CORDIS provides links to public deliverables and publications of HORIZON projects.
Links to deliverables and publications from FP7 projects, as well as links to some specific result types such as dataset and software, are dynamically retrieved from OpenAIRE .
Deliverables
Risk management (6 months update) (opens in new window)
Dissemination and Communication report Y1 (opens in new window)
Progress Activity Report Y1 (opens in new window)
Yearly report on benchmarking Y1 (opens in new window)
NANOMAT PDE (opens in new window)
Device use case trained models for machine learning-2 (opens in new window)
Device use case trained models for machine learning
Publications
Author(s):
K. Tsagaraki, A. Adikimenakis, A. Kostopoulos and A. Georgakilas
Published in:
Micor Nano 2024, 2024
Publisher:
None
Author(s):
I.Kochylas, J. Theocharis, G.Papaioannou, Z.Afshin
Published in:
2024
Publisher:
None
Author(s):
L. Michalas, A. Ngabonziza, G. Stavrinidis, P. Martins, M. le Baillif, A. Ziaei and G. Konstantinidis
Published in:
Micro Nano 2024, 2024
Publisher:
None
Author(s):
J. Theocharis, J. P. Martins, A. Mahjoub, E. Eustache, A. Ziaei, G. Papaioannou
Published in:
2024
Publisher:
sciencedirect
Author(s):
J. Theocharis, J. P. Martins,A. Mahjoub,E. Eustache, A. Ziaei and G. Papaioannou
Published in:
2024
Publisher:
None
Author(s):
Antonio Harder, Santiago Campos-Boettges and Mohamad Abo Ras
Published in:
SEMI-THERM Conference 2023, 2023
Publisher:
IEEE
Author(s):
I. Kochilas, J. P. Martins, J. Theocharis, A. Mahjoub, E. Eustache, A. Ziaei, G. Papaioannou
Published in:
EuroSimE 2025, 2025
Publisher:
None
Author(s):
M. Blaho, D. Gregušová, O. Pohorelec, S. Hasenöhrl, P. Eliáš, F. Gucmann, E. Dobročka, Z. Zápražný, Š. Haščík, M. Kayambaki, M. Androulidaki, G. Konstantinidis, and J. Kuzmík
Published in:
12th International Workshop on Nitride Semiconductors (IWN 2024), 2024
Publisher:
None
Author(s):
Arash Mohammadi, George Boldeiu, Dan Vasilache, Afshin Ziaei, Bernhard Wunderle
Published in:
2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2024
Publisher:
IEEE
DOI:
10.1109/EuroSimE60745.2024.10491501
Author(s):
L. Chevas, N. Makris, M. Kayambaki, A. Kostopoulos, A. Stavrinidis, E. Lourandakis, G. Konstantinidis and M. Bucher
Published in:
2023
Publisher:
Micro Nano 2023
Author(s):
George Boldeiu, Alexandra Nicoloiu, Arash Mohammadi, Claudia Nastase, Monica Nedelcu, Ioana Zdru, Dan Vasilache, Adrian Dinescu, Bernhard Wunderle, Alexandru Muller
Published in:
EuroSimE2025, 2025
Publisher:
None
Author(s):
Santiago Campos-Boettges, Antonio Harder and Mohamad Abo Ras
Published in:
17th Advanced Technology Workshop on Micropackaging and Thermal Management, 2024
Publisher:
None
Author(s):
V. Kontomitrou, S. Lymperapoulou, G. Stavrinidis, A. Stavrinidis, A. Kostopoulos, G. Konstantinidis and L. Michalas
Published in:
2024
Publisher:
None
Author(s):
L. Michalas, G. Stavrinidis, A. Stavrinidis, K. Tsagaraki and G. Konstantinidis
Published in:
2023
Publisher:
Mico Nano 2024
Author(s):
M. Androulidaki, A. Stavrinidis, C.C. Katsidis, L. Michalas, K. Tsagaraki and G. Konstantinidi
Published in:
2023
Publisher:
Micro Nano 2023
Author(s):
E. Koutantou, G. Veisakis, G. Makris, D. Kosmidis and G. Deligeorgis
Published in:
2024
Publisher:
None
Author(s):
J. Kuzmík, M. Blaho, D. Gregušová, P. Eliáš, O. Pohorelec, S. Hasenöhrl, Š. Haščík, F. Gucmann, Z. Zápražný, E. Dobročka, M. Kyambaki, G. Konstantinidis
Published in:
Materials Science in Semiconductor Processing, Issue 185, 2024, ISSN 1369-8001
Publisher:
Elsevier BV
DOI:
10.1016/J.MSSP.2024.108959
Author(s):
J. Theocharis, D. Birmpiliotis, S. Gardelis, G. Papaioannou
Published in:
Microelectronics Reliability, Issue 150, 2023, ISSN 0026-2714
Publisher:
Elsevier BV
DOI:
10.1016/j.microrel.2023.115192
Author(s):
Athanasios Kostopoulos, Adam Adikimenakis, Katerina Tsagaraki, Maria Kayambaki, Nikolaos Kornilios, George Konstantinidis, Alexandros Georgakilas
Published in:
Materials Science in Semiconductor Processing, Issue 188, 2025, ISSN 1369-8001
Publisher:
Elsevier BV
DOI:
10.1016/J.MSSP.2024.109213
Author(s):
J. Theocharis, J. P. Martins, A. Mahjoub, E. Eustache, A. Ziaei, G. Papaioannou
Published in:
Microelectronics Reliability, 2025
Publisher:
ScienceDirect
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