Publications
Author(s):
Jan Schultheiß, Tadej Rojac, Dennis Meier
Published in:
Advanced Electronic Materials, 2021, ISSN 2199-160X
Publisher:
Wiley
DOI:
10.1002/aelm.202100996
Author(s):
Elzbieta Gradauskaite; Kasper Hunnestad; Dennis Meier; Morgan Trassin; Quintin N. Meier
Published in:
Chemistry of Materials, 34 (14), Issue 4, 2022, ISSN 0897-4756
Publisher:
American Chemical Society
DOI:
10.3929/ethz-b-000558395
Author(s):
K. A. Hunnestad; Erik Dobloug Roede; A. T. J. van Helvoort; Dennis Meier
Published in:
Journal of Applied Physics, Issue 1, 2020, ISSN 0021-8979
Publisher:
American Institute of Physics
DOI:
10.1063/5.0029284
Author(s):
Jan Schultheiß, Erik Lysne, Lukas Puntigam, Jakob Schaab, Edith Bourret, Zewu Yan, Stephan Krohns, and Dennis Meier
Published in:
Nano Letters, 2021, ISSN 1530-6984
Publisher:
American Chemical Society
DOI:
10.1021/acs.nanolett.1c03182
Author(s):
Erik D. Roede; Konstantin Shapovalov; Thomas J. Moran; Aleksander B. Mosberg; Zewu Yan; Edith Bourret; Andres Cano; Bryan D. Huey; Antonius T. J. van Helvoort; Dennis Meier
Published in:
Advanced Materials, 34 (36), Issue 3, 2022, ISSN 0935-9648
Publisher:
United Nations Industrial Developement Organization
DOI:
10.3929/ethz-b-000563949
Author(s):
Dennis Meier and Sverre M. Selbach
Published in:
Nature Reviews Materials, 2022, ISSN 2058-8437
Publisher:
Nature Springer
DOI:
10.1038/s41578-021-00375-z
Author(s):
L. Richarz, J. He, U. Ludacka, E. Bourret, Z. Yan, A. T. J. van Helvoort, and D. Meier
Published in:
Applied Physics Letters, Issue 122, 2023, Page(s) 162903, ISSN 0003-6951
Publisher:
American Institute of Physics
DOI:
10.1063/5.0145173
Author(s):
Lukas Puntigam, Jan Schultheiß, Ana Strinic, Zewu Yan, Edith Bourret, Markus Altthaler, István Kézsmárki, Donald M. Evans, Dennis Meier, and Stephan Krohns
Published in:
Journal of Applied Physics, 2021, ISSN 0021-8979
Publisher:
American Institute of Physics
DOI:
10.1063/5.0038300
Author(s):
Kasper A. Hunnestad, Jan Schultheiß, Anders C. Mathisen, Ivan N. Ushakov, Constantinos Hatzoglou, Antonius T. J. van Helvoort, Dennis Meier
Published in:
Advanced Materials, Issue 35, 2023, Page(s) 2302543, ISSN 0935-9648
Publisher:
United Nations Industrial Developement Organization
DOI:
10.1002/adma.202302543
Author(s):
K.A. Hunnestad, C. Hatzoglou, F. Vurpillot, I.-E. Nylund, Z. Yan, E. Bourret, A.T.J. van Helvoort, D. Meier
Published in:
Materials Characterization, Issue 203, 2023, Page(s) 113085, ISSN 1044-5803
Publisher:
Elsevier BV
DOI:
10.1016/j.matchar.2023.113085
Author(s):
Olav W. Sandvik; Aaron Merlin Müller; Håkon W. Ånes; Manuel Zahn; Jiali He; Manfred Fiebig; Thomas Lottermoser; Tadej Rojac; Dennis Meier; Jan Schultheiß
Published in:
Nano Letters, Issue 23, 2023, Page(s) 6994-7000, ISSN 1530-6984
Publisher:
American Chemical Society
DOI:
10.1021/acs.nanolett.3c01638
Author(s):
Jan Schultheiß; Fei Xue; Erik Roede; Håkon W. Ånes; Frida H. Danmo; Sverre M. Selbach; Long‐Qing Chen; Dennis Meier
Published in:
Advanced Materials, Issue 2, 2022, ISSN 0935-9648
Publisher:
United Nations Industrial Developement Organization
DOI:
10.1002/adma.202203449
Author(s):
C.M. Fernandez-Posada, C.R.S. Haines, D.M. Evans, Z. Yan, E. Bourret, D. Meier, and M.A. Carpenter
Published in:
Journal of Magnetism and Magnetic Materials, 2022, ISSN 0304-8853
Publisher:
Elsevier BV
DOI:
10.1016/j.jmmm.2022.169277
Author(s):
Erik Dobloug Roede; Aleksander B. Mosberg; Donald M. Evans; Edith Bourret; Zewu Yan; Antonius T. J. van Helvoort; Dennis Meier
Published in:
APL Materials, Issue 9, 2021, Page(s) 021105, ISSN 2166-532X
Publisher:
AIP
DOI:
10.1063/5.0038909
Author(s):
K. A. Hunnestad, C. Hatzoglou, Z. M. Khalid, P. E. Vullum, Z. Yan, E. Bourret, A. T. J. van Helvoort, S. M. Selbach, D. Meier
Published in:
Nature Communications, Issue 13, 2022, ISSN 2041-1723
Publisher:
Nature Publishing Group
DOI:
10.1038/s41467-022-32189-0
Author(s):
Constantinos Hatzoglou, Gérald Da Costa, Peter Wells, Xiaochen Ren, Brian P Geiser, David J Larson, Remi Demoulin, Kasper Hunnestad, Etienne Talbot, Baishakhi Mazumder, Dennis Meier, François Vurpillot
Published in:
Microscopy and Microanalysis, Issue 29, 2023, Page(s) 1124–1136, ISSN 1435-8115
Publisher:
Oxford University Press
DOI:
10.1093/micmic/ozad054
Author(s):
Theodor S. Holstad, Trygve M. Ræder, Donald M. Evans, Didirk R. Småbråten, Stephan Krohns, Jakob Schaab, Zewu Yan, Edith Bourret, Antonius T. J. van Helvoort, Tor Grande, Sverre M. Selbach, Joshua C. Agar, and Dennis Meier
Published in:
npj Computational Materials, 2020, ISSN 2057-3960
Publisher:
Springer Nature
DOI:
10.1038/s41524-020-00426-z
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