Creating building blocks for atomic-scale electronics

Publikacje

Unveiling Alternating Current Electronic Properties at Ferroelectric Domain Walls

Autorzy: Jan Schultheiß, Tadej Rojac, Dennis Meier
Opublikowane w: Advanced Electronic Materials, 2021, ISSN 2199-160X
Wydawca: Wiley
DOI: 10.1002/aelm.202100996

Ferroelectric Domain Engineering Using Structural Defect Ordering

Autorzy: Elzbieta Gradauskaite; Kasper Hunnestad; Dennis Meier; Morgan Trassin; Quintin N. Meier
Opublikowane w: Chemistry of Materials, 34 (14), Numer 4, 2022, ISSN 0897-4756
Wydawca: American Chemical Society
DOI: 10.3929/ethz-b-000558395

Characterization of ferroelectric domain walls by scanning electron microscopy

Autorzy: K. A. Hunnestad; Erik Dobloug Roede; A. T. J. van Helvoort; Dennis Meier
Opublikowane w: Journal of Applied Physics, Numer 1, 2020, ISSN 0021-8979
Wydawca: American Institute of Physics
DOI: 10.1063/5.0029284

Charged Ferroelectric Domain Walls for Deterministic ac Signal Control at the Nanoscale

Autorzy: Jan Schultheiß, Erik Lysne, Lukas Puntigam, Jakob Schaab, Edith Bourret, Zewu Yan, Stephan Krohns, and Dennis Meier
Opublikowane w: Nano Letters, 2021, ISSN 1530-6984
Wydawca: American Chemical Society
DOI: 10.1021/acs.nanolett.1c03182

The Third Dimension of Ferroelectric Domain Walls

Autorzy: Erik D. Roede; Konstantin Shapovalov; Thomas J. Moran; Aleksander B. Mosberg; Zewu Yan; Edith Bourret; Andres Cano; Bryan D. Huey; Antonius T. J. van Helvoort; Dennis Meier
Opublikowane w: Advanced Materials, 34 (36), Numer 3, 2022, ISSN 0935-9648
Wydawca: United Nations Industrial Developement Organization
DOI: 10.3929/ethz-b-000563949

Ferroelectric domain walls for nanotechnology

Autorzy: Dennis Meier and Sverre M. Selbach
Opublikowane w: Nature Reviews Materials, 2022, ISSN 2058-8437
Wydawca: Nature Springer
DOI: 10.1038/s41578-021-00375-z

Moiré fringes in conductive atomic force microscopy

Autorzy: L. Richarz, J. He, U. Ludacka, E. Bourret, Z. Yan, A. T. J. van Helvoort, and D. Meier
Opublikowane w: Applied Physics Letters, Numer 122, 2023, Strona(/y) 162903, ISSN 0003-6951
Wydawca: American Institute of Physics
DOI: 10.1063/5.0145173

Insulating improper ferroelectric domain walls as robust barrier layer capacitors

Autorzy: Lukas Puntigam, Jan Schultheiß, Ana Strinic, Zewu Yan, Edith Bourret, Markus Altthaler, István Kézsmárki, Donald M. Evans, Dennis Meier, and Stephan Krohns
Opublikowane w: Journal of Applied Physics, 2021, ISSN 0021-8979
Wydawca: American Institute of Physics
DOI: 10.1063/5.0038300

Quantitative Mapping of Chemical Defects at Charged Grain Boundaries in a Ferroelectric Oxide

Autorzy: Kasper A. Hunnestad, Jan Schultheiß, Anders C. Mathisen, Ivan N. Ushakov, Constantinos Hatzoglou, Antonius T. J. van Helvoort, Dennis Meier
Opublikowane w: Advanced Materials, Numer 35, 2023, Strona(/y) 2302543, ISSN 0935-9648
Wydawca: United Nations Industrial Developement Organization
DOI: 10.1002/adma.202302543

Correlating laser energy with compositional and atomic-level information of oxides in atom probe tomography

Autorzy: K.A. Hunnestad, C. Hatzoglou, F. Vurpillot, I.-E. Nylund, Z. Yan, E. Bourret, A.T.J. van Helvoort, D. Meier
Opublikowane w: Materials Characterization, Numer 203, 2023, Strona(/y) 113085, ISSN 1044-5803
Wydawca: Elsevier BV
DOI: 10.1016/j.matchar.2023.113085

Pressure Control of Nonferroelastic Ferroelectric Domains in ErMnO<sub>3</sub>

Autorzy: Olav W. Sandvik; Aaron Merlin Müller; Håkon W. Ånes; Manuel Zahn; Jiali He; Manfred Fiebig; Thomas Lottermoser; Tadej Rojac; Dennis Meier; Jan Schultheiß
Opublikowane w: Nano Letters, Numer 23, 2023, Strona(/y) 6994-7000, ISSN 1530-6984
Wydawca: American Chemical Society
DOI: 10.1021/acs.nanolett.3c01638

Confinement‐Driven Inverse Domain Scaling in Polycrystalline ErMnO <sub>3</sub>

Autorzy: Jan Schultheiß; Fei Xue; Erik Roede; Håkon W. Ånes; Frida H. Danmo; Sverre M. Selbach; Long‐Qing Chen; Dennis Meier
Opublikowane w: Advanced Materials, Numer 2, 2022, ISSN 0935-9648
Wydawca: United Nations Industrial Developement Organization
DOI: 10.1002/adma.202203449

Magnetoelastic properties of multiferroic hexagonal ErMnO3

Autorzy: C.M. Fernandez-Posada, C.R.S. Haines, D.M. Evans, Z. Yan, E. Bourret, D. Meier, and M.A. Carpenter
Opublikowane w: Journal of Magnetism and Magnetic Materials, 2022, ISSN 0304-8853
Wydawca: Elsevier BV
DOI: 10.1016/j.jmmm.2022.169277

Contact-free reversible switching of improper ferroelectric domains by electron and ion irradiation

Autorzy: Erik Dobloug Roede; Aleksander B. Mosberg; Donald M. Evans; Edith Bourret; Zewu Yan; Antonius T. J. van Helvoort; Dennis Meier
Opublikowane w: APL Materials, Numer 9, 2021, Strona(/y) 021105, ISSN 2166-532X
Wydawca: AIP
DOI: 10.1063/5.0038909

Atomic-scale 3D imaging of individual dopant atoms in an oxide semiconductor

Autorzy: K. A. Hunnestad, C. Hatzoglou, Z. M. Khalid, P. E. Vullum, Z. Yan, E. Bourret, A. T. J. van Helvoort, S. M. Selbach, D. Meier
Opublikowane w: Nature Communications, Numer 13, 2022, ISSN 2041-1723
Wydawca: Nature Publishing Group
DOI: 10.1038/s41467-022-32189-0

Introducing a Dynamic Reconstruction Methodology for Multilayered Structures in Atom Probe Tomography

Autorzy: Constantinos Hatzoglou, Gérald Da Costa, Peter Wells, Xiaochen Ren, Brian P Geiser, David J Larson, Remi Demoulin, Kasper Hunnestad, Etienne Talbot, Baishakhi Mazumder, Dennis Meier, François Vurpillot
Opublikowane w: Microscopy and Microanalysis, Numer 29, 2023, Strona(/y) 1124–1136, ISSN 1435-8115
Wydawca: Oxford University Press
DOI: 10.1093/micmic/ozad054

Application of a long short-term memory for deconvoluting conductance contributions at charged ferroelectric domain walls

Autorzy: Theodor S. Holstad, Trygve M. Ræder, Donald M. Evans, Didirk R. Småbråten, Stephan Krohns, Jakob Schaab, Zewu Yan, Edith Bourret, Antonius T. J. van Helvoort, Tor Grande, Sverre M. Selbach, Joshua C. Agar, and Dennis Meier
Opublikowane w: npj Computational Materials, 2020, ISSN 2057-3960
Wydawca: Springer Nature
DOI: 10.1038/s41524-020-00426-z

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