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Optical characterisation methods for micro-electro- mechanical systems manufacturing: implementing and calibration of an in situ integrated technique

Obiettivo

While MEMS manufacturing is impressively progressed during the last decade, tools for testing of mechanical properties of microstructures are not very well-developed and not suited for MEMS technology. The proposed programme aims at strengthening MEMS testability using optical on-chip integrated techniques based on MEMS interrogation by integrated interferometry. This testability has to play an important role, both during design and development of micromechanical structures and during chip-production.

Thus, the stress of a deposited thin films can be obtained from measurements by an integrated interrogation system based on Mach-Zehnder interferometry where one of the branches of this interferometer is rigid the other one is made on top of a piezoelectically actuated membrane. When the piezoelectric actuation is applied to the membrane, the Mach-Zehnder output signals contain the information about the optical path change of the sensing arm produced by membrane deformations.

Campo scientifico (EuroSciVoc)

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IHP-MCIF-99-1
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Meccanismo di finanziamento

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Coordinatore

UNIVERSIT_ DE FRANCHE-COMT_
Contributo UE
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Indirizzo
Rue Goudimel
BESAN_ON
Francia
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