Resultado final
Initial benchmarking towards evolving wideband communication and sensing
Final report on electrical parameter, interface dielectric trap and RF (S parameter and NF) characterization of devices operated at cryogenic condition
Final report on electrical parameter interface dielectric trap and RF S parameter and NF characterization of devices operated at cryogenic condition
Report on first version of device compact models for LF and RF circuit simulationFirst report on interface dielectric trap and RF (S parameter and NF) characterization of devices operated at cryogenic condition
Web site launch
Report on extremely low temperature (20mK-4K) device characterization
Report on extremely low temperature 20mK4K device characterization
Road map for integrated and improved quantum computer electronicsReport on device compact modelling for LF and RF circuit simulation
Report on self heating device characterization by thermal and electrical techniques
Review of key building blocks for cryogenic logic and space, 40-70 K, as well as wideband communication, RT
First report on electrical characterization and parameter extraction of devices operated at cryogenic condition
External Communication Plan
Dissemination Plan
Final Dissemination Plan
Initial report on circuit design with layouts and simulated performance
Publicaciones
Autores:
G. Ghibaudo, M. Aouad, M. Casse, T. Poiroux, C. Theodorou
Publicado en:
Solid-State Electronics, Edición 176, 2021, Página(s) 107949, ISSN 0038-1101
Editor:
Pergamon Press Ltd.
DOI:
10.1016/j.sse.2020.107949
Autores:
Bruna Cardoso Paz, Mikael Casse, Christoforos Theodorou, Gerard Ghibaudo, Thorsten Kammler, Luca Pirro, Maud Vinet, Silvano de Franceschi, Tristan Meunier, Fred Gaillard
Publicado en:
IEEE Transactions on Electron Devices, Edición 67/11, 2020, Página(s) 4563-4567, ISSN 0018-9383
Editor:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/ted.2020.3021999
Autores:
Fabian Thome, Arnulf Leuther
Publicado en:
IEEE Journal of Solid-State Circuits, 2021, Página(s) 1-1, ISSN 0018-9200
Editor:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/jssc.2021.3052952
Autores:
Patrik Olausson, Lasse Södergren, Mattias Borg, Erik Lind
Publicado en:
physica status solidi (a), Edición 218/7, 2021, Página(s) 2000720, ISSN 1862-6300
Editor:
Wiley - V C H Verlag GmbbH & Co.
DOI:
10.1002/pssa.202000720
Autores:
Abinaya Krishnaraja, Johannes Svensson, Elvedin Memisevic, Zhongyunshen Zhu, Axel R. Persson, Erik Lind, Lars Reine Wallenberg, Lars-Erik Wernersson
Publicado en:
ACS Applied Electronic Materials, Edición 2/9, 2020, Página(s) 2882-2887, ISSN 2637-6113
Editor:
ACS
DOI:
10.1021/acsaelm.0c00521
Autores:
Mikaël Cassé, Bruna Cardoso Paz, Gérard Ghibaudo, Thierry Poiroux, Emmanuel Vincent, Philippe Galy, André Juge, Fred Gaillard, Silvano de Franceschi, Tristan Meunier, Maud Vinet
Publicado en:
Applied Physics Letters, Edición 116/24, 2020, Página(s) 243502, ISSN 0003-6951
Editor:
American Institute of Physics
DOI:
10.1063/5.0007100
Autores:
Christian Marty, Clarissa Convertino, Cezar Zota
Publicado en:
Semiconductor Science and Technology, Edición 35/11, 2020, Página(s) 115027, ISSN 0268-1242
Editor:
Institute of Physics Publishing
DOI:
10.1088/1361-6641/abb841
Autores:
Enrico Caruso, Jun Lin, Scott Monaghan, Karim Cherkaoui, Farzan Gity, Pierpaolo Palestri, David Esseni, Luca Selmi, Paul K. Hurley
Publicado en:
IEEE Transactions on Electron Devices, Edición 67/10, 2020, Página(s) 4372-4378, ISSN 0018-9383
Editor:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/ted.2020.3018095
Autores:
Clarissa Convertino, Cezar B. Zota, Heinz Schmid, Daniele Caimi, Lukas Czornomaz, Adrian M. Ionescu, Kirsten E. Moselund
Publicado en:
Nature Electronics, Edición 4/2, 2021, Página(s) 162-170, ISSN 2520-1131
Editor:
Nature
DOI:
10.1038/s41928-020-00531-3
Autores:
Fabian Thome, Felix Heinz, Arnulf Leuther
Publicado en:
IEEE Microwave and Wireless Components Letters, Edición 30/11, 2020, Página(s) 1089-1092, ISSN 1531-1309
Editor:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/lmwc.2020.3025674
Autores:
D. Caimi, H. Schmid, T. Morf, P. Mueller, M. Sousa, K.E. Moselund, C.B. Zota
Publicado en:
Solid-State Electronics, Edición 185, 2021, Página(s) 108077, ISSN 0038-1101
Editor:
Pergamon Press Ltd.
DOI:
10.1016/j.sse.2021.108077
Autores:
Daniele Caimi, Marilyne Sousa, Siegfried Karg and Cezar B. Zota
Publicado en:
Japanese Journal of Applied Physics, Edición 60/SB, 2021, Página(s) SB0801, ISSN 0021-4922
Editor:
IOP Science
DOI:
10.35848/1347-4065/abd707
Autores:
Arnout Beckers, Dominique Beckers, Farzan Jazaeri, Bertrand Parvais, Christian Enz
Publicado en:
Journal of Applied Physics, Edición 129/4, 2021, Página(s) 045701, ISSN 0021-8979
Editor:
American Institute of Physics
DOI:
10.1063/5.0037432
Autores:
Lasse Södergren, Navya Sri Garigapati, Mattias Borg, Erik Lind
Publicado en:
Applied Physics Letters, Edición 117/1, 2020, Página(s) 013102, ISSN 0003-6951
Editor:
American Institute of Physics
DOI:
10.1063/5.0006530
Autores:
Daniele Caimi, Preksha Tiwari, Marilyne Sousa, Kirsten E. Moselund, Cezar B. Zota
Publicado en:
IEEE Transactions on Electron Devices, 2021, Página(s) 1-8, ISSN 0018-9383
Editor:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/ted.2021.3067273
Autores:
Stefan Andric, Lars Ohlsson Fhager, Lars-Erik Wernersson
Publicado en:
IEEE Transactions on Nanotechnology, Edición 20, 2021, Página(s) 434-440, ISSN 1536-125X
Editor:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tnano.2021.3080621
Autores:
M. Casse, B. Cardoso Paz, G. Ghibaudo, T. Poiroux, S. Barraud, M. Vinet, S. de Franceschi, T. Meunier, F. Gaillard
Publicado en:
IEEE Transactions on Electron Devices, Edición 67/11, 2020, Página(s) 4636-4640, ISSN 0018-9383
Editor:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/ted.2020.3022607
Autores:
Stefan Andrić, Lars Ohlsson-Fhager, Lars-Erik Wernersson
Publicado en:
Edición 10-15 Jan. 2021, 2020
Editor:
IEEE
Autores:
M. Aouad, S. Martinie, F. Triozon, T. Poiroux, M. Vinet, G. Ghibaudo
Publicado en:
2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2020, Página(s) 1-4, ISBN 978-1-7281-8765-5
Editor:
IEEE
DOI:
10.1109/eurosoi-ulis49407.2020.9365297
Autores:
Abinaya Krishnaraja, Johannes Svensson, Lars-Erik Wernersson
Publicado en:
2020 IEEE Silicon Nanoelectronics Workshop (SNW), 2020, Página(s) 17-18, ISBN 978-1-7281-9735-7
Editor:
IEEE
DOI:
10.1109/snw50361.2020.9131656
Autores:
Lars-Erik Wernersson
Publicado en:
2020 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2020, Página(s) 1-4, ISBN 978-1-7281-9749-4
Editor:
IEEE
DOI:
10.1109/bcicts48439.2020.9392932
Autores:
Christian Enz, Arnout Beckers, Farzan Jazaeri
Publicado en:
2020 IEEE International Electron Devices Meeting (IEDM), 2020, Página(s) 25.3.1-25.3.4, ISBN 978-1-7281-8888-1
Editor:
IEEE
DOI:
10.1109/iedm13553.2020.9371894
Autores:
C. Convertino, L. Vergano, L. Czornomaz, C. B. Zota, S. Karg
Publicado en:
2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2020, Página(s) 1-4, ISBN 978-1-7281-8765-5
Editor:
IEEE
DOI:
10.1109/eurosoi-ulis49407.2020.9365288
Autores:
Mikaël Cassé, Gérard Ghibaudo
Publicado en:
Low-Temperature Technologies [Working Title], 2021
Editor:
IntechOpen
DOI:
10.5772/intechopen.98403
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