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Technology Advances and Key Enablers for Module Integration for 5 nm

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Publications

Electrostatically actuated probes for Scanning Sub-surface Ultrasonic Resonance Frequency Microscopy

Author(s): Maarten. H. van Es, Martijn van Riel, Tom Duivenvoorde, Hamed Sadeghian
Published in: 3rd ERP 3D Nanomanufacturing Dissemination Event Proceedings, Issue 06-11-2017, 2017

Frequency Modulation Subsurface Ultrasonic Force Microscopy

Author(s): Maarten. H. van Es, Hamed Sadeghian
Published in: 3rd ERP 3D Nanomanufacturing Dissemination Event Proceedings, Issue 06-11-2017, 2017

EUV for HVM: towards an industrialized scanner for HVM NXE3400B performance update

Author(s): Mark A. van de Kerkhof, Arthur W. E. Minnaert, Marco Pieters, Hans Meiling, Joost Smits, Rudy Peeters, Roderik van Es, Geert Fisser, Jos W. de Klerk, Roel Moors, Eric Verhoeven, Leon Levasier
Published in: Extreme Ultraviolet (EUV) Lithography IX, Issue 2018, 2018, Page(s) 13
DOI: 10.1117/12.2299503

The future of EUV lithography: continuing Moore's Law into the next decade

Author(s): Jan van Schoot, Kars Troost, Frank Bornebroek, Rob van Ballegoij, Sjoerd Lok, Peter Krabbendam, Judon Stoeldraijer, Jos Benschop, Jo Finders, Hans Meiling, Eelco van Setten, Bernhard Kneer, Peter Kuerz, Winfried Kaiser, Tilmann Heil, Sascha Migura
Published in: Extreme Ultraviolet (EUV) Lithography IX, Issue 2018, 2018, Page(s) 23
DOI: 10.1117/12.2295800

EUV lithography industrialization progress

Author(s): Roderik van Es, Mark van de Kerkhof, Leon Levasier, Rudy Peeters, Hans Jasper
Published in: International Conference on Extreme Ultraviolet Lithography 2017, Issue 2017, 2017, Page(s) 2
DOI: 10.1117/12.2281184

High-NA EUV lithography: The next step in EUV imaging (Conference Presentation)

Author(s): Eelco van Setten, John McNamara, Jan van Schoot, Gerardo Bottiglieri, Kars Troost, Timon Fliervoet, Stephen Hsu, Jörg Zimmermann, Jens-Timo Neumann, Matthias Rösch, Paul Graeupner
Published in: International Conference on Extreme Ultraviolet Lithography 2018, Issue 2018, 2018, Page(s) 34
DOI: 10.1117/12.2502149

High NA EUV lithography: Next step in EUV imaging

Author(s): Eelco van Setten, Gerardo Bottiglieri, John McNamara, Jan van Schoot, Kars Troost, Joseph Zekry, Timon Fliervoet, Stephen Hsu, Joerg Zimmermann, Matthias Roesch, Bartosz Bilski, Paul Graeupner
Published in: Extreme Ultraviolet (EUV) Lithography X, Issue 2019, 2019, Page(s) 5
DOI: 10.1117/12.2514952

High-NA EUV lithography exposure tool progress

Author(s): Jan van Schoot, Eelco van Setten, Kars Troost, Frank Bornebroek, Rob van Ballegoij, Sjoerd Lok, Judon Stoeldraijer, Jo Finders, Paul Graeupner, Joerg Zimmermann, Peter Kuerz, Marco Pieters, Winfried Kaiser
Published in: Extreme Ultraviolet (EUV) Lithography X, Issue 2019, 2019, Page(s) 3
DOI: 10.1117/12.2515205

High-NA EUV lithography exposure tool progress (Conference Presentation)

Author(s): Jan van Schoot, Eelco van Setten, Kars Troost, Frank Bornebroek, Rob van Ballegoij, Sjoerd Lok, Judon Stoeldraijer, Jo Finders, Hans Meiling, Paul Graeupner, Peter Kuerz, Winfried Kaiser, Erik Loopstra, Bernhard Kneer, Sascha Migura
Published in: International Conference on Extreme Ultraviolet Lithography 2018, Issue 2018, 2018, Page(s) 33
DOI: 10.1117/12.2502894

Reduction in overlay error from mark asymmetry using simulation and alignment models

Author(s): Boris Menchtchikov, Robert Socha, Chumeng Zheng, Sudharshanan Raghunathan, Leendertjan Karssemeijer, Irina Lyulina, Jonathan Lee, Igor Aarts, Krishanu Shome, Chris de Ruiter, Manouk Rijpstra, Henry Megens, Ralph Brinkhof, Floris Teeuwisse, Chung-Tien Li, Jan Hermans, Philippe Leray
Published in: Optical Microlithography XXXI, Issue 2018, 2018, Page(s) 11
DOI: 10.1117/12.2297493

Cross-platform (NXE-NXT) machine-to-machine overlay matching supporting next node chip manufacturing

Author(s): Ting-Ju Yueh, Miao-Chi Chen, Hsueh-Hung Wu, Shin-Rung Peng, Chun-Kuang Chen, L. J. Chen, John Lin, Kevin Cheng, Alexander Padi, Cathy Wang, Jean Phillippe van Damme, Theo Thijssen, Marcel Beckers, Albert Mollema, Leon Levasier, Jason Hung, Amy Chen, Floris Teeuwisse, Robin Tijssen, Marcel Mastenbroek, Harald Vos, Wilson Tzeng, Laurens van Bokhoven, Niels Lammers
Published in: Optical Microlithography XXXI, Issue 2018, 2018, Page(s) 8
DOI: 10.1117/12.2297387

Holistic feedforward control for the 5 nm logic node and beyond

Author(s): Henry Megens, Ralph Brinkhof, Igor Aarts, Haico Kok, Leendertjan Karssemeijer, Gijs ten Haaf, Shawn Lee, Daan Slotboom, Chris de Ruiter, Irina Lyulina, Simon Huisman, Stefan Keij, Evert Mos, Wim Tel, Manouk Rijpstra, Emil Schmitt-Weaver, Kaustuve Bhattacharyya, Robert Socha, Boris Menchtchikov, Michael Kubis, Jan Mulkens
Published in: Optical Microlithography XXXII, Issue 2019, 2019, Page(s) 18
DOI: 10.1117/12.2515449

Advanced Processing for Quantitative Sub-surface Data Extraction (poster presentation)

Author(s): Laurent Fillinger, Mehmet S. Tamer, Maarten H. v. Es, Marco v.d.Lans
Published in: Semicon Innovation Day 2019, Issue 21-05-2019, 2019

Frequency Modulation Sub-surface Atomic Force Microscopy (poster presentation)

Author(s): Aliasghar Keyvani, Mehmet S. Tamer, Maarten H. v. Es, Marco v.d.Lans
Published in: Semicon Innovation Day 2019, Issue 21-05-2019, 2019

High Resolution SubSurface Probe Microscopy for node5 applications

Author(s): Maarten H. van Es, Laurent Fillinger, Mehmet S. Tamer, Marco van der Lans
Published in: Semicon Innovation Day 2019, Issue 21-05-2019, 2019

Sub-surface Imaging with Photo Thermal Actuation(poster presentation)

Author(s): Maarten E. v. Reijzen, Mehmet S. Tamer, Maarten H. v. Es, Martijn v. Riel, Tom Duivenvoorde Aliasghar Keyvani, Hamed Sadeghian, Marco v.d. Lans
Published in: Semicon Innovation Day 2019, Issue 21-05-2019, 2019

Quantitative tomography with subsurface scanning ultrasound resonance force microscopy

Author(s): Maarten H. van Es, Laurent Fillinger, Hamed Sadeghian
Published in: Metrology, Inspection, and Process Control for Microlithography XXXIII, 2019, Page(s) 20
DOI: 10.1117/12.2515048

Improved sub-surface AFM using photothermal actuation

Author(s): Maarten E. van Reijzen, Mehmet S. Tamer, Maarten H. van Es, Martijn M. C. J. M. van Riel, Sasan Keyvani, Hamed Sadeghian, Marco van der Lans
Published in: Metrology, Inspection, and Process Control for Microlithography XXXIII, Issue 2 July 2019, 2019, Page(s) 19
DOI: 10.1117/12.2515441

High-NA EUV imaging: challenges and outlook

Author(s): Bartosz Bilski, Joerg Zimmermann, Matthias Roesch, Jack Liddle, Eelco van Setten, Gerardo Bottiglieri, Jan van Schoot
Published in: 35th European Mask and Lithography Conference (EMLC 2019), Issue 2019, 2019, Page(s) 42
DOI: 10.1117/12.2536329

High-NA EUV Lithography exposure tool: program progress and mask impact (Conference Presentation)

Author(s): Jan Van Schoot, Eelco van Setten, Kars Troost, Sjoerd Lok, Judon Stoeldraijer, Rudy Peeters, Jos Benschop, Joerg Zimmermann, Paul Graeupner, Peter Kuerz, Winfried Kaiser
Published in: International Conference on Extreme Ultraviolet Lithography 2019, Issue 2019, 2019, Page(s) 34
DOI: 10.1117/12.2538325

High-NA EUV lithography: pushing the limits

Author(s): Claus Zahlten, P. Gräupner, Jan van Schoot, Peter Kuerz, J. Stoeldraijer, Winfried Kaiser
Published in: 35th European Mask and Lithography Conference (EMLC 2019), Issue 2019, 2019, Page(s) 43
DOI: 10.1117/12.2536469

Advancing EUV lithography optics (Conference Presentation)

Author(s): Heiko Feldmann, Olaf Conradi, Paul Graeupner, Jan van Schoot, Peter Kuerz, Winfried Kaiser
Published in: International Conference on Extreme Ultraviolet Lithography 2019, Issue 2019, 2019, Page(s) 2
DOI: 10.1117/12.2538927

High-NA EUV Optics – The key for miniaturization of integrated circuits in the next decade

Author(s): Heiko Feldmann, Paul Graupner, Peter Kurz, Winfried Kaiser
Published in: ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC), Issue 2019, 2019, Page(s) 61-63
DOI: 10.1109/essderc.2019.8901696

Pushing limits of optical lithography: Status and future perspectives of EUVL optics

Author(s): Lars Wischmeier
Published in: "17th Workshop ""Beams and More"", Suttgart, 2019", Issue 2019, 2019

Process window discovery methodology for extreme ultraviolet (EUV) lithography

Author(s): Sandip Halder, Dieter Van den Heuvel, Stephane Lariviere, Philippe Leray, Kaushik Sah, Andrew Cross, Antonio Mani
Published in: Metrology, Inspection, and Process Control for Microlithography XXXIII, Issue 2019, 2019, Page(s) 65
DOI: 10.1117/12.2515805

Heavily Ce 3+ -doped Y 3 Al 5 O 12 thin films deposited by a polymer sol–gel method for fast scintillation detectors

Author(s): Kateřina Rubešová, Jan Havlíček, Vít Jakeš, Ladislav Nádherný, Jakub Cajzl, Dalibor Pánek, Tomáš Parkman, Alena Beitlerova, Romana Kučerková, František Hájek, Martin Nikl
Published in: CrystEngComm, Issue 21/34, 2019, Page(s) 5115-5123, ISSN 1466-8033
DOI: 10.1039/c9ce00842j

Inspection of stochastic defects with broadband plasma optical systems for extreme ultraviolet (EUV) lithography

Author(s): Kaushik Sah, Sandip Halder, Andrew Cross, Philippe Leray
Published in: IEEE Transactions on Semiconductor Manufacturing, 2020, Page(s) 1-1, ISSN 0894-6507
DOI: 10.1109/tsm.2019.2963483

Chapter 5: Optical Systems for EUVL

Author(s): S. Migura, W. Kaiser, J.T. Neumann, H. Enkisch, D. Hellweg
Published in: EUV Lithography, 2nd Edition, Issue 2018, 2018, Page(s) 225-333