When characterizing a three-dimensional (3D) structure using two-dimensional (2D) experimental tools, great care has to be taken not to get a false impression of the reality. This is critical when characterizing crystalline materials: whereas essentially all materials’ microstructures are 3D, the by far most widely applied microstructural characterization tool is microscopy, which provides 2D images only.
Motivated by the need for much more comprehensive 3D data, intense efforts were devoted in the early 2000’ies to the development of synchrotron X-ray based 3D characterization tools, and today a palette of X-ray orientation imaging methods is available at the large international synchrotron facilities. However, characterization tools at synchrotron sources are insufficient: availability of beam time there is very limited, extended measurement times (> 1 week) are not realistic, and the turnaround time (from idea to result) is typically a year or more. Similar tools working in the home-laboratories are required to realize the dream of making 3D characterization the new golden standard.
Today only one laboratory X-ray tool exists for a crystallographic orientation mapping (LabDCT). LabDCT can image grains larger than 20 μm, and the grains have to be defect-free.
Our solution to overcome these limitations is to develop a laboratory-based 3D micro X-ray Laue diffraction (LabμXRD) technique using newly developed and commercially available X-ray optics to focus the X-ray beam from a laboratory X-ray instrument, and then adapt scanning and translation principles.
The technical objectives are:
• to build and optimize LabμXRD set-ups using both open-architectural and commercial systems,
• to validate and benchmark the spatial resolution by other methods wherever possible,
• to develop measurement and analysis methodologies matching industrial needs.
The commercial objectives are:
• to thoroughly map the market and the competitive landscape, incl. talking to end users,
• to complete a first business plan,
• to work with instrument suppliers to get commitment to commercialize the technology.
End users are scientists and industrial researchers/developers alike, who need microstructural and crystallographic orientation characterization of crystalline samples or components. Today these end users mainly use electron microscopy, LabDCT and/or synchrotron methods for their characterization.
If LabμXRD can be manufactured to the specification, and commercialized at a reasonable sales price, we foresee that it will in time supplement or even replace LabDCT. In the longer perspective (within the order of 10 years) we foresee LabμXRD to also replace at least a part of the electron back scattering diffraction market, and become the new golden standard for microstructural characterization.