yield prediction in semiconductor manufacturing using an AI-based cascading classification system

Auteurs: Peter Stich, Michael Wahl, Peter Czerner, Christian Weber, Madjid Fathi
Publié dans: 2020 IEEE International Conference on Electro Information Technology (EIT), 2020, Page(s) 609-614, ISBN 978-1-7281-5317-9
Éditeur: IEEE
DOI: 10.1109/eit48999.2020.9208250

Towards a Resilient Society – Technology 5.0, Risks and Ethics

Auteurs: Schoitsch Erwin
Publié dans: IDIMT 2020, Numéro 9, 2020
Éditeur: Trauner Verlag
DOI: 10.5281/zenodo.4000984

Weakly-Supervised Learning for Multimodal Human Activity Recognition in Human-Robot Collaboration Scenarios

Auteurs: Clemens Pohlt, homas Schlegl, Sven Wachsmuth
Publié dans: IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS), 2020
Éditeur: IEEE

Erfolgsfaktoren bei der Einführung Digitaler Technologien im Kontext von Industrie 4.0

Auteurs: Stocker Alexander, Rosenberger Manfred, Resztej Mirjam, Damalas Stelios Andreas
Publié dans: Mensch und Computer 2020 - Workshopband, 2020
Éditeur: Gesellschaft für Informatik e.V
DOI: 10.18420/muc2020-ws116-006

Visual Analytics for Data-Driven Analysis in Semiconductor Manufacturing

Auteurs: Patrick Boden, Sebastian Rank, Thorsten Schmidt
Publié dans: ASIM Fachtagung - 25. Symposium Simulationstechnik, 2020
Éditeur: ASIM - Arbeitsgemeinschaft Simulation
DOI: 10.11128/arep.59.a59019

Chip and Board Scale Transient Thermal Simulations for Power MOS Devices Reliability Analysis

Auteurs: Madalin Vasile Moise, Paul Svasta, Norocel Codreanu, Ciprian Ionescu, Mihaela Pantazica, Alexandru Vasile, Bogdan Mihailescu, Cristian Boianceanu
Publié dans: 2021 44th International Spring Seminar on Electronics Technology (ISSE), 2021, Page(s) 1-4, ISBN 978-1-6654-1477-7
Éditeur: IEEE
DOI: 10.1109/isse51996.2021.9467624

Development and Evaluation of a Blockchain Concept for Production Planning and Control in the Semiconductor Industry

Auteurs: Herrgoß, Laura; Lohmer, Jacob; Schneider, Germar; Lasch, Rainer
Publié dans: IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), 2020
Éditeur: IEEE
DOI: 10.5281/zenodo.4003638

Challenges in Smart Health Applications using Wearable Medical Internet of Things – A Review

Auteurs: Benedikt Schnell, Patrick Moder, Hans Ehm, Marcel Konstantinov, Mahmoud Ismail
Publié dans: ICICT 2021 – 6th International Congress on Information and Communication Technology, 2021
Éditeur: Infineon Technologies AG

Using representative process flows for simulation model simplification

Auteurs: Igor Stogniy, Wolfgang Scholl
Publié dans: International Conference on Industrial Technology, 2021
Éditeur: IEEE

SMACD / PRIME 2021; International Conference on SMACD and 16th Conference on PRIME

Auteurs: Davide Severin; Giovanni Capodivacca; Bernard Blaise Tchodjie Tchamabe; Andi Buzo; Cristian-Vasile Diaconu
Publié dans: SMACD / PRIME 2021; International Conference on SMACD and 16th Conference on PRIME, 2021, ISBN 978-3-8007-5588-2
Éditeur: IEEE

Adversarial Training is Not Ready for Robot Learning

Auteurs: Lechner, Mathias; Hasani, Ramin; Grosu, Radu; Rus, Daniela; Henzinger, Thomas A.
Publié dans: IEEE International Conference on Robotics and Automation (ICRA), 2021
Éditeur: IEEE
DOI: 10.1109/icra48506.2021.9561036

Einsatzmöglichkeiten der Rückwärtssimulation zur Produktionsplanung in der Halbleiterfertigung

Auteurs: Christoph Laroque, Christoph Löffler, Wolfgang Scholl, Germar Schneider
Publié dans: Proceedings ASIM SST 2020, 2020, Page(s) 397-401, ISBN 9783901608933
Éditeur: ARGESIM Publisher Vienna
DOI: 10.11128/arep.59.a59055

A Low-Dropout Regulator for One Time Programmable (OTP) Memories in Automotive Applications

Auteurs: Osvaldo Gasparri; Bozic Aleksandar; Paolo del Croce; Andrea Baschirotto
Publié dans: International Conference on Electronics, Circuits and Systems (ICECS), 2022
Éditeur: IEEE
DOI: 10.1109/icecs53924.2021.9665607

Automated and Optimized Lot-To-Order Matching in 300 mm Semiconductor Facilities

Auteurs: Christian Flechsig, Jacob Lohmer, Rainer Lasch, Benjamin Zettler, Germar Scheider, Dietrich Eberts
Publié dans: 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2021, Page(s) 1-6, ISBN 978-1-7281-8645-0
Éditeur: IEEE
DOI: 10.1109/ASMC51741.2021.9435730

Visual Analytics for Data-Driven Analysis in Semiconductor Manufacturing

Auteurs: Boden, Patrick; Rank, Sebastian; Schmidt, Thorsten
Publié dans: Proceedings ASIM SST 2020, Numéro 1, 2020, ISBN 9783901608933
Éditeur: Arbeitsgemeinschaft Simuluation

SIMULATION MODEL SIMPLIFICATION FOR CHANGING PRODUCT MIX SCENARIO

Auteurs: Igor Stogniy, Wolfgang Scholl, Hans Ehm
Publié dans: Proceedings of the 2021 Winter Simulation Conferenc, 2021
Éditeur: IEEE

DC-DC Buck Converter with Constant Off-Time Peak Current Mode Control

Auteurs: Osvaldo Gasparri, Roberto Di Lorenzo, Albino Pidutti, Paolo Del Croce, Andrea Baschirotto
Publié dans: 2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2020
Éditeur: IEEE
DOI: 10.1109/icecs49266.2020.9294913

Assessing the Impact of Information Assistance Systems on a Worker Level - A Pre-Study towards an Evaluation Framework

Auteurs: Lindner Fabian, Winkler Daniel, Müller Arvid, Mühlan Kevin, Keil Sophia
Publié dans: Mensch und Computer - Workshopband 2020, 2020
Éditeur: Gesellschaft für Informatik
DOI: 10.18420/muc2020-ws116-001

A DISCRETE-EVENT HEURISTIC FOR MAKESPAN OPTIMIZATION IN MULTI-SERVERFLOW-SHOP PROBLEMS WITH MACHINE RE-ENTERING

Auteurs: Angel A. Juan, Pedro Copado, Javier Panadero, Christoph Laroque, Rocio de la Torre
Publié dans: Proceedings of the 2020 Winter Simulation Conference, 2020
Éditeur: IEEE

Model-based versus Model-free Deep Reinforcement Learning for Autonomous Racing Cars

Auteurs: Brunnbauer, Axel; Berducci, Luigi; Brandstätter, Andreas; Lechner, Mathias; Hasani, Ramin; Rus, Daniela; Grosu, Radu
Publié dans: preprint, Numéro 1, 2021
Éditeur: TU Vienna

Poster: Smart Virtual Collaboration to Optimize the Development Process in Semiconductor Industry

Auteurs: Germar Schneider, Fabian Lindner, Sophia Keil
Publié dans: EUROPEAN ADVANCED PROCESS CONTROL AND MANUFACTURING (APC|M) CONFERENCE, 2021
Éditeur: apc/m

Machine Learning based Indicators to Enhance Process Monitoring by Pattern Recognition

Auteurs: Schrunner, Stefan; Scheiber, Michael; Jenul, Anna; Zernig, Anja; Kästner, Andre; Kern, Roman
Publié dans: preprint, Numéro 2, 2021
Éditeur: Know Center

Development and evaluation of a Blockchain concept for the IFD 300 mm Pre-Assembly Line

Auteurs: Germar Schneider; Laura Herrgoß; Jacob Lohmer; Rainer Lasch
Publié dans: apcm, Numéro 2, 2021
Éditeur: apcm
DOI: 10.5281/zenodo.4686629

Variable Selection Using Nearest Neighbor Gaussian Processes

Auteurs: Posch, Konstantin; Arbeiter, Maximilian; Pleschberger, Martin; Pilz, Juergen
Publié dans: preprint, Numéro 1, 2021
Éditeur: University Klagenfurt

Presentation: Investigation of the Airborne Molecular Contamination Behavior in 300 mm Semiconductor Front - End Manufacturing

Auteurs: Germar Schneider, Laura Herrgoß, Jacob Lohmer, Rainer Lasch
Publié dans: EUROPEAN ADVANCED PROCESS CONTROL AND MANUFACTURING (APC|M) CONFERENCE, 2021
Éditeur: APC/M

Poster: Chances & Challenges of Digitization in Semiconductor Fabs and Success Factors during the Implementation

Auteurs: Schneider G., Herrgoß L, Lindner F., Keil S.
Publié dans: 19th European Advanced Process Control and Manufacturing Conference (apc|m), 2019
Éditeur: European Advanced Process Control and Manufacturing Conference

Poster: An experimental proof of the different granularity levels of automated-generated long-term simulation model

Auteurs: Igor Stogniy, Wolfgang Scholl
Publié dans: 19th European Advanced Process Control and Manufacturing Conference (apc|m), 2019
Éditeur: 19th European Advanced Process Control and Manufacturing Conference (apc|m)

Presentation: New defect classification methodology with regard to causal modeling, supervised by engineers (SME)

Auteurs: Andre Schaaf-Ledermüller
Publié dans: APC 2018: Advanced Process Control Conference, 2018
Éditeur: apc conference

Presentation: On the deep nature of human knowledge (part II): Physical information, knowledge and language

Auteurs: Gerhard Luhn, Germar Schneider, Gerald Huether
Publié dans: APC 2018: Advanced Process Control Conference, 2018
Éditeur: apc conference

Presentation: On the deep nature of human knowledge (part I): Neuroscience, quantum physics and the imaginary

Auteurs: Gerhard Luhn, Germar Schneider, Gerald Hüther
Publié dans: APC 2018: Advanced Process Control Conference, 2018
Éditeur: apc conference

Liquid Time-constant Recurrent Neural Networks as Universal Approximators

Auteurs: Hasani, Ramin M.; Lechner, Mathias; Amini, Alexander; Rus, Daniela; Grosu, Radu
Publié dans: preprint, Numéro 1, 2018
Éditeur: arxiv.org

Re-purposing Compact Neuronal Circuit Policies to Govern Reinforcement Learning Tasks

Auteurs: Hasani, Ramin M.; Lechner, Mathias; Amini, Alexander; Rus, Daniela; Grosu, Radu
Publié dans: preprint, Numéro 1, 2018
Éditeur: arix.org

Presentation: The List is Our Process! An analysis of the kernel's email-based development process

Auteurs: Ralf Ramsauer, Sebastian Duda, Lukas Bulwahn, Wolfgang Mauerer
Publié dans: Embedded Linux Conference Europe, 2019
Éditeur: ELCE

"Presentation: Quicker from R&D to Line - A ""Smart Experiments"" Approach"

Auteurs: S. Anger, M. Schellenberger, M. Pfeffer, V. Häublein, G. Roeder, A. Bauer
Publié dans: Workshop of GMM-Fachgruppe 1.2.3 Abscheide- und Ätzverfahren, 2019
Éditeur: GMM

"Presentation: Digitale Kompetenzen in der Hochschullehre - ""10.000 Schritte in den Fußstapfen eines 'Pickers'"""

Auteurs: Keil S., Mühlan K., Winkler D., Lindner F.
Publié dans: 14th Regional Conference for Engineering Pedagogy, 2019
Éditeur: HSZG

Poster: An Advanced Further Education Framework for Industry 4.0 - Developing a Certification Program for Digital Transformation

Auteurs: Sophia Keil, Fabian Lidner, Kevin Mühlan, Daniel Winkler
Publié dans: 2019
Éditeur: HSZG
DOI: 10.13140/rg.2.2.11557.96480

Presentation: A Planning Approach for an Effective Digitalization of Processes in Mature Semiconductor Production Facilities

Auteurs: Keil S., Schneider G., Lindner F., Jakubowitz T.
Publié dans: 2019
Éditeur: HSZG

"Poster: Die Bedeutung ""klassischer"" Kompetenzen in der digitalen Transformation"

Auteurs: Lindner F., Mühlan K., Winkler D., Naumann F., Keil S.
Publié dans: Workshop on E-Learning, 2019
Éditeur: HSZG
DOI: 10.13140/rg.2.2.35748.83846

Presentation: Statistical Modelling and Design for Quality Control and Reliability Analysis in Power Semiconductor Manufacturing Processes

Auteurs: Jürgen Pilz, Daniel Kurz, Natalie Vollert
Publié dans: DAGSTAT Conference, 2019
Éditeur: DAGSTAT

Presentation: Two Worlds - Common Concept?

Auteurs: A. Zernig, K. Krebs, F. D. Frumosu, D. Surmann
Publié dans: European Network for Business and Industrial Statistics, 2019
Éditeur: ENBIS

Presentation: The impact of supply chain design options on performance measures in the semiconductor industry

Auteurs: Bernhard Oberegger, Andreas Felsberger, Boualem Rabta, Gerald Reiner
Publié dans: 30th European Conference on Operational Research (EURO), 2019
Éditeur: EURO

Presentation: Modeling an Ontology for Planning and Control Tasks in Semiconductor Value Chains

Auteurs: Sebastian Arens, Lars Moench
Publié dans: European Conference on Operational Research, 2019
Éditeur: European Conference on Operational Research

Real-time Electrical Power Prediction in a Combined Cycle Power Plant

Auteurs: Lobo, Jesus L.; Ballesteros, Igor; Oregi, Izaskun; Del Ser, Javier
Publié dans: preprint, 2019
Éditeur: Tecnalia
DOI: 10.13140/rg.2.2.21137.99680

Presentation: Experimentelle Untersuchung der Auswirkungen digitalisierter Arbeitsplätze auf Menschen in der Industrie 4.0 Modellfabrik.

Auteurs: Rinat Saifoulline, Sabine Friese, Tobias Jakubowitz, Dirk Reichelt, Rüdiger von der Weth
Publié dans: AOW Tagung 2019, 2019
Éditeur: AOW

Presentation: Computersimulation komplexer Arbeitsanforderungen als Werkzeug für Qualifikation und prospektive Arbeitsgestaltung.

Auteurs: Rüdiger von der Weth, Tobias Jakubowitz, Sabine Friese, Rinat Saifoulline
Publié dans: 11. Tagung der Fachgruppe Arbeits-, Organisations- und Wirtschaftspsychologie der Deutschen Gesellschaft für Psychologie, 2019
Éditeur: AOW

Presentation: Correlated Parameters to Accurately Measure Uncertainty in Deep Neural Networks

Auteurs: Konstantin Posch, Jürgen Pilz
Publié dans: 10th International Workshop on Simulation and Statistics, 2019
Éditeur: ÖSG

Can a Compact Neuronal Circuit Policy be Re-purposed to Learn Simple Robotic Control?

Auteurs: Ramin Hasani, Mathias Lechner, Alexander Amin, Daniela Rus, Radu Grosu
Publié dans: preprint, 2018
Éditeur: TU Wien

On Information Plane Analyses of Neural Network Classifiers -- A Review

Auteurs: Geiger, Bernhard C.
Publié dans: preprint, Numéro 1, 2020
Éditeur: Know Center

A Novel Multi-Scale Method for Thermo-Mechanical Simulation of Power Integrated Circuit

Auteurs: A. Bojita, M. Purcar, D. Simon, C. Florea, C. Boianceanu and V. Topa
Publié dans: IEEE Journal of the Electron Devices Society, 2022, ISSN 2168-6734
Éditeur: Institute of Electrical and Electronics Engineers Inc.
DOI: 10.1109/jeds.2022.3144530

LUNAR: Cellular automata for drifting data streams

Auteurs: Jesus L. Lobo, Javier Del Ser, Francisco Herrera
Publié dans: Information Sciences, Numéro 543, 2021, Page(s) 467-487, ISSN 0020-0255
Éditeur: Elsevier BV
DOI: 10.1016/j.ins.2020.08.064

Learn to Shape the Digital Transformation: The Design Approach of a Learning Factory for Industrial Engineers

Auteurs: Fabian Lindner, Daniel Winkler, Kevin Mühlan, Uwe Wendt, Sophia Keil
Publié dans: SSRN Electronic Journal, 2021, ISSN 1556-5068
Éditeur: Elsevier
DOI: 10.2139/ssrn.3858409

Unexpected applause for the human mind. The limitations of deterministic approaches in neuroscience - allowing us to become who we are

Auteurs: Gerhard Luhn, Gerald Hüther
Publié dans: International Journal of Foresight and Innovation Policy, 2021, ISSN 1740-2816
Éditeur: Inderscience Publishers

DC-DC Buck Converter Driver with Variable Off-Time Peak Current Mode Control

Auteurs: svaldo Gasparri, Paolo Del Croce, Andrea Baschirotto
Publié dans: Advances in Science, Technology and Engineering Systems Journal, 2020, ISSN 2415-6698
Éditeur: ASTES
DOI: 10.25046/aj050642

Test Structure Design for Defect Detection during Active Thermal Cycling

Auteurs: Ciprian Florea; Dan Simon; Adrian Bojiță; Marius Purcar; Cristian Boianceanu; Vasile Țopa
Publié dans: Sensors; Volume 22; Numéro 19; Pages: 7223, Numéro 2, 2022, ISSN 1424-8220
Éditeur: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/s22197223

Ultra-thin oxide breakdown for OTP development in power technologies

Auteurs: Osvaldo Gasparri, Mirko Bernardoni, Paolo Del Croce, Andrea Baschirotto
Publié dans: e & i Elektrotechnik und Informationstechnik, Numéro 138/1, 2021, Page(s) 44-47, ISSN 0932-383X
Éditeur: Springer Verlag
DOI: 10.1007/s00502-020-00838-1

A Comparison of Variational Bounds for the Information Bottleneck Functional

Auteurs: Bernhard C. Geiger, Ian S. Fischer
Publié dans: Entropy, Numéro 22/11, 2020, Page(s) 1229, ISSN 1099-4300
Éditeur: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/e22111229

Streamlining Semiconductor Manufacturing of 200 mm and 300 mm Wafers: A Longitudinal Case Study on the Lot-To-Order-Matching Process

Auteurs: Christian Flechsig; Jacob Lohmer; Rainer Lasch; Benjamin Zettler; Germar Schneider; Dietrich Eberts
Publié dans: Transactions on Semiconductor Manufacturing, Numéro 3, 2022, ISSN 0894-6507
Éditeur: Institute of Electrical and Electronics Engineers
DOI: 10.1109/TSM.2022.3184041

Transformation of semantic knowledge into simulation-based decision support

Auteurs: Wiking Jurasky, Patrick Moder, Michael Milde, Hans Ehm, Gunther Reinhart
Publié dans: Robotics and Computer-Integrated Manufacturing, Numéro 71, 2021, Page(s) 102174, ISSN 0736-5845
Éditeur: Pergamon Press Ltd.
DOI: 10.1016/j.rcim.2021.102174

Zur Messung des Einflusses von „Augmented Reality“ auf die individuelle Produktivität bei Montagearbeiten

Auteurs: Manfred Rosenberger, Michael Fellmann, Fabienne Lambusch, Michael Poppe, Michael Spitzer
Publié dans: HMD Praxis der Wirtschaftsinformatik, Numéro 57/3, 2020, Page(s) 451-464, ISSN 1436-3011
Éditeur: SpringerLink
DOI: 10.1365/s40702-020-00620-z

Cluster Purging: Efficient Outlier Detection based on Rate-Distortion Theory

Auteurs: Maximilian Bernhard Toller, Bernhard Claus Geiger, Roman Kern
Publié dans: IEEE Transactions on Knowledge and Data Engineering, 2021, Page(s) 1-1, ISSN 1041-4347
Éditeur: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tkde.2021.3103571

On Information Plane Analyses of Neural Network Classifiers – A Review

Auteurs: Bernhard C. Geiger
Publié dans: IEEE Transactions on Neural Networks and Learning Systems, 2021, ISSN 2162-2388
Éditeur: IEEE
DOI: 10.1109/tnnls.2021.3089037

CURIE: A Cellular Automaton for Concept Drift Detection

Auteurs: Lobo, Jesus L.; Del Ser, Javier; Osaba, Eneko; Bifet, Albert; Herrera, Francisco
Publié dans: Data Mining and Knowledge Discovery, Numéro Special Numéro of the Journal Track of ECML PKDD 2021, 2020, ISSN 1573-756X
Éditeur: Springer
DOI: 10.1007/s10618-021-00776-2

Measuring the Uncertainty of Predictions in Deep Neural Networks with Variational Inference.

Auteurs: Jan Steinbrener; Konstantin Posch; Jürgen Pilz
Publié dans: Numéro 21, Numéro 3, 2020, ISSN 1424-8220
Éditeur: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/s20216011

SMT2020—A Semiconductor Manufacturing Testbed

Auteurs: Denny Kopp, Michael Hassoun, Adar Kalir, Lars Monch
Publié dans: IEEE Transactions on Semiconductor Manufacturing, 2020, Page(s) 1-1, ISSN 0894-6507
Éditeur: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tsm.2020.3001933

Modeling the Dependency of Analog Circuit Performance Parameters on Manufacturing Process Variations with Applications in Sensitivity Analysis and Yield Prediction

Auteurs: Elena-Diana Sandru, Emilian David, Ingrid Kovacs, Andi Buzo, Corneliu Burileanu, Georg Pelz
Publié dans: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2021, Page(s) 1-1, ISSN 0278-0070
Éditeur: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tcad.2021.3054804

Transferrable Framework Based on Knowledge Graphs for Generating Explainable Results in Domain-Specific, Intelligent Information Retrieval

Auteurs: Hasan Abu-Rasheed, Christian Weber, Johannes Zenkert , Mareike Dornhöfer and Madjid Fathi
Publié dans: Journal informatics, 2022, ISSN 2227-9709
Éditeur: MDPI
DOI: 10.3390/informatics9010006

Production planning and scheduling in multi-factory production networks: a systematic literature review

Auteurs: Jacob Lohmer, Rainer Lasch
Publié dans: International Journal of Production Research, 2020, Page(s) 1-27, ISSN 0020-7543
Éditeur: Taylor & Francis
DOI: 10.1080/00207543.2020.1797207

Investigation of the Airborne Molecular Contamination Behavior in 300 mm Semiconductor Front - End Manufacturing

Auteurs: Peter Franze, Germar Schneider, Clara Zaengle, Markus Pfeffer, Stefan Kaskel
Publié dans: International Journal of Materials Science and Applications, Numéro 9/1, 2020, Page(s) 14, ISSN 2327-2635
Éditeur: Science Publishing Group
DOI: 10.11648/j.ijmsa.20200901.13

Understanding Neural Networks and Individual Neuron Importance via Information-Ordered Cumulative Ablation

Auteurs: Rana Ali Amjad, Kairen Liu, Bernhard C. Geiger
Publié dans: IEEE Transactions on Neural Networks and Learning Systems, 2021, Page(s) 1-11, ISSN 2162-237X
Éditeur: IEEE Computational Intelligence Society
DOI: 10.1109/tnnls.2021.3088685

A Geometric Perspective on Information Plane Analysis

Auteurs: Mina Basirat, Bernhard C. Geiger, Peter M. Roth
Publié dans: Entropy, Numéro 23/6, 2021, Page(s) 711, ISSN 1099-4300
Éditeur: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/e23060711

AUTOMATED ONTOLOGY-BASED SECURITY REQUIREMENTSIDENTIFICATION FOR THE VEHICULAR DOMAIN

Auteurs: Abdelkader Magdy Shaaban, Christoph Schmittner, Thomas Gruber, A. Baith Mohamed, Gerald Quirchmayr, and Erich Schikuta
Publié dans: Journal of Data Intelligence,, 2020, ISSN 2577-610X
Éditeur: rintonpress

A novel Bayesian approach for variable selection in linear regression models

Auteurs: Konstantin Posch, Maximilian Arbeiter, Juergen Pilz
Publié dans: Computational Statistics & Data Analysis, Numéro 144, 2020, Page(s) 106881, ISSN 0167-9473
Éditeur: Elsevier BV
DOI: 10.1016/j.csda.2019.106881

SAZED: parameter-free domain-agnostic season length estimation in time series data

Auteurs: Maximilian Toller, Tiago Santos, Roman Kern
Publié dans: Data Mining and Knowledge Discovery, 2019, ISSN 1384-5810
Éditeur: Kluwer Academic Publishers
DOI: 10.1007/s10618-019-00645-z

Spiking Neural Networks and online learning: an overview and perspectives

Auteurs: Jesus L. Lobo, Javier Del Ser, Albert Bifet, Nikola Kasabov
Publié dans: Neural Networks, 2020, Page(s) 88-100, ISSN 0893-6080
Éditeur: Pergamon Press Ltd.
DOI: 10.1016/j.neunet.2019.09.004

Auteurs: Konstantin Posch, Juergen Pilz
Publié dans: IEEE Transactions on Neural Networks and Learning Systems, 2020, Page(s) 1-15, ISSN 2162-237X
Éditeur: IEEE Computational Intelligence Society
DOI: 10.1109/tnnls.2020.2980004

An Empirical Survey of Functions and Configurations of Open-Source Capture the Flag (CTF) Environments

Auteurs: Stela Kucek, Maria Leitner
Publié dans: Journal of Network and Computer Applications, Numéro 151, 2020, Page(s) 102470, ISSN 1084-8045
Éditeur: Academic Press
DOI: 10.1016/j.jnca.2019.102470

Exploiting the stimuli encoding scheme of evolving Spiking Neural Networks for stream learning

Auteurs: Jesus L. Lobo, Izaskun Oregi, Albert Bifet, Javier Del Ser
Publié dans: Neural Networks, Numéro 123, 2020, Page(s) 118-133, ISSN 0893-6080
Éditeur: Pergamon Press Ltd.
DOI: 10.1016/j.neunet.2019.11.021

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