Resultado final
1-2 newsletters/year over the duration of the project.
Promotion guide about TUTPromotion guide about TUT.
Project websiteProject leaflet and poster
• Project leaflet (2 pages, A4 size) and Powerpoint presentation providing overview of the project • Project poster (A1 size)
Publicaciones
Autores:
Gadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon D. ter Braak, Sergei Devadze, Goerschwin Fey, Maksim Jenihhin, Artur Jutman, Hans G. Kerkhoff, Robert Könighofer, Shlomit Koyfman, Jan Malburg, Shiri Moran, Jaan Raik, Gerard Rauwerda, Heinz Riener, Franz Röck, Konstantin Shibin, Kim Sunesen, Jinbo Wan, Yong Zhao
Publicado en:
Lecture Notes in Electrical Engineering, 2018, Página(s) 15-38
Editor:
Springer International Publishing
DOI:
10.1007/978-3-319-62920-9_2
Autores:
Jevgeni Marenkov, Tarmo Robal, Ahto Kalja
Publicado en:
Databases and Information Systems, Edición 615, 2016, Página(s) 257-271, ISBN 978-3-319-40179-9
Editor:
Springer International Publishing
DOI:
10.1007/978-3-319-40180-5_18
Autores:
Jevgeni Marenkov, Tarmo Robal, Ahto Kalja
Publicado en:
Advances in Databases and Information Systems, Edición 10509, 2017, Página(s) 394-407, ISBN 978-3-319-66916-8
Editor:
Springer International Publishing
DOI:
10.1007/978-3-319-66917-5_26
Autores:
Yue Zhao, Tarmo Robal, Christoph Lofi, Claudia Hauff
Publicado en:
Lifelong Technology-Enhanced Learning - 13th European Conference on Technology Enhanced Learning, EC-TEL 2018, Leeds, UK, September 3-5, 2018, Proceedings, Edición 11082, 2018, Página(s) 101-115, ISBN 978-3-319-98571-8
Editor:
Springer International Publishing
DOI:
10.1007/978-3-319-98572-5_8
Autores:
Ardo Allik, Kristjan Pilt, Deniss Karai, Ivo Fridolin, Mairo Leier, Gert Jervan
Publicado en:
World Congress on Medical Physics and Biomedical Engineering 2018, Edición 68/3, 2019, Página(s) 13-17, ISBN 978-981-10-9022-6
Editor:
Springer Singapore
DOI:
10.1007/978-981-10-9023-3_3
Autores:
Laura Päeske, Maie Bachmann, Jaan Raik, Hiie Hinrikus
Publicado en:
World Congress on Medical Physics and Biomedical Engineering 2018 - June 3-8, 2018, Prague, Czech Republic (Vol.2), Edición 68/2, 2019, Página(s) 237-240, ISBN 978-981-10-9037-0
Editor:
Springer Singapore
DOI:
10.1007/978-981-10-9038-7_44
Autores:
Jüri Vain, Leonidas Tsiopoulos, Vyacheslav Kharchenko, Apneet Kaur, Maksim Jenihhin, Jaan Raik, Sven Nõmm
Publicado en:
Green IT Engineering: Social, Business and Industrial Applications, Edición 171, 2019, Página(s) 273-297, ISBN 978-3-030-00252-7
Editor:
Springer International Publishing
DOI:
10.1007/978-3-030-00253-4_12
Autores:
Raimund Ubar, Lembit Jürimägi, Elmet Orasson, Jaan Raik
Publicado en:
VLSI-SoC: Design for Reliability, Security, and Low Power, Edición 483, 2016, Página(s) 23-45, ISBN 978-3-319-46096-3
Editor:
Springer International Publishing
DOI:
10.1007/978-3-319-46097-0_2
Autores:
Marco Gaudesi, Maksim Jenihhin, Jaan Raik, Ernesto Sanchez, Giovanni Squillero, Valentin Tihhomirov, Raimund Ubar
Publicado en:
Applications of Evolutionary Computation, 2014, Página(s) 425-436, ISBN 978-3-662-45523-4
Editor:
Springer Berlin Heidelberg
DOI:
10.1007/978-3-662-45523-4_35
Autores:
Raimund Ubar, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Lembit Jürimägi
Publicado en:
Microelectronics Reliability, Edición 81, 2018, Página(s) 252-261, ISSN 0026-2714
Editor:
Elsevier BV
DOI:
10.1016/j.microrel.2017.11.027
Autores:
Raimund Ubar, Lembit Jürimägi, Jaan Raik, Vladimir Viies
Publicado en:
Microprocessors and Microsystems, Edición 48, 2017, Página(s) 56-61, ISSN 0141-9331
Editor:
Elsevier BV
DOI:
10.1016/j.micpro.2016.09.006
Autores:
Konstantin Shibin, Sergei Devadze, Artur Jutman, Martin Grabmann, Robin Pricken
Publicado en:
IEEE Design & Test, Edición 34/6, 2017, Página(s) 27-35, ISSN 2168-2356
Editor:
IEEE Computer Society
DOI:
10.1109/MDAT.2017.2750902
Autores:
Igor Aleksejev, Artur Jutman, Sergei Devadze
Publicado en:
IEEE Instrumentation & Measurement Magazine, Edición 20/4, 2017, Página(s) 23-30, ISSN 1094-6969
Editor:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/MIM.2017.8006390
Autores:
Valery Sklyarov, Iouliia Skliarova, Artjom Rjabov, Alexander Sudnitson
Publicado en:
International Journal of Computers Communications & Control, Edición 11/1, 2015, Página(s) 126, ISSN 1841-9836
Editor:
Agora University
DOI:
10.15837/ijccc.2016.1.1442
Autores:
Valery Sklyarov, Iouliia Skliarova, Alexander Sudnitson
Publicado en:
Elektronika ir Elektrotechnika, Edición 22/4, 2016, ISSN 1392-1215
Editor:
Kauno Technologijos Universitetas
DOI:
10.5755/j01.eie.22.4.15920
Autores:
V Sklyarov, I Skliarova, A Rjabov, A Sudnitson
Publicado en:
Proceedings of the Estonian Academy of Sciences, Edición 66/3, 2017, Página(s) 323, ISSN 1736-6046
Editor:
Estonian Academy Publishers
DOI:
10.3176/proc.2017.3.07
Autores:
Peeter Ellervee, Jari Nurmi
Publicado en:
Journal of Signal Processing Systems, Edición 87/3, 2017, Página(s) 269-270, ISSN 1939-8018
Editor:
Springer Verlag
DOI:
10.1007/s11265-017-1242-x
Autores:
Igor Aleksejev, Sergei Devadze, Artur Jutman, Konstantin Shibin
Publicado en:
Journal of Electronic Testing, Edición 32/3, 2016, Página(s) 245-255, ISSN 0923-8174
Editor:
Kluwer Academic Publishers
DOI:
10.1007/s10836-016-5588-y
Autores:
Syed Mohammad Asad Hassan Jafri, Muhammad Adeel Tajammul, Ahmed Hemani, Kolin Paul, Juha Plosila, Peeter Ellervee, Hannu Tenuhnen
Publicado en:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Edición 24/1, 2016, Página(s) 403-407, ISSN 1063-8210
Editor:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tvlsi.2015.2402392
Autores:
Laura Päeske, Maie Bachmann, Toomas Põld, Sara Pereira Mendes de Oliveira, Jaanus Lass, Jaan Raik, Hiie Hinrikus
Publicado en:
Frontiers in Physiology, Edición 9, 2018, ISSN 1664-042X
Editor:
Frontiers Research Foundation
DOI:
10.3389/fphys.2018.01350
Autores:
Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros
Publicado en:
Journal of Electronic Testing, Edición 32/3, 2016, Página(s) 273-289, ISSN 0923-8174
Editor:
Kluwer Academic Publishers
DOI:
10.1007/s10836-016-5589-x
Autores:
Maksim Gorev, Raimund Ubar, Peeter Ellervee, Sergei Devadze, Jaan Raik, Mart Min
Publicado en:
Microprocessors and Microsystems, Edición 01419331, 2015, Página(s) 909-918, ISSN 0141-9331
Editor:
Elsevier BV
DOI:
10.1016/j.micpro.2014.11.002
Autores:
Jaak Kõusaar, Raimund Ubar, Sergei Devadze, Jaan Raik
Publicado en:
Microprocessors and Microsystems, Edición 01419331, 2015, Página(s) 1130-1138, ISSN 0141-9331
Editor:
Elsevier BV
DOI:
10.1016/j.micpro.2015.05.003
Autores:
Maksim Jenihhin, Anton Tsepurov, Valentin Tihhomirov, Jaan Raik, Hanno Hantson, Raimund Ubar, Gunter Bartsch, JorgeHernan Meza Escobar, Heinz-Dietrich Wuttke
Publicado en:
IEEE Design & Test, Edición 21682356, 2014, Página(s) 83-92, ISSN 2168-2356
Editor:
IEEE Computer Society
DOI:
10.1109/MDAT.2013.2271420
Autores:
Jaan Raik, Urmas Repinski, Anton Chepurov, Hanno Hantson, Raimund Ubar, Maksim Jenihhin
Publicado en:
Microprocessors and Microsystems, Edición 01419331, 2013, Página(s) 505-513, ISSN 0141-9331
Editor:
Elsevier BV
DOI:
10.1016/j.micpro.2012.11.004
Autores:
Siavoosh Payandeh Azad, Behrad Niazmand, Karl Janson, Thilo Kogge, Jaan Raik, Gert Jervan, Thomas Hollstein
Publicado en:
2017 IEEE International Symposium on Circuits and Systems (ISCAS), 2017, Página(s) 1-4, ISBN 978-1-4673-6853-7
Editor:
IEEE
DOI:
10.1109/ISCAS.2017.8050634
Autores:
Adeboye Stephen Oyeniran, Raimund Ubar, Siavoosh Payandeh Azad, Jaan Raik
Publicado en:
2017 12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC), 2017, Página(s) 1-8, ISBN 978-1-5386-3344-1
Editor:
IEEE
DOI:
10.1109/ReCoSoC.2017.8016156
Autores:
Tsotne Putkaradze, Siavoosh Payandeh Azad, Behrad Niazmand, Jaan Raik, Gert Jervan
Publicado en:
2017 12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC), 2017, Página(s) 1-8, ISBN 978-1-5386-3344-1
Editor:
IEEE
DOI:
10.1109/ReCoSoC.2017.8016161
Autores:
Siavoosh Payandeh Azad, Behrad Niazmand, Apneet Kaur Sandhu, Jaan Raik, Gert Jervan, Thomas Hollstein
Publicado en:
2017 22nd IEEE European Test Symposium (ETS), 2017, Página(s) 1-2, ISBN 978-1-5090-5457-2
Editor:
IEEE
DOI:
10.1109/ETS.2017.7968211
Autores:
Siavoosh Payandeh Azad, Behrad Niazmand, Karl Janson, Nevin George, Adeboye Stephen Oyeniran, Tsotne Putkaradze, Apneet Kaur, Jaan Raik, Gert Jervan, Raimund Ubar, Thomas Hollstein
Publicado en:
2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2017, Página(s) 48-53, ISBN 978-1-5386-0472-4
Editor:
IEEE
DOI:
10.1109/DDECS.2017.7934565
Autores:
Raimund Ubar, Sergei Kostin, Maksim Jenihhin, Jaan Raik
Publicado en:
2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2017, Página(s) 152-157, ISBN 978-1-5386-0472-4
Editor:
IEEE
DOI:
10.1109/DDECS.2017.7934568
Autores:
Sergei Odintsov, Artur Jutman, Sergei Devadze
Publicado en:
2017 IEEE International Test Conference (ITC), 2017, Página(s) 1-10, ISBN 978-1-5386-3413-4
Editor:
IEEE
DOI:
10.1109/TEST.2017.8242070
Autores:
Sergei Odintsov, Artur Jutman, Sergei Devadze, Igor Aleksejev
Publicado en:
2017 IEEE AUTOTESTCON, 2017, Página(s) 1-9, ISBN 978-1-5090-4922-6
Editor:
IEEE
DOI:
10.1109/AUTEST.2017.8080516
Autores:
Juri Vain, Apneet Kaur, Leonidas Tsiopoulos, Jaan Raik, Maksim Jenihhin
Publicado en:
2018 16th Biennial Baltic Electronics Conference (BEC), 2018, Página(s) 1-6, ISBN 978-1-5386-7312-6
Editor:
IEEE
DOI:
10.1109/bec.2018.8600986
Autores:
Behrad Niazmand, Siavoosh Payandeh Azad, Tara Ghasempouri, Jaan Raik, Gert Jervan
Publicado en:
2018 IEEE International Test Conference in Asia (ITC-Asia), 2018, Página(s) 139-144, ISBN 978-1-5386-5180-3
Editor:
IEEE
DOI:
10.1109/itc-asia.2018.00034
Autores:
Emmanuel Ovie Osimiry, Raimund Ubar, Sergei Kostin, Jaan Raik
Publicado en:
2016 IEEE Nordic Circuits and Systems Conference (NORCAS), 2016, Página(s) 1-4, ISBN 978-1-5090-1095-0
Editor:
IEEE
DOI:
10.1109/norchip.2016.7792915
Autores:
Anton Tsertov, Artur Jutman, Sergei Devadze, Matteo Sonza Reorda, Erik Larsson, Farrokh Ghani Zadegan, Riccardo Cantoro, Mehrdad Montazeri, Rene Krenz-Baath
Publicado en:
2016 IEEE International Test Conference (ITC), 2016, Página(s) 1-10, ISBN 978-1-4673-8773-6
Editor:
IEEE
DOI:
10.1109/test.2016.7805840
Autores:
Anton Karputkin, Jaan Raik
Publicado en:
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2016, Página(s) 1124-1127, ISBN 978-3-9815370-7-9
Editor:
Research Publishing Services
DOI:
10.3850/9783981537079_0260
Autores:
Emmanuel Ovie Osimiry, Sergei Kostin, Jaan Raik, Raimund Ubar
Publicado en:
2016 15th Biennial Baltic Electronics Conference (BEC), 2016, Página(s) 79-82, ISBN 978-1-5090-1393-7
Editor:
IEEE
DOI:
10.1109/bec.2016.7743733
Autores:
S. Kostin, E. Orasson, R. Ubar
Publicado en:
2016 11th European Workshop on Microelectronics Education (EWME), 2016, Página(s) 1-6, ISBN 978-1-4673-8584-8
Editor:
IEEE
DOI:
10.1109/ewme.2016.7496466
Autores:
Ardo Allik, Kristjan Pilt, Deniss Karai, Ivo Fridolin, Mairo Leier, Gert Jervan
Publicado en:
2016 IEEE EMBS Conference on Biomedical Engineering and Sciences (IECBES), 2016, Página(s) 460-464, ISBN 978-1-4673-7791-1
Editor:
IEEE
DOI:
10.1109/iecbes.2016.7843493
Autores:
Ahto Kalja, Tarmo Robal, Triin Gailan
Publicado en:
2017 Portland International Conference on Management of Engineering and Technology (PICMET), 2017, Página(s) 1-7, ISBN 978-1-890843-36-6
Editor:
IEEE
DOI:
10.23919/picmet.2017.8125312
Autores:
Tara Ghasempouri, Siavoosh Payandeh Azad, Behrad Niazmand, Jaan Raik
Publicado en:
2018 IEEE International Test Conference in Asia (ITC-Asia), 2018, Página(s) 61-66, ISBN 978-1-5386-5180-3
Editor:
IEEE
DOI:
10.1109/itc-asia.2018.00021
Autores:
Karl Janson, Rene Pihlak, Siavoosh Payandeh Azad, Behrad Niazmand, Gert Jervan, Jaan Raik
Publicado en:
2018 13th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC), 2018, Página(s) 1-6, ISBN 978-1-5386-7957-9
Editor:
IEEE
DOI:
10.1109/recosoc.2018.8449374
Autores:
Yu. Gordienko, S. Stirenko, O. Alienin, K. Skala, Z. Sojat, A. Rojbi, J.R. Lopez Benito, E. Artetxe Gonzalez, U. Lushchyk, L. Sajn, A. Llorente Coto, G. Jervan
Publicado en:
2017 40th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO), 2017, Página(s) 359-364, ISBN 978-953-233-090-8
Editor:
IEEE
DOI:
10.23919/mipro.2017.7973449
Autores:
Adeboye Stephen Oyeniran, Siavoosh Payandeh Azad, Raimund Ubar
Publicado en:
2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR), 2018, Página(s) 1-6, ISBN 978-1-5386-2205-6
Editor:
IEEE
DOI:
10.1109/aqtr.2018.8402708
Autores:
Priit Ruberg, Keijo Lass, Peeter Ellervee
Publicado en:
2016 IEEE Nordic Circuits and Systems Conference (NORCAS), 2016, Página(s) 1-5, ISBN 978-1-5090-1095-0
Editor:
IEEE
DOI:
10.1109/norchip.2016.7792916
Autores:
Priit Ruberg, Keijo Lass, Peeter Ellervee
Publicado en:
2016 15th Biennial Baltic Electronics Conference (BEC), 2016, Página(s) 123-126, ISBN 978-1-5090-1393-7
Editor:
IEEE
DOI:
10.1109/bec.2016.7743744
Autores:
Priit Ruberg, Keijo Lass, Elvar Liiv, Peeter Ellervee
Publicado en:
2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE), 2017, Página(s) 1-6, ISBN 978-1-5386-4137-8
Editor:
IEEE
DOI:
10.1109/aieee.2017.8270530
Autores:
Jaak Kousaar, Raimund Ubar, Sergei Kostin, Sergei Devadze, Jaan Raik
Publicado en:
"2018 25th International Conference ""Mixed Design of Integrated Circuits and System"" (MIXDES)", 2018, Página(s) 305-310, ISBN 978-83-63578-14-5
Editor:
IEEE
DOI:
10.23919/mixdes.2018.8436880
Autores:
Tarmo Robal
Publicado en:
2018 28th EAEEIE Annual Conference (EAEEIE), 2018, Página(s) 1-9, ISBN 978-1-5386-7711-7
Editor:
IEEE
DOI:
10.1109/eaeeie.2018.8534256
Autores:
Mairo Leier, Gert Jervan, Ardo Allik, Kristjan Pilt, Deniss Karai, Ivo Fridolin
Publicado en:
2018 16th Biennial Baltic Electronics Conference (BEC), 2018, Página(s) 1-4, ISBN 978-1-5386-7312-6
Editor:
IEEE
DOI:
10.1109/bec.2018.8600959
Autores:
Lembit Jurimagi, Raimund Ubar
Publicado en:
2018 16th Biennial Baltic Electronics Conference (BEC), 2018, Página(s) 1-4, ISBN 978-1-5386-7312-6
Editor:
IEEE
DOI:
10.1109/bec.2018.8600967
Autores:
Thiago Copetti, Guilherme Medeiros, Leticia Bolzani Poehls, Fabian Vargas, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Raimund Ubar
Publicado en:
2016 17th Latin-American Test Symposium (LATS), 2016, Página(s) 75-80, ISBN 978-1-5090-1331-9
Editor:
IEEE
DOI:
10.1109/latw.2016.7483343
Autores:
Jevgeni Marenkov, Tarmo Robal, Ahto Kalja
Publicado en:
Proceedings of the 8th International Conference on Web Intelligence, Mining and Semantics - WIMS '18, 2018, Página(s) 1-9, ISBN 9781-450354899
Editor:
ACM Press
DOI:
10.1145/3227609.3227667
Autores:
Karl Janson, Rene Pihlak, Siavoosh Payandeh Azad, Behrad Niazmand, Gert Jervan, Jaan Raik
Publicado en:
2018 16th Biennial Baltic Electronics Conference (BEC), 2018, Página(s) 1-4, ISBN 978-1-5386-7312-6
Editor:
IEEE
DOI:
10.1109/bec.2018.8600989
Autores:
Sai Kumar Dwivedi, Siavoosh Payandeh Azad, Peeter Ellervee, Ratnakar Dash
Publicado en:
2016 15th Biennial Baltic Electronics Conference (BEC), 2016, Página(s) 63-66, ISBN 978-1-5090-1393-7
Editor:
IEEE
DOI:
10.1109/bec.2016.7743729
Autores:
Artjom Rjabov
Publicado en:
2016 15th Biennial Baltic Electronics Conference (BEC), 2016, Página(s) 59-62, ISBN 978-1-5090-1393-7
Editor:
IEEE
DOI:
10.1109/bec.2016.7743728
Autores:
Madis Kerner, Kalle Tammemae
Publicado en:
2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2017, Página(s) 92-95, ISBN 978-1-5386-0472-4
Editor:
IEEE
DOI:
10.1109/ddecs.2017.7934577
Autores:
Lembit Jurimagi, Raimund Ubar, Maksim Jenihhin, Jaan Raik, Sergei Devadze, Sergei Kostin
Publicado en:
2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS), 2018, Página(s) 1-6, ISBN 978-1-5386-6365-3
Editor:
IEEE
DOI:
10.1109/patmos.2018.8464176
Autores:
Artjom Jasnetski, Stephen Adeboye Oyeniran, Anton Tsertov, Mario Scholzel, Raimund Ubar
Publicado en:
2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2016, Página(s) 1-6, ISBN 978-1-5090-2467-4
Editor:
IEEE
DOI:
10.1109/ddecs.2016.7482445
Autores:
Adeboye Stephen Oyeniran, Artjom Jasnetski, Anton Tsertov, Raimund Ubar
Publicado en:
2017 6th Mediterranean Conference on Embedded Computing (MECO), 2017, Página(s) 1-6, ISBN 978-1-5090-6742-8
Editor:
IEEE
DOI:
10.1109/meco.2017.7977167
Autores:
Anton Tsertov, Artur Jutman, Konstantin Shibin, Sergei Devadze
Publicado en:
2018 IEEE AUTOTESTCON, 2018, Página(s) 1-9, ISBN 978-1-5386-5223-7
Editor:
IEEE
DOI:
10.1109/autest.2018.8532559
Autores:
Sergei Odintsov
Publicado en:
2018 IEEE AUTOTESTCON, 2018, Página(s) 1-6, ISBN 978-1-5386-5223-7
Editor:
IEEE
DOI:
10.1109/autest.2018.8532547
Autores:
Johanna Sepulveda, Cezar Reinbrecht, Siavoosh Payandeh Azad, Behrad Niazmand, Gert Jervan
Publicado en:
Proceedings of the 18th International Conference on Embedded Computer Systems Architectures, Modeling, and Simulation - SAMOS '18, 2018, Página(s) 162-166, ISBN 9781-450364942
Editor:
ACM Press
DOI:
10.1145/3229631.3239367
Autores:
Tarmo Robal, Yue Zhao, Christoph Lofi, Claudia Hauff
Publicado en:
Proceedings of the 29th on Hypertext and Social Media - HT '18, 2018, Página(s) 106-114, ISBN 9781-450354271
Editor:
ACM Press
DOI:
10.1145/3209542.3209547
Autores:
Artjom Rjabov, Alexander Sudnitson, Valery Sklyarov, Iouliia Skliarova
Publicado en:
2016 18th Mediterranean Electrotechnical Conference (MELECON), 2016, Página(s) 1-4, ISBN 978-1-5090-0058-6
Editor:
IEEE
DOI:
10.1109/melcon.2016.7495400
Autores:
Behrad Niazmand, Siavoosh Payandeh Azad, Jose Flich, Jaan Raik, Gert Jervan, Thomas Hollstein
Publicado en:
2016 Tenth IEEE/ACM International Symposium on Networks-on-Chip (NOCS), 2016, Página(s) 1-8, ISBN 978-1-4673-9030-9
Editor:
IEEE
DOI:
10.1109/nocs.2016.7579317
Autores:
Raimund Ubar, Adeboye Stephen Oyeniran, Olusiji Medaiyese
Publicado en:
2018 16th Biennial Baltic Electronics Conference (BEC), 2018, Página(s) 1-4, ISBN 978-1-5386-7312-6
Editor:
IEEE
DOI:
10.1109/bec.2018.8600980
Autores:
Tarmo Robal, Ahto Kalja
Publicado en:
2016 Portland International Conference on Management of Engineering and Technology (PICMET), 2016, Página(s) 1942-1952
Editor:
IEEE
DOI:
10.1109/picmet.2016.7806759
Autores:
Raimund Ubar, Stephen Adeboye Oyeniran
Publicado en:
2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR), 2016, Página(s) 1-6, ISBN 978-1-4673-8692-0
Editor:
IEEE
DOI:
10.1109/aqtr.2016.7501287
Autores:
Artjom Jasnetski, Raimund Ubar, Anton Tsertov
Publicado en:
2016 17th Latin-American Test Symposium (LATS), 2016, Página(s) 177-177, ISBN 978-1-5090-1331-9
Editor:
IEEE
DOI:
10.1109/latw.2016.7483357
Autores:
Artur Jutman, Igor Aleksejev, Sergei Devadze
Publicado en:
2016 21th IEEE European Test Symposium (ETS), 2016, Página(s) 1-2, ISBN 978-1-4673-9659-2
Editor:
IEEE
DOI:
10.1109/ets.2016.7519295
Autores:
Konstantin Shibin, Sergei Devadze, Artur Jutman
Publicado en:
2016 17th Latin-American Test Symposium (LATS), 2016, Página(s) 69-74, ISBN 978-1-5090-1331-9
Editor:
IEEE
DOI:
10.1109/latw.2016.7483342
Autores:
Tarmo Robal, Jevgeni Marenkov, Ahto Kalja
Publicado en:
2017 Portland International Conference on Management of Engineering and Technology (PICMET), 2017, Página(s) 1-8, ISBN 978-1-890843-36-6
Editor:
IEEE
DOI:
10.23919/picmet.2017.8125425
Autores:
Adeboye Stephen Oyeniran, Siavoosh Payandeh Azad, Raimund Ubar
Publicado en:
2018 IEEE International Symposium on Circuits and Systems (ISCAS), 2018, Página(s) 1-5, ISBN 978-1-5386-4881-0
Editor:
IEEE
DOI:
10.1109/iscas.2018.8350936
Autores:
Priit Ruberg, Keijo Lass, Elvar Liiv, Peeter Ellervee
Publicado en:
2017 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC), 2017, Página(s) 1-6, ISBN 978-1-5386-2844-7
Editor:
IEEE
DOI:
10.1109/norchip.2017.8124964
Autores:
Uljana Reinsalu, Siavoosh Payandeh Azad, Mairo Leier, Kalle Tammemae, Thomas Hollstein
Publicado en:
2016 11th European Workshop on Microelectronics Education (EWME), 2016, Página(s) 1-6, ISBN 978-1-4673-8584-8
Editor:
IEEE
DOI:
10.1109/ewme.2016.7496463
Autores:
Serhiy Avramenko, Siavoosh Payandeh Azad, Stefano Esposito, Behrad Niazmand, Massimo Violante, Jaan Raik, Maksim Jenihhin
Publicado en:
2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2018, Página(s) 67-72, ISBN 978-1-5386-5754-6
Editor:
IEEE
DOI:
10.1109/ddecs.2018.00-10
Autores:
Artjom Rjabov, Valery Sklyarov, Iouliia Skliarova, Alexander Sudnitson
Publicado en:
2017 40th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO), 2017, Página(s) 176-181, ISBN 978-953-233-090-8
Editor:
IEEE
DOI:
10.23919/mipro.2017.7973413
Autores:
Iouliia Skliarova, Valery Sklyarov, Alexander Sudnitson, Margus Kruus
Publicado en:
2017 IEEE Global Engineering Education Conference (EDUCON), 2017, Página(s) 1084-1088, ISBN 978-1-5090-5467-1
Editor:
IEEE
DOI:
10.1109/educon.2017.7942983
Autores:
Artur Jutman, Konstantin Shibin, Sergei Devadze
Publicado en:
2016 IEEE AUTOTESTCON, 2016, Página(s) 1-10, ISBN 978-1-5090-0790-5
Editor:
IEEE
DOI:
10.1109/autest.2016.7589605
Autores:
Siavoosh Payandeh Azad, Adeboye Stephen Oyeniran, Raimund Ubar
Publicado en:
2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2018, Página(s) 21-26, ISBN 978-1-5386-5754-6
Editor:
IEEE
DOI:
10.1109/ddecs.2018.00011
Autores:
Raimund Ubar, Lembit Jurimagi, Elmet Orasson, Jaan Raik
Publicado en:
2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC), 2015, Página(s) 171-176, ISBN 978-1-4673-9140-5
Editor:
IEEE
DOI:
10.1109/vlsi-soc.2015.7314411
Autores:
Raivo Sell, Mairo Leier, Anton Rassolkin, Juhan-Peep Ernits
Publicado en:
2018 19th International Conference on Research and Education in Mechatronics (REM), 2018, Página(s) 111-116, ISBN 978-1-5386-5413-2
Editor:
IEEE
DOI:
10.1109/rem.2018.8421793
Autores:
Siavoosh Payandeh Azad, Behrad Niazmand, Peeter Ellervee, Jaan Raik, Gert Jervan, Thomas Hollstein
Publicado en:
2016 11th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC), 2016, Página(s) 1-6, ISBN 978-1-5090-2520-6
Editor:
IEEE
DOI:
10.1109/recosoc.2016.7533903
Autores:
Karl Janson, Carl Johann Treudler, Thomas Hollstein, Jaan Raik, Maksim Jenihhin, Goerschwin Fey
Publicado en:
2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2018, Página(s) 147-152, ISBN 978-1-5386-5754-6
Editor:
IEEE
DOI:
10.1109/ddecs.2018.00033
Autores:
C. Sgouropoulou, I. Voyiatzis, A. Koutoumanos, S. Hamdioui, P. Pouyan, M. Comte, P. Prinetto, G. Airo Farulla, P. Ellervee, C. Delgado Kloos, R. Crespo Garcia
Publicado en:
2017 IEEE Global Engineering Education Conference (EDUCON), 2017, Página(s) 1619-1621, ISBN 978-1-5090-5467-1
Editor:
IEEE
DOI:
10.1109/educon.2017.7943065
Autores:
Yue Zhao, Tarmo Robal, Christoph Lofi, Claudia Hauff
Publicado en:
Adjunct Publication of the 26th Conference on User Modeling, Adaptation and Personalization - UMAP '18, 2018, Página(s) 299-303, ISBN 9781-450357845
Editor:
ACM Press
DOI:
10.1145/3213586.3225241
Autores:
Raimund Ubar, Lembit Jurimagi, Maksim Jenihhin, Jaan Raik, Niyi-Leigh Olugbenga, Vladimir Viies
Publicado en:
2018 7th Mediterranean Conference on Embedded Computing (MECO), 2018, Página(s) 1-6, ISBN 978-1-5386-5683-9
Editor:
IEEE
DOI:
10.1109/meco.2018.8406051
Autores:
Muhammad Adeel Tajammul, Syed M. A. H. Jafri, Ahmed Hemani, Peter Ellervee
Publicado en:
2016 26th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS), 2016, Página(s) 92-99, ISBN 978-1-5090-0733-2
Editor:
IEEE
DOI:
10.1109/patmos.2016.7833431
Autores:
Tarmo Robal, Yue Zhao, Christoph Lofi, Claudia Hauff
Publicado en:
Proceedings of the 2018 Conference on Human Information Interaction&Retrieval - IUI '18, 2018, Página(s) 189-197, ISBN 9781-450349451
Editor:
ACM Press
DOI:
10.1145/3172944.3172987
Autores:
Maksim Jenihhin, Alexander Kamkin, Zainalabedin Navabi, Somayeh Sadeghi-Kohan
Publicado en:
2016 IEEE East-West Design & Test Symposium (EWDTS), 2016, Página(s) 1-5, ISBN 978-1-5090-0693-9
Editor:
IEEE
DOI:
10.1109/ewdts.2016.7807635
Autores:
Marenkov, Jevgeni; Robal, Tarmo; Kalja, Ahto
Publicado en:
2016
Editor:
IOS Press
DOI:
10.3233/978-1-61499-714-6-283
Autores:
Artjom Jasnetski, Raimund Ubar, Anton Tsertov
Publicado en:
"2017 MIXDES - 24th International Conference ""Mixed Design of Integrated Circuits and Systems", 2017, Página(s) 453-458, ISBN 978-83-63578-12-1
Editor:
IEEE
DOI:
10.23919/mixdes.2017.8005252
Autores:
Allik, A.; Mägi, S.; Pilt, K.; Karai, D.; Fridolin I.; Leier, M.; Jervan, G.
Publicado en:
2017
Editor:
Springer
Autores:
Põld, Janari; Kalja, Ahto; Robal, Tarmo
Publicado en:
2017
Editor:
IOS Press
DOI:
10.3233/978-1-61499-720-7-13
Autores:
Artur Jutman, Christophe Lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans Kerkhoff, Rene Krenz-Baath, Piet Engelke
Publicado en:
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017, 2017, Página(s) 115-120, ISBN 978-3-9815370-8-6
Editor:
IEEE
DOI:
10.23919/DATE.2017.7926968
Autores:
Francesco Pellerey, Maksim Jenihhin, Giovanni Squillero, Jaan Raik, Matteo Sonza Reorda, Valentin Tihhomirov, Raimund Ubar
Publicado en:
2016 IEEE 25th Asian Test Symposium (ATS), 2016, Página(s) 304-309, ISBN 978-1-5090-3809-1
Editor:
IEEE
DOI:
10.1109/ATS.2016.57
Autores:
Gadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon Ter Braak, Sergei Devadze, Goerschwin Fey, Maksim Jenihhin, Artur Jutman, Hans G. Kerkhoff, Robert Konighofer, Jan Malburg, Shiri Moran, Jaan Raik, Gerard Rauwerda, Heinz Riener, Franz Rock, Konstantin Shibin, Kim Sunesen, Jinbo Wan, Yong Zhao
Publicado en:
2016 Forum on Specification and Design Languages (FDL), 2016, Página(s) 1-8, ISBN 979-10-92279-17-7
Editor:
IEEE
DOI:
10.1109/FDL.2016.7880382
Autores:
D. Appello, P. Bernardi, G. Giacopelli, A. Motta, A. Pagani, G. Pollaccia, C. Rabbi, M. Restifo, P. Ruberg, E. Sanchez, C.M. Villa, F. Venini
Publicado en:
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017, 2017, Página(s) 646-649, ISBN 978-3-9815370-8-6
Editor:
IEEE
DOI:
10.23919/DATE.2017.7927068
Autores:
Pietro Saltarelli, Behrad Niazmand, Ranganathan Hariharan, Jaan Raik, Gert Jervan, Thomas Hollstein
Publicado en:
2015 10th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC), 2015, Página(s) 1-8, ISBN 978-1-4673-7942-7
Editor:
IEEE
DOI:
10.1109/ReCoSoC.2015.7238079
Autores:
Pietro Saltarelli, Behrad Niazmand, Jaan Raik, Ranganathan Hariharan, Gert Jervan, Thomas Hollstein
Publicado en:
2015 Euromicro Conference on Digital System Design, 2015, Página(s) 288-292, ISBN 978-1-4673-8035-5
Editor:
IEEE
DOI:
10.1109/DSD.2015.15
Autores:
Syed, Saif Abrar; Jenihhin, Maksim; Raik, Jaan.
Publicado en:
International Conference on Advances in Computing, Communications and Informatics (ICACCI), Kochi, India, August 10-13, 2015, 2015, Página(s) 1-6
Editor:
IEEE
Autores:
Pietro Saltarelli, Behrad Niazmand, Jaan Raik, Vineeth Govind, Thomas Hollstein, Gert Jervan, Ranganathan Hariharan
Publicado en:
Proceedings of the 9th International Symposium on Networks-on-Chip - NOCS '15, 2015, Página(s) 1-8, ISBN 9781450333962
Editor:
ACM Press
DOI:
10.1145/2786572.2788713
Autores:
Palermo, N.; Tihhomirov, V.; Copetti, T.S.; Jenihhin, M.; Raik, J.; Kostin, S.; Gaudesi, M.; Squillero, G.; Sonza Reorda, M.; Vargas, F.; Bolzani Poehls, L.
Publicado en:
16th IEEE Latin-American Test Symposium March 25 - 27, 2015, Puerto Vallarta, Mexico, 2015, Página(s) 1-6
Editor:
IEEE Computer Society Press
Autores:
Ubar, Raimund; Jürimägi, Lembit; Orasson, Elmet; Raik, Jaan
Publicado en:
IFIP/IEEE International Conference on Very Large Scale Integration - VLSI-SoC'2015, 2015, Página(s) 1-6
Editor:
IEEE Computer Society Press
Autores:
Jasnetski, Artjom; Raik, Jaan; Tsertov, Anton; Ubar, Raimund
Publicado en:
IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - DDECS, 2015, Página(s) 1-6
Editor:
IEEE Computer Society Press
Autores:
Kostin, Sergei; Raik, Jaan; Ubar, Raimund; Jenihhin, Maksim; Copetti, Thiago; Vargas, Fabian; Bolzani Poehls, Leticia
Publicado en:
IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2015, Belgrade, Serbia, 2015, Página(s) 1-6
Editor:
IEEE Computer Society Press
Autores:
Syed, Saif Abrar; Jenihhin, Maksim; Raik, Jaan
Publicado en:
IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2015, Belgrade, Serbia, 2015, Página(s) 1-4
Editor:
IEEE Computer Society Press
Autores:
Vierhaus, Heinrich; Raik, Jaan; Ubar, Raimund
Publicado en:
Proceedings of the 10th European Workshop on Microelectronics Education – EWME, 2014, Página(s) 1-4
Editor:
IEEE Computer Society
Autores:
Syed Saif Abrar, Maksim Jenihhin, Jaan Raik
Publicado en:
2014 IEEE International Advance Computing Conference (IACC), 2014, Página(s) 50-55, ISBN 978-1-4799-2572-8
Editor:
IEEE
DOI:
10.1109/IAdCC.2014.6779293
Autores:
Kõusaar, J.; Ubar, R.; Devadze, S.; Raik, J.
Publicado en:
17th Euromicro Conference on Digital System Design, Verona, Italy, August 27-29, 2014, 2014
Editor:
IEEE Computer Society
Autores:
Gaudesi, Marco; Jenihhin, Maksim; Raik, Jaan; Sanchez, Ernesto; Squillero, Giovanni; Tihomirov, Valentin; Ubar, Raimund
Publicado en:
Genetic and Evolutionary Computation Conference, Vancouver, BC, Canada, July 12-16, 2014, 2014, Página(s) 1-6
Editor:
IEEE Computer Society Press
Autores:
Valentin Tihhomirov, Anton Tsepurov, Maksim Jenihhin, Jaan Raik, Raimund Ubar
Publicado en:
2013 14th Latin American Test Workshop - LATW, 2013, Página(s) 1-6, ISBN 978-1-4799-0597-3
Editor:
IEEE
DOI:
10.1109/LATW.2013.6562665
Autores:
Niazmand, Behrad; Hariharan, Ranganathan; Govind, Vineeth; Jervan, Gert; Hollstein, Thomas; Raik, Jaan
Publicado en:
Baltic Electronic Conference, Laulasmaa, Estonia, 2014, Página(s) 1-4
Editor:
IEEE
Autores:
Syed, Saif Abrar; Jenihhin, Maksim; Raik, Jaan
Publicado en:
15th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Karlovy Vary, Czech Republic, April 8-10, 2013, 2013, Página(s) 112-115
Editor:
IEEE
Autores:
Maksim Gorev, Raimund Ubar, Peeter Ellervee, Sergei Devadze, Jaan Raik, Mart Min
Publicado en:
2013 NORCHIP, 2013, Página(s) 1-6, ISBN 978-1-4799-1647-4
Editor:
IEEE
DOI:
10.1109/NORCHIP.2013.6702000
Autores:
Syed, Saif Abrar; Shyam, Kiran A.; Jenihhin, Maksim; Raik, Jaan; Babu, C.
Publicado en:
Proc. of 2nd IEEE International Conference on Advances in Computing, Communications & Informatics, 2013, Página(s) 1-6
Editor:
IEEE
Autores:
Ubar, Raimund; Vargas, Fabian; Jenihhin, Maksim; Raik, Jaan; Kostin, Serge; Bolzani Poehls, Letícia
Publicado en:
Proceedings of the 16th Euromicro Conference on Digital System Design, 2013, Página(s) 136–141
Editor:
IEEE Computer Society Press
Autores:
Ubar, Raimund; Kostin, Sergei; Raik, Jaan
Publicado en:
8th Int. Conference on Design & Technology of Integrated Systems in Nanoscale Era - DTIS’13, 2013, Página(s) 1-6
Editor:
IEEE Computer Society
Autores:
Jevgeni Marenkov, Tarmo Robal, Ahto Kalja
Publicado en:
Complex Systems Informatics and Modeling Quarterly, Edición 15, 2018, Página(s) 90-109, ISSN 2255-9922
Editor:
0302-9743
DOI:
10.7250/csimq.2018-15.05
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