Radiation Hard Resistive Random-Access Memory

Informazioni relative al progetto

R2RAM

ID dell’accordo di sovvenzione: 640073

DOI

10.3030/640073

Progetto chiuso

Data della firma CE 17 Novembre 2014

Data di avvio 1 Gennaio 2015

Data di completamento 31 Dicembre 2016

Finanziato da

• INDUSTRIAL LEADERSHIP - Leadership in enabling and industrial technologies – Space

Costo totale

€ 1 039 362,50

Contributo UE

€ 1 039 362,50

Coordinato da

IHP GMBH - LEIBNIZ INSTITUTE FOR HIGH PERFORMANCE MICROELECTRONICS
Germany

CORDIS fornisce collegamenti ai risultati finali pubblici e alle pubblicazioni dei progetti ORIZZONTE.

I link ai risultati e alle pubblicazioni dei progetti del 7° PQ, così come i link ad alcuni tipi di risultati specifici come dataset e software, sono recuperati dinamicamente da .OpenAIRE .

Risultati finali

Documents, reports (3)

Programming and Erasing Strategy in R2RAM

Reporting the writing and sensing schemes for programming, erasing and reading

1Mbit R2RAM Architecture

Providing the best architectural solution for the internal phases.

Read Strategy in R2RAM

Reporting the writing and sensing schemes for reading.

Websites, patent fillings, videos etc. (2)

Articles in international journals

Publications of achievements and lessons learnt through conferences, international press and peer-reviewed journals .

R2RAM website

Development of a web site that provides open access to the results achieved within the Project.

Pubblicazioni

Peer reviewed articles (9)

Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays

Autori: Alessandro Grossi, Cristian Zambelli, Piero Olivo, Enrique Miranda, Valeriy Stikanov, Christian Walczyk, Christian Wenger
Pubblicato in: Solid-State Electronics, Numero 115, 2016, Pagina/e 17-25, ISSN 0038-1101
Editore: Pergamon Press Ltd.
DOI: 10.1016/j.sse.2015.10.003

Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays

Autori: Alessandro Grossi, Damian Walczyk, Cristian Zambelli, Enrique Miranda, Piero Olivo, Valeriy Stikanov, Alessandro Feriani, Jordi Sune, Gunter Schoof, Rolf Kraemer, Bernd Tillack, Alexander Fox, Thomas Schroeder, Christian Wenger, Christian Walczyk
Pubblicato in: IEEE Transactions on Electron Devices, Numero 62/8, 2015, Pagina/e 2502-2509, ISSN 0018-9383
Editore: Institute of Electrical and Electronics Engineers
DOI: 10.1109/TED.2015.2442412

Resistive switching characteristics of integrated polycrystalline hafnium oxide based one transistor and one resistor devices fabricated by atomic vapor deposition methods

Autori: Hee-Dong Kim, Felice Crupi, Mindaugas Lukosius, Andreas Trusch, Christian Walczyk, Christian Wenger
Pubblicato in: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, Numero 33/5, 2015, Pagina/e 052204, ISSN 2166-2754
Editore: AVS Science and Technology Society
DOI: 10.1116/1.4928412

Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays

Autori: Felice Crupi, Francesco Filice, Alessandro Grossi, Cristian Zambelli, Piero Olivo, Eduardo Perez, Christian Wenger
Pubblicato in: IEEE Transactions on Device and Materials Reliability, Numero 16/3, 2016, Pagina/e 413-418, ISSN 1530-4388
Editore: Institute of Electrical and Electronics Engineers
DOI: 10.1109/TDMR.2016.2594119

An Automated Test Equipment for Characterization of emerging MRAM and RRAM arrays

Autori: Alessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Christian Wenger, Jeremy Alvarez-Herault, Ken Mackay
Pubblicato in: IEEE Transactions on Emerging Topics in Computing, 2016, Pagina/e 1-1, ISSN 2168-6750
Editore: IEEE Computer Society
DOI: 10.1109/TETC.2016.2585043

Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2

Autori: Alessandro Grossi, Cristian Zambelli, Piero Olivo, Alberto Crespo-Yepes, Javier Martin-Martinez, Rosana Rodríguez, Monserrat Nafria, Eduardo Perez, Christian Wenger
Pubblicato in: Solid-State Electronics, 2016, ISSN 0038-1101
Editore: Pergamon Press Ltd.
DOI: 10.1016/j.sse.2016.10.025

Impact of the incremental programming algorithm on the filament conduction in HfO2 based RRAM arrays

Autori: Eduardo Perez, Alessandro Grossi, Cristian Zambelli, Piero Olivo, Christian Wenger
Pubblicato in: IEEE Journal of the Electron Devices Society, 2016, Pagina/e 1-1, ISSN 2168-6734
Editore: Institute of Electrical and Electronics Engineers Inc.
DOI: 10.1109/JEDS.2016.2618425

Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices

Autori: Eduardo Pérez, Christian Wenger, Alessandro Grossi, Cristian Zambelli, Piero Olivo, Robin Roelofs
Pubblicato in: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, Numero 35/1, 2017, Pagina/e 01A103, ISSN 2166-2754
Editore: AVS Science and Technology Society
DOI: 10.1116/1.4967308

Electrical study of radiation hard designed HfO2-based 1T-1R RRAM devices

Autori: Eduardo Pérez, Florian Teply, Christian Wenger
Pubblicato in: MRS Advances, 2016, Pagina/e 1-6, ISSN 2059-8521
Editore: MRS Advances
DOI: 10.1557/adv.2016.616

Conference proceedings (6)

Radiation hard design of HfO2 based 1T1R cells and memory arrays

Autori: Alessandro Grossi, Cristiano Calligaro, Eduardo Perez, Jens Schmidt, Florian Teply, Thomas Mausolf, Cristian Zambelli, Piero Olivo, Christian Wenger
Pubblicato in: 2015 International Conference on Memristive Systems (MEMRISYS), 2015, Pagina/e 1-2, ISBN 978-1-4673-9209-9
Editore: IEEE
DOI: 10.1109/MEMRISYS.2015.7378390

Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2

Autori: Alessandro Grossi, Eduardo Perez, Cristian Zambelli, Piero Olivo, Christian Wenger
Pubblicato in: 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2016, Pagina/e 80-83, ISBN 978-1-4673-8609-8
Editore: IEEE
DOI: 10.1109/ULIS.2016.7440057

RRAM Reliability/Performance Characterization through Array Architectures Investigations

Autori: Cristian Zambelli, Alessandro Grossi, Piero Olivo, Christian Walczyk, Christian Wenger
Pubblicato in: 2015 IEEE Computer Society Annual Symposium on VLSI, 2015, Pagina/e 327-332, ISBN 978-1-4799-8719-1
Editore: IEEE
DOI: 10.1109/ISVLSI.2015.17

Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays

Autori: Alessandro Grossi, Cristian Zambelli, Piero Olivo, Enrique Miranda, Valeriy Stikanov, Thomas Schroeder, Christian Walczyk, Christian Wenger
Pubblicato in: 2015 IEEE International Memory Workshop (IMW), 2015, Pagina/e 1-4, ISBN 978-1-4673-6933-6
Editore: IEEE
DOI: 10.1109/IMW.2015.7150303

Design of resistive non-volatile memories for rad-hard applications

Autori: Nicola Lupo; Cristiano Calligaro; Roberto Gastaldi; Christian Wenger; Franco Maloberti
Pubblicato in: 2016 IEEE International Symposium on Circuits and Systems (ISCAS), 2016, Pagina/e 1594-1597
Editore: IEEE Xpolore
DOI: 10.1109/ISCAS.2016.7538869

Impact of HfO2 Deposition Techniques on the Switching Parameters in embedded 1T-1R Cells and Arrays

Autori: A. Grossi, E. Perez, C. Zambelli, P. Olivo, Ch. Wenger
Pubblicato in: Workshop on Dielectrics in Microelectronics (WoDiM 2016), 2016
Editore: unknown