Training and Innovation in Reliable and Efficient Chip Design for Edge AI

Project Information

TIRAMISU

Grant agreement ID: 101169378

DOI

10.3030/101169378

EC signature date 25 June 2024

Start date 1 September 2024

End date 31 August 2028

Funded under

• Marie Skłodowska-Curie Actions (MSCA)

Total cost

No data

EU contribution

€ 3 851 294,40

Coordinated by

TALLINNA TEHNIKAÜLIKOOL
Estonia

CORDIS provides links to public deliverables and publications of HORIZON projects.

Links to deliverables and publications from FP7 projects, as well as links to some specific result types such as dataset and software, are dynamically retrieved from OpenAIRE .

Publications

Conference proceedings (10)

A Novel Node- and Layout-Aware Radiation-Hardened 7 nm D Flip-Flop

Author(s): Cui, Aobo;Vacca, Eleonora;Azimi, Sarah;Sterpone, Luca
Published in: 2026 24th IEEE Interregional NEWCAS Conference (NEWCAS)
Publisher: IEEE

Development of a Radiation-Hardened Standard Cell Library in 7 nm FinFET Technology

Author(s): Cui, Aobo;Sarah,Azimi;Sterpone, Luca
Published in: 33rd IEEE International Conference on Electronics, Circuits and Systems (ICECS 2026)
Publisher: IEEE

A Novel Layout-Circuit Co-Design Framework for Radiation Hardening in Nanoscale Technology

Author(s): Aobo Cui, Eleonora Vacca, Luca Sterpone, Sarah Azimi
Published in: 2025 IEEE Nordic Circuits and Systems Conference (NorCAS), 2025
Publisher: IEEE
DOI: 10.1109/NORCAS66540.2025.11231286

An Edge AI Industrial Environment Supporting Reliability Assessment and Enhancement

Author(s): Gustavo Vilar de Farias;Celik Abdullah;Josie E. Rodriguez Condia;Matteo Sonza Reorda
Published in: IEEE International Conference on Omni-Layer Intelligent Systems (COINS), 2026
Publisher: IEEE

Towards ISO 26262-compliant Vector Processors: Combining STLs and LBIST

Author(s): Vilar de Farias,Gustavo;Abed,Sergiu-Mohamed;Guerrero-Balaguera,Juan-David;Rodriguez Condia, Josie Esteban;Sonza Reorda,Matteo
Published in: 2026 IFIP/IEEE 34th International Conference on Very Large Scale Integration SoC (VLSI-SoC), Limassol, Cyprus, 2026.
Publisher: IEEE

Analysis and Mitigation of Soft-errors in GPU-accelerated Hyperspectral Image Classifiers

Author(s): Abed, Sergiu Mohamed; RODRIGUEZ CONDIA, JOSIE ESTEBAN; Sonza Reorda, Matteo; Guerrero Balaguera, Juan David; De Lucia, Gianluca; Lapegna, Marco
Published in: 2025 IEEE 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2025
DOI: 10.5281/ZENODO.14563028

Analyzing hardware accelerators’ reliability: from design exploration to fast evaluation with hyperscalers

Author(s): Guerrero-Balaguera,Juan-David; Limas Sierra,Robert; Vilar de Farias,Gustavo; Abed,Sergiu-Mohamed; Bagbaba,Ahmet Cagri; Rodriguez Condia,Josie E.
Published in: 2026 IEEE 17th Latin America Symposium on Circuits and System (LASCAS), 2026, ISSN 2473-4667
Publisher: IEEE

Algorithm-based Fault Tolerance for RISC-V Vector Processors in Safety-critical AI Applications

Author(s): Sergiu-Mohamed Abed, Ahmet Cagri Bagbaba, Connie O’Shea, Josie E. Rodriguez Condia, Matteo Sonza Reorda
Published in: 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS), 2026
Publisher: IEEE
DOI: 10.1109/IOLTS69666.2026.11633611

A Flexible Framework for Vector Accelerators In-field Testing

Author(s): Gustavo Vilar de Farias, Josie E. Rodriguez Condia, Matteo Sonza Reorda
Published in: 2026 IEEE 44th VLSI Test Symposium (VTS), 2026
Publisher: IEEE
DOI: 10.1109/VTS69484.2026.11563325

Analysis and Mitigation of Soft-errors in GPU-accelerated Hyperspectral Image Classifiers

Author(s): Sergiu-Mohamed Abed, Juan-David Guerrero-Balaguera, Josie E. Rodriguez Condia, Gianluca De Lucia, Marco Lapegna, Matteo Sonza Reorda
Published in: 2025 IEEE 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2025
Publisher: IEEE
DOI: 10.1109/DDECS63720.2025.11006812

Peer reviewed articles (3)

Analyzing Hardware Accelerators' Reliability: From Design Exploration to Fast Evaluation with Hyperscalers

Author(s): Guerrero-Balaguera,Juan-David; Limas Sierra,Robert; Vilar de Farias,Gustavo; Abed,Sergiu-Mohamed; Bagbaba,Ahmet Cagri; Rodriguez Condia,Josie E.
Published in: 2026 IEEE 17th Latin America Symposium on Circuits and System (LASCAS), 2026, ISBN 979-8-3315-7097-2
Publisher: IEEE
DOI: 10.1109/LASCAS67804.2026.11457105

Industry Associations and Small-firm Innovation: The Strategy Tripod Perspective in Emerging Economies

Author(s): Xiangrui Zeng, Lianyong Xu, Ruiyu Liu, Christian Hopp, Alessandra Colombelli
Published in: IEEE Transactions on Engineering Management, 2025, ISSN 0018-9391
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
DOI: 10.1109/TEM.2025.3637144

European Test Symposium Teams: an Anniversary Snapshot

Author(s): Jenihhin, Maksim; Raik, Jaan; Jutman, Artur; Cherezova, Natalia; Ubar, Raimund; Miclea, Liviu; Enyedi, Szilard; Stefan, Iulia; Stan, Ovidiu; Corches, Cosmina; Peng, Zebo; Eles, Petru; Drechsler, Rolf; Eggersglüß, Stephan; Fey, Görschwin; Glowatz, Andreas; Tille, Daniel; Gielen, Georges; Coyette, Anthony; Dobbelaere, Wim; Vanhooren, Ronny; Chuang, Po-Yao; Marinissen, Erik Jan; Di Natale, Giorgio; Barragan, Manuel; Maistri, Paolo; Mir, Salvador; Vatajelu, Ioana; Bernardi, Paolo; Di Carlo, Stefano; Prinetto, Paolo; Sonza Reorda, Matteo; Violante, Massimo; Stratigopoulos, Haralampos; Michael, Maria K.; Neophytou, Stelios; Hadjitheophanous, Stavros; Christou, Kyriakos A.; Skitsas, Michael; Bosio, Alberto; Deveautour, Bastien; Girard, Patrick; Traiola, Marcello; Virazel, Arnaud; Fernandes dos Santos, Fernando; Kritikakou, Angeliki; Casagranda, Giulia; Vallero, Marzio; Vella, Flavio; Rech, Paolo; Bolzani Poehls, Letícia Maria; Krstic, Milos; Andjelkovic, Marko; Vargas, Fabian Luis; Tshagharyan, Grigor; Harutyunyan, Gurgen; Vardanian, Valery; Shoukourian, Samvel K.; Zorian, Yervant; Dworak, Jennifer; Nepal, Kundan; Manikas, Theodore; Taouil, Motta; Fieback, Moritz; Gebregiorgis, Anteneh; Bishnoi, Rajendra; Hamdioui, Said; Chatterjee, Abhijit; Saha, Anurup; Komarraju, Sri Gowri; Ma, Kwondo; Amarnath, Chandramouli; Tahoori, Mehdi B.; Mayahinia, Mahta; Rajabalipanah, Maryam; Basharkhah, Katayoon; Nosrati, Nooshin; Jahanpeima, Zahra; Navabi, Zainalabedin; Wunderlich, Hans-Joachim; Hellebrand, Sybille
Published in: 2025 IEEE European Test Symposium (ETS), 2025
Publisher: IEEE
DOI: 10.15480/882.15435