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Reliability study of fine-pitch area-array Pb-free solder joints for advanced electronic packaging effect of inter-metallic compounds

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The demand for Pb-free solders in a green environment and the increasing requirements to miniaturize electronic goods are the two most critical considerations in the global electronics market. Such a two-fold critical requirement possesses a reliability t hreat in the selection of proper materials and processes as a state-of-the-art requirement of the electronics industries. Although many studies of Pb-free soldering have been performed recently, most of them are related to Surface Mount Technology(SMT) com ponents. In the case of SMT components, although a good joint reliability has been shown in most Pb-free solder joints, similar reliability is not expected in the area-array solder joints used for the Flip Chip(FC) and Ball Grid Array(BGA) packages. These solder joints, because of their tiny contact area and the limited volume of solder alloy, operate under more stressed conditions during mechanical/thermal shock loading. In particular, intermetallic compound (IMC) formation during soldering and subsequent aging (at the time of device operation) as well as higher tensile strength and lower elongation to failure of Pb-free solder than conventional Sn-Pb solder is likely to lead to easy crack initiation and propagation along the solder-IMC interface, which is a serious concern for electronic packaging scientists and engineers at this moment. The key objectives of the proposed project are as follows: a. To develop a finite element model capturing microstructural characteristics of area-array Pb-free solder joi nts where IMC volume is relatively higher. b. To establish a theoretical model to predict the reliability of a Pb-free solder joint. c. To understand the failure mechanisms of tiny Pb-free solder joints with the variation of the IMC characteristics. Along with the mathematical modeling, an experimental study will also be conducted. In this project, the researcher will gain training in computational mechanics and the use of finite element technology.

Wissenschaftliches Gebiet (EuroSciVoc)

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Aufforderung zur Vorschlagseinreichung

FP6-2004-MOBILITY-7
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Finanzierungsplan

IIF - Marie Curie actions-Incoming International Fellowships

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UNIVERSITY OF GREENWICH
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Old Royal Naval College
GREENWICH, LONDON
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