Radiation Hard Resistive Random-Access Memory

Informations projet

R2RAM

N° de convention de subvention: 640073

DOI

10.3030/640073

Projet clôturé

Date de signature de la CE 17 Novembre 2014

Date de début 1 Janvier 2015

Date de fin 31 Decembre 2016

Financé au titre de

• INDUSTRIAL LEADERSHIP - Leadership in enabling and industrial technologies – Space

Coût total

€ 1 039 362,50

Contribution de l’UE

€ 1 039 362,50

Coordonné par

IHP GMBH - LEIBNIZ INSTITUTE FOR HIGH PERFORMANCE MICROELECTRONICS
Germany

CORDIS fournit des liens vers les livrables publics et les publications des projets HORIZON.

Les liens vers les livrables et les publications des projets du 7e PC, ainsi que les liens vers certains types de résultats spécifiques tels que les jeux de données et les logiciels, sont récupérés dynamiquement sur OpenAIRE .

Livrables

Documents, reports (3)

Programming and Erasing Strategy in R2RAM

Reporting the writing and sensing schemes for programming, erasing and reading

1Mbit R2RAM Architecture

Providing the best architectural solution for the internal phases.

Read Strategy in R2RAM

Reporting the writing and sensing schemes for reading.

Websites, patent fillings, videos etc. (2)

Articles in international journals

Publications of achievements and lessons learnt through conferences, international press and peer-reviewed journals .

R2RAM website

Development of a web site that provides open access to the results achieved within the Project.

Publications

Peer reviewed articles (9)

Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays

Auteurs: Alessandro Grossi, Cristian Zambelli, Piero Olivo, Enrique Miranda, Valeriy Stikanov, Christian Walczyk, Christian Wenger
Publié dans: Solid-State Electronics, Numéro 115, 2016, Page(s) 17-25, ISSN 0038-1101
Éditeur: Pergamon Press Ltd.
DOI: 10.1016/j.sse.2015.10.003

Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays

Auteurs: Alessandro Grossi, Damian Walczyk, Cristian Zambelli, Enrique Miranda, Piero Olivo, Valeriy Stikanov, Alessandro Feriani, Jordi Sune, Gunter Schoof, Rolf Kraemer, Bernd Tillack, Alexander Fox, Thomas Schroeder, Christian Wenger, Christian Walczyk
Publié dans: IEEE Transactions on Electron Devices, Numéro 62/8, 2015, Page(s) 2502-2509, ISSN 0018-9383
Éditeur: Institute of Electrical and Electronics Engineers
DOI: 10.1109/TED.2015.2442412

Resistive switching characteristics of integrated polycrystalline hafnium oxide based one transistor and one resistor devices fabricated by atomic vapor deposition methods

Auteurs: Hee-Dong Kim, Felice Crupi, Mindaugas Lukosius, Andreas Trusch, Christian Walczyk, Christian Wenger
Publié dans: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, Numéro 33/5, 2015, Page(s) 052204, ISSN 2166-2754
Éditeur: AVS Science and Technology Society
DOI: 10.1116/1.4928412

Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays

Auteurs: Felice Crupi, Francesco Filice, Alessandro Grossi, Cristian Zambelli, Piero Olivo, Eduardo Perez, Christian Wenger
Publié dans: IEEE Transactions on Device and Materials Reliability, Numéro 16/3, 2016, Page(s) 413-418, ISSN 1530-4388
Éditeur: Institute of Electrical and Electronics Engineers
DOI: 10.1109/TDMR.2016.2594119

An Automated Test Equipment for Characterization of emerging MRAM and RRAM arrays

Auteurs: Alessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Christian Wenger, Jeremy Alvarez-Herault, Ken Mackay
Publié dans: IEEE Transactions on Emerging Topics in Computing, 2016, Page(s) 1-1, ISSN 2168-6750
Éditeur: IEEE Computer Society
DOI: 10.1109/TETC.2016.2585043

Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2

Auteurs: Alessandro Grossi, Cristian Zambelli, Piero Olivo, Alberto Crespo-Yepes, Javier Martin-Martinez, Rosana Rodríguez, Monserrat Nafria, Eduardo Perez, Christian Wenger
Publié dans: Solid-State Electronics, 2016, ISSN 0038-1101
Éditeur: Pergamon Press Ltd.
DOI: 10.1016/j.sse.2016.10.025

Impact of the incremental programming algorithm on the filament conduction in HfO2 based RRAM arrays

Auteurs: Eduardo Perez, Alessandro Grossi, Cristian Zambelli, Piero Olivo, Christian Wenger
Publié dans: IEEE Journal of the Electron Devices Society, 2016, Page(s) 1-1, ISSN 2168-6734
Éditeur: Institute of Electrical and Electronics Engineers Inc.
DOI: 10.1109/JEDS.2016.2618425

Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices

Auteurs: Eduardo Pérez, Christian Wenger, Alessandro Grossi, Cristian Zambelli, Piero Olivo, Robin Roelofs
Publié dans: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, Numéro 35/1, 2017, Page(s) 01A103, ISSN 2166-2754
Éditeur: AVS Science and Technology Society
DOI: 10.1116/1.4967308

Electrical study of radiation hard designed HfO2-based 1T-1R RRAM devices

Auteurs: Eduardo Pérez, Florian Teply, Christian Wenger
Publié dans: MRS Advances, 2016, Page(s) 1-6, ISSN 2059-8521
Éditeur: MRS Advances
DOI: 10.1557/adv.2016.616

Conference proceedings (6)

Radiation hard design of HfO2 based 1T1R cells and memory arrays

Auteurs: Alessandro Grossi, Cristiano Calligaro, Eduardo Perez, Jens Schmidt, Florian Teply, Thomas Mausolf, Cristian Zambelli, Piero Olivo, Christian Wenger
Publié dans: 2015 International Conference on Memristive Systems (MEMRISYS), 2015, Page(s) 1-2, ISBN 978-1-4673-9209-9
Éditeur: IEEE
DOI: 10.1109/MEMRISYS.2015.7378390

Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2

Auteurs: Alessandro Grossi, Eduardo Perez, Cristian Zambelli, Piero Olivo, Christian Wenger
Publié dans: 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2016, Page(s) 80-83, ISBN 978-1-4673-8609-8
Éditeur: IEEE
DOI: 10.1109/ULIS.2016.7440057

RRAM Reliability/Performance Characterization through Array Architectures Investigations

Auteurs: Cristian Zambelli, Alessandro Grossi, Piero Olivo, Christian Walczyk, Christian Wenger
Publié dans: 2015 IEEE Computer Society Annual Symposium on VLSI, 2015, Page(s) 327-332, ISBN 978-1-4799-8719-1
Éditeur: IEEE
DOI: 10.1109/ISVLSI.2015.17

Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays

Auteurs: Alessandro Grossi, Cristian Zambelli, Piero Olivo, Enrique Miranda, Valeriy Stikanov, Thomas Schroeder, Christian Walczyk, Christian Wenger
Publié dans: 2015 IEEE International Memory Workshop (IMW), 2015, Page(s) 1-4, ISBN 978-1-4673-6933-6
Éditeur: IEEE
DOI: 10.1109/IMW.2015.7150303

Design of resistive non-volatile memories for rad-hard applications

Auteurs: Nicola Lupo; Cristiano Calligaro; Roberto Gastaldi; Christian Wenger; Franco Maloberti
Publié dans: 2016 IEEE International Symposium on Circuits and Systems (ISCAS), 2016, Page(s) 1594-1597
Éditeur: IEEE Xpolore
DOI: 10.1109/ISCAS.2016.7538869

Impact of HfO2 Deposition Techniques on the Switching Parameters in embedded 1T-1R Cells and Arrays

Auteurs: A. Grossi, E. Perez, C. Zambelli, P. Olivo, Ch. Wenger
Publié dans: Workshop on Dielectrics in Microelectronics (WoDiM 2016), 2016
Éditeur: unknown