Deliverables
Initial benchmarking towards evolving wideband communication and sensing
Final report on electrical parameter, interface dielectric trap and RF (S parameter and NF) characterization of devices operated at cryogenic condition
Final report on electrical parameter interface dielectric trap and RF S parameter and NF characterization of devices operated at cryogenic condition
Report on first version of device compact models for LF and RF circuit simulationFirst report on interface dielectric trap and RF (S parameter and NF) characterization of devices operated at cryogenic condition
Web site launch
Report on extremely low temperature (20mK-4K) device characterization
Report on extremely low temperature 20mK4K device characterization
Road map for integrated and improved quantum computer electronicsReport on device compact modelling for LF and RF circuit simulation
Report on self heating device characterization by thermal and electrical techniques
Review of key building blocks for cryogenic logic and space, 40-70 K, as well as wideband communication, RT
First report on electrical characterization and parameter extraction of devices operated at cryogenic condition
External Communication Plan
Dissemination Plan
Final Dissemination Plan
Initial report on circuit design with layouts and simulated performance
Publications
Author(s):
G. Ghibaudo, M. Aouad, M. Casse, T. Poiroux, C. Theodorou
Published in:
Solid-State Electronics, Issue 176, 2021, Page(s) 107949, ISSN 0038-1101
Publisher:
Pergamon Press Ltd.
DOI:
10.1016/j.sse.2020.107949
Author(s):
Bruna Cardoso Paz, Mikael Casse, Christoforos Theodorou, Gerard Ghibaudo, Thorsten Kammler, Luca Pirro, Maud Vinet, Silvano de Franceschi, Tristan Meunier, Fred Gaillard
Published in:
IEEE Transactions on Electron Devices, Issue 67/11, 2020, Page(s) 4563-4567, ISSN 0018-9383
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/ted.2020.3021999
Author(s):
Fabian Thome, Arnulf Leuther
Published in:
IEEE Journal of Solid-State Circuits, 2021, Page(s) 1-1, ISSN 0018-9200
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/jssc.2021.3052952
Author(s):
Patrik Olausson, Lasse Södergren, Mattias Borg, Erik Lind
Published in:
physica status solidi (a), Issue 218/7, 2021, Page(s) 2000720, ISSN 1862-6300
Publisher:
Wiley - V C H Verlag GmbbH & Co.
DOI:
10.1002/pssa.202000720
Author(s):
Abinaya Krishnaraja, Johannes Svensson, Elvedin Memisevic, Zhongyunshen Zhu, Axel R. Persson, Erik Lind, Lars Reine Wallenberg, Lars-Erik Wernersson
Published in:
ACS Applied Electronic Materials, Issue 2/9, 2020, Page(s) 2882-2887, ISSN 2637-6113
Publisher:
ACS
DOI:
10.1021/acsaelm.0c00521
Author(s):
Mikaël Cassé, Bruna Cardoso Paz, Gérard Ghibaudo, Thierry Poiroux, Emmanuel Vincent, Philippe Galy, André Juge, Fred Gaillard, Silvano de Franceschi, Tristan Meunier, Maud Vinet
Published in:
Applied Physics Letters, Issue 116/24, 2020, Page(s) 243502, ISSN 0003-6951
Publisher:
American Institute of Physics
DOI:
10.1063/5.0007100
Author(s):
Christian Marty, Clarissa Convertino, Cezar Zota
Published in:
Semiconductor Science and Technology, Issue 35/11, 2020, Page(s) 115027, ISSN 0268-1242
Publisher:
Institute of Physics Publishing
DOI:
10.1088/1361-6641/abb841
Author(s):
Enrico Caruso, Jun Lin, Scott Monaghan, Karim Cherkaoui, Farzan Gity, Pierpaolo Palestri, David Esseni, Luca Selmi, Paul K. Hurley
Published in:
IEEE Transactions on Electron Devices, Issue 67/10, 2020, Page(s) 4372-4378, ISSN 0018-9383
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/ted.2020.3018095
Author(s):
Clarissa Convertino, Cezar B. Zota, Heinz Schmid, Daniele Caimi, Lukas Czornomaz, Adrian M. Ionescu, Kirsten E. Moselund
Published in:
Nature Electronics, Issue 4/2, 2021, Page(s) 162-170, ISSN 2520-1131
Publisher:
Nature
DOI:
10.1038/s41928-020-00531-3
Author(s):
Fabian Thome, Felix Heinz, Arnulf Leuther
Published in:
IEEE Microwave and Wireless Components Letters, Issue 30/11, 2020, Page(s) 1089-1092, ISSN 1531-1309
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/lmwc.2020.3025674
Author(s):
D. Caimi, H. Schmid, T. Morf, P. Mueller, M. Sousa, K.E. Moselund, C.B. Zota
Published in:
Solid-State Electronics, Issue 185, 2021, Page(s) 108077, ISSN 0038-1101
Publisher:
Pergamon Press Ltd.
DOI:
10.1016/j.sse.2021.108077
Author(s):
Daniele Caimi, Marilyne Sousa, Siegfried Karg and Cezar B. Zota
Published in:
Japanese Journal of Applied Physics, Issue 60/SB, 2021, Page(s) SB0801, ISSN 0021-4922
Publisher:
IOP Science
DOI:
10.35848/1347-4065/abd707
Author(s):
Arnout Beckers, Dominique Beckers, Farzan Jazaeri, Bertrand Parvais, Christian Enz
Published in:
Journal of Applied Physics, Issue 129/4, 2021, Page(s) 045701, ISSN 0021-8979
Publisher:
American Institute of Physics
DOI:
10.1063/5.0037432
Author(s):
Lasse Södergren, Navya Sri Garigapati, Mattias Borg, Erik Lind
Published in:
Applied Physics Letters, Issue 117/1, 2020, Page(s) 013102, ISSN 0003-6951
Publisher:
American Institute of Physics
DOI:
10.1063/5.0006530
Author(s):
Daniele Caimi, Preksha Tiwari, Marilyne Sousa, Kirsten E. Moselund, Cezar B. Zota
Published in:
IEEE Transactions on Electron Devices, 2021, Page(s) 1-8, ISSN 0018-9383
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/ted.2021.3067273
Author(s):
Stefan Andric, Lars Ohlsson Fhager, Lars-Erik Wernersson
Published in:
IEEE Transactions on Nanotechnology, Issue 20, 2021, Page(s) 434-440, ISSN 1536-125X
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tnano.2021.3080621
Author(s):
M. Casse, B. Cardoso Paz, G. Ghibaudo, T. Poiroux, S. Barraud, M. Vinet, S. de Franceschi, T. Meunier, F. Gaillard
Published in:
IEEE Transactions on Electron Devices, Issue 67/11, 2020, Page(s) 4636-4640, ISSN 0018-9383
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/ted.2020.3022607
Author(s):
Stefan Andrić, Lars Ohlsson-Fhager, Lars-Erik Wernersson
Published in:
Issue 10-15 Jan. 2021, 2020
Publisher:
IEEE
Author(s):
M. Aouad, S. Martinie, F. Triozon, T. Poiroux, M. Vinet, G. Ghibaudo
Published in:
2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2020, Page(s) 1-4, ISBN 978-1-7281-8765-5
Publisher:
IEEE
DOI:
10.1109/eurosoi-ulis49407.2020.9365297
Author(s):
Abinaya Krishnaraja, Johannes Svensson, Lars-Erik Wernersson
Published in:
2020 IEEE Silicon Nanoelectronics Workshop (SNW), 2020, Page(s) 17-18, ISBN 978-1-7281-9735-7
Publisher:
IEEE
DOI:
10.1109/snw50361.2020.9131656
Author(s):
Lars-Erik Wernersson
Published in:
2020 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2020, Page(s) 1-4, ISBN 978-1-7281-9749-4
Publisher:
IEEE
DOI:
10.1109/bcicts48439.2020.9392932
Author(s):
Christian Enz, Arnout Beckers, Farzan Jazaeri
Published in:
2020 IEEE International Electron Devices Meeting (IEDM), 2020, Page(s) 25.3.1-25.3.4, ISBN 978-1-7281-8888-1
Publisher:
IEEE
DOI:
10.1109/iedm13553.2020.9371894
Author(s):
C. Convertino, L. Vergano, L. Czornomaz, C. B. Zota, S. Karg
Published in:
2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2020, Page(s) 1-4, ISBN 978-1-7281-8765-5
Publisher:
IEEE
DOI:
10.1109/eurosoi-ulis49407.2020.9365288
Author(s):
Mikaël Cassé, Gérard Ghibaudo
Published in:
Low-Temperature Technologies [Working Title], 2021
Publisher:
IntechOpen
DOI:
10.5772/intechopen.98403
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