Embedded storage elements on next MCU generation ready for AI on the edge

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Publicaciones

Status and challenges of in-memory computing for neural accelerators

Autores: D. Ielmini, N. Lepri, P. Mannocci and A. Glukhov
Publicado en: 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (2022), 2022
Editor: IEEE
DOI: 10.1109/vlsi-tsa54299.2022.9770972

Integration of BEoL compatible 1T-1C FeFET memory cells into an established technology

Autores: David Lehninger; Hannes Mähne; Tarek Ali; Raik Hoffmann; Ricardo Olivo; Maximilian Lederer; Konstantin Mertens; Thomas Kämpfe, Kati Biedermann, Matthias Landwehr, Andreas Heinig,Defu Wang, Yukai Shen, Kerstin Bernert, Steffen Thiem, Konrad Seidel
Publicado en: 2022 IEEE International Memory Workshop (IMW), 2022
Editor: IEEE
DOI: 10.1109/imw52921.2022.9779252

Mitigating read-program variation and IR drop by circuit architecture in RRAM-based neural network accelerators

Autores: N. Lepri, A. Glukhov and D. Ielmini
Publicado en: 2022 IEEE International Reliability Physics Symposium (IRPS) 3C2-1-3C2-6 (2022), 2022
Editor: IEEE
DOI: 10.1109/irps48227.2022.9764486

Channel-wise Mixed-precision Assignment for DNN Inference on Constrained Edge Nodes

Autores: Matteo Risso, Alessio Burrello, Luca Benini, Enrico Macii, Massimo Poncino and Daniele Jahier Pagliari
Publicado en: Proceedings of the 2022 IEEE 13th International Green and Sustainable Computing Conference (IGSC), 2022
Editor: IEEE
DOI: 10.1109/igsc55832.2022.9969373

Privacy-preserving Social Distance Monitoring on Microcontrollers with Low-Resolution Infrared Sensors and CNNs

Autores: Chen Xie, Francesco Daghero, Yukai Chen∗, Marco Castellano, Luca Gandol, Andrea Calimera, Enrico Macii, Massimo Poncino, Daniele Jahier Pagliari
Publicado en: 2022 IEEE International Symposium on Circuits and Systems (ISCAS), 2022
Editor: IEEE
DOI: 10.48550/arxiv.2204.10541

Ferroelectric HfO2/ZrO2 Superlattices with Improved Leakage at Bias and Temperature Stress

Autores: David Lehninger, Ayse S¨unb¨ul, Ricardo Olivo, Thomas K¨ampfe, Konrad Seidel, Maximilian Lederer
Publicado en: 2023 IEEE International Memory Workshop (IMW), 2023
Editor: IEEE
DOI: 10.1109/imw56887.2023.10145927

End-to-end modelling of variability-aware neural networks based on resistive-switching memory arrays

Autores: A. Glukhov, N. Lepri, V. Milo, A. Baroni, C. Zambelli, P. Olivo, E. Pérez, C. Wenger and D. Ielmini
Publicado en: 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC), 2022, pp. 1-5, 2022
Editor: IEEE
DOI: 10.1109/vlsi-soc54400.2022.9939653

A Ferroelectric BEoL Module: Adding Non-Volatile Memories and Varactors to Existing Technology Nodes

Autores: Konrad Seidel, David Lehninger, Sukhrob Abdulazhanov, Ayse Sünbül, Raik Hoffmann, Katrin Zimmermann, Nandakishor Yadav, Quang Huy Le, Matthias Landwehr, Andreas Heinig, Hannes Mähne, Kerstin Bernert, Steffen Thiem, Thomas Kämpfe, Maximilian Lederer
Publicado en: 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM), Dresden, Germany, 2023, pp. 1-3, 2023
Editor: IEEE
DOI: 10.1109/iitc/mam57687.2023.10154868

Hafnium oxide-based Ferroelectric Memories: Are we ready for Application?

Autores: Konrad Seidel, David Lehninger, Franz Müller, Yannick Raffel, Ayse Sünbül, Ricardo Revello, Raik Hoffmann Sourav De, Thomas Kämpfe, Maximilian Lederer
Publicado en: 2023 IEEE International Memory Workshop (IMW, 2023
Editor: IEEE
DOI: 10.1109/imw56887.2023.10145945

Energy-efficient and Privacy-aware Social Distance Monitoring with Low-resolution Infrared Sensors and Adaptive Inference

Autores: Chen Xie, Daniele Jahier Pagliari, Andrea Calimera
Publicado en: 2022 17th Conference on Ph.D Research in Microelectronics and Electronics (PRIME), 2022
Editor: IEEE
DOI: 10.1109/prime55000.2022.9816801

An embedded PCM Peripheral Unit adding Analog MAC In-Memory Computing Feature addressing Non-linearity and Time Drift Compensation

Autores: Alessio Antolini, Andrea Lico, Eleonora Franchi Scarselli, Antonio Gnudi, Luca Perilli, Mattia Luigi Torres, Marcella Carissimi, Marco Pasotti, Roberto Antonio Canegallo
Publicado en: ESSCIRC 2022: IEEE 48th European Solid-State Circuits Conference, 2022
Editor: IEEE
DOI: 10.1109/esscirc55480.2022.9911447

Statistical model of program/verify algorithms in resistive-switching memories for in-memory neural network accelerators

Autores: A. Glukhov, V. Milo, A. Baroni, N. Lepri, C. Zambelli, P. Olivo, E. Perez, C. Wenger and D. Ielmini
Publicado en: 2022 IEEE International Reliability Physics Symposium (IRPS) 3C3-1-3C3-7 (2022)., 2022
Editor: IEEE
DOI: 10.1109/irps48227.2022.9764497

Conductive Filament Stabilization in Oxygen Engineered Hafnium and Yttrium Oxide‐based RRAM Devices Revealed by Low‐frequency Noise Studies

Autores: E. Piros, M. Lonsky, S. Petzold, A. Zintler, N. Kaiser, T. Vogel, R. Eilhardt, S. U. Sharath, E. Jalaguier, E. Nolot, C. Charpin-Nicolle, C. Wenger, L. Molina-Luna, J. Müller and L. Alff
Publicado en: 4th International Conference on Memristive Materials, Devices & Systems (Memrisys) 2021, 2021
Editor: Memrisys

Measurement-based Channel Characterization for A2A and A2G Wireless Drone Communication Systems

Autores: U. Erdemir, B. Kaplan, I. Hökelek, A. Görçin, H. A. Çırpan
Publicado en: IEEE VTC 2023 Spring, 2023
Editor: IEEE
DOI: 10.48550/arxiv.2306.08474

Measurement-based Characterization of Physical Layer Security for RIS-assisted Wireless Systems

Autores: S. Keşir, S. Kayraklık, I. Hökelek, A. E. Pusane, E. Başar, A. Görçin
Publicado en: IEEE VTC 2023 Spring, 2023
Editor: IEEE
DOI: 10.48550/arxiv.2212.07254

Memory Array Demonstration of fully integrated 1T-1C FeFET concept with separated ferroelectric MFM device in interconnect layer

Autores: Konrad Seidel; David Lehninger; Raik Hoffmann; Tarek Ali; Maximilian Lederer; Ricardo Revello; Konstantin Mertens; Kati Biedermann; Yukai Shen Defu Wang,Matthias Landwehr, Andreas Heinig, Thomas Kämpfe, Hannes Mähne, Kerstin Bernert, Steffen Thiem,
Publicado en: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2022
Editor: IEEE
DOI: 10.1109/vlsitechnologyandcir46769.2022.9830141

Multilayer Structure in SeAsGeSi-based OTS for High Thermal Stability and Reliability Enhancement

Autores: C. Laguna, M. Bernard, J. Garrione, N. Castellani, V. Meli, S. Martin, F. Aussenac, D. Rouchon, N. Rochat, E. Nolot, G. Bourgeois, M. C. Cyrille, L. Militaru, A. Souifi, F. Andrieu and G. Navarro
Publicado en: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC), 2022
Editor: IEEE
DOI: 10.1109/essderc55479.2022.9947186

Phase-change memory cells characterization in an analog in-memory computing perspective

Autores: Alessio Antolini , Andrea Lico, Eleonora Franchi Scarselli, Marcella Carissimi, Marco Pasotti
Publicado en: 2022 17th Conference on Ph.D Research in Microelectronics and Electronics (PRIME), 2022
Editor: IEEE xplore
DOI: 10.1109/prime55000.2022.9816788

Vers une éthique processuelle de l'IA

Autores: Eric Pardoux, Louis Devillaine
Publicado en: Conférence Nationale en Intelligence Artificielle 2022 (CNIA 2022), 2022
Editor: Conférence Nationale en Intelligence Artificielle

Enhanced Thermal Confinement in Phase-Change Memory Targeting Current Reduction

Autores: C. De Camaret, G. Bourgeois, O. Cueto, V. Meli, S. Martin, D. Despois, V. Beugin, N. Castellani, M.C. Cyrille, F. Andrieu, J. Arcamone, Y. Le-Friec and G. Navarro
Publicado en: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC), 2022
Editor: IEEE
DOI: 10.1109/essderc55479.2022.9947190

Indoor Coverage Enhancement for RIS-Assisted Communication Systems: Practical Measurements and Efficient Grouping

Autores: S. Kayraklık, I. Yıldırım, Y. Gevez, E. Başar, A. Görçin
Publicado en: IEEE ICC 2023, 2023
Editor: IEEE
DOI: 10.48550/arxiv.2211.07188

Compressed sensing by phase change memories: Coping with encoder non-linearities

Autores: Paolino Carmine, Antolini Alessio, Pareschi Fabio, Mangia Mauro, Rovatti Riccardo, Franchi Scarselli Eleonora, Gnudi Antonio, Setti Gianluca, Canegallo Roberto, Carissimi Marcella, Pasotti Marco
Publicado en: 2021 IEEE International Symposium on Circuits and Systems (ISCAS), 2021, ISSN 2158-1525
Editor: IEEE
DOI: 10.1109/iscas51556.2021.9401176

TiTe/Ge2Sb2Te5 Bi-layer-based Phase-Change Memory Targeting Storage Class Memory

Autores: G. Lama, M. Bernard, J. Garrione, N. Castellani, G. Bourgeois, M.C. Cyrille, F. Andrieu and G. Navarro
Publicado en: 2022
Editor: IEEE
DOI: 10.1109/essderc55479.2022.9947157

Study of Nanosecond Laser Annealing on Silicon Doped Hafnium Oxide Film Crystallization and Capacitor Reliability

Autores: T. Ali; R. Olivo; S. Kerdilès; D. Lehninger; M. Lederer; D. Sourav; A-S. Royet; A. Sünbül; A. Prabhu; K. Kühnel; M. Czernohorsky, M. Rudolph; R. Hoffmann; C. Charpin-Nicolle; L. Grenouillet; T. Kämpfe; K. Seidel
Publicado en: 2022 IEEE International Memory Workshop (IMW), 2022, pp. 1-4,, 2022
Editor: IEEE Xplore
DOI: 10.1109/imw52921.2022.9779281

An embedded PCM Peripheral Unit adding Analog MAC In-Memory Computing Features addressing Non-linearity and Time Drift Compensation

Autores: Alessio Antolini (IUNET-UNIBO) , Andrea Lico (IUNET-UNIBO), Eleonora Franchi Scarselli (IUNET-UNIBO), Antonio Gnudi (IUNET-UNIBO), Luca Perilli (IUNET-UNIBO), Marcella Carissimi (ST-I), Marco Pasotti (ST-I) and Roberto Antonio Canegallo (ST-I)
Publicado en: ESSCIRC 2022 - https://www.esscirc-essderc2022.org/, 2022
Editor: ESSCIRC

Feature Attention Based Blind Denoising Network for mmWave Beamspace Channel Estimation

Autores: Erhan Karakoca, Hasan Nayir,Ali Görçin, Khalid Qaraqe
Publicado en: 2022 IEEE Globecom Workshops (GC Wkshps): Workshop on Emerging Topics in 6G Communications-page 1555-1560, 2022
Editor: IEEE
DOI: 10.1109/gcwkshps56602.2022.10008723

RSS-Based Wireless LAN Indoor Localization and Tracking Using Deep Architectures

Autores: Muhammed Zahid Karakusak ,Hasan Kivrak,Hasan Fehmi Ates, Mehmet Kemal Ozdemir
Publicado en: Big Data Cogn. Comput 2022, 6(3), 84, 2022, ISSN 2504-2289
Editor: MDPI
DOI: 10.3390/bdcc6030084

Efficient Deep Learning Models for Privacy-preserving People Counting on Low-resolution Infrared Arrays

Autores: Chen Xie, Francesco Daghero, Yukai Chen, Marco Castellano, Luca Gandolfi, Andrea Calimera, Enrico Macii, Massimo Poncino, Daniele Jahier Pagliari
Publicado en: IEEE Internet of Things Journal, 2023, ISSN 2327-4662
Editor: Institute of Electrical and Electronics Engineers Inc.
DOI: 10.1109/jiot.2023.3263290

2022 Roadmap on Neuromorphic Computing and Engineering

Autores: Dennis V Christensen, Regina Dittmann, Bernabe Linares-Barranco, Abu Sebastian, Manuel Le Gallo, Andrea Redaelli, Stefan Slesazeck, Thomas Mikolajick, Sabina Spiga, Stephan Menzel, Ilia Valov, Gianluca Milano, Carlo Ricciardi, Shi-Jun Liang, Feng Miao, Mario Lanza, Tyler J Quill, Scott T Keene, Alberto Salleo, Julie Grollier, Danijela Marković, Alice Mizrahi, Peng Yao, J Joshua Yang, Giacomo Indi
Publicado en: Neuromorph. Comput. Eng. 2 022501, 2022, ISSN 2634-4386
Editor: IOP Publishing Ltd
DOI: 10.1088/2634-4386/ac4a83

Defect-Stabilized Substoichiometric Polymorphs of Hafnium Oxide with Semiconducting Properties

Autores: Nico Kaiser; Tobias Vogel; Alexander Zintler; Stefan Petzold; Alexey Arzumanov; Eszter Piros; Robert Eilhardt; Leopoldo Molina-Luna; Lambert Alff
Publicado en: Crossref, Edición 19448244, 2021, ISSN 1944-8244
Editor: American Chemical Society
DOI: 10.1021/acsami.1c09451

Enhanced Conductivity and Microstructure in Highly Textured TiN1−x/c‑Al2O3 Thin Films

Autores: Alexander Zintler, Robert Eilhardt, Stefan Petzold, Sankaramangalam Ulhas Sharath, Enrico Bruder, Nico Kaiser, Lambert Alff, and Leopoldo Molina-Luna
Publicado en: ACS Omega 2022, 7, 2041−2048, Edición 24701343, 2022, ISSN 2470-1343
Editor: American Chemical Society
DOI: 10.1021/acsomega.1c05505

Ferroelectric FETs With Separated Capacitor in the Back-End-of-Line: Role of the Capacitance Ratio

Autores: David Lehninger, Raik Hoffmann; Ayse Sünbül; Hannes Mähne; Thomas Kämpfe; Kerstin Bernert; Steffen Thiem; Konrad Seidel
Publicado en: IEEE Electron Device Letters ( Volume: 43, Edición: 11, November 2022), 2022, ISSN 1558-0563
Editor: IEEE
DOI: 10.1109/led.2022.3204360

An Energy-efficient In-Memory Computing Architecture for Survival Data Analysis based on Resistive Switching Memories (RRAM)

Autores: A. Baroni, A. Glukhov, E. Pérez, C. Wenger, E. Calore, S. F. Schifano, P. Olivo, D. Ielmini and C. Zambelli
Publicado en: Front. Neurosci. 16:932270, 2022, ISSN 1662-453X
Editor: Frontiers Media S.A
DOI: 10.3389/fnins.2022.932270

Ge Content Optimization in Ge(SbSe)N OTS Materials for Selector Applications

Autores: C. Laguna , M. Bernard, F. Fillot, D. Rouchon, N. Rochat, J. Garrione, L. Prazakova, E. Nolot, V. Meli, N. Castellani, S. Martin, C. Sabbione, G. Bourgeois , M.C. Cyrille, L. Militaru, A. Souifi, F. Andrieu, G. Navarro
Publicado en: IEEE Transactions on Electron Devices, 2022, ISSN 1557-9646
Editor: IEEE
DOI: 10.1109/ted.2022.3203368

Fluorite-Structured Ferroelectric and Antiferroelectric Materials: A Gateway of Miniaturized Electronic Devices

Autores: Faizan Ali,Tarek Ali,David Lehninger,Ayse Sünbül,Alison Viegas,Ridham Sachdeva,Akmal Abbas,Malte Czernohorsky,Konrad Seidel
Publicado en: Adv. Funct. Mater. 2022, 2201737, Edición 1616301X, 2022, ISSN 1616-301X
Editor: John Wiley & Sons Ltd.
DOI: 10.1002/adfm.202201737

Controlling the Formation of Conductive Pathways in Memristive Devices

Autores: Robert Winkler, Alexander Zintler, Stefan Petzold, Eszter Piros, Nico Kaiser, Tobias Vogel, Déspina Nasiou, Keith P. McKenna, Leopoldo Molina-Luna, Lambert Alff
Publicado en: Advanced Science 2022, 2198-3844, 2201806, 2022, ISSN 2198-3844
Editor: Wiley online library
DOI: 10.1002/advs.202201806

Multilayered Sb-Rich GeSbTe Phase-Change Memory for Best Endurance and Reduced Variability

Autores: Giusy Lama, M. Bernard, G. Bourgeois , J. Garrione, V. Meli, N. Castellani, C. Sabbione , L. Prazakova , D. Fernandez Rodas, E. Nolot, M.C. Cyrille, F. Andrieu, G. Navarro
Publicado en: IEEE Transactions on Electron Devices, 2022, ISSN 1557-9646
Editor: IEEE
DOI: 10.1109/ted.2022.3184659

Fast Fitting of the Dynamic Memdiode Model to the Conduction Characteristics of RRAM Devices Using Convolutional Neural Networks

Autores: Fernando Leonel Aguirre, Eszter Piros, Nico Kaiser, Tobias Vogel, Stephan Petzold, Jonas Gehrunger, Timo Oster, Christian Hochberger, Jordi Suñé, Lambert Alff and Enrique Miranda
Publicado en: Micromechanics, 2022, ISSN 2072-666X
Editor: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/mi13112002

Impact of Ferroelectric Layer Thickness on Reliability of Back-End-of-Line-Compatible Hafnium Zirconium Oxide Films

Autores: Ayse Sünbül, David Lehninger, Raik Hoffmann, Ricardo Olivo, Aditya Prabhu, Fred Schöne, Kati Kühnel, Moritz Döllgast, Nora Haufe, Lisa Roy, Thomas Kämpfe, Konrad Seidel, Lukas M. Eng
Publicado en: Adv. Eng. Mater.2022, 2201124, Edición 15272648, 2022, ISSN 1527-2648
Editor: Wiley Online Libray
DOI: 10.1002/adem.202201124

Review on the Microstructure of Ferroelectric Hafnium Oxides

Autores: Lederer, M., Lehninger, D., Ali, T. and Kämpfe, T.
Publicado en: Phys. Status Solidi RRL, 16: 2200168., 2022, ISSN 1862-6270
Editor: Wiley online library
DOI: 10.1002/pssr.202200168

Simulation of the effect of material properties on yttrium oxide memristor-based artificial neural networks

Autores: F Aguirre, E Piros, N Kaiser, T Vogel, S Petzold, J Gehrunger, T Oster, K Hofmann, C Hochberger, J Suñé, L Alff, E Miranda
Publicado en: APL Machine Learning, 2023, ISSN 2770-9019
Editor: AIP Publishing
DOI: 10.1063/5.0143926

Oxide thickness-dependent resistive switching characteristics of Cu/HfO2/Pt ECM devices

Autores: Taewook Kim, Tobias Vogel, Eszter Piros, Déspina Nasiou, Nico Kaiser, Philipp Schreyer, Robert Winkler, Alexander Zintler, Alexey Arzumanov, Stefan Petzold, Leopoldo Molina-Luna, Lambert Alff
Publicado en: Appl. Phys. Lett. 122, 023502 (2023), 2023, ISSN 0003-6951
Editor: American Institute of Physics
DOI: 10.1063/5.0124781

Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks

Autores: A. Baroni, A. Glukhov, E. Perez, C. Wenger, D. Ielmini, P. Olivo and C. Zambelli
Publicado en: IEEE Transactions on Device and Materials Reliability, vol. 22, no. 3, pp. 340-347, Sept. 2022, 2022, ISSN 1530-4388
Editor: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tdmr.2022.3182133

Ferroelectric [HfO2/ZrO2] Superlattices with Enhanced Polarization, Tailored Coercive Field, and Improved High Temperature Reliability

Autores: David Lehninger, Aditya Prabhu, Ayse Sünbül, Tarek Ali, Fred Schöne, Thomas Kämpfe, Kati Biedermann, Lisa Roy, Konrad Seidel, Maximilian Lederer, Lukas M. Eng
Publicado en: Adv. Physics Res.2023, 2023, ISSN 2751-1200
Editor: Wiley Online Library
DOI: 10.1002/apxr.202200108

Heavy ion irradiation induced phase transitions and their impact on the switching behavior of ferroelectric hafnia

Autores: M. Lederer, T. Vogel, T. Kämpfe, N. Kaiser, E. Piros, R. Olivo, T. Ali, S. Petzold, D. Lehninger, C. Trautmann, L. Alff, K. Seidel
Publicado en: Journal of Applied Physics 132, 064102 (2022), Edición 10897550, 2022, ISSN 1089-7550
Editor: AIP Publishing
DOI: 10.1063/5.0098953

Sub 10-nm ferroelectric Gd-doped HfO2 Layers

Autores: E.V. Skopin, N. Guillaume, L. Alrifai, P. Gonon, and A. Bsiesy
Publicado en: Appl. Phys. Lett. 120, 172901 (2022), Edición 00036951, 2022, ISSN 0003-6951
Editor: American Institute of Physics
DOI: 10.1063/5.0088505

Crystal and electronic structure of oxygen vacancy stabilized rhombohedral hafnium oxide

Autores: Nico Kaiser, Eszter Piros, Philipp Schreyer, Taewook Kim, Stefan Petzold, Roser Valenti, Youngjoon Song, Tobias Vogel, Lambert Alff
Publicado en: ACS Applied Electronic Materials, 2023, ISSN 2637-6113
Editor: ACS Publications
DOI: 10.1021/acsaelm.2c01255

Decoding Algorithms and HW Strategies to Mitigate Uncertainties in a PCM-based Analog Encoder for Compressed Sensing

Autores: Carmine Paolino, Alessio Antolini, Francesco Zavalloni, Andrea Lico, Eleonora Franchi Scarselli, Mauro Mangia, Alex Marchioni, Fabio Pareschi, Gianluca Setti, Riccardo Rovatti, Mattia Luigi Torres, Marcella Carissimi and Marco Pasotti
Publicado en: J. Low Power Electron. Appl. 2023, 13(1), 17;, 2023, ISSN 2079-9268
Editor: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/jlpea13010017

Combined HW/SW Drift and Variability Mitigation for PCM-Based Analog In-Memory Computing for Neural Network Applications

Autores: Alessio Antolini, Carmine Paolino, Francesco Zavalloni, Andrea Lico, Eleonora Franchi Scarselli, Mauro Mangia, Fabio Pareschi, Gianluca Setti, Riccardo Rovatti, Mattia Luigi Torres, Marcella Carissimi, Marco Pasotti
Publicado en: IEEE Journal on Emerging and Selected Topics in Circuits and Systems, vol. 13, no. 1, pp. 395-407, March 2023,, 2023, ISSN 2156-3357
Editor: IEEE Circuits and Systems Society
DOI: 10.1109/jetcas.2023.3241750

Structural and electrical response of emerging memories exposed to heavy ion radiation

Autores: Tobias Vogel, Alexander Zintler, Nico Kaiser, Nicolas Guillaume, Gauthier Lefèvre, Maximilian Lederer, Anna Lisa Serra, Eszter Piros, Taewook Kim, Philipp Schreyer, Robert Winkler, Déspina Nasiou, Ricardo Revello Olivo, Tarek Ali, David Lehninger, Alexey Arzumanov, Christelle Charpin-Nicolle, Guillaume Bourgeois, Laurent Grenouillet, Marie-Claire Cyrille, Gabriele Navarro, Konrad Seidel, Thomas
Publicado en: ACS Nano 2022, 16, 9, 14463–14478, Edición 1936086X, 2022, ISSN 1936-086X
Editor: ACS publications
DOI: 10.1021/acsnano.2c04841

A generalizable, uncertainty-aware neural network potential for GeSbTe with Monte Carlo dropout

Autores: Sung-Ho Lee, Valerio Olevano, Benoit Sklénard
Publicado en: Solid-State Electronics Volume 199, January 2023, 108508, 2023, ISSN 0038-1101
Editor: Pergamon Press Ltd.
DOI: 10.1016/j.sse.2022.108508

Xilinx Vitis AI ‘facedetect’ Demo on Trenz Electronic board TE0808 SoM + TEBF0808 Carrier

Autores: Zdeněk Pohl, Lukáš Kohout, Jiří Kadlec
Publicado en: 2022
Editor: UTIA

Fast Bayesian Algorithms for FPGA Platforms

Autores: Raissa Likhonina
Publicado en: 2022
Editor: UTIA

Integration of labeled 4D-STEM SPED data for confirmation of phase identification

Autores: T. Vogel, A. Zintler, N. Kaiser, N. Guillaume, G. Lefèvre, M. Lederer, A. L. Serra, E. Piros, T. Kim, P. Schreyer, R. Winkler, D. Nasiou, R. R. Olivo, T. Ali, D. Lehninger, A. Arzumanov, C. Charpin-Nicolle, G. Bourgeois, L. Grenouillet, MC. Cyrille, G. Navarro, K. Seidel, T. Kämpfe, S. Petzold, C. Trautmann, L. Molina-Luna, L. Alff
Publicado en: Open Repository TuDatalib 2022, 2022
Editor: TU Darmstadt
DOI: 10.48328/tudatalib-896

Testing all Samples from Xilinx Vitis AI Library 2.0 on Trenz Electronic board TE0808 SoM + TEBF0808 Carrier

Autores: Zdeněk Pohl, Lukáš Kohout, Jiří Kadlec
Publicado en: 2022
Editor: UTIA

Xilinx Vitis AI ‘facedetect’ and ‘resnet50’ Demo on Trenz Electronic TE0821-01-2cg-4GB SoM + TE0706-3 Carrier

Autores: Zdeněk Pohl, Lukáš Kohout, Jiří Kadlec
Publicado en: 2022
Editor: UTIA

All VART Examples from Xilinx Vitis AI 2.0 for Trenz Electronic board TE0808 SoM + TEBF0808 Carrier

Autores: Zdeněk Pohl, Lukáš Kohout, Jiří Kadlec
Publicado en: 2022
Editor: UTIA

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