CORDIS - Resultados de investigaciones de la UE
CORDIS

Pan-European Training, research and education network on Electromagnetic Risk management

Resultado final

Publicaciones

Study of Random Field Coupling onto a Scooter following the Risk-based EMC Approach

Autores: V. Gkatsi, R. Vogt-Ardatjew, F. Leferink
Publicado en: 2022 International Symposium on Electromagnetic Compatibility – EMC Europe, 2022
Editor: IEEE
DOI: 10.1109/emceurope51680.2022.9900924

Risk-based EMC System Analysis Platform of Automotive Environments

Autores: V. Gkatsi, R. Vogt-Ardatjew, F. Leferink
Publicado en: 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 2021
Editor: IEEE
DOI: 10.1109/emc/si/pi/emceurope52599.2021.9559385

A Methodology for Estimating the Criticality of Energy Infrastructures in the Context of IEMI

Autores: F. R. Arduini, M. Lanzrath, T. Pusch, M. Suhrke and H. Garbe
Publicado en: IEEE Int. Joint EMC/SI/PI and EMC Europe Symp., 2021, 2021
Editor: IEEE
DOI: 10.1109/emc/si/pi/emceurope52599.2021.9559348

Resilience of Reed-Solomon Codes Against Harsh Electromagnetic Disturbances: Influence of Over-Voltage Detection

Autores: P. Memar, J. Vankeirsbilck, D. Vanoost, T. Holvoet, J. Boydens
Publicado en: 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 2021
Editor: IEEE
DOI: 10.1109/emc/si/pi/emceurope52599.2021.9559336

Time-efficient EMI Risk Evaluation Method in a Hospital Environment

Autores: Mumpy Das, Robert Vogt-Ardatjew, Bärbel van den Berg, Frank Leferink
Publicado en: 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 2021
Editor: IEEE Xplore
DOI: 10.1109/emc/si/pi/emceurope52599.2021.9559356

Susceptibility of Power Line Communication (PLC) Channel to DS, AM and Jamming Intentional Electromagnetic Interferences

Autores: A. Nateghi, M. Schaarschmidt, S. Fisahn, H. Garbe
Publicado en: Asia-Pacific Int. Symp. On Electromagnetic Compatibility (APEMC), 2021
Editor: IEEE
DOI: 10.1109/apemc49932.2021.9596789

Digital and Analogue Hardware Design of an On-Board EMI Detector

Autores: Hasan Habib, Tin Claeys, Richard Perdriau. Davy, Pissoort
Publicado en: International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo), Edición 13, 2022
Editor: IEEE
DOI: 10.1109/emccompo52133.2022.9758598

Definition And Characterization Of An Electromagnetic Operational Domain Model

Autores: M. Tishehzan, M. Nicholson, and J. F. Dawson
Publicado en: Int. Symp. on Electromagnetic Compatibility (EMC Europe), 2023, 2023
Editor: IEEE
DOI: 10.1109/emceurope57790.2023.10274226

Development of an EMI Detector Based on an Inverted Data Pair with Reduced Number of False Negatives

Autores: Hasan Habib, Tim Claeys, Dries Vanoost, Guy A. E. Vandenbosch, Davy Pissoort
Publicado en: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Edición 23-25 Sept. 2020, 2020, Página(s) 1-6, ISBN 978-1-7281-5579-1
Editor: IEEE
DOI: 10.1109/emceurope48519.2020.9245715

A new TRL/TRM PCB-based Calibration Method for On-Board Devices Under Test (DUTs)

Autores: A. Ramezani, Q. M. Khan, H. Pues
Publicado en: 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2022
Editor: IEEE Xplore
DOI: 10.1109/emccompo52133.2022.9758617

IEMI Vulnerability Analysis for Different Smart Grid-enabled Devices

Autores: F. R. Arduini, A. Nateghi, M. Schaarschmidt, M. Lanzrath and M. Suhrke
Publicado en: EMV Kongress 2022. Aachen, 2022
Editor: Apprimus
DOI: 10.15488/12553

Vulnerability of Wireless Smart Meter to Electromagnetic Interference Sweep Frequency Jamming Signals

Autores: A. Nateghi, M. Schaarschmidt, S. Fisahn, H. Garbe
Publicado en: IEEE Int. Joint EMC/SI/PI and EMC Europe Symposium, 2021, 2021
Editor: IEEE
DOI: 10.1109/emc/si/pi/emceurope52599.2021.9559200

Providing Assurance that Risks Associated with Electromagnetic Disturbances are Sufficiently Managed

Autores: Mohammad Tishehzan; Mark Nicholson; John F. Dawson; Davy Pissoort
Publicado en: Int. Symp. on Electromagnetic Compatibility (EMC Europe), 2022
Editor: IEEE
DOI: 10.1109/emceurope51680.2022.9900989

System Level Risk Analysis for Immunity in Automotive Functional Safety Analyses

Autores: Lokesh Devaraj, Alastair R. Ruddle, Alistair P. Duffy
Publicado en: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, 2020, Página(s) 1-6, ISBN 978-1-7281-5579-1
Editor: IEEE
DOI: 10.1109/emceurope48519.2020.9245692

EMI Aspects of Low Voltage Power Distribution Systems for Ships

Autores: N. Omollo, R. A. Vogt-Ardatjew, J. K. van der Ven, F. Leferink
Publicado en: Int. Symp. On Electromagnetic Compatibility (EMC Europe), 2020
Editor: IEEE
DOI: 10.1109/emceurope48519.2020.9245796

Studying the Probability of EMI through Time-Variance Behavior of Environment on Medical Devices

Autores: Mumpy Das, Robert Vogt-Ardatjew, Bärbel van den Berg, Frank Leferink
Publicado en: 2021 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), 2021
Editor: IEEE Xplore
DOI: 10.1109/apemc49932.2021.9596842

A Comparative Study of On-Chip CMOS S&H Voltage Sensors for Power Integrity: SOI vs. Bulk

Autores: Q. M. Khan, R. Perdriau, M. Ramdani, M. Koohestani
Publicado en: 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 2021
Editor: IEEE Xplore
DOI: 10.1109/emc/si/pi/emceurope52599.2021.9559242

Investigating the EMC Performance of a Matrix Converter and Measures to Improve It

Autores: N. Omollo, R. Vogt-Ardatjes, J. K. van der Ven, F. Leferink
Publicado en: Asia-Pacific Int. Symp. On Electromagnetic Compatibility (APEMC), 2021
Editor: IEEE
DOI: 10.1109/apemc49932.2021.9596817

Determining the Electromagnetic Environment on Board Ships for Risk-based Approach EMC Analysis

Autores: N. Omollo, J. K. van der Ven, R. A. Vogt-Ardatjew, F. Leferink
Publicado en: IEEE Int. Symp. On Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), 2020
Editor: IEEE
DOI: 10.1109/emcsi38923.2020.9191557

Risk assessment approach for EM resilience in complex systems using Bayesian Networks

Autores: Lokesh Devaraj, Alastair R. Ruddle, Alistair P. Duffy and Anthony J. M. Martin
Publicado en: Proceedings of 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 2021, Página(s) pp. 760-764
Editor: IEEE
DOI: 10.1109/emc/si/pi/emceurope52599.2021.9559243

EMI risk estimation for system-level functions using probabilistic graphical models

Autores: Lokesh Devaraj, Alastair R. Ruddle and Alistair P. Duffy
Publicado en: Proceedings of 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 2021, Página(s) 851-856
Editor: IEEE
DOI: 10.1109/emc/si/pi/emceurope52599.2021.9559291

Effects of the MHz Frequency Range Electromagnetic Immunity of the Swept Frequency Pulse Coupled on the kHz Frequency Range G3 Power Line Communication

Autores: A. Nateghi, N. Moonen, M. Schaarschmidt, S. Fisahn, H. Garbe
Publicado en: 2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), 2022
Editor: IEEE
DOI: 10.1109/emcsi39492.2022.9889619

Knowledge-based approach for system level electromagnetic safety analysis

Autores: Lokesh Devaraj, Alastair R. Ruddle, Qazi Mashaal Khan, Alistair P. Duffy
Publicado en: Proceedings of the 31st European Safety and Reliability Conference (ESREL 2021), 2021, Página(s) 1867-1874, ISBN 978-981-18-2016-8
Editor: Research Publishing Services
DOI: 10.3850/978-981-18-2016-8_203-cd

Investigation of the Mechanisms behind EMI Issues caused by Ready-Made Connecting Devices in Electronic Systems

Autores: Z. Chen, T. Claeys, J. Catrysse and D. Pissoort,
Publicado en: Int. Symp. on Electromagnetic Compatibility (EMC Europe), 2023., 2023
Editor: IEEE
DOI: 10.1109/emceurope57790.2023.10274381

Obsolescence in EMC Risk Assessment: A Case Study on EFT Immunity of Microcontrollers

Autores: Qazi Mashaal Khan, Mohsen Koohestani, Mohamed Ramdani, Richard Perdriau
Publicado en: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, 2020, Página(s) 1-6, ISBN 978-1-7281-5579-1
Editor: IEEE
DOI: 10.1109/emceurope48519.2020.9245783

Electromagnetic Environment Measurement Procedure for a Moving Car

Autores: R. Aba, V. Gkatsi, R. Vogt-Ardatjew, F. Leferink
Publicado en: 2023 IEEE 7th Global Electromagnetic Compatibility Conference (GEMCCON), 2023
Editor: IEEE
DOI: 10.1109/gemccon57842.2023.10078197

Including Experimental Aging of Shielded Cables into Bulk Current Injection Simulations

Autores: O. Leppäaho, F. Lafon, B. Ferreri, P. Fernandez-Lopez, M. Stojanovic, R. Perdriau, M. Ramdani
Publicado en: 2022 International Symposium on Electromagnetic Compatibility – EMC Europe, 2022
Editor: IEEE
DOI: 10.1109/emceurope51680.2022.9901089

Sensitivity of Shielded Cable Transfer Impedance Measurement to Triaxial Cell Diameter

Autores: O. Leppäaho, F. Lafon, P. Fernandez-Lopez, M. Stojanovic, R. Perdriau, M. Ramdani
Publicado en: 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, Edición 26 July-13 Aug. 2021, 2021, Página(s) 917-921
Editor: IEEE
DOI: 10.1109/emc/si/pi/emceurope52599.2021.9559176

The threat of Intentional Electromagnetic Interference to Maritime Vessels

Autores: F. R. Arduini, CJJ van der Ven, M. Lanzrath, M. Suhrke
Publicado en: International Ship Control Systems Symposium, 2022
Editor: IMarEST
DOI: 10.24868/10723

Implementation of Inverted-Pair EMI Detector using a Monte-Carlo Based Simulation Framework

Autores: Hasan Habib, Tim Claeys, Jonas Lannoo, Dries Vanoost, Guy A. E. Vandenbosch, Davy Pissoort
Publicado en: 2020 XXIX International Scientific Conference Electronics (ET), Edición 16-18 Sept. 2020, 2020, Página(s) 1-4, ISBN 978-1-7281-7426-6
Editor: IEEE
DOI: 10.1109/et50336.2020.9238167

Detection of EMI Issues Caused by Differential-Mode Voltages on an Electric Scooter

Autores: V. Gkatsi, R. Vogt-Ardatjew, F. Leferink
Publicado en: 2023 IEEE 7th Global Electromagnetic Compatibility Conference (GEMCCON), 2023
Editor: IEEE
DOI: 10.1109/gemccon57842.2023.10078199

Comparing simulated impact of single frequency and multitone EMI for an integrated circuit

Autores: Lokesh Devaraj, Alastair R. Ruddle, Qazi Mashaal Khan, Alistair P. Duff
Publicado en: Proceedings of 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2022, Página(s) 107-111
Editor: IEEE
DOI: 10.1109/emccompo52133.2022.9758612

Assuring Shielded Cables as EMI Mitigation in Automotive ADAS

Autores: O. Leppäaho, M. Nicholson, F. Lafon, M. Ramdani
Publicado en: 31st European Safety and Reliability Conference, Edición 22/09/2021, 2021, Página(s) 1859-1866
Editor: Research Publishing (S) Pte Ltd.
DOI: 10.3850/978-981-18-2016-8_263-c

Risk-based EMC Approach in Hospital Environment

Autores: Mumpy Das, Robert Vogt-Ardatjew, Barbel van den Berg, Frank Leferink
Publicado en: 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), 2020, Página(s) 676-680, ISBN 978-1-7281-7430-3
Editor: IEEE
DOI: 10.1109/emcsi38923.2020.9191637

On-Site Automotive Environment Measurements for a Risk-based EMC Approach

Autores: V. Gkatsi, R. Vogt-Ardatjew, F. Leferink
Publicado en: 2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), 2022
Editor: IEEE
DOI: 10.1109/emcsi39492.2022.9889626

Coupling of Energy Into PCB Traces in a Reverberant Environment: Absorption Cross-section and Probability of Susceptibility

Autores: Arunkumar H. Venkateshaiah, Haiyan Xie, John F. Dawson, Andrew C. Marvin, Linda Dawson, Martin P. Robinson
Publicado en: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, 2020, Página(s) 1-6, ISBN 978-1-7281-5579-1
Editor: IEEE
DOI: 10.1109/emceurope48519.2020.9245804

Resilience of Reed-Solomon Codes Against Single-Frequency Electromagnetic Disturbances: Fault Elimination Through Encoder Tuning

Autores: P Memar, J Vankeirsbilck, D Vanoost, T Holvoet, J Boydens
Publicado en: IEEE International Symposium on Electromagnetic Compatibility (EMC), 2022
Editor: IEEE
DOI: 10.1109/emcsi39492.2022.9889646

Risk Management Plan For the Hospital Environment

Autores: Mumpy Das, Robert Vogt-Ardatjew, Bärbel van den Berg, Frank Leferink
Publicado en: 2022 International Symposium on Electromagnetic Compatibility – EMC Europe, 2022
Editor: IEEE Xplore
DOI: 10.1109/emceurope51680.2022.9901309

Mutual Influence Of Cavity Resonances Of A Shielding Enclosure On The Resonance Of A Dipole Inside That Enclosure

Autores: Zhao CHEN, Tim Claeys, Ronny Deseine, Davy Pissoort
Publicado en: EMC+SIPI 2021 Virtual Symposium, 2021
Editor: IEEE
DOI: 10.1109/emc/si/pi/emceurope52599.2021.9559267

Effectiveness of Forward Error Corrections Over Different Wired Communication Channels in Harsh Electromagnetic Environments

Autores: P. Memar, H. Habib, Z. Chen, D. Vanoost, R. Vogt-Ardatjew, B. van den Berg, T. Holvoet, D. Pissoort, J. Boydens
Publicado en: 2022 International Symposium on Electromagnetic Compatibility–EMC Europe, 2022
Editor: IEEE
DOI: 10.1109/emceurope51680.2022.9901094

Risk-based EMC Approach for the Ship's Semi enclosed Reverberant Indoor Environment to evaluate EMI generated by Wireless Devices

Autores: Mumpy Das, Robert Vogt-Ardatjew, Frank Leferink
Publicado en: 2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), 2022
Editor: IEEE Xplore
DOI: 10.1109/emcsi39492.2022.9889589

Analysis and Estimation of Electromagnetic Energy Coupled into IC packages

Autores: H. Tang, A. H. Venkateshaiah, J. F. Dawson, A. C. Marvin, M. P. Robinson and J. Ge
Publicado en: IEEE Int. Joint EMC/SI/PI and EMC Europe Symp, 2021
Editor: IEEE
DOI: 10.1109/emc/si/pi/emceurope52599.2021.9559238

A Comparison Among DPI Immunities of Multi-Stage CSVCOs and Ring Oscillators

Autores: Q. M. Khan, A. Ramezani, M. Koohestani, M. Ramdani, R. Perdriau
Publicado en: 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2022
Editor: IEEE Xplore
DOI: 10.1109/emccompo52133.2022.9758599

Introduction of Wireless Services and Devices in a Hospital Environment Following a Risk-based EMC Approach

Autores: Mumpy Das, Silvo Jeunink, Robert Vogt-Ardatjew, Barbel van den Berg, Frank Leferink
Publicado en: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, 2020, Página(s) 1-6, ISBN 978-1-7281-5579-1
Editor: IEEE
DOI: 10.1109/emceurope48519.2020.9245878

Electromagnetic Interference Risk Assessment for the Use of LED Lights on Board of Ships

Autores: N. Omollo, R. Vogt-Ardatjew, J. K. van der Ven, F. Leferink
Publicado en: 2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), 2022
Editor: IEEE
DOI: 10.1109/emcsi39492.2022.9889312

A System’s Perspective on the Use of EMI Detection and Correction Methods in Safety Critical Systems

Autores: T. Claeys, H. Tirmizi, H. Habib, D. Vanoost, G. Vandenbosch, D. Pissoort
Publicado en: 2021 Joint IEEE Symposium on EMC+SIPI and EMC Europe, 2021
Editor: IEEE
DOI: 10.1109/emc/si/pi/emceurope52599.2021.9559314

Combining Fast Field Probes with an EMI Detector to reveal Bit Errors induced by ElectroMagnetic Disturbances

Autores: Hasan Habib, Tim Claeys, Robert Vogt-Ardatjew, Bärbel van den Berg, Guy A. E. Vandenbosch, Davy Pissoort
Publicado en: 2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Edición 20+, 2022
Editor: IEEE
DOI: 10.1109/emceurope51680.2022.9901010

Vulnerability of Smart Grid-based Protection Systems to Ultra-Wide Band IEMI Sources

Autores: F. R. Arduini, M. Suhrke, T. Pusch and H. Garbe
Publicado en: Int. Symp. on Electromagnetic Compatibility (EMC Europe), 2022
Editor: IEEE
DOI: 10.1109/emceurope51680.2022.9901132

Evaluation of EM Vehicle Environment Measurement Methods for Risk-Based EMC Analysis

Autores: V. Gkatsi, R. Vogt-Ardatjew, F. Leferink
Publicado en: 2022 ESA Workshop on Aerospace EMC (Aerospace EMC), 2022
Editor: IEEE
DOI: 10.23919/aerospaceemc54301.2022.9828833

Case Study of Electromagnetic Interference in Surgery Environment

Autores: Zhao Chen, Johan Catrysse, Ronny Deseine, Tim Claeys, Davy Pissoort
Publicado en: 2022 XXXI International Scientific Conference Electronics (ET), 2022
Editor: IEEE
DOI: 10.1109/et55967.2022.9920274

Resilience of Reed-Solomon Codes against Single-Frequency Electromagnetic Disturbances: Fault Mechanisms and Fault Elimination through Symbol Inversion

Autores: P. Memar, J. Vankeirsbilck, D. Vanoost, T. Claeys, D. Pissoort, J. Boydens
Publicado en: Electronics, Edición 11(9), 2022, Página(s) 1292, ISSN 2079-9292
Editor: MDPI
DOI: 10.3390/electronics11091292

A Comparative Performance Analysis of 6T & 9T SRAM Integrated Circuits: SOI vs. Bulk

Autores: Q. M. Khan, R. Perdriau, M. Ramdani, M. Koohestani
Publicado en: IEEE Letters on Electromagnetic Compatibility Practice and Applications, Edición vol.4, no. 2, 2022, Página(s) pp 25-30, ISSN 2637-6423
Editor: IEEE
DOI: 10.1109/lemcpa.2022.3163963

Validation of IC Conducted Emission and Immunity Models Including Aging and Thermal Stress

Autores: Q. M. Khan, M. Koohestani, J. -L. Levant, M. Ramdani, R. Perdriau
Publicado en: IEEE Transactions on Electromagnetic Compatibility, 2023, ISSN 1558-187X
Editor: IEEE
DOI: 10.1109/temc.2023.3253385

Electromagnetic Risk Analysis for EMI Impact on Functional Safety With Probabilistic Graphical Models and Fuzzy Logic

Autores: L. Devaraj, A. R. Ruddle, A. P. Duffy
Publicado en: IEEE Letters on Electromagnetic Compatibility Practice and Applications, Edición Volume: 2, Edición: 4, Dec. 2020, 2020, Página(s) 96 - 100, ISSN 2637-6423
Editor: IEEE
DOI: 10.1109/lemcpa.2020.3017483

Fast and Curious: Exposure of EMI Vulnerability of an Electric Scooter for a Risk-based EMC Approach

Autores: V. Gkatsi, R. Vogt-Ardatjew, and F. Leferink
Publicado en: IEEE Letters on Electromagnetic Compatibility Practice and Applications, 2023, ISSN 2637-6423
Editor: IEEE
DOI: 10.1109/lemcpa.2023.3284232

Application of Probabilistic Models for Multitone Electromagnetic Immunity Analysis

Autores: L. Devaraj, Q. M. Khan, A. R. Ruddle, A. P. Duffy, R. Perdriau and M. Koohestani
Publicado en: IEEE Transactions on Electromagnetic Compatibility, Edición 64 (6), 2022, Página(s) 2067-2079, ISSN 1558-187X
Editor: IEEE
DOI: 10.1109/temc.2022.3211458

Advanced Design of a Robust and Effective EMI Detector for Wired Communication Channels

Autores: Habib, H., Claeys, T., Vandenbosch, G., Pissoort, D.
Publicado en: IEEE Transactions on Electromagnetic Compatibility, Edición Volume: 65, Edición: 2, April 2023, 2023, Página(s) 595-598, ISSN 1558-187X
Editor: IEEE
DOI: 10.1109/temc.2022.3228822

Influences of Wiring inside Ready-Made Connecting Devices on EMI in Medical Electronic Systems

Autores: Z. Chen, T. Claeys, R. Deseine, J. Catrysse and D. Pissoort
Publicado en: EEE Letters on Electromagnetic Compatibility Practice and Applications, Edición 2023, 2023, ISSN 2637-6423
Editor: IEEE
DOI: 10.1109/lemcpa.2023.3286727

Triaxial Cell for Determining Shielded Cable Transfer Impedance During Environmental Stress

Autores: O. Leppäaho, F. Lafon, P. Fernández-López, M. Stojanovic, T. Claeys, R. Perdriau, M. Ramdani
Publicado en: IEEE Transactions on Electromagnetic Compatibility, Edición Volume: 65, Edición: 2, April 2023, 2023, Página(s) 395-405, ISSN 0018-9375
Editor: Institute of Electrical and Electronics Engineers
DOI: 10.1109/temc.2023.3244061

Synergistic Effect of Multi-Tone EMI on the Conducted Immunity of Integrated Oscillators

Autores: Q. M. Khan, L. Devaraj, M. Koohestani, A. R. Ruddle, M. Ramdani, R. Perdriau
Publicado en: IEEE Letters on Electromagnetic Compatibility Practice and Applications, 2022, ISSN 2637-6423
Editor: IEEE
DOI: 10.1109/lemcpa.2022.3175433

Influence of Temperature on the EFT Immunity of Multistage Integrated Oscillators

Autores: Q. M. Khan, M. Koohestani, R. Perdriau
Publicado en: IEEE Transactions on Electromagnetic Compatibility, 2022, ISSN 1558-187X
Editor: IEEE
DOI: 10.1109/temc.2022.3225540

Vulnerability of Smart Grid-enabled protection relays to IEMI

Autores: F. R. Arduini, M. Lanzrath, S. Ghosalkar, A. Nateghi, S. Fisahn and M. Schaarschmidt
Publicado en: Advances in Radio Science, 2023, ISSN 1684-9973
Editor: Copernicus
DOI: 10.5194/ars-20-131-2023

Experimental Characterization of Multitone EM Immunity of Integrated Oscillators Under Thermal Stress

Autores: Q. M. Khan, L. Devaraj, R. Perdriau, A. R. Ruddle, T. Claeys, M. Ramdani, M. Koohestani
Publicado en: IEEE Access, Edición vol.10, 2022, Página(s) pp. 83898-83915, ISSN 2169-3536
Editor: Institute of Electrical and Electronics Engineers Inc.
DOI: 10.1109/access.2022.3197659

Evaluation of the A&S and the Advanced EMI Detectors Based on Modeling Frameworks With Appropriate Condition Assessment

Autores: Habib, H., Claeys, T., Vandenbosch, G., Pissoort, D.
Publicado en: IEEE Access, Edición IEEE Access ( Volume: 11), 2023, Página(s) 72537-72551, ISSN 2169-3536
Editor: Institute of Electrical and Electronics Engineers Inc.
DOI: 10.1109/access.2023.3296095

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