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Autonomous Creation of Analog Integrated Circuits based on Self-Learning of Design Expertise

Publicaciones

Analog synthesis 3.0: AI/ML to boost automated design and test ofanalog/mixed-signal ICs

Autores: Georges Gielen
Publicado en: proceedings ASP-DAC, Edición 2023, 2023
Editor: IEEE

Using probabilistic model rollouts to boost the sample efficiency of reinforcement learning for automated analog circuit sizing

Autores: Mohsen Ahmadzadeh; Georges Gielen
Publicado en: proceedings Design Automation Conference (DAC), Edición 2024, 2024
Editor: ACM/IEEE

Recent Trends and Perspectives on Defect-Oriented Testing

Autores: P. Bernardi; R. Cantoro; A. Coyette; W. Dobbeleare; M. Fieback; A. Floridia; Georges Gielen; J. Gomez; M. Grosso; A. Guerriero; I. Guglielminetti; S. Hamdioui; G. Insinga; N. Mautone; N. Mirabella; S. Sartoni; M. Sonza Reorda; R. Ullmann; R. Vanhooren; Nektar Xama; L. Wu
Publicado en: proceedings 2022 IEEE 28TH INTERNATIONAL SYMPOSIUM ON ON-LINE TESTING AND ROBUST SYSTEM DESIGN (IOLTS 2022), Edición 2022, 2022
Editor: IEEE
DOI: 10.1109/iolts56730.2022.9897647

Analog synthesis 3.0: AI/ML to synthesize and test analog ICs: hope or hype ?

Autores: Georges Gielen
Publicado en: proceedings ACM/IEEE Workshop on Machine Learning for CAD (MLCAD), Edición 2024, 2024
Editor: ACM/IEEE
DOI: 10.1109/mlcad58807.2023.10299830

Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs using SVM Classifiers

Autores: Nektar Xama; Jhon Gomez Caicedo; Georges Gielen
Publicado en: IEEE Transactions on Computer-Aided Design of Integrated Circuits And Systems, Edición 2023, 2023, ISSN 0278-0070
Editor: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tcad.2023.3244892

AI in the edge; the edge of AI

Autores: Georges Gielen
Publicado en: keynote presentation Design, Automation & Test in Europe (DATE) conference, Edición 2022, 2022
Editor: IEEE CEDA

Machine-learning-based synthesis of analog integrated circuits exploiting the self-learning of design expertise

Autores: Georges Gielen
Publicado en: invited presentation MPSoC'22 conference, Edición 2022, 2022
Editor: EDAA/IEEE

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