Training and Innovation in Reliable and Efficient Chip Design for Edge AI

Informations projet

TIRAMISU

N° de convention de subvention: 101169378

DOI

10.3030/101169378

Date de signature de la CE 25 Juin 2024

Date de début 1 Septembre 2024

Date de fin 31 Août 2028

Financé au titre de

• Marie Skłodowska-Curie Actions (MSCA)

Coût total

Aucune donnée

Contribution de l’UE

€ 3 851 294,40

Coordonné par

TALLINNA TEHNIKAÜLIKOOL
Estonia

CORDIS fournit des liens vers les livrables publics et les publications des projets HORIZON.

Les liens vers les livrables et les publications des projets du 7e PC, ainsi que les liens vers certains types de résultats spécifiques tels que les jeux de données et les logiciels, sont récupérés dynamiquement sur OpenAIRE .

Publications

Conference proceedings (10)

A Novel Node- and Layout-Aware Radiation-Hardened 7 nm D Flip-Flop

Auteurs: Cui, Aobo;Vacca, Eleonora;Azimi, Sarah;Sterpone, Luca
Publié dans: 2026 24th IEEE Interregional NEWCAS Conference (NEWCAS)
Éditeur: IEEE

Development of a Radiation-Hardened Standard Cell Library in 7 nm FinFET Technology

Auteurs: Cui, Aobo;Sarah,Azimi;Sterpone, Luca
Publié dans: 33rd IEEE International Conference on Electronics, Circuits and Systems (ICECS 2026)
Éditeur: IEEE

A Novel Layout-Circuit Co-Design Framework for Radiation Hardening in Nanoscale Technology

Auteurs: Aobo Cui, Eleonora Vacca, Luca Sterpone, Sarah Azimi
Publié dans: 2025 IEEE Nordic Circuits and Systems Conference (NorCAS), 2025
Éditeur: IEEE
DOI: 10.1109/NORCAS66540.2025.11231286

An Edge AI Industrial Environment Supporting Reliability Assessment and Enhancement

Auteurs: Gustavo Vilar de Farias;Celik Abdullah;Josie E. Rodriguez Condia;Matteo Sonza Reorda
Publié dans: IEEE International Conference on Omni-Layer Intelligent Systems (COINS), 2026
Éditeur: IEEE

Towards ISO 26262-compliant Vector Processors: Combining STLs and LBIST

Auteurs: Vilar de Farias,Gustavo;Abed,Sergiu-Mohamed;Guerrero-Balaguera,Juan-David;Rodriguez Condia, Josie Esteban;Sonza Reorda,Matteo
Publié dans: 2026 IFIP/IEEE 34th International Conference on Very Large Scale Integration SoC (VLSI-SoC), Limassol, Cyprus, 2026.
Éditeur: IEEE

Analysis and Mitigation of Soft-errors in GPU-accelerated Hyperspectral Image Classifiers

Auteurs: Abed, Sergiu Mohamed; RODRIGUEZ CONDIA, JOSIE ESTEBAN; Sonza Reorda, Matteo; Guerrero Balaguera, Juan David; De Lucia, Gianluca; Lapegna, Marco
Publié dans: 2025 IEEE 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2025
DOI: 10.5281/ZENODO.14563028

Analyzing hardware accelerators’ reliability: from design exploration to fast evaluation with hyperscalers

Auteurs: Guerrero-Balaguera,Juan-David; Limas Sierra,Robert; Vilar de Farias,Gustavo; Abed,Sergiu-Mohamed; Bagbaba,Ahmet Cagri; Rodriguez Condia,Josie E.
Publié dans: 2026 IEEE 17th Latin America Symposium on Circuits and System (LASCAS), 2026, ISSN 2473-4667
Éditeur: IEEE

Algorithm-based Fault Tolerance for RISC-V Vector Processors in Safety-critical AI Applications

Auteurs: Sergiu-Mohamed Abed, Ahmet Cagri Bagbaba, Connie O’Shea, Josie E. Rodriguez Condia, Matteo Sonza Reorda
Publié dans: 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS), 2026
Éditeur: IEEE
DOI: 10.1109/IOLTS69666.2026.11633611

A Flexible Framework for Vector Accelerators In-field Testing

Auteurs: Gustavo Vilar de Farias, Josie E. Rodriguez Condia, Matteo Sonza Reorda
Publié dans: 2026 IEEE 44th VLSI Test Symposium (VTS), 2026
Éditeur: IEEE
DOI: 10.1109/VTS69484.2026.11563325

Analysis and Mitigation of Soft-errors in GPU-accelerated Hyperspectral Image Classifiers

Auteurs: Sergiu-Mohamed Abed, Juan-David Guerrero-Balaguera, Josie E. Rodriguez Condia, Gianluca De Lucia, Marco Lapegna, Matteo Sonza Reorda
Publié dans: 2025 IEEE 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2025
Éditeur: IEEE
DOI: 10.1109/DDECS63720.2025.11006812

Peer reviewed articles (3)

Analyzing Hardware Accelerators' Reliability: From Design Exploration to Fast Evaluation with Hyperscalers

Auteurs: Guerrero-Balaguera,Juan-David; Limas Sierra,Robert; Vilar de Farias,Gustavo; Abed,Sergiu-Mohamed; Bagbaba,Ahmet Cagri; Rodriguez Condia,Josie E.
Publié dans: 2026 IEEE 17th Latin America Symposium on Circuits and System (LASCAS), 2026, ISBN 979-8-3315-7097-2
Éditeur: IEEE
DOI: 10.1109/LASCAS67804.2026.11457105

Industry Associations and Small-firm Innovation: The Strategy Tripod Perspective in Emerging Economies

Auteurs: Xiangrui Zeng, Lianyong Xu, Ruiyu Liu, Christian Hopp, Alessandra Colombelli
Publié dans: IEEE Transactions on Engineering Management, 2025, ISSN 0018-9391
Éditeur: Institute of Electrical and Electronics Engineers (IEEE)
DOI: 10.1109/TEM.2025.3637144

European Test Symposium Teams: an Anniversary Snapshot

Auteurs: Jenihhin, Maksim; Raik, Jaan; Jutman, Artur; Cherezova, Natalia; Ubar, Raimund; Miclea, Liviu; Enyedi, Szilard; Stefan, Iulia; Stan, Ovidiu; Corches, Cosmina; Peng, Zebo; Eles, Petru; Drechsler, Rolf; Eggersglüß, Stephan; Fey, Görschwin; Glowatz, Andreas; Tille, Daniel; Gielen, Georges; Coyette, Anthony; Dobbelaere, Wim; Vanhooren, Ronny; Chuang, Po-Yao; Marinissen, Erik Jan; Di Natale, Giorgio; Barragan, Manuel; Maistri, Paolo; Mir, Salvador; Vatajelu, Ioana; Bernardi, Paolo; Di Carlo, Stefano; Prinetto, Paolo; Sonza Reorda, Matteo; Violante, Massimo; Stratigopoulos, Haralampos; Michael, Maria K.; Neophytou, Stelios; Hadjitheophanous, Stavros; Christou, Kyriakos A.; Skitsas, Michael; Bosio, Alberto; Deveautour, Bastien; Girard, Patrick; Traiola, Marcello; Virazel, Arnaud; Fernandes dos Santos, Fernando; Kritikakou, Angeliki; Casagranda, Giulia; Vallero, Marzio; Vella, Flavio; Rech, Paolo; Bolzani Poehls, Letícia Maria; Krstic, Milos; Andjelkovic, Marko; Vargas, Fabian Luis; Tshagharyan, Grigor; Harutyunyan, Gurgen; Vardanian, Valery; Shoukourian, Samvel K.; Zorian, Yervant; Dworak, Jennifer; Nepal, Kundan; Manikas, Theodore; Taouil, Motta; Fieback, Moritz; Gebregiorgis, Anteneh; Bishnoi, Rajendra; Hamdioui, Said; Chatterjee, Abhijit; Saha, Anurup; Komarraju, Sri Gowri; Ma, Kwondo; Amarnath, Chandramouli; Tahoori, Mehdi B.; Mayahinia, Mahta; Rajabalipanah, Maryam; Basharkhah, Katayoon; Nosrati, Nooshin; Jahanpeima, Zahra; Navabi, Zainalabedin; Wunderlich, Hans-Joachim; Hellebrand, Sybille
Publié dans: 2025 IEEE European Test Symposium (ETS), 2025
Éditeur: IEEE
DOI: 10.15480/882.15435