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Radiation Hard Resistive Random-Access Memory

Deliverables

Programming and Erasing Strategy in R2RAM

Reporting the writing and sensing schemes for programming, erasing and reading

1Mbit R2RAM Architecture

Providing the best architectural solution for the internal phases.

Read Strategy in R2RAM

Reporting the writing and sensing schemes for reading.

Articles in international journals

Publications of achievements and lessons learnt through conferences, international press and peer-reviewed journals .

R2RAM website

Development of a web site that provides open access to the results achieved within the Project.

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Publications

Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays

Author(s): Alessandro Grossi, Cristian Zambelli, Piero Olivo, Enrique Miranda, Valeriy Stikanov, Christian Walczyk, Christian Wenger
Published in: Solid-State Electronics, Issue 115, 2016, Page(s) 17-25, ISSN 0038-1101
DOI: 10.1016/j.sse.2015.10.003

Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays

Author(s): Alessandro Grossi, Damian Walczyk, Cristian Zambelli, Enrique Miranda, Piero Olivo, Valeriy Stikanov, Alessandro Feriani, Jordi Sune, Gunter Schoof, Rolf Kraemer, Bernd Tillack, Alexander Fox, Thomas Schroeder, Christian Wenger, Christian Walczyk
Published in: IEEE Transactions on Electron Devices, Issue 62/8, 2015, Page(s) 2502-2509, ISSN 0018-9383
DOI: 10.1109/TED.2015.2442412

Resistive switching characteristics of integrated polycrystalline hafnium oxide based one transistor and one resistor devices fabricated by atomic vapor deposition methods

Author(s): Hee-Dong Kim, Felice Crupi, Mindaugas Lukosius, Andreas Trusch, Christian Walczyk, Christian Wenger
Published in: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, Issue 33/5, 2015, Page(s) 052204, ISSN 2166-2754
DOI: 10.1116/1.4928412

Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays

Author(s): Felice Crupi, Francesco Filice, Alessandro Grossi, Cristian Zambelli, Piero Olivo, Eduardo Perez, Christian Wenger
Published in: IEEE Transactions on Device and Materials Reliability, Issue 16/3, 2016, Page(s) 413-418, ISSN 1530-4388
DOI: 10.1109/TDMR.2016.2594119

An Automated Test Equipment for Characterization of emerging MRAM and RRAM arrays

Author(s): Alessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Christian Wenger, Jeremy Alvarez-Herault, Ken Mackay
Published in: IEEE Transactions on Emerging Topics in Computing, 2016, Page(s) 1-1, ISSN 2168-6750
DOI: 10.1109/TETC.2016.2585043

Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2

Author(s): Alessandro Grossi, Cristian Zambelli, Piero Olivo, Alberto Crespo-Yepes, Javier Martin-Martinez, Rosana Rodríguez, Monserrat Nafria, Eduardo Perez, Christian Wenger
Published in: Solid-State Electronics, 2016, ISSN 0038-1101
DOI: 10.1016/j.sse.2016.10.025

Impact of the incremental programming algorithm on the filament conduction in HfO2 based RRAM arrays

Author(s): Eduardo Perez, Alessandro Grossi, Cristian Zambelli, Piero Olivo, Christian Wenger
Published in: IEEE Journal of the Electron Devices Society, 2016, Page(s) 1-1, ISSN 2168-6734
DOI: 10.1109/JEDS.2016.2618425

Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices

Author(s): Eduardo Pérez, Christian Wenger, Alessandro Grossi, Cristian Zambelli, Piero Olivo, Robin Roelofs
Published in: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, Issue 35/1, 2017, Page(s) 01A103, ISSN 2166-2754
DOI: 10.1116/1.4967308

Electrical study of radiation hard designed HfO2-based 1T-1R RRAM devices

Author(s): Eduardo Pérez, Florian Teply, Christian Wenger
Published in: MRS Advances, 2016, Page(s) 1-6, ISSN 2059-8521
DOI: 10.1557/adv.2016.616

Radiation hard design of HfO2 based 1T1R cells and memory arrays

Author(s): Alessandro Grossi, Cristiano Calligaro, Eduardo Perez, Jens Schmidt, Florian Teply, Thomas Mausolf, Cristian Zambelli, Piero Olivo, Christian Wenger
Published in: 2015 International Conference on Memristive Systems (MEMRISYS), 2015, Page(s) 1-2
DOI: 10.1109/MEMRISYS.2015.7378390

Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2

Author(s): Alessandro Grossi, Eduardo Perez, Cristian Zambelli, Piero Olivo, Christian Wenger
Published in: 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2016, Page(s) 80-83
DOI: 10.1109/ULIS.2016.7440057

RRAM Reliability/Performance Characterization through Array Architectures Investigations

Author(s): Cristian Zambelli, Alessandro Grossi, Piero Olivo, Christian Walczyk, Christian Wenger
Published in: 2015 IEEE Computer Society Annual Symposium on VLSI, 2015, Page(s) 327-332
DOI: 10.1109/ISVLSI.2015.17

Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays

Author(s): Alessandro Grossi, Cristian Zambelli, Piero Olivo, Enrique Miranda, Valeriy Stikanov, Thomas Schroeder, Christian Walczyk, Christian Wenger
Published in: 2015 IEEE International Memory Workshop (IMW), 2015, Page(s) 1-4
DOI: 10.1109/IMW.2015.7150303

Design of resistive non-volatile memories for rad-hard applications

Author(s): Nicola Lupo; Cristiano Calligaro; Roberto Gastaldi; Christian Wenger; Franco Maloberti
Published in: 2016 IEEE International Symposium on Circuits and Systems (ISCAS), 2016, Page(s) 1594-1597
DOI: 10.1109/ISCAS.2016.7538869

Impact of HfO2 Deposition Techniques on the Switching Parameters in embedded 1T-1R Cells and Arrays

Author(s): A. Grossi, E. Perez, C. Zambelli, P. Olivo, Ch. Wenger
Published in: Workshop on Dielectrics in Microelectronics (WoDiM 2016), 2016