AMBEATion: New Algorithm for Generation IC Matched Structures with Respecting Linear and Non-linear Gradient Parameter Effects
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Author(s):
Dalibor Barri, Patrik Vacula, Vlastimil Kotě, Jan Nemazal, Miloš Vacula, Daniele Jahier Pagliari, Francesco Daghero, Matteo Risso, Chen Xie, Michelangelo Grosso
Published in:
2024 International Conference on Applied Electronics (AE), 2024, Page(s) 1-4
Publisher:
IEEE
DOI:
10.1109/ae61743.2024.10710229
Extended Abstract: Automatic Generation of Analog Layout from Netlist
Author(s):
Martin Stastny, Francesco Daghero
Published in:
Proceedings of the International Student Scientific Conference Poster, Issue 27, 2023, Page(s) 55-56, ISBN 978-80-01-07140-3
Publisher:
Ceske vysoke uceni technicke v Praze, Fakulta elektrotechnicka
Machine Learning-based feasibility estimation of digital blocks in BCD technology
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Author(s):
Francesco Daghero, Gabriele Faraone, Michelangelo Grosso, Daniele Jahier Pagliari, Nicola Di Carolo, Giovanna Antonella Franchino, Dario Licastro, Eugenio Serianni
Published in:
2024 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS), 2024, Page(s) 1-6
Publisher:
IEEE
DOI:
10.1109/dttis62212.2024.10780062
AMBEATion: Analog Mixed-Signal Back-End Design Automation with Machine Learning and Artificial Intelligence Techniques
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Author(s):
Giulia Elena Aliffi, Joao Baixinho, Dalibor Barri, Francesco Daghero, Nicola Di Carolo, Gabriele Faraone, Michelangelo Grosso, Daniele Jahier Pagliari, Jiri Jakovenko, Vladimír Janíček, Dario Licastro, Vazgen Melikyan, Matteo Risso, Vittorio Romano, Eugenio Serianni, Martin Štastný, Patrik Vacula, Giorgia Vitanza, Chen Xie
Published in:
2024 Design, Automation & Test in Europe Conference & Exhibition (DATE), Issue 81, 2024, Page(s) 1-6
Publisher:
IEEE
DOI:
10.23919/date58400.2024.10546515
Predicting Digital Layout Success in Analog-on-Top Designs Using Machine Learning
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Author(s):
Francesco Daghero, Gabriele Faraone, Eugenio Serianni, Nicola Di Carolo, Dario Licastro, Giovanna Antonella Franchino, Michelangelo Grosso, Daniele Jahier Pagliari
Published in:
2025 23rd IEEE Interregional NEWCAS Conference (NEWCAS), 2025, Page(s) 60-64
Publisher:
IEEE
DOI:
10.1109/newcas64648.2025.11107059