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Pan-European Training, research and education network on Electromagnetic Risk management

Deliverables

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Publications

Development of an EMI Detector Based on an Inverted Data Pair with Reduced Number of False Negatives

Author(s): Hasan Habib, Tim Claeys, Dries Vanoost, Guy A. E. Vandenbosch, Davy Pissoort
Published in: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, 23-25 Sept. 2020, 2020, Page(s) 1-6, ISBN 978-1-7281-5579-1
Publisher: IEEE
DOI: 10.1109/emceurope48519.2020.9245715

System Level Risk Analysis for Immunity in Automotive Functional Safety Analyses

Author(s): Lokesh Devaraj, Alastair R. Ruddle, Alistair P. Duffy
Published in: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, 2020, Page(s) 1-6, ISBN 978-1-7281-5579-1
Publisher: IEEE
DOI: 10.1109/emceurope48519.2020.9245692

Risk assessment approach for EM resilience in complex systems using Bayesian Networks

Author(s): Lokesh Devaraj, Alastair R. Ruddle, Alistair P. Duffy and Anthony J. M. Martin
Published in: Proceedings of 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 2021, Page(s) pp. 760-764
Publisher: IEEE
DOI: 10.1109/emc/si/pi/emceurope52599.2021.9559243

EMI risk estimation for system-level functions using probabilistic graphical models

Author(s): Lokesh Devaraj, Alastair R. Ruddle and Alistair P. Duffy
Published in: Proceedings of 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 2021, Page(s) 851-856
Publisher: IEEE
DOI: 10.1109/emc/si/pi/emceurope52599.2021.9559291

Knowledge-based approach for system level electromagnetic safety analysis

Author(s): Lokesh Devaraj, Alastair R. Ruddle, Qazi Mashaal Khan, Alistair P. Duffy
Published in: Proceedings of the 31st European Safety and Reliability Conference (ESREL 2021), 2021, Page(s) 1867-1874, ISBN 978-981-18-2016-8
Publisher: Research Publishing Services
DOI: 10.3850/978-981-18-2016-8_203-cd

Obsolescence in EMC Risk Assessment: A Case Study on EFT Immunity of Microcontrollers

Author(s): Qazi Mashaal Khan, Mohsen Koohestani, Mohamed Ramdani, Richard Perdriau
Published in: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, 2020, Page(s) 1-6, ISBN 978-1-7281-5579-1
Publisher: IEEE
DOI: 10.1109/emceurope48519.2020.9245783

Implementation of Inverted-Pair EMI Detector using a Monte-Carlo Based Simulation Framework

Author(s): Hasan Habib, Tim Claeys, Jonas Lannoo, Dries Vanoost, Guy A. E. Vandenbosch, Davy Pissoort
Published in: 2020 XXIX International Scientific Conference Electronics (ET), 16-18 Sept. 2020, 2020, Page(s) 1-4, ISBN 978-1-7281-7426-6
Publisher: IEEE
DOI: 10.1109/et50336.2020.9238167

Risk-based EMC Approach in Hospital Environment

Author(s): Mumpy Das, Robert Vogt-Ardatjew, Barbel van den Berg, Frank Leferink
Published in: 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), 2020, Page(s) 676-680, ISBN 978-1-7281-7430-3
Publisher: IEEE
DOI: 10.1109/emcsi38923.2020.9191637

Coupling of Energy Into PCB Traces in a Reverberant Environment: Absorption Cross-section and Probability of Susceptibility

Author(s): Arunkumar H. Venkateshaiah, Haiyan Xie, John F. Dawson, Andrew C. Marvin, Linda Dawson, Martin P. Robinson
Published in: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, 2020, Page(s) 1-6, ISBN 978-1-7281-5579-1
Publisher: IEEE
DOI: 10.1109/emceurope48519.2020.9245804

Introduction of Wireless Services and Devices in a Hospital Environment Following a Risk-based EMC Approach

Author(s): Mumpy Das, Silvo Jeunink, Robert Vogt-Ardatjew, Barbel van den Berg, Frank Leferink
Published in: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, 2020, Page(s) 1-6, ISBN 978-1-7281-5579-1
Publisher: IEEE
DOI: 10.1109/emceurope48519.2020.9245878

Electromagnetic Risk Analysis for EMI Impact on Functional Safety With Probabilistic Graphical Models and Fuzzy Logic

Author(s): L. Devaraj, A. R. Ruddle, A. P. Duffy
Published in: IEEE Letters on Electromagnetic Compatibility Practice and Applications, Volume: 2, Issue: 4, Dec. 2020, 2020, Page(s) 96 - 100, ISSN 2637-6423
Publisher: IEEE
DOI: 10.1109/lemcpa.2020.3017483