3D Advanced Metrology and materials for advanced devices

Leistungen

Workshops year 2 and publication of presented material

•Program: Review of the R&D activities on stand-alone techniques of the first two 3DAM years •Authors: specialists of the 3DAM partner companies, academia and research institutes. •Timing: April 2018, right after the imec Partner Technical Week •Place: imec premises •Publication: => HD video recording of the lecturer, synchronized with a HD screen-recording of the presentation slides => PDF versions of the presentations will also be available => The result is a set of technical/scientific presentations open to the public, and on-line accessible on any device (laptop, tablet) through the Imec Academy streaming facilities •Participants: open to the public after registration at Imec Academy

Workshops year 1 and publication of presented material

•Program: reviews of the 2016 state-of-the-art of metrology and characterization techniques relevant for 3DAM •Authors: specialists from the 3DAM partner companies. •Timing: April 2017, right after the imec Partner Technical Week •Place: imec premises •Publication: => HD video recording of the lecturer, synchronized with a HD screen-recording of the presentation slides => PDF versions of the presentations will also be available => The result is an e-learning package which can be used as a tutorial on HVM metrology, open to the public, and on-line accessible on any device (laptop, tablet) through the Imec Academy streaming facilities •Participants: open to the public after registration at Imec Academy

Workshops year 3 and publication of presented material

•Program: Review of the hybrid/correlative techniques as from the results obtained during 3DAM •Authors: specialists from the 3DAM partner companies. •Timing: March 2019 •Place: MINATEC Grenoble •Publication: => PDF versions of the presentations will be available for the participant at the workshop •Participants: open to the public after registration

Veröffentlichungen

Electrical characterization of single nanometer-wide Si fins in dense arrays

Autoren: Steven Folkersma, Janusz Bogdanowicz, Andreas Schulze, Paola Favia, Dirch H Petersen, Ole Hansen, Henrik H Henrichsen, Peter F Nielsen, Lior Shiv, Wilfried Vandervorst
Veröffentlicht in: Beilstein Journal of Nanotechnology, Ausgabe 9, 2018, Seite(n) 1863-1867, ISSN 2190-4286
Herausgeber: Beilstein-Institut Zur Forderung der Chemischen Wissenschaften
DOI: 10.3762/bjnano.9.178

Quality assessment of terahertz time-domain spectroscopy transmission and reflection modes for graphene conductivity mapping

Autoren: David M. A. Mackenzie, Patrick R. Whelan, Peter Bøggild, Peter Uhd Jepsen, Albert Redo-Sanchez, David Etayo, Norbert Fabricius, Dirch Hjorth Petersen
Veröffentlicht in: Optics Express, Ausgabe 26/7, 2018, Seite(n) 9220, ISSN 1094-4087
Herausgeber: Optical Society of America
DOI: 10.1364/oe.26.009220

Quality assessment of graphene: Continuity, uniformity, and accuracy of mobility measurements

Autoren: David M. A. Mackenzie, Jonas D. Buron, Patrick R. Whelan, José M. Caridad, Martin Bjergfelt, Birong Luo, Abhay Shivayogimath, Anne L. Smitshuysen, Joachim D. Thomsen, Timothy J. Booth, Lene Gammelgaard, Johanna Zultak, Bjarke S. Jessen, Peter Bøggild, Dirch H. Petersen
Veröffentlicht in: Nano Research, Ausgabe 10/10, 2017, Seite(n) 3596-3605, ISSN 1998-0124
Herausgeber: Tsinghua Univ Press
DOI: 10.1007/s12274-017-1570-y

Breakthrough in current-in-plane tunneling measurement precision by application of multi-variable fitting algorithm

Autoren: Alberto Cagliani, Frederik W. Østerberg, Ole Hansen, Lior Shiv, Peter F. Nielsen, Dirch H. Petersen
Veröffentlicht in: Review of Scientific Instruments, Ausgabe 88/9, 2017, Seite(n) 095005, ISSN 0034-6748
Herausgeber: American Institute of Physics
DOI: 10.1063/1.4989994

Qualitative analysis of scanning gate microscopy on epitaxial graphene

Autoren: David M A Mackenzie, Vishal Panchal, Héctor Corte-León, Dirch H Petersen, Olga Kazakova
Veröffentlicht in: 2D Materials, Ausgabe 6/2, 2019, Seite(n) 025023, ISSN 2053-1583
Herausgeber: IOP Publishing Ltd
DOI: 10.1088/2053-1583/ab0572

Electrical Homogeneity Mapping of Epitaxial Graphene on Silicon Carbide

Autoren: Patrick R. Whelan, Vishal Panchal, Dirch H. Petersen, David M. A. Mackenzie, Christos Melios, Iwona Pasternak, John Gallop, Frederik W. Østerberg, Peter U. Jepsen, Wlodek Strupinski, Olga Kazakova, Peter Bøggild
Veröffentlicht in: ACS Applied Materials & Interfaces, Ausgabe 10/37, 2018, Seite(n) 31641-31647, ISSN 1944-8244
Herausgeber: American Chemical Society
DOI: 10.1021/acsami.8b11428

Anisotropic stress in narrow sGe fin field-effect transistor channels measured using nano-focused Raman spectroscopy

Autoren: T. Nuytten, J. Bogdanowicz, L. Witters, G. Eneman, T. Hantschel, A. Schulze, P. Favia, H. Bender, I. De Wolf, W. Vandervorst
Veröffentlicht in: APL Materials, Ausgabe 6/5, 2018, Seite(n) 058501, ISSN 2166-532X
Herausgeber: APL Materials
DOI: 10.1063/1.4999277

Rechte des geistigen Eigentums

Multi mode system with a dispersion x-ray detector

Antrags-/Publikationsnummer: USPTO for US20180012728A1 Application for US20180012728A1
Datum: 2018-01-11
Antragsteller: APPLIED MATERIALS ISRAEL LTD

Xray shielding with improved vacuum conductivity

Antrags-/Publikationsnummer: US US 16/106,914
Datum: 2018-08-21
Antragsteller: FEI ELECTRON OPTICS BV

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Veröffentlichungen

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