Picometer metrology for light-element nanostructures: making every electron count

Element specific atom counting for heterogeneous nanostructures : combining multiple ADF STEM images for simultaneous thickness and composition determination

Author(s): Sentürk Duygu Gizem, De Backer Annick, Van Aert Sandra
Published in: Ultramicroscopy, Issue 259, 2024, Page(s) 113941, ISSN 0304-3991
Publisher: Elsevier BV
DOI: 10.1016/j.ultramic.2024.113941

3D Characterization and Plasmon Mapping of Gold Nanorods Welded by Femtosecond Laser Irradiation

Author(s): Thaís Milagres de Oliveira, Wiebke Albrecht, Guillermo González-Rubio, Thomas Altantzis, Ivan Pedro Lobato Hoyos, Armand Béché, Sandra Van Aert, Andrés Guerrero-Martínez, Luis M. Liz-Marzán, Sara Bals
Published in: ACS Nano, Issue 14/10, 2020, Page(s) 12558-12570, ISSN 1936-0851
Publisher: American Chemical Society
DOI: 10.1021/acsnano.0c02610

Alloy CsCd x Pb 1– x Br 3 Perovskite Nanocrystals: The Role of Surface Passivation in Preserving Composition and Blue Emission

Author(s): Muhammad Imran, Julien Ramade, Francesco Di Stasio, Manuela De Franco, Joka Buha, Sandra Van Aert, Luca Goldoni, Simone Lauciello, Mirko Prato, Ivan Infante, Sara Bals, Liberato Manna
Published in: Chemistry of Materials, 2020, ISSN 0897-4756
Publisher: American Chemical Society
DOI: 10.1021/acs.chemmater.0c03825

Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt

Author(s): De wael, A.; De Backer, A.; Lobato, I.; Van Aert, S.
Published in: Ultramicroscopy, Issue 03043991, 2021, Page(s) 113391, ISSN 0304-3991
Publisher: Elsevier BV
DOI: 10.1016/j.ultramic.2021.113391

Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network

Author(s): Lobato Hoyos Ivan Pedro, De Backer A., Van Aert Sandra
Published in: Ultramicroscopy, Issue 251, 2023, Page(s) 113769, ISSN 0304-3991
Publisher: Elsevier BV
DOI: 10.1016/j.ultramic.2023.113769

Phase object reconstruction for 4D-STEM using deep learning

Author(s): Friedrich Thomas, Yu Chu-Ping, Verbeeck Johan, Van Aert Sandra
Published in: Microscopy and microanalysis, Issue 29, 2023, Page(s) 395, ISSN 1431-9276
Publisher: Cambridge University Press
DOI: 10.1093/micmic/ozac002

Interface Pattern Engineering in Core‐Shell Upconverting Nanocrystals: Shedding Light on Critical Parameters and Consequences for the Photoluminescence Properties

Author(s): Hudry, D.; De Backer, A.; Popescu, R.; Busko, D.; Howard, I.A.; Bals, S.; Zhang, Y.; Pedrazo‐Tardajos, A.; Van Aert, S.; Gerthsen, D.; Altantzis, T.; Richards, B.S.
Published in: Small, Issue 16136810, 2021, Page(s) 2104441, ISSN 1613-6810
Publisher: Wiley - V C H Verlag GmbbH & Co.
DOI: 10.1002/smll.202104441

Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X‐ray Spectroscopy

Author(s): De Backer, A.; Zhang, Z.; van den Bos, K.H.W.; Bladt, E.; Sánchez‐Iglesias, A.; Liz‐Marzán, L.M.; Nellist, P.D.; Bals, S.; Van Aert, S.
Published in: Small Methods, Issue 23669608, 2022, Page(s) 2200875, ISSN 2366-9608
Publisher: Wiley-v c h verlag gmbh
DOI: 10.1002/smtd.202200875

Three-Dimensional Nanoparticle Transformations Captured by an Electron Microscope

Author(s): Wiebke Albrecht, Sandra Van Aert, Sara Bals
Published in: Accounts of Chemical Research, Issue 54/5, 2021, Page(s) 1189-1199, ISSN 0001-4842
Publisher: American Chemical Society
DOI: 10.1021/acs.accounts.0c00711

Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy

Author(s): Annelies De wael, Annick De Backer, Lewys Jones, Aakash Varambhia, Peter D. Nellist, Sandra Van Aert
Published in: Physical Review Letters, Issue 124/10, 2020, ISSN 0031-9007
Publisher: American Physical Society
DOI: 10.1103/physrevlett.124.106105

Coupling Charge and Topological Reconstructions at Polar Oxide Interfaces

Author(s): van Thiel, T. c.; Brzezicki, W.; Autieri, C.; Hortensius, J. r.; Afanasiev, D.; Gauquelin, N.; Jannis, D.; Janssen, N.; Groenendijk, D. j.; Fatermans, J.; Van Aert, S.; Verbeeck, J.; Cuoco, M.; Caviglia, A. d.
Published in: Physical review letters, Issue 00319007, 2021, Page(s) 127202, ISSN 0031-9007
Publisher: American Physical Society
DOI: 10.1103/physrevlett.127.127202

Sampling Real-Time Atomic Dynamics in Metal Nanoparticles by Combining Experiments, Simulations, and Machine Learning

Author(s): Matteo Cioni, Massimo Delle Piane, Daniela Polino, Daniele Rapetti, Martina Crippa, Ece Arslan Irmak, Sandra Van Aert, Sara Bals, and Giovanni M. Pavan
Published in: Advanced Science, 2024, Page(s) 1-13, ISSN 2198-3844
Publisher: Wiley
DOI: 10.1002/advs.202307261

Thermal Activation of Gold Atom Diffusion in Au@Pt Nanorods

Author(s): Pedrazo-Tardajos, A.; Arslan Irmak, E.; Kumar, V.; Sánchez-Iglesias, A.; Chen, Q.; Wirix, M.; Freitag, B.; Albrecht, W.; Van Aert, S.; Liz-Marzán, L.M.; Bals, S.
Published in: ACS nano, Issue 19360851, 2022, Page(s) 9608-9619, ISSN 1936-0851
Publisher: American Chemical Society
DOI: 10.1021/acsnano.2c02889

Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution

Author(s): Robert, Hl.; Lobato, I.; Lyu, Fj.; Chen, Q.; Van Aert, S.; Van Dyck, D.; Müller-Caspary, K.
Published in: Ultramicroscopy, Issue 03043991, 2022, Page(s) 113425, ISSN 0304-3991
Publisher: Elsevier BV
DOI: 10.1016/j.ultramic.2021.113425

Atom counting from a combination of two ADF STEM images

Author(s): Sentürk Duygu Gizem, Yu C.P., De Backer A., Van Aert Sandra
Published in: Ultramicroscopy, Issue 255, 2024, Page(s) 113859, ISSN 0304-3991
Publisher: Elsevier BV
DOI: 10.1016/j.ultramic.2023.113859

Low-dose 4D-STEM tomography for beam-sensitive nanocomposites

Author(s): Hugenschmidt Milena, Jannis Daen, Kadu Ajinkya Anil, Grünewald Lukas, De Marchi Sarah, Perez-Juste Jorge, Verbeeck Johan, Van Aert Sandra, Bals Sara
Published in: ACS materials letters, Issue 6, 2023, Page(s) 165-173, ISSN 2639-4979
Publisher: American Chemical Society
DOI: 10.1021/acsmaterialslett.3c01042

Berry phase engineering at oxide interfaces

Author(s): D. J. Groenendijk, C. Autieri, T. C. van Thiel, W. Brzezicki, J. R. Hortensius, D. Afanasiev, N. Gauquelin, P. Barone, K. H. W. van den Bos, S. van Aert, J. Verbeeck, A. Filippetti, S. Picozzi, M. Cuoco, A. D. Caviglia
Published in: Physical Review Research, Issue 2/2, 2020, ISSN 2643-1564
Publisher: American Physical Society
DOI: 10.1103/physrevresearch.2.023404

A decade of atom-counting in STEM : from the first results toward reliable 3D atomic models from a single projection

Author(s): De Backer Annick, Bals Sara, Van Aert Sandra, Van Aert Sandra
Published in: Ultramicroscopy, Issue 247, 2023, Page(s) 113702, ISSN 0304-3991
Publisher: Elsevier BV
DOI: 10.1016/j.ultramic.2023.113702

Experimental reconstructions of 3D atomic structures from electron microscopy images using a Bayesian genetic algorithm

Author(s): De Backer, A.; Van Aert, S.; Faes, C.; Arslan Irmak, E.; Nellist, P.D.; Jones, L.
Published in: npj Computational Materials, Issue 20573960, 2022, Page(s) 1-8, ISSN 2057-3960
Publisher: N P J Computational Materials / Chinese academy of sciences
DOI: 10.1038/s41524-022-00900-w

Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images

Author(s): J. Fatermans, A. J. den Dekker, K. Müller-Caspary, I. Lobato, C. M. O’Leary, P. D. Nellist, S. Van Aert
Published in: Physical Review Letters, Issue 121/5, 2018, ISSN 0031-9007
Publisher: American Physical Society
DOI: 10.1103/PHYSREVLETT.121.056101

The atomic lensing model: New opportunities for atom-by-atom metrology of heterogeneous nanomaterials

Author(s): K.H.W. van den Bos, L. Janssens, A. De Backer, P.D. Nellist, S. Van Aert
Published in: Ultramicroscopy, Issue 203, 2019, Page(s) 155-162, ISSN 0304-3991
Publisher: Elsevier BV
DOI: 10.1016/j.ultramic.2018.12.004

Electrical Polarization in AlN/GaN Nanodisks Measured by Momentum-Resolved 4D Scanning Transmission Electron Microscopy

Author(s): Knut Müller-Caspary, Tim Grieb, Jan Müßener, Nicolas Gauquelin, Pascal Hille, Jörg Schörmann, Johan Verbeeck, Sandra Van Aert, Martin Eickhoff, Andreas Rosenauer
Published in: Physical Review Letters, Issue 122/10, 2019, ISSN 0031-9007
Publisher: American Physical Society
DOI: 10.1103/PHYSREVLETT.122.106102

Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp

Author(s): Giulio Guzzinati, Thomas Altantzis, Maria Batuk, Annick De Backer, Gunnar Lumbeeck, Vahid Samaee, Dmitry Batuk, Hosni Idrissi, Joke Hadermann, Sandra Van Aert, Dominique Schryvers, Johan Verbeeck, Sara Bals
Published in: Materials, Issue 11/8, 2018, Page(s) 1304, ISSN 1996-1944
Publisher: MDPI Open Access Publishing
DOI: 10.3390/ma11081304

Quantitative 3D Characterization of Elemental Diffusion Dynamics in Individual Ag@Au Nanoparticles with Different Shapes

Author(s): Alexander Skorikov, Wiebke Albrecht, Eva Bladt, Xiaobin Xie, Jessi E. S. van der Hoeven, Alfons van Blaaderen, Sandra Van Aert, Sara Bals
Published in: ACS Nano, Issue 13/11, 2019, Page(s) 13421-13429, ISSN 1936-0851
Publisher: American Chemical Society
DOI: 10.1021/acsnano.9b06848

Self‐Assembly of Atomically Thin Chiral Copper Heterostructures Templated by Black Phosphorus

Author(s): Hannah C. Nerl, Anuj Pokle, Lewys Jones, Knut Müller‐Caspary, Karel H. W. Bos, Clive Downing, Eoin K. McCarthy, Nicolas Gauquelin, Quentin M. Ramasse, Ivan Lobato, Dermot Daly, Juan Carlos Idrobo, Sandra Van Aert, Gustaaf Van Tendeloo, Stefano Sanvito, Jonathan N. Coleman, Clotilde S. Cucinotta, Valeria Nicolosi
Published in: Advanced Functional Materials, Issue 29/37, 2019, Page(s) 1903120, ISSN 1616-301X
Publisher: John Wiley & Sons Ltd.
DOI: 10.1002/adfm.201903120

Three-Dimensional Quantification of the Facet Evolution of Pt Nanoparticles in a Variable Gaseous Environment

Author(s): Thomas Altantzis, Ivan Lobato, Annick De Backer, Armand Béché, Yang Zhang, Shibabrata Basak, Mauro Porcu, Qiang Xu, Ana Sánchez-Iglesias, Luis M. Liz-Marzán, Gustaaf Van Tendeloo, Sandra Van Aert, Sara Bals
Published in: Nano Letters, Issue 19/1, 2018, Page(s) 477-481, ISSN 1530-6984
Publisher: American Chemical Society
DOI: 10.1021/ACS.NANOLETT.8B04303

The maximum a posteriori probability rule for atom column detection from HAADF STEM images

Author(s): J. Fatermans, S. Van Aert, A.J. den Dekker
Published in: Ultramicroscopy, Issue 201, 2019, Page(s) 81-91, ISSN 0304-3991
Publisher: Elsevier BV
DOI: 10.1016/j.ultramic.2019.02.003

Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy

Author(s): Sandra Van Aert, Annick De Backer, Lewys Jones, Gerardo T. Martinez, Armand Béché, Peter D. Nellist
Published in: Physical Review Letters, Issue 122/6, 2019, ISSN 0031-9007
Publisher: American Physical Society
DOI: 10.1103/PHYSREVLETT.122.066101

Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose

Author(s): Knut Müller-Caspary, Florian F. Krause, Florian Winkler, Armand Béché, Johan Verbeeck, Sandra Van Aert, Andreas Rosenauer
Published in: Ultramicroscopy, Issue 203, 2019, Page(s) 95-104, ISSN 0304-3991
Publisher: Elsevier BV
DOI: 10.1016/J.ULTRAMIC.2018.12.018

Monitoring oxygen production on mass-selected iridium–tantalum oxide electrocatalysts

Author(s): Zheng, Y.-R.; Vernieres, J.; Wang, Z.; Zhang, K.; Hochfilzer, D.; Krempl, K.; Liao, T.-W.; Presel, F.; Altantzis, T.; Fatermans, J.; Scott, S.B.; Secher, N.M.; Moon, C.; Liu, P.; Bals, S.; Van Aert, S.; Cao, A.; Anand, M.; Nørskov, J.K.; Kibsgaard, J.; Chorkendorff, I.
Published in: Nature Energy, Issue 20587546, 2021, ISSN 2058-7546
Publisher: Nature Publishing Group
DOI: 10.1038/s41560-021-00948-w

3D Atomic‐Scale Dynamics of Laser‐Light‐Induced Restructuring of Nanoparticles Unraveled by Electron Tomography

Author(s): Albrecht, W.; Arslan Irmak, E.; Altantzis, T.; Pedrazo‐Tardajos, A.; Skorikov, A.; Deng, T.‐S.; van der Hoeven, J.E.S.; van Blaaderen, A.; Van Aert, S.; Bals, S.
Published in: Advanced materials, Issue 09359648, 2021, Page(s) 2100972, ISSN 0935-9648
Publisher: United Nations Industrial Developement Organization
DOI: 10.1002/adma.202100972

Three-dimensional atomic structure of supported Au nanoparticles at high temperature

Author(s): Pei Liu, Ece Arslan Irmak, Annick De Backer, Annelies De wael, Ivan Lobato, Armand Béché, Sandra Van Aert, Sara Bals
Published in: Nanoscale, Issue 13/3, 2021, Page(s) 1770-1776, ISSN 2040-3364
Publisher: Royal Society of Chemistry
DOI: 10.1039/d0nr08664a

Deep convolutional neural networks to restore single-shot electron microscopy images

Author(s): Lobato Hoyos Ivan Pedro, Friedrich Thomas, Van Aert Sandra
Published in: NPJ Computational Materials, Issue 10, 2024, Page(s) 1-19, ISSN 2057-3960
Publisher: Springer Nature
DOI: 10.1038/s41524-023-01188-0

Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors

Author(s): Sentürk, D.G.; De Backer, A.; Friedrich, T.; Van Aert, S.
Published in: Ultramicroscopy, Issue 03043991, 2022, Page(s) 113626, ISSN 0304-3991
Publisher: Elsevier BV
DOI: 10.1016/j.ultramic.2022.113626

Atomic-scale detection of individual lead clusters confined in Linde Type A zeolites

Author(s): Fatermans, J.; Romolini, G.; Altantzis, T.; Hofkens, J.; Roeffaers, M.B.J.; Bals, S.; Van Aert, S.
Published in: Nanoscale, Issue 20403364, 2022, Page(s) 9323-9330, ISSN 2040-3364
Publisher: Royal Society of Chemistry
DOI: 10.1039/d2nr01819e

Preventing cation intermixing enables 50% quantum yield in sub-15 nm short-wave infrared-emitting rare-earth based core-shell nanocrystals

Author(s): Fernando Arteaga Cardona; Noopur Jain; Radian Popescu; Dmitry Busko; Eduard Madirov; Bernardo A. Arús; Dagmar Gerthsen; Annick De Backer; Sara Bals; Oliver T. Bruns; Andriy Chmyrov; Sandra Van Aert; Bryce S. Richards; Damien Hudry
Published in: Nature Communications, Issue 14, 2023, Page(s) 1-14, ISSN 2041-1723
Publisher: Nature Publishing Group
DOI: 10.1038/s41467-023-40031-4

Restructuring of titanium oxide overlayers over nickel nanoparticles during catalysis

Author(s): Monai Matteo, Jenkinson Kellie, Melcherts Angela E.M., Louwen Jaap N., Arslan Irmak Ece, Van Aert Sandra, Altantzis Thomas, Vogt Charlotte, van der Stam Ward, Duchon Tomas, Smid Bretislav, Groeneveld Esther, Berben Peter, Bals Sara, Weckhuysen Bert M.
Published in: Science, Issue 380, 2023, Page(s) 644-651, ISSN 0036-8075
Publisher: American Association for the Advancement of Science
DOI: 10.1126/science.adf6984

3D Atomic Structure of Supported Metallic Nanoparticles Estimated from 2D ADF STEM Images: A Combination of Atom – Counting and a Local Minima Search Algorithm

Author(s): Arslan Irmak, E.; Liu, P.; Bals, S.; Van Aert, S.
Published in: Small methods, Issue 23669608, 2021, Page(s) 2101150, ISSN 2366-9608
Publisher: Wiley-VCH GmbH
DOI: 10.1002/smtd.202101150

Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEM

Author(s): Yu, C.-P.; Friedrich, T.; Jannis, D.; Van Aert, S.; Verbeeck, J.
Published in: Microscopy and microanalysis, Issue 14319276, 2022, Page(s) 1526-1537, ISSN 1431-9276
Publisher: Cambridge University Press
DOI: 10.1017/s1431927622000617

Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitations

Author(s): Annelies De wael, Annick De Backer, Sandra Van Aert
Published in: Ultramicroscopy, Issue 219, 2020, Page(s) 113131, ISSN 0304-3991
Publisher: Elsevier BV
DOI: 10.1016/j.ultramic.2020.113131

An atomically dispersed Mn-photocatalyst for generating hydrogen peroxide from seawater via the Water Oxidation Reaction (WOR)

Author(s): Ren Peng, Zhang Tong, Jain Noopur, Ching Hong Yue Vincent, Jaworski Aleksander, Barcaro Giovanni, Monti Susanna, Silvestre-Albero Joaquin, Celorrio Veronica, Chouhan Lata, Rokicinska Anna, Debroye Elke, Kustrowski Piotr, Van Doorslaer Sabine, Van Aert Sandra, Bals Sara, Das Shoubhik
Published in: Journal of the American Chemical Society, Issue 145, 2023, Page(s) 16584-16596, ISSN 0002-7863
Publisher: American Chemical Society
DOI: 10.1021/jacs.3c03785

Three approaches for representing the statistical uncertainty on atom-counting results in quantitative ADF STEM

Author(s): De wael, A.; De Backer, A.; Yu, C.-P.; Sentürk, D.G.; Lobato, I.; Faes, C.; Van Aert, S.
Published in: Microscopy and microanalysis, Issue 14319276, 2022, Page(s) 1-9, ISSN 1431-9276
Publisher: Cambridge University Press
DOI: 10.1017/s1431927622012284

Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions

Author(s): Zhang, Zezhong; Lobato, Ivan; De Backer, Annick; Van Aert, Sandra; Nellist, Peter
Published in: Ultramicroscopy, Issue 246, 2023, Page(s) 113671, ISSN 0304-3991
Publisher: Elsevier BV
DOI: 10.1016/j.ultramic.2022.113671

Atom column detection from simultaneously acquired ABF and ADF STEM images

Author(s): J. Fatermans, A.J. den Dekker, K. Müller-Caspary, N. Gauquelin, J. Verbeeck, S. Van Aert
Published in: Ultramicroscopy, Issue 219, 2020, Page(s) 113046, ISSN 0304-3991
Publisher: Elsevier BV
DOI: 10.1016/j.ultramic.2020.113046

Optimal experiment design for nanoparticle atom counting from ADF STEM images

Author(s): Annick De Backer, Jarmo Fatermans, Arnold J. den Dekker, Sandra Van Aert
Published in: Quantitative Atomic-Resolution Electron Microscopy, Issue 217, 2021, Page(s) 145-175, ISBN 9780128246078
Publisher: Elsevier
DOI: 10.1016/bs.aiep.2021.01.005

Statistical parameter estimation theory: principles and simulation studies

Author(s): Annick De Backer, Jarmo Fatermans, Arnold J. den Dekker, Sandra Van Aert
Published in: Quantitative Atomic-Resolution Electron Microscopy, Issue 217, 2021, Page(s) 29-72, ISBN 9780128246078
Publisher: Elsevier
DOI: 10.1016/bs.aiep.2021.01.002

Atom column detection

Author(s): Jarmo Fatermans, Annick De Backer, Arnold J. den Dekker, Sandra Van Aert
Published in: Quantitative Atomic-Resolution Electron Microscopy, Issue 217, 2021, Page(s) 177-214, ISBN 9780128246078
Publisher: Elsevier
DOI: 10.1016/bs.aiep.2021.01.006

Efficient fitting algorithm

Author(s): Annick De Backer, Jarmo Fatermans, Arnold J. den Dekker, Sandra Van Aert
Published in: Quantitative Atomic-Resolution Electron Microscopy, Issue 217, 2021, Page(s) 73-90, ISBN 9780128246078
Publisher: Elsevier
DOI: 10.1016/bs.aiep.2021.01.003

Atom counting

Author(s): Annick De Backer, Jarmo Fatermans, Arnold J. den Dekker, Sandra Van Aert
Published in: Quantitative Atomic-Resolution Electron Microscopy, Issue 217, 2021, Page(s) 91-144, ISBN 9780128246078
Publisher: Elsevier
DOI: 10.1016/bs.aiep.2021.01.004

Introduction

Author(s): Annick De Backer, Jarmo Fatermans, Arnold J. den Dekker, Sandra Van Aert
Published in: Quantitative Atomic-Resolution Electron Microscopy, Issue 217, 2021, Page(s) 1-28, ISBN 9780128246078
Publisher: Elsevier
DOI: 10.1016/bs.aiep.2021.01.001

Image-quality evaluation and model selection with maximum a posteriori probability

Author(s): Jarmo Fatermans, Annick De Backer, Arnold J. den Dekker, Sandra Van Aert
Published in: Quantitative Atomic-Resolution Electron Microscopy, Issue 217, 2021, Page(s) 215-242, ISBN 9780128246078
Publisher: Elsevier
DOI: 10.1016/bs.aiep.2021.01.007

General conclusions and future perspectives

Author(s): Annick De Backer, Jarmo Fatermans, Arnold J. den Dekker, Sandra Van Aert
Published in: Quantitative Atomic-Resolution Electron Microscopy, Issue 217, 2021, Page(s) 243-253, ISBN 9780128246078
Publisher: Elsevier
DOI: 10.1016/bs.aiep.2021.01.008

Phase retrieval from 4-dimensional electron diffraction datasets

Author(s): Friedrich, Thomas; Yu, Chu-Ping; Verbeek, Johan; Pennycook, Timothy; Van Aert, Sandra
Published in: IEEE International Conference on Image Processing (ICIP), SEP 19-22, 2021, Electr. network, 2021, Page(s) 3453-3457, ISBN 978-1-6654-4115-5
Publisher: IEEE
DOI: 10.1109/icip42928.2021.9506709

Unscrambling complex heterogeneous nanostructures by using quantitative 4D scanning transmission electron microscopy

Author(s): Duygu Gizem Şentürk
Published in: 2024
Publisher: University of Antwerp

Quantifying atomic structures using neural networks from 4D scanning transmission electron microscopy (STEM) datasets

Author(s): Friedrich, Thomas
Published in: 2023
Publisher: University of Antwerp

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