Influence of the Mission Profile on the Selection of the Leakage Inductance for DAB converter
Author(s):
A. Campos, P. Dworakowski, B. Asllani, K. Vershinin
Published in:
EPE 2025
Publisher:
EPE 2025
Solid insulation electrical endurance assessment under square voltage,
Author(s):
M. Balde
Published in:
CEIDP September 14-17, 2025 (IEEE Conference on Electrical I5nsulation and Dielectric Phenomena), Manchester, 202
Publisher:
IEEE Conference 2025
A Dual-Channel Gate Driver Design with Active Voltage Balancing Circuit for Series Connection of SiC MOSFETs
Author(s):
Rui Wang, Drazen Dujic
Published in:
ECCE Aisa 2024, 2024, ISBN 979-8-3503-5133-0
Publisher:
IEEE
Development of 15kV SiC-IGBT technology at Hitachi Energy
Author(s):
N
Published in:
ECPE Workshop
Publisher:
ECPE Workshop
Minimizing edge termination footprint in UHV SiC power devices: an area-efficient edge structure for power devices rated over 10kV
Author(s):
n
Published in:
ISCRM25
Publisher:
ISCRM25
Integrated Short-Circuit Protection Design Based on Dual-Channel Gate Driver for Series Connected Medium-Voltage SiC MOSFETs
Author(s):
Rui Wang, Drazen Dujic
Published in:
APEC 2024
Publisher:
APEC 2024
Pushing the limits: Advanced SiC detectors for operation in harsh environments
Author(s):
G. Pellegrini
Published in:
CERN invited talk
Publisher:
CERN