Autonomous navigation will be an indispensable part of our daily lives in the near future. Data from multiple sensors, i.e. GPS, camera, LIDAR, RADAR, and inertial sensors, are fused in navigation algorithms. Unlike any other sensor, navigation with inertial sensors is error-proof if a no-drift inertial sensor could be invented. The gyroscope and accelerometer outputs are integrated for navigation, and drift leads to error accumulation over time. The drift is the main barrier for utilizing MicroElectroMechanical System (MEMS) inertial sensors in demanding autonomous navigation applications. This project (0-drift) aims to address the drift problem in MEMS gyroscopes. 0-drift targets to develop an ideal sensor with just white noise through innovative on-chip self-calibration methods. Currently, inertial sensors are considered unreliable and deployed only to stop the vehicle when all other sensors fail due to weather conditions. If 0-drift succeeds, the navigation algorithms could rely on the error-proof, only gravity-referenced inertial sensors. The navigation would be more robust and could resume under all conditions. For example, cameras might fail in the dark, GPS signal can be jammed or lost, but the inertial sensor operation is independent of light, weather, and location conditions. A no-drift, low-cost MEMS sensor would enable indoor navigation where GPS cannot be used and also disrupt the precision inertial sensor market by replacing much more expensive and bulky counterparts. There has been ongoing research, and the MEMS inertial sensors have become more stable, mainly due to noise improvements. However, limited research focuses on the basic drift problem. 0-drift will approach the problem in an unconventional way by introducing a self-calibrating sensor. The only way a MEMS sensor can interact with its environment is through the device anchors. Environmental stress and temperature variations cause the device anchors to shift, affecting device dynamics and resulting in drift. 0-drift will develop a sensor that applies a stress stimulus to the device and extracts its own drift transfer function by measuring the on-chip stress and the MEMS sensor output. A novel MEMS fabrication flow, a new integrated electronic readout circuit, new control and calibration methods, along with an innovative sensor, will be developed in the context of 0-drift.