Actinic photoemission spectroscopy of litho materials using a table-top ultrafast EUV source
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Author(s):
D. P. Singh, K. M. Dorney, F. Holzmeier, E. W. Larsen, L. Galleni, C. Mokhtarzadeh, M. J. van Setten, T. Conard, J. S. Petersen, P. A. W. van der Heide
Published in:
Proc. SPIE 12955, Metrology, Inspection, and Process Control XXXVIII, Issue 12955, 2024, 2024, Page(s) 1295504
Publisher:
SPIE
DOI:
10.1117/12.3010751
Actinic inspection of the EUV optical parameters of lithographic materials with lab-based radiometry and reflectometry
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Author(s):
Kevin M. Dorney, Nicola N. Kissoon, Fabian Holzmeier, Esben W. Larsen, Dhirendra P. Singh, Shikhar Arvind, Sayantani Santra, Roberto Fallica, Igor Makhotkin, Vicky Philipsen, Stefan De Gendt, Claudia Fleischmann, Paul A. W. van der Heide, John S. Petersen
Published in:
Proceedings of SPIE, Volume 12494, Optical and EUV Nanolithography XXXVI, Issue 12494, 2023, 2023, Page(s) 1249407
Publisher:
SPIE
DOI:
10.1117/12.2658359