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2D Oxide and van der Waals layered devices

Periodic Reporting for period 1 - OXWALD (2D Oxide and van der Waals layered devices)

Okres sprawozdawczy: 2019-05-01 do 2021-04-30

BaTiO3 flakes on PDMS released from La2/3Sr1/3MnO3 sacrificial buffer layer. (a) 20nm and (b) 4nm.
Young’s modulus characterization of BaTiO3
Scanning transmission electron microscopy characterization of a freestanding BTO flake.
Out-of-plane PFM-phase characterization of a 25nm-BaTiO3 flake.
BaTiO3 reflectance as a function of thickness.
La2/3Sr1/3MnO3 flakes transferred onto the grid for synchrotron characterization.
X-Ray diffraction of freestanding CCOs.
Photos of Víctor Rouco during the Semana de la Ciencia.
La2/3Sr1/3MnO3 flakes transferred onto SiOx and R(T) electrical transport measurements.
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