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CORDIS

Advanced packaging for photonics, optics and electronics for low cost manufacturing in Europe

Deliverables

Report on communications and disseminations activities

Report including realized communication and dissemination activities during the project

UC5 demonstration report

Demonstration report for UC5

UC2 demonstration report

Demonstration report for UC2

UC3 demonstration report

Demonstration report for UC3

UC4 demonstration report

Demonstration report for UC4

UC1 demonstration report

Demonstration report for UC1

Publications

Mathematical Model and Synthetic Data Generation for Infra-Red Sensors

Author(s): Laura Leja,Vitālijs Purlans, Rihards Novickis, Andrejs Cvetkovs and Kaspars Ozols
Published in: Sensors, 2022, ISSN 1424-8220
Publisher: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/s22239458

Versatile Externally Modulated Lasers Technology for Multiple Telecommunication Applications

Author(s): Xing Dai, Helene Debregeas, Guillaume Da Rold, David Carrara, Kevin Louarn, Elena Duran Valdeiglesias, Francois Lelarge
Published in: IEEE Journal of Selected Topics in Quantum Electronics, Issue 27/3, 2021, Page(s) 1-12, ISSN 1077-260X
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/jstqe.2020.3029394

Squeeze-out and bond strength of patterned Cusingle bondSn SLID seal-frames

Author(s): Papatzacos, P. H., Nguyen, H. V., Roy, A., Hoivik, N., Broaddus, P., & Ohlckers, P.
Published in: Microelectronics Reliability, 2022, ISSN 0026-2714
Publisher: Elsevier BV
DOI: 10.1016/j.microrel.2022.114692

Finite Element Simulation of Solid–Liquid Interdiffusion Bonding Process: Understanding Process-Dependent Thermomechanical Stress

Author(s): Nikhilendu Tiwary, Vesa Vuorinen, Glenn Ross, Mervi Paulasto-Kröckel
Published in: IEEE TRANSACTIONS ON COMPONENTS, PACKAGING AND MANUFACTURING TECHNOLOGY, VOL. 12, NO. 5, MAY 2022, 2022, ISSN 2156-3950
Publisher: Institute of Electrical and Electronics Engineers Inc.
DOI: 10.1109/tcpmt.2022.3170082

Failure analysis of fabrication process in hermetic wafer-level packaging for microbolometer focal plane arrays

Author(s): H. Xia, A. Roy, H.-V. Nguyen, Z. Ramic, K.E. Aasmundtveit, P. Ohlckers
Published in: Microelectronics Reliability, 2022, ISSN 0026-2714
Publisher: Elsevier BV
DOI: 10.1016/j.microrel.2022.114712

Achieving low-temperature wafer level bonding with Cu-Sn-In ternary at 150 °C

Author(s): Obert Golim, Vesa Vuorinen, Glenn Ross, Tobias Wernicke, Marta Pawlak, Nikhilendu Tiwary, Mervi Paulasto-Kröckel
Published in: Scripta Materialia, Volume 222, 1 January 2023, 114998, 2023, ISSN 1359-6462
Publisher: Pergamon Press Ltd.
DOI: 10.1016/j.scriptamat.2022.114998

Wafer Level Solid Liquid Interdiffusion Bonding: Formation and Evolution of Microstructures

Author(s): V. Vuorinen, H. Dong, G. Ross, J. Hotchkiss, J. Kaaos, M. Paulasto-Kröckel
Published in: Journal of Electronic Materials, 2020, ISSN 0361-5235
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1007/s11664-020-08530-y

Design of Silicon Cap for Hermetic Packaging of Microbolometer Focal Plane Arrays

Author(s): Hexin Xia, Muhammad Nadeem Akram, Avisek Roy, Eivind Bardalen, Hoang-Vu Nguyen,Nils Høivik, Knut Eilif Aasmundtveit and Per Ohlckers
Published in: IEEE TRANSACTIONS ON COMPONENTS, PACKAGING AND MANUFACTURING TECHNOLOGY. December 2021. (Early access), 2021, ISSN 2156-3950
Publisher: Institute of Electrical and Electronics Engineers Inc.
DOI: 10.1109/tcpmt.2021.3135081

Demonstrating 170°C Low Temperature Cu-In-Sn wafer level Solid Liquid Interdiffusion Bonding

Author(s): Vesa Vuorinen, Glenn Ross, Anton Klami, Hongqun Dong, Mervi Paulasto-Krockel, Tobias Wernicke, Anneliese Ponninger
Published in: IEEE Transactions on Components, Packaging and Manufacturing Technology, 2021, Page(s) 1-1, ISSN 2156-3950
Publisher: Institute of Electrical and Electronics Engineers Inc.
DOI: 10.1109/tcpmt.2021.3111345

Simulated effects of wet-etched induced surface roughness on IR transmission and reflection

Author(s): Phillip Papatzacos, M. Nadeem Akram, Eivind Bardalen, Per Ohlckers
Published in: 2020 IEEE 8th Electronics System-Integration Technology Conference (ESTC), 2020, Page(s) 1-4, ISBN 978-1-7281-6293-5
Publisher: IEEE
DOI: 10.1109/estc48849.2020.9229821

Vacuum Packaging of MEMS-based Infrared Detectors

Author(s): Avisek Roy; Hoang-Vu Nguyen; Hexin Xia; Phillip Papatzacos; Per Ohlckers; Knut Eilif Aasmundtveit
Published in: 2022 IEEE 9th Electronics System-Integration Technology Conference (ESTC), 2022
Publisher: IEEE
DOI: 10.1109/estc55720.2022.9939461

High-speed ultra-accurate direct C2W bonding

Author(s): Birgit Brandstatter, Daniel Aschenwald, Benedikt Auer, Norbert Bilewicz, Ruurd Boomsma, Christoph Kroll, Andreas Mayr, Richard Neumayr, Hannes Rieser, Mario Schernthaner, Hubert Selhofer, Florian Speer, Peter Unterwaditzer, Andras Videki, Martin Widauer, Thomas Widmann
Published in: 2020 IEEE 70th Electronic Components and Technology Conference (ECTC), 2020, Page(s) 1943-1949, ISBN 978-1-7281-6180-8
Publisher: IEEE
DOI: 10.1109/ectc32862.2020.00303

Impact of Micromachining Process on Cu-Sn Solid-Liquid Interdiffusion (SLID) Bonds

Author(s): Xia, A. Roy, E. Bardalen, H. -V. Nguyen, K. E. Aasmundtveit and P. Ohlckers
Published in: 2021 23rd European Microelectronics and Packaging Conference & Exhibition (EMPC), 2021
Publisher: IEEE
DOI: 10.23919/empc53418.2021.9584992

Study of Cu-Sn-In system for low temperature, wafer level solid liquid inter-diffusion bonding

Author(s): Joseph Hotchkiss, Vesa Vuorinen, Hongqun Dong, Glenn Ross, Jani Kaaos, Mervi Paulasto-Krockel, Tobias Wernicke, Anneliese Ponninger
Published in: 2020 IEEE 8th Electronics System-Integration Technology Conference (ESTC), 2020, Page(s) 1-5, ISBN 978-1-7281-6293-5
Publisher: IEEE
DOI: 10.1109/estc48849.2020.9229696

Investigation of seal frame geometry on Sn squeeze-out in Cu-Sn SLID bonds

Author(s): P. Papatzacos, N. Tiwary, N. Hoivik, H. V. Nguyen, A. Roy, and K. E. Aasmundtveit
Published in: 2021 23rd European Microelectronics and Packaging Conference & Exhibition (EMPC), 13-16 Sept. 2021, 2021
Publisher: IEEE
DOI: 10.23919/empc53418.2021.9584990

Evaluation of Silicon Diaphragms for Hermetic Packaging of Microbolometer Arrays

Author(s): Hexin Xia, Muhammed Nadeem Akram, Eivind Bardalen, Avisek Roy, Knut Eilif Aasmundtveit, Per Ohlckers
Published in: 2020 IEEE 8th Electronics System-Integration Technology Conference (ESTC), 2020, Page(s) 1-5, ISBN 978-1-7281-6293-5
Publisher: IEEE
DOI: 10.1109/estc48849.2020.9229710

Low-temperature Metal Bonding for Optical Device Packaging

Author(s): Obert Golim, Vesa Vuorinen, Nikhilendu Tiwary, Ross Glenn, Mervi Paulasto-Kröckel
Published in: 2021 23rd European Microelectronics and Packaging Conference & Exhibition (EMPC), 13-16 Sept. 2021, 2021
Publisher: IEEE
DOI: 10.23919/empc53418.2021.9585007

Intellectual Property Rights

Elektromedizinische Elektrode

Application/Publication number: 10 2021100688
Date: 2021-01-14
Applicant(s): OSYPKA AG

Elektromedizinische Elektrode

Application/Publication number: 10 2021100685
Date: 2021-01-14
Applicant(s): OSYPKA AG

SEMICONDUCTOR DEVICES FOR EMITTING MODULATED LIGHT AND METHODS FOR FABRICATING SUCH DEVICES

Application/Publication number: 21 305377
Date: 2021-03-25
Applicant(s): ALMAE TECHNOLOGIES

HIGH FLOW VACUUM CHUCK

Application/Publication number: 20 21054332
Date: 2021-10-11
Applicant(s): ICOS VISION SYSTEMS NV

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