Resultado final
•Program: Review of the R&D activities on stand-alone techniques of the first two 3DAM years •Authors: specialists of the 3DAM partner companies, academia and research institutes. •Timing: April 2018, right after the imec Partner Technical Week •Place: imec premises •Publication: => HD video recording of the lecturer, synchronized with a HD screen-recording of the presentation slides => PDF versions of the presentations will also be available => The result is a set of technical/scientific presentations open to the public, and on-line accessible on any device (laptop, tablet) through the Imec Academy streaming facilities •Participants: open to the public after registration at Imec Academy
Workshops year 1 and publication of presented material•Program: reviews of the 2016 state-of-the-art of metrology and characterization techniques relevant for 3DAM •Authors: specialists from the 3DAM partner companies. •Timing: April 2017, right after the imec Partner Technical Week •Place: imec premises •Publication: => HD video recording of the lecturer, synchronized with a HD screen-recording of the presentation slides => PDF versions of the presentations will also be available => The result is an e-learning package which can be used as a tutorial on HVM metrology, open to the public, and on-line accessible on any device (laptop, tablet) through the Imec Academy streaming facilities •Participants: open to the public after registration at Imec Academy
Workshops year 3 and publication of presented material•Program: Review of the hybrid/correlative techniques as from the results obtained during 3DAM •Authors: specialists from the 3DAM partner companies. •Timing: March 2019 •Place: MINATEC Grenoble •Publication: => PDF versions of the presentations will be available for the participant at the workshop •Participants: open to the public after registration
Publicaciones
Autores:
Steven Folkersma, Janusz Bogdanowicz, Andreas Schulze, Paola Favia, Dirch H Petersen, Ole Hansen, Henrik H Henrichsen, Peter F Nielsen, Lior Shiv, Wilfried Vandervorst
Publicado en:
Beilstein Journal of Nanotechnology, Edición 9, 2018, Página(s) 1863-1867, ISSN 2190-4286
Editor:
Beilstein-Institut Zur Forderung der Chemischen Wissenschaften
DOI:
10.3762/bjnano.9.178
Autores:
David M. A. Mackenzie, Patrick R. Whelan, Peter Bøggild, Peter Uhd Jepsen, Albert Redo-Sanchez, David Etayo, Norbert Fabricius, Dirch Hjorth Petersen
Publicado en:
Optics Express, Edición 26/7, 2018, Página(s) 9220, ISSN 1094-4087
Editor:
Optical Society of America
DOI:
10.1364/oe.26.009220
Autores:
David M. A. Mackenzie, Jonas D. Buron, Patrick R. Whelan, José M. Caridad, Martin Bjergfelt, Birong Luo, Abhay Shivayogimath, Anne L. Smitshuysen, Joachim D. Thomsen, Timothy J. Booth, Lene Gammelgaard, Johanna Zultak, Bjarke S. Jessen, Peter Bøggild, Dirch H. Petersen
Publicado en:
Nano Research, Edición 10/10, 2017, Página(s) 3596-3605, ISSN 1998-0124
Editor:
Tsinghua Univ Press
DOI:
10.1007/s12274-017-1570-y
Autores:
Alberto Cagliani, Frederik W. Østerberg, Ole Hansen, Lior Shiv, Peter F. Nielsen, Dirch H. Petersen
Publicado en:
Review of Scientific Instruments, Edición 88/9, 2017, Página(s) 095005, ISSN 0034-6748
Editor:
American Institute of Physics
DOI:
10.1063/1.4989994
Autores:
David M A Mackenzie, Vishal Panchal, Héctor Corte-León, Dirch H Petersen, Olga Kazakova
Publicado en:
2D Materials, Edición 6/2, 2019, Página(s) 025023, ISSN 2053-1583
Editor:
IOP Publishing Ltd
DOI:
10.1088/2053-1583/ab0572
Autores:
Patrick R. Whelan, Vishal Panchal, Dirch H. Petersen, David M. A. Mackenzie, Christos Melios, Iwona Pasternak, John Gallop, Frederik W. Østerberg, Peter U. Jepsen, Wlodek Strupinski, Olga Kazakova, Peter Bøggild
Publicado en:
ACS Applied Materials & Interfaces, Edición 10/37, 2018, Página(s) 31641-31647, ISSN 1944-8244
Editor:
American Chemical Society
DOI:
10.1021/acsami.8b11428
Autores:
T. Nuytten, J. Bogdanowicz, L. Witters, G. Eneman, T. Hantschel, A. Schulze, P. Favia, H. Bender, I. De Wolf, W. Vandervorst
Publicado en:
APL Materials, Edición 6/5, 2018, Página(s) 058501, ISSN 2166-532X
Editor:
APL Materials
DOI:
10.1063/1.4999277
Derechos de propiedad intelectual
Número de solicitud/publicación:
USPTO for US20180012728A1
Application for US20180012728A1
Fecha:
2018-01-11
Solicitante(s):
APPLIED MATERIALS ISRAEL LTD
Número de solicitud/publicación:
US
US 16/106,914
Fecha:
2018-08-21
Solicitante(s):
FEI ELECTRON OPTICS BV
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