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Sustainable tecHnologies enablIng Future Telecommunication applications

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Publications

Exploring Compact Modeling of SiGe HBTs in Sub-THz Range With HICUM

Author(s): S. R. Panda, T. Zimmer, A. Chakravorty, N. Derrier and S. Fregonese
Published in: IEEE Transactions on Electron Devices, 2024, ISSN 0018-9383
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/TED.2023.3321017

A SiGe BiCMOS D-Band LNA with Gain Boosted by Local Feedback in Common-Emitter Transistors

Author(s): Guglielmo De Filippi, Lorenzo Piotto, Andrea Bilato, Andrea Mazzanti
Published in: 2023
Publisher: 2023 IEEE Radio Frequency Integrated Circuits Symposium (RFIC)
DOI: 10.1109/RFIC54547.2023.10186168

Low-noise Si/SiGe HBT for LEO satellite user terminals in Ku-Ka bands

Author(s): A. Gauthier, E. Brezza, A. Montagné, N. Guitard, J. Azevedo Goncalves, M. Buczko, S. Jan, N. Derrier, D. Céli, C. Deglise-Favre, J. Ma, H. Audouin, F. Deprat, D. Ristoiu, L. Berthier, L. Clément, B. Grelaud, C. Rougier, P. Chevalier
Published in: 2023
Publisher: 2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)
DOI: 10.1109/BCICTS54660.2023.10310961

Low frequency noise study of X-ray irradiated Si/SiGe:C BiCMOS technology bipolar transistors

Author(s): A Adebabay Belie, J El Beyrouthy, Fabien Pascal, J Boch, T Maraine, M Bouhouche, Bruno Sagnes, S Haendler, P Chevalier, D Gloria
Published in: 2023
Publisher: 26th International Conference on Noise and Fluctuations

A 20mW 130-175GHz Phase Shifter with Meandered λ/2 TLINEs in BiCMOS 55nm

Author(s): Lorenzo Piotto, Guglielmo De Filippi, Andrea Bilato and Andrea Mazzanti
Published in: 2023
Publisher: IEEE 49th European Solid State Circuits Conference (ESSCIRC)
DOI: 10.1109/ESSCIRC59616.2023.10268727

A D-Band Low-Noise-Amplifier in SiGe BiCMOS with Broadband Multi-Resonance Matching Networks

Author(s): Guglielmo De Filippi, Lorenzo Piotto, Andrea Bilato, Andrea Mazzanti
Published in: 2023
Publisher: 2023 18th European Microwave Integrated Circuits Conference (EuMIC)
DOI: 10.23919/EuMIC58042.2023.10288669

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