Rezultaty Documents, reports (3) Programming and Erasing Strategy in R2RAM Reporting the writing and sensing schemes for programming, erasing and reading 1Mbit R2RAM Architecture Providing the best architectural solution for the internal phases. Read Strategy in R2RAM Reporting the writing and sensing schemes for reading. Websites, patent fillings, videos etc. (2) Articles in international journals Publications of achievements and lessons learnt through conferences, international press and peer-reviewed journals . R2RAM website Development of a web site that provides open access to the results achieved within the Project. Publikacje Peer reviewed articles (9) Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays Autorzy: Alessandro Grossi, Cristian Zambelli, Piero Olivo, Enrique Miranda, Valeriy Stikanov, Christian Walczyk, Christian Wenger Opublikowane w: Solid-State Electronics, Numer 115, 2016, Strona(/y) 17-25, ISSN 0038-1101 Wydawca: Pergamon Press Ltd. DOI: 10.1016/j.sse.2015.10.003 Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays Autorzy: Alessandro Grossi, Damian Walczyk, Cristian Zambelli, Enrique Miranda, Piero Olivo, Valeriy Stikanov, Alessandro Feriani, Jordi Sune, Gunter Schoof, Rolf Kraemer, Bernd Tillack, Alexander Fox, Thomas Schroeder, Christian Wenger, Christian Walczyk Opublikowane w: IEEE Transactions on Electron Devices, Numer 62/8, 2015, Strona(/y) 2502-2509, ISSN 0018-9383 Wydawca: Institute of Electrical and Electronics Engineers DOI: 10.1109/TED.2015.2442412 Resistive switching characteristics of integrated polycrystalline hafnium oxide based one transistor and one resistor devices fabricated by atomic vapor deposition methods Autorzy: Hee-Dong Kim, Felice Crupi, Mindaugas Lukosius, Andreas Trusch, Christian Walczyk, Christian Wenger Opublikowane w: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, Numer 33/5, 2015, Strona(/y) 052204, ISSN 2166-2754 Wydawca: AVS Science and Technology Society DOI: 10.1116/1.4928412 Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays Autorzy: Felice Crupi, Francesco Filice, Alessandro Grossi, Cristian Zambelli, Piero Olivo, Eduardo Perez, Christian Wenger Opublikowane w: IEEE Transactions on Device and Materials Reliability, Numer 16/3, 2016, Strona(/y) 413-418, ISSN 1530-4388 Wydawca: Institute of Electrical and Electronics Engineers DOI: 10.1109/TDMR.2016.2594119 An Automated Test Equipment for Characterization of emerging MRAM and RRAM arrays Autorzy: Alessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Christian Wenger, Jeremy Alvarez-Herault, Ken Mackay Opublikowane w: IEEE Transactions on Emerging Topics in Computing, 2016, Strona(/y) 1-1, ISSN 2168-6750 Wydawca: IEEE Computer Society DOI: 10.1109/TETC.2016.2585043 Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2 Autorzy: Alessandro Grossi, Cristian Zambelli, Piero Olivo, Alberto Crespo-Yepes, Javier Martin-Martinez, Rosana Rodríguez, Monserrat Nafria, Eduardo Perez, Christian Wenger Opublikowane w: Solid-State Electronics, 2016, ISSN 0038-1101 Wydawca: Pergamon Press Ltd. DOI: 10.1016/j.sse.2016.10.025 Impact of the incremental programming algorithm on the filament conduction in HfO2 based RRAM arrays Autorzy: Eduardo Perez, Alessandro Grossi, Cristian Zambelli, Piero Olivo, Christian Wenger Opublikowane w: IEEE Journal of the Electron Devices Society, 2016, Strona(/y) 1-1, ISSN 2168-6734 Wydawca: Institute of Electrical and Electronics Engineers Inc. DOI: 10.1109/JEDS.2016.2618425 Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices Autorzy: Eduardo Pérez, Christian Wenger, Alessandro Grossi, Cristian Zambelli, Piero Olivo, Robin Roelofs Opublikowane w: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, Numer 35/1, 2017, Strona(/y) 01A103, ISSN 2166-2754 Wydawca: AVS Science and Technology Society DOI: 10.1116/1.4967308 Electrical study of radiation hard designed HfO2-based 1T-1R RRAM devices Autorzy: Eduardo Pérez, Florian Teply, Christian Wenger Opublikowane w: MRS Advances, 2016, Strona(/y) 1-6, ISSN 2059-8521 Wydawca: MRS Advances DOI: 10.1557/adv.2016.616 Conference proceedings (6) Radiation hard design of HfO2 based 1T1R cells and memory arrays Autorzy: Alessandro Grossi, Cristiano Calligaro, Eduardo Perez, Jens Schmidt, Florian Teply, Thomas Mausolf, Cristian Zambelli, Piero Olivo, Christian Wenger Opublikowane w: 2015 International Conference on Memristive Systems (MEMRISYS), 2015, Strona(/y) 1-2, ISBN 978-1-4673-9209-9 Wydawca: IEEE DOI: 10.1109/MEMRISYS.2015.7378390 Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2 Autorzy: Alessandro Grossi, Eduardo Perez, Cristian Zambelli, Piero Olivo, Christian Wenger Opublikowane w: 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2016, Strona(/y) 80-83, ISBN 978-1-4673-8609-8 Wydawca: IEEE DOI: 10.1109/ULIS.2016.7440057 RRAM Reliability/Performance Characterization through Array Architectures Investigations Autorzy: Cristian Zambelli, Alessandro Grossi, Piero Olivo, Christian Walczyk, Christian Wenger Opublikowane w: 2015 IEEE Computer Society Annual Symposium on VLSI, 2015, Strona(/y) 327-332, ISBN 978-1-4799-8719-1 Wydawca: IEEE DOI: 10.1109/ISVLSI.2015.17 Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays Autorzy: Alessandro Grossi, Cristian Zambelli, Piero Olivo, Enrique Miranda, Valeriy Stikanov, Thomas Schroeder, Christian Walczyk, Christian Wenger Opublikowane w: 2015 IEEE International Memory Workshop (IMW), 2015, Strona(/y) 1-4, ISBN 978-1-4673-6933-6 Wydawca: IEEE DOI: 10.1109/IMW.2015.7150303 Design of resistive non-volatile memories for rad-hard applications Autorzy: Nicola Lupo; Cristiano Calligaro; Roberto Gastaldi; Christian Wenger; Franco Maloberti Opublikowane w: 2016 IEEE International Symposium on Circuits and Systems (ISCAS), 2016, Strona(/y) 1594-1597 Wydawca: IEEE Xpolore DOI: 10.1109/ISCAS.2016.7538869 Impact of HfO2 Deposition Techniques on the Switching Parameters in embedded 1T-1R Cells and Arrays Autorzy: A. Grossi, E. Perez, C. Zambelli, P. Olivo, Ch. Wenger Opublikowane w: Workshop on Dielectrics in Microelectronics (WoDiM 2016), 2016 Wydawca: unknown Wyszukiwanie danych OpenAIRE... Podczas wyszukiwania danych OpenAIRE wystąpił błąd Brak wyników
