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CORDIS - EU research results
CORDIS

MIcroelectronics RELiability driven by Artificial Intelligence

CORDIS provides links to public deliverables and publications of HORIZON projects.

Links to deliverables and publications from FP7 projects, as well as links to some specific result types such as dataset and software, are dynamically retrieved from OpenAIRE .

Deliverables

Second annual network meeting (opens in new window)

Second annual network meeting hosted by PCCL

First annual network meeting (opens in new window)

First annual network meeting hosted by TU DELFT

Publications

Literature Review: Global Criticality Assessment Based on Feature Surrogates at the PCBA Levels (opens in new window)

Author(s): Qiulin Yu, Vikram G. Kamble, Dieter P. Gruber, Peter F. Fuchs, Karl Fendt, Thomas Krivec
Published in: 2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), Issue 209, 2024, ISSN 2833-8596
Publisher: IEEE
DOI: 10.1109/EuroSimE60745.2024.10491544

Warpage Optimization of Package Substrates Using Metamodels - A Review (opens in new window)

Author(s): Fredy John Porathur, Vikram G Kamble, Eduard Stadler, Fabian Huber, Dieter P. Gruber, Peter Filipp Fuchs
Published in: 2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2024, ISSN 2833-8596
Publisher: IEEE
DOI: 10.1109/EuroSimE60745.2024.10491528

A comprehensive methodology for criticality assessment of microvias in printed circuit board assemblies (opens in new window)

Author(s): Vikram G Kamble, Dhaval Rasheshkumar Patel, Christian Schipfer, Andreas Thalhamer, Julia Zuendel, Thomas Krivec, Thomas Antretter, Peter Filipp Fuchs
Published in: 2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2024, ISSN 2833-8596
Publisher: IEEE
DOI: 10.1109/EuroSimE60745.2024.10491487

Enhancing Defect Detection Using Lock In Thermography (opens in new window)

Author(s): Doaa Mohamed, Daniel May, Kaushal Arun Pareek, Mohamad Abo Ras, Bernhard Wunderle
Published in: 2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2024
Publisher: IEEE
DOI: 10.1109/EuroSimE60745.2024.10491470

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