Analyzing Hardware Accelerators' Reliability: From Design Exploration to Fast Evaluation with Hyperscalers
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Autori:
Guerrero-Balaguera,Juan-David; Limas Sierra,Robert; Vilar de Farias,Gustavo; Abed,Sergiu-Mohamed; Bagbaba,Ahmet Cagri; Rodriguez Condia,Josie E.
Pubblicato in:
2026 IEEE 17th Latin America Symposium on Circuits and System (LASCAS), 2026, ISBN 979-8-3315-7097-2
Editore:
IEEE
DOI:
10.1109/LASCAS67804.2026.11457105
Industry Associations and Small-firm Innovation: The Strategy Tripod Perspective in Emerging Economies
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Autori:
Xiangrui Zeng, Lianyong Xu, Ruiyu Liu, Christian Hopp, Alessandra Colombelli
Pubblicato in:
IEEE Transactions on Engineering Management, 2025, ISSN 0018-9391
Editore:
Institute of Electrical and Electronics Engineers (IEEE)
DOI:
10.1109/TEM.2025.3637144
European Test Symposium Teams: an Anniversary Snapshot
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Autori:
Jenihhin, Maksim; Raik, Jaan; Jutman, Artur; Cherezova, Natalia; Ubar, Raimund; Miclea, Liviu; Enyedi, Szilard; Stefan, Iulia; Stan, Ovidiu; Corches, Cosmina; Peng, Zebo; Eles, Petru; Drechsler, Rolf; Eggersglüß, Stephan; Fey, Görschwin; Glowatz, Andreas; Tille, Daniel; Gielen, Georges; Coyette, Anthony; Dobbelaere, Wim; Vanhooren, Ronny; Chuang, Po-Yao; Marinissen, Erik Jan; Di Natale, Giorgio; Barragan, Manuel; Maistri, Paolo; Mir, Salvador; Vatajelu, Ioana; Bernardi, Paolo; Di Carlo, Stefano; Prinetto, Paolo; Sonza Reorda, Matteo; Violante, Massimo; Stratigopoulos, Haralampos; Michael, Maria K.; Neophytou, Stelios; Hadjitheophanous, Stavros; Christou, Kyriakos A.; Skitsas, Michael; Bosio, Alberto; Deveautour, Bastien; Girard, Patrick; Traiola, Marcello; Virazel, Arnaud; Fernandes dos Santos, Fernando; Kritikakou, Angeliki; Casagranda, Giulia; Vallero, Marzio; Vella, Flavio; Rech, Paolo; Bolzani Poehls, Letícia Maria; Krstic, Milos; Andjelkovic, Marko; Vargas, Fabian Luis; Tshagharyan, Grigor; Harutyunyan, Gurgen; Vardanian, Valery; Shoukourian, Samvel K.; Zorian, Yervant; Dworak, Jennifer; Nepal, Kundan; Manikas, Theodore; Taouil, Motta; Fieback, Moritz; Gebregiorgis, Anteneh; Bishnoi, Rajendra; Hamdioui, Said; Chatterjee, Abhijit; Saha, Anurup; Komarraju, Sri Gowri; Ma, Kwondo; Amarnath, Chandramouli; Tahoori, Mehdi B.; Mayahinia, Mahta; Rajabalipanah, Maryam; Basharkhah, Katayoon; Nosrati, Nooshin; Jahanpeima, Zahra; Navabi, Zainalabedin; Wunderlich, Hans-Joachim; Hellebrand, Sybille
Pubblicato in:
2025 IEEE European Test Symposium (ETS), 2025
Editore:
IEEE
DOI:
10.15480/882.15435
