CORDIS provides links to public deliverables and publications of HORIZON projects.
Links to deliverables and publications from FP7 projects, as well as links to some specific result types such as dataset and software, are dynamically retrieved from OpenAIRE .
Deliverables
PA and LNA data sheet
Web site launch and Press Release for the INSIGHT project
Web site launch and Press Release for the INSIGHT project
Correlation between CV, 1/f, Hysteresis gm(w) on the border trap densityCorrelation between CV, 1/f, Hysteresis gm(w) on the border trap density.
Final report on RF-transistorsData from first small signal model obtained from existing nanowire technology
First noise measurements and RF noise model
Second update on Dissemination Plan
Second update on dissemination plan. It will be included in the “plan for Dissemination and Exploitation”.
Circuit-level Benchmarking ReportFinal Dissemination Plan
Final Dissemination Plan. It will be included in “Plan for Dissemination and Exploitation”.
External Communication PlanReport on high voltage (3-6V) gate stack development
Publications
Author(s):
V. Deshpande, V. Djara, E. O'Connor, D. Caimi, M. Sousa, L. Czornomaz, J. Fompeyrine, P. Hashemi, K. Balakrishnan
Published in:
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Issue Yearly, 2016, Page(s) 127-130, ISBN 978-1-4673-8609-8
Publisher:
IEEE
DOI:
10.1109/ULIS.2016.7440069
Author(s):
Martin Berg, Karl-Magnus Persson, Olli-Pekka Kilpi, Johannes Svensson, Erik Lind, Lars-Erik Wernersson
Published in:
2015 IEEE International Electron Devices Meeting (IEDM), 2015, Page(s) 31.2.1-31.2.4, ISBN 978-1-4673-9894-7
Publisher:
IEEE
DOI:
10.1109/IEDM.2015.7409806
Author(s):
Cezar B. Zota, Lars-Erik Wernersson, Erik Lind
Published in:
2015 IEEE International Electron Devices Meeting (IEDM), 2015, Page(s) 31.4.1-31.4.4, ISBN 978-1-4673-9894-7
Publisher:
IEEE
DOI:
10.1109/IEDM.2015.7409808
Author(s):
Millar, D., Peralagu, U., Fu, Y.-C., Li, X., Steer, M., and Thayne, I.
Published in:
WoDIM, Issue Yearly; Session 4: III-V FETs, 2016, Page(s) N/A
Publisher:
http://wodim2016.imm.cnr.it/index.asp?cont=program
Author(s):
Adam Jonsson, Johannes Svensson, Lars-Erik Wemersson
Published in:
2018 IEEE International Electron Devices Meeting (IEDM), 2018, Page(s) 39.3.1-39.3.4, ISBN 978-1-7281-1987-8
Publisher:
IEEE
DOI:
10.1109/iedm.2018.8614685
Author(s):
Olli-Pekka Kilpi, Johannes Svensson, Lars-Erik Wernersson
Published in:
2017 IEEE International Electron Devices Meeting (IEDM), 2017, Page(s) 17.3.1-17.3.4, ISBN 978-1-5386-3559-9
Publisher:
IEEE
DOI:
10.1109/iedm.2017.8268408
Author(s):
E. Caruso, J. Lin, K. F. Burke, K. Cherkaoui, D. Esseni, F. Gity, S. Monaghan, P. Palestri, P. Hurley, L. Selmi
Published in:
2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2018, Page(s) 1-4, ISBN 978-1-5386-4811-7
Publisher:
IEEE
DOI:
10.1109/ulis.2018.8354757
Author(s):
Stefan Andric, Lars Ohlsson, Lars-Erik Wenrersson
Published in:
2019 92nd ARFTG Microwave Measurement Conference (ARFTG), 2019, Page(s) 1-4, ISBN 978-1-5386-6599-2
Publisher:
IEEE
DOI:
10.1109/arftg.2019.8637222
Author(s):
V. Deshpande, H. Hahn, E. O'Connor, Y. Baumgartner, M. Sousa, D. Caimi, H. Boutry, J. Widiez, L. Brevard, C. Le Royer, M. Vinet, J. Fompeyrine, L. Czornomaz
Published in:
2017 Symposium on VLSI Technology, 2017, Page(s) T74-T75, ISBN 978-4-86348-605-8
Publisher:
IEEE
DOI:
10.23919/vlsit.2017.7998205
Author(s):
Lars-Erik Wernersson
Published in:
2017 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA), 2017, Page(s) 1-2, ISBN 978-1-5090-5805-1
Publisher:
IEEE
DOI:
10.1109/vlsi-tsa.2017.7942489
Author(s):
H. Hahn, V. Deshpande, E. Caruso, S. Sant, E. O'Connor, Y. Baumgartner, M. Sousa, D. Caimi, A. Olziersky, P. Palestri, L. Selmi, A. Schenk, L. Czornomaz
Published in:
2017 IEEE International Electron Devices Meeting (IEDM), 2017, Page(s) 17.5.1-17.5.4, ISBN 978-1-5386-3559-9
Publisher:
IEEE
DOI:
10.1109/iedm.2017.8268410
Author(s):
V. Deshpande, H. Hahn, V. Djara, E. O'Connor, D. Caimi, M. Sousa, J. Fompeyrine, L. Czornomaz
Published in:
2017 47th European Solid-State Device Research Conference (ESSDERC), 2017, Page(s) 244-247, ISBN 978-1-5090-5978-2
Publisher:
IEEE
DOI:
10.1109/essderc.2017.8066637
Author(s):
C. Convertino, C. B. Zota, D. Caimi, M. Sousa, L. Czornomaz
Published in:
2018 48th European Solid-State Device Research Conference (ESSDERC), 2018, Page(s) 162-165, ISBN 978-1-5386-5401-9
Publisher:
IEEE
DOI:
10.1109/essderc.2018.8486862
Author(s):
Lars Ohlsson, Fredrik Lindelow, Cezar B. Zota, Matthias Ohlrogge, Thomas Merkle, Lars-Erik Wernersson, Erik Lind
Published in:
2017 75th Annual Device Research Conference (DRC), 2017, Page(s) 1-2, ISBN 978-1-5090-6328-4
Publisher:
IEEE
DOI:
10.1109/drc.2017.7999451
Author(s):
C. B. Zota, C. Convertino, Y. Baumgartner, M. Sousa, D. Caimi, L. Czornomaz
Published in:
2018 IEEE International Electron Devices Meeting (IEDM), 2018, Page(s) 39.4.1-39.4.4, ISBN 978-1-7281-1987-8
Publisher:
IEEE
DOI:
10.1109/iedm.2018.8614530
Author(s):
C. Convertino, C. Zota, S. Sant, F. Eltes, M. Sousa, D. Caimi, A. Schenk, L. Czornomaz
Published in:
2018 IEEE International Electron Devices Meeting (IEDM), 2018, Page(s) 39.2.1-39.2.4, ISBN 978-1-7281-1987-8
Publisher:
IEEE
DOI:
10.1109/iedm.2018.8614640
Author(s):
C. Convertino, D. Cutaia, H. Schmid, N. Bologna, P. Paletti, A.M. Ionescu, H. Riel, K. E. Moselund
Published in:
2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2017, Page(s) 148-151, ISBN 978-1-5090-5313-1
Publisher:
IEEE
DOI:
10.1109/ulis.2017.7962586
Author(s):
Lars-Erik Wernersson
Published in:
2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2017, Page(s) 99-100, ISBN 978-1-5090-5313-1
Publisher:
IEEE
DOI:
10.1109/ulis.2017.7962611
Author(s):
Arnulf Leuther, Matthias Ohlrogge, Lukas Czornomaz, Thomas Merkle, Frank Bernhardt, Axel Tessmann
Published in:
2017 12th European Microwave Integrated Circuits Conference (EuMIC), 2017, Page(s) 130-133, ISBN 978-2-87487-048-4
Publisher:
IEEE
DOI:
10.23919/eumic.2017.8230677
Author(s):
H. Schmid, B. Mayer, J. Gooth, S. Wirths, L. Czornomaz, H. Riel, S. Mauthe, C. Convertino, K. E. Moselund
Published in:
2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2017, Page(s) 1-3, ISBN 978-1-5386-3766-1
Publisher:
IEEE
DOI:
10.1109/s3s.2017.8309200
Author(s):
V. Deshpande, V. Djara, T. Morf, P. Hashemi, E. O’Connor, K. Balakrishnan, D. Caimi, M. Sousa,
L. Czornomaz and J. Fompeyrine
Published in:
Int'l Conf. on Solid State Devices and Materials (SSDM),, Issue Book of Extended Abstracts in 2016, 2016
Publisher:
SSDM
Author(s):
Amulf Leuther, Matthias Ohlrogge, Lukas Czornomaz, Thomas Merkle, Frank Bernhardt, Axel Tessmann
Published in:
2017 IEEE MTT-S International Microwave Symposium (IMS), 2017, Page(s) 1133-1136, ISBN 978-1-5090-6360-4
Publisher:
IEEE
DOI:
10.1109/mwsym.2017.8058798
Author(s):
Olli-Pekka Kilpi, Jun Wu, Johannes Svensson, Erik Lind, Lars-Erik Wernersson
Published in:
2017 Symposium on VLSI Technology, 2017, Page(s) T36-T37, ISBN 978-4-86348-605-8
Publisher:
IEEE
DOI:
10.23919/vlsit.2017.7998191
Author(s):
A. Tessmann, A. Leuther, F. Heinz, F. Bernhardt, H. Massler
Published in:
2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2018, Page(s) 156-159, ISBN 978-1-5386-6502-2
Publisher:
IEEE
DOI:
10.1109/bcicts.2018.8550836
Author(s):
C. B. Zota, C. Convertino, V. Deshpande, T. Merkle, M. Sousa, D. Caimi, L. Czomomaz
Published in:
2018 IEEE Symposium on VLSI Technology, 2018, Page(s) 165-166, ISBN 978-1-5386-4218-4
Publisher:
IEEE
DOI:
10.1109/vlsit.2018.8510631
Author(s):
H. Schmid, D. Cutaia, J. Gooth, S. Wirths, N. Bologna, K. E. Moselund, H. Riel
Published in:
2016 IEEE International Electron Devices Meeting (IEDM), Issue Yearly, 2016, Page(s) 3.6.1-3.6.4, ISBN 978-1-5090-3902-9
Publisher:
IEEE
DOI:
10.1109/IEDM.2016.7838340
Author(s):
Cezar B. Zota, Fredrik Lindelow, Lars-Erik Wernersson, Erik Lind
Published in:
2016 IEEE International Electron Devices Meeting (IEDM), 2016, Page(s) 3.2.1-3.2.4, ISBN 978-1-5090-3902-9
Publisher:
IEEE
DOI:
10.1109/IEDM.2016.7838336
Author(s):
Cezar B. Zota, Fredrik Lindelow, Lars-Erik Wernersson, Erik Lind
Published in:
2016 IEEE Symposium on VLSI Technology, Issue Yearly, 2016, Page(s) 1-2, ISBN 978-1-5090-0638-0
Publisher:
IEEE
DOI:
10.1109/VLSIT.2016.7573418
Author(s):
Martin Berg, Olli-Pekka Kilpi, Karl-Magnus Persson, Johannes Svensson, Markus Hellenbrand, Erik Lind, Lars-Erik Wernersson
Published in:
IEEE Electron Device Letters, Issue Volume:PP Issue: 99 , 2016, Page(s) 1-1, ISSN 0741-3106
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/LED.2016.2581918
Author(s):
Cezar Zota, Lars-Erik Wernersson, Erik Lind
Published in:
IEEE Electron Device Letters, 2016, Page(s) 1-1, ISSN 0741-3106
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/LED.2016.2602841
Author(s):
Cezar Zota, Fredrik Lindelöw, Lars-Erik Wernersson, Erik Lind
Published in:
Electronics Letters, 2016, ISSN 0013-5194
Publisher:
Institute of Electrical Engineers
DOI:
10.1049/el.2016.3108
Author(s):
Philippe Ferrandis, Mathilde Billaud, Julien Duvernay, Mickael Martin, Alexandre Arnoult, Helen Grampeix, Mikael Cassé, Hervé Boutry, Thierry Baron, Maud Vinet, Gilles Reimbold
Published in:
Journal of Applied Physics, Issue 123/16, 2018, Page(s) 161534, ISSN 0021-8979
Publisher:
American Institute of Physics
DOI:
10.1063/1.5007920
Author(s):
Markus Hellenbrand, Elvedin Memisevic, Martin Berg, Olli-Pekka Kilpi, Johannes Svensson, Lars-Erik Wernersson
Published in:
IEEE Electron Device Letters, Issue 38/11, 2017, Page(s) 1520-1523, ISSN 0741-3106
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/led.2017.2757538
Author(s):
Adam Jonsson, Johannes Svensson, Lars-Erik Wernersson
Published in:
IEEE Electron Device Letters, Issue 39/7, 2018, Page(s) 935-938, ISSN 0741-3106
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/led.2018.2837676
Author(s):
Markus Hellenbrand, Olli-Pekka Kilpi, Johannes Svensson, Erik Lind, Lars-Erik Wernersson
Published in:
Microelectronic Engineering, 2019, Page(s) 110986, ISSN 0167-9317
Publisher:
Elsevier BV
DOI:
10.1016/j.mee.2019.110986
Author(s):
Jun Lin, Scott Monaghan, Karim Cherkaoui, Ian M. Povey, Brendan Sheehan, Paul K. Hurley
Published in:
Microelectronic Engineering, Issue 178, 2017, Page(s) 204-208, ISSN 0167-9317
Publisher:
Elsevier BV
DOI:
10.1016/j.mee.2017.05.020
Author(s):
Clarissa Convertino, Cezar Zota, Heinz Schmid, Daniele Caimi, Marilyne Sousa, Kirsten Moselund, Lukas Czornomaz
Published in:
Materials, Issue 12/1, 2019, Page(s) 87, ISSN 1996-1944
Publisher:
MDPI Open Access Publishing
DOI:
10.3390/ma12010087
Author(s):
Mattias Borg, Lynne Gignac, John Bruley, Andreas Malmgren, Saurabh Sant, Clarissa Convertino, Marta D Rossell, Marilyne Sousa, Chris Breslin, Heike Riel, Kirsten E Moselund, Heinz Schmid
Published in:
Nanotechnology, Issue 30/8, 2019, Page(s) 084004, ISSN 0957-4484
Publisher:
Institute of Physics Publishing
DOI:
10.1088/1361-6528/aaf547
Author(s):
Erik Lind
Published in:
Semiconductor Science and Technology, Issue 31/9, 2016, Page(s) 093005, ISSN 0268-1242
Publisher:
Institute of Physics Publishing
DOI:
10.1088/0268-1242/31/9/093005
Author(s):
Olli-Pekka Kilpi, Johannes Svensson, Erik Lind, Lars-Erik Wernersson
Published in:
IEEE Journal of the Electron Devices Society, Issue 7, 2019, Page(s) 70-75, ISSN 2168-6734
Publisher:
Institute of Electrical and Electronics Engineers Inc.
DOI:
10.1109/jeds.2018.2878659
Author(s):
Axel Tessmann, Arnulf Leuther, Felix Heinz, Frank Bernhardt, Laurenz John, Hermann Massler, Lukas Czornomaz, Thomas Merkle
Published in:
IEEE Journal of Solid-State Circuits, 2019, Page(s) 1-8, ISSN 0018-9200
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/jssc.2019.2915161
Author(s):
Olli-Pekka Kilpi, Johannes Svensson, Jun Wu, Axel R. Persson, Reine Wallenberg, Erik Lind, Lars-Erik Wernersson
Published in:
Nano Letters, Issue 17/10, 2017, Page(s) 6006-6010, ISSN 1530-6984
Publisher:
American Chemical Society
DOI:
10.1021/acs.nanolett.7b02251
Author(s):
Cezar B. Zota, Clarissa Convertino, Marilyne Sousa, Daniele Caimi, Kirsten Moselund, Lukas Czornomaz
Published in:
IEEE Electron Device Letters, Issue 40/4, 2019, Page(s) 538-541, ISSN 0741-3106
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/led.2019.2902519
Author(s):
Veeresh Deshpande, H. Hahn, E. O'Connor, Y. Baumgartner, D. Caimi, M. Sousa, H. Boutry, J. Widiez, L. Brevard, C. Le Royer, M. Vinet, J. Fompeyrine, L. Czornomaz
Published in:
IEEE Transactions on Electron Devices, Issue 64/11, 2017, Page(s) 4503-4509, ISSN 0018-9383
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/ted.2017.2755662
Author(s):
V. Deshpande, V. Djara, E. O'Connor, P. Hashemi, K. Balakrishnan, D. Caimi, M. Sousa, L. Czornomaz, J. Fompeyrine
Published in:
Solid-State Electronics, Issue 128, 2017, Page(s) 87-91, ISSN 0038-1101
Publisher:
Pergamon Press Ltd.
DOI:
10.1016/j.sse.2016.10.034
Author(s):
Clarissa Convertino, Cezar B. Zota, Daniele Caimi, Marilyne Sousa, Kirsten E. Moselund, Lukas Czornomaz
Published in:
Japanese Journal of Applied Physics, Issue 58/8, 2019, Page(s) 080901, ISSN 0021-4922
Publisher:
IOP Publishing
Author(s):
Mattias Borg, Heinz Schmid, Johannes Gooth, Marta D. Rossell, Davide Cutaia, Moritz Knoedler, Nicolas Bologna, Stephan Wirths, Kirsten E. Moselund, Heike Riel
Published in:
ACS Nano, Issue 11/3, 2017, Page(s) 2554-2560, ISSN 1936-0851
Publisher:
American Chemical Society
DOI:
10.1021/acsnano.6b04541
Author(s):
É. O'Connor, K. Cherkaoui, S. Monaghan, B. Sheehan, I. M. Povey, P. K. Hurley
Published in:
Applied Physics Letters, Issue 110/3, 2017, Page(s) 032902, ISSN 0003-6951
Publisher:
American Institute of Physics
DOI:
10.1063/1.4973971
Author(s):
Aein S. Babadi, Johannes Svensson, Erik Lind, Lars-Erik Wernersson
Published in:
Applied Physics Letters, Issue 110/5, 2017, Page(s) 053502, ISSN 0003-6951
Publisher:
American Institute of Physics
DOI:
10.1063/1.4975374
Author(s):
Davide Cutaia, K. Moselund, H. Schmid, M. Borg, H. Riel
Published in:
Compound Semiconductor, Issue 23 (1), 2017, Page(s) 38-42, ISSN 2042-7328
Publisher:
Angel Business Communications
Author(s):
V. Deshpande, V. Djara, E. O'Connor, P. Hashemi, T. Morf, K. Balakrishnan, D. Caimi, M. Sousa, J. Fompeyrine, L. Czornomaz
Published in:
Japanese Journal of Applied Physics, Issue vol 56, 2017, Page(s) 04CA05, ISSN 1347-4065
Publisher:
Institute of Physics
DOI:
10.7567/JJAP.56.04CA05
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