Publications
Author(s):
R Chen, G Sisto, A Jourdain, G Hiblot, M Stucchi, N Kakarla, B Chehab, SM Salahuddin, F Schleicher, A Veloso, G Hellings, P Weckx, D Milojevic, G Van der Plas, J Ryckaert, E Beyne
Published in:
2021 IEEE International Electron Devices Meeting (IEDM), Issue yearly, 2021, Page(s) 22.4. 1-22.4. 4
Publisher:
IEEE
DOI:
10.1109/iedm19574.2021.9720528
Author(s):
G Sisto, B Chehab, B Genneret, R Baert, R Chen, P Weckx, J Ryckaert, R Chou, G van Der Plas, E Beyne, D Milojevic
Published in:
2021 IEEE International Interconnect Technology Conference (IITC), Issue yearly, 2020, Page(s) 1~3
Publisher:
IEEE
DOI:
10.1109/iitc51362.2021.9537541
Author(s):
Giuliano Sisto; Rongmei Chen; Richard Chou; Geert Van der Plas; Eric Beyne; Rod Metcalfe; Dragomir Milojevic
Published in:
2021 ACM/IEEE International Workshop on System Level Interconnect Prediction (SLIP), Issue yearly, 2022
Publisher:
IEEE
DOI:
10.1109/slip52707.2021.00011
Author(s):
R Chen, P Weckx, SM Salahuddin, S-W Kim, G Sisto, G Van der Plas, M Stucchi, R Baert, P Debacker, MH Na, J Ryckaert, D Milojevic, E Beyne
Published in:
2020 IEEE International Electron Devices Meeting (IEDM), Issue yearly, 2020, Page(s) 15.2. 1-15.2. 4
Publisher:
IEEE
DOI:
10.1109/iedm13553.2020.9371905
Author(s):
Rongmei Chen, Lin Chen, Jie Liang, Yuanqing Cheng, Souhir Elloumi, Jaehyun Lee, Kangwei Xu, Vihar P Georgiev, Kai Ni, Peter Debacker, Asen Asenov, Aida Todri-Sanial
Published in:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Issue montly, 2022, Page(s) 440-448, ISSN 1063-8210
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tvlsi.2022.3146064
Author(s):
Rongmei Chen, Lin Chen, Jie Liang, Yuanqing Cheng, Souhir Elloumi, Jaehyun Lee, Kangwei Xu, Vihar P Georgiev, Kai Ni, Peter Debacker, Asen Asenov, Aida Todri-Sanial
Published in:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Issue montly, 2022, Page(s) 432-439, ISSN 1063-8210
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tvlsi.2022.3146125
Author(s):
Liu, Hsiao-Hsuan, Salahuddin, Shairfe M ; Abdi, Dawit ; Chen, Rongmei ; Weckx, Pieter ; Matagne, Philippe ; Catthoor, Francky
Published in:
IEEE TRANSACTIONS ON ELECTRON DEVICES, Issue montly, 2022, Page(s) 3113 - 3117, ISSN 0018-9383
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/ted.2022.3165738
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