Resultado final
Fabrication of elementary VNWFET devices (JL and PC) - First version
Elementary VNWFET devices (JL and PC) - V2Fabrication of elementary VNWFET devices (JL and PC) - improved version
First report on the thermal impedance and trap extraction of VNWFETs devices fabricated in WP1
Plan for dissemination of the results - Y1Annual plan for dissemination of the results
Workshops and summer school's reportReport on workshops and summer school's
Plan for dissemination of the results - Y2Annual plan for dissemination of the results, year 2
Technology impact and exploitation innovation - Y1Technology impact and exploitation innovation First assessment
Pre-trained speech ASR/MT model and use-cases - V2Second version of pre-trained speech ASR/MT model and use-cases
Open source release: parameterizable simulator with application examples - V1First open source release: parameterizable simulator with application examples
Plan for dissemination of the results - Y3Annual plan for dissemination of the results - year 3
Scaled-down N2C2 designReport on scaled-down N2C2 design
Library of optimized VNWFET-based logic cellsPre-trained speech ASR/MT model and use-cases - V1
First version of pretrained speech ASRMT model and usecases
Architecture library, multi-objective trade-offs and calibrated thermal models - V1First version of architecture library, multi-objective trade-offs and calibrated thermal models
Technology impact and exploitation innovation - Y2Technology impact and exploitation innovation - Second assessment
Virtual scalable N2C2 design and Pareto-front data - V1Report on virtual scalable N2C2 design and Paretofront data V1
Co-optimized hardware/NN architecture for ASR/MT - V1First report on the co-optimized hardware/NN architecture for ASR/MT
Versatile and scalable 3D architectural interconnect frameworkReport on the versatile and scalable 3D architectural interconnect framework
Project handbookHandbook summarizing decisionmaking process and planned meetings quality process for deliverables deliverable template progress reports template
Parasitic element extraction - V1Report on parasitic element extraction
Project Website and social networks accounts for FVLLMONTI are visible online
Publicaciones
Autores:
C. Maneux, C. Mukherjee, M. Deng, G. Larrieu, Y. Wang, Houssem Rezgui and B. Neckel Wesling
Publicado en:
243rd ECS Meeting, Boston, US, May 28th -June 2nd, 2023, Edición mai-23, 2023
Editor:
ECS
DOI:
10.1149/11101.0209ecst
Autores:
L. Réveil, C. Mukherjee, C. Maneux, M. Deng, F. Marc, A. Kumar, A. Lecestre, G. Larrieu, A. Poittevin, I. O'Connor, O. Baumgartner and D. Pirker
Publicado en:
VLSI-SOC, 2022
Editor:
VLSI-SOC
Autores:
Thesberg, M., Schanovsky, F., Stanojevic, Z., Baumgartner, O. and Karner, M.
Publicado en:
International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Edición 2023, 2023, ISBN 978-4-86348-803-8
Editor:
IEEE
DOI:
10.23919/sispad57422.2023.10319645
Autores:
Rios, M., Ponzina, F., Ansaloni, G., Levisse, A. and Atienza, D.
Publicado en:
In Proceedings of the Great Lakes Symposium on VLSI 2022, Edición 2022, 2022, ISBN 9781450393225
Editor:
Association for Computing Machinery
DOI:
10.1145/3526241.3530351
Autores:
Guilhem Larrieu, Jonas Müller, Sylvain Pelloquin, Abhishek Kumar, Konstantinos Moustakas, Pawel Michalowski, Aurelie Lecestre
Publicado en:
21st International Workshop on Junction Technology (IWJT), Edición 23 juin, 2023, ISBN 978-4-86348-807-6
Editor:
IEEE
DOI:
10.23919/iwjt59028.2023.10175172
Autores:
Ian O’Connor, Arnaud Poittevin, Sébastien Le Beux, Alberto Bosio, Zlatan Stanojevic, Oskar Baumgartner, C Mukherjee, C Maneux, J Trommer, T Mikolajick, G Larrieu
Publicado en:
Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS), 2021, Página(s) 1-4
Editor:
NA
Autores:
Ferretti, Lorenzo, Giovanni Ansaloni, Renaud Marquis, Tomas Teijeiro, Philippe Ryvlin, David Atienza, and Laura Pozzi
Publicado en:
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2022, Página(s) 1449-1454
Editor:
IEEE
Autores:
B. Neckel Wesling, M. Deng, C. Mukherjee, A. Kumar, G. Larrieu, et al.
Publicado en:
8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI−ULIS) 2022, May, Edición mai 22, 2022
Editor:
Elsevier
DOI:
10.1016/j.sse.2022.108359
Autores:
Medina Morillas, Rafael, Joshua Alexander Harrison Klein, Yasir Mahmood Qureshi, Marina Zapater Sancho, Giovanni Ansaloni, and David Atienza Alonso
Publicado en:
IEEE 13th Latin America Symposium on Circuits and System (LASCAS), 2022
Editor:
IEEE
Autores:
C. Maneux, C. Mukherjee, M. Deng, M. Dubourg, L. Reveil, G. Bordea, A. Lecestre, G. Larrieu, J. Trommer, E.T. Breyer, S. Slesazeck, T. Mikolajick, O. Baumgartner, M. Karner, D. Pirker, Z. Stanojevic, David Atienza, A. Levisse, G. Ansaloni, A. Poittevin, A. Bosio, D. Deleruyelle, C. Marchand, I. O'Connor
Publicado en:
IEEE IEDM, 2021
Editor:
IEEE
Autores:
Leila Ben Letaifa, Jean-Luc Rouas.
Publicado en:
EUSIPCO 2022, 2022
Editor:
EUSIPCO
Autores:
C. Maneux, C. Mukherjee, M. Deng, B. Neckel Wesling, L. Reveil, Z. Stanojevic, O. baumgartner, A. Poittevin, I. O'Connor, G. Larrieu
Publicado en:
IEEE LAEDC, 2022
Editor:
NA
Autores:
A. Poittevin, I. O‘Connor, C. Marchand, A. Bosio, C. Maneux, C. Mukherjee, G. Larrieu, A. Kumar
Publicado en:
20th IEEE Interregional NEWCAS Conference (NEWCAS), 2022
Editor:
NA
DOI:
10.1109/newcas52662.2022.9842100
Autores:
T. Mauersberger, J. Trommer, G. Galderisi, M. Knaut, D. Pohl, A. Tahn, B. Rellinghaus, T. Mikolajick, A. Heinzig
Publicado en:
EMRS Fall Meeting, Warsaw, 2023, Edición No proceedings, talk only, 2023
Editor:
EMRS
Autores:
K. Moustakas, B. Neckel-Wesling, A. Lecestre, F. Mathieu, T. Mikolajick, J. Trommer, G. Larrieu, L. Cancellara, J.-D. Grillet
Publicado en:
EMRS Fall Meeting, Warsaw, 2023, Edición 23-oct., 2023
Editor:
EMRS
Autores:
B. Neckel Wesling, M. Deng, C. Mukherjee, T. Mikolajick, J. Trommer and C. Maneux
Publicado en:
IEEE International Conference on Microelectronic Test Structures (ICMTS), April 2024, Edinburgh, Scotland, Edición Avr 24, 2024
Editor:
IEEE
Autores:
Guilhem Larrieu, Houssem Rezgui, Abhishek Kumar, Jonas Müller, Sylvain Pelloquin, Yifan Wang, Marina Deng, Aurelie Lecestre, Cristell Maneux, Chhandak Mukherjee
Publicado en:
2023 Silicon Nanoelectronics Workshop (SNW), Kyoto, Japan, Edición juin-23, 2023, ISBN 978-4-86348-808-3
Editor:
IEEE
DOI:
10.23919/snw57900.2023.10183951
Autores:
Lorenzo Ferretti; Giovanni Ansaloni; Renaud Marquis; Tomas Teijeiro; Philippe Ryvlin; David Atienza; Laura Pozzi
Publicado en:
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), Edición 1, 2022, Página(s) 1449-1454
Editor:
IEEE
DOI:
10.23919/date54114.2022.9774713
Autores:
L. Ben Letaifa and J.-L. Rouas
Publicado en:
21st IEEE International Conference on Machine Learning and Applications (ICMLA), Dec. 2022, Edición 2022, 2022
Editor:
IEEE
DOI:
10.1109/icmla55696.2022.00149
Autores:
Ponzina F, Rios M, Levisse A, Ansaloni G, Atienza D.
Publicado en:
ACM Transactions on Embedded Computing Systems, Edición ACM Transactions on Embedded Computing SystemsVolume 22Edición 5sArticle No.: 121, 2023, Página(s) pp 1–23, ISSN 1539-9087
Editor:
Association for Computing Machinary, Inc.
DOI:
10.1145/3609387
Autores:
Tom Mauersberger; Jens Trommer; Saurabh Sharma; Martin Knaut; Darius Pohl; Bernd Rellinghaus; Thomas Mikolajick; Andre Heinzig
Publicado en:
Semiconductor Science and Technology, Edición 1, 2021, ISSN 0268-1242
Editor:
Institute of Physics Publishing
DOI:
10.1088/1361-6641/ac1827
Autores:
Ponzina, Flavio, Simone Machetti, Marco Antonio Rios, Benoît Walter Denkinger, Alexandre Sébastien Julien Levisse, Giovanni Ansaloni, Miguel Peon Quiros, and David Atienza Alonso
Publicado en:
IEEE Micro - Special Edición on Artificial Intelligence at the Edge, 2022, ISSN 0272-1732
Editor:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/mm.2022.3195617
Autores:
Mukherjee, C., Poittevin, A., O'Connor, I., Larrieu, G., Maneux, C.
Publicado en:
Solid-State Electronics, 2021, ISSN 0038-1101
Editor:
Pergamon Press Ltd.
DOI:
10.1016/j.sse.2021.108125
Autores:
C. Mukherjee, H. Rezgui, Y. Wang, M. Deng, A. Kumar, J. Muller, G. Larrieu and C. Maneux
Publicado en:
IEEE TED Vol 70 n°12, Edición 11 oct, 2023, ISSN 0018-9383
Editor:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/ted.2023.3321277
Autores:
H. Rezgui, C. Mukherjee, Y. Wang, M. Deng, A. Kumar, J. Muller, G. Larrieu and C. Maneux
Publicado en:
IEEE TED Vol 70 n°12, Edición oct.-23, 2023, ISSN 0018-9383
Editor:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/ted.2023.3321280
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