Cel On-wafer testing of monolithic microwave integrated circuits (MMICs) plays an increasingly important role in the design and manufacture of circuits and products widely used in the telecom and defence industries. The present method of testing of MMICs is based on the use of microwave contacting-probes, aligned on to pre-defined contact pads on the semiconductor wafer by means of a precision test-jig. Measurements are limited by the available probes to about 40 GHz and by the requirement for contact pads at every circuit node of interest. The trend towards denser integration of devices and higher operating frequencies is exposing the limitations of this method. The objectives of this project are the development of a new electro-optic sampling (EOS) technique for the testing of MMICs on the wafer (before dice and mount) together with its implementation into a commercial instrument, capable of extending the measurements to packing densities and frequencies higher than possible with conventional methods. The EOS technique is based on in situ measurements of the electric field due to a signal propagating within the circuit, without test pads. Dziedzina nauki nauki przyrodniczenauki fizyczneelektromagnetyzm i elektronikaurządzenie półprzewodnikowe Program(-y) FP3-MAT - Specific research and technological development programme (EEC) in the field of measurements and testing, 1990-1994 Temat(-y) Data not available Zaproszenie do składania wniosków Data not available System finansowania CSC - Cost-sharing contracts Koordynator NPL MANAGEMENT LTD. Adres Queens road 33 TW11 0LW Teddington Zjednoczone Królestwo Zobacz na mapie Wkład UE Brak danych Uczestnicy (2) Sortuj alfabetycznie Sortuj według wkładu UE Rozwiń wszystko Zwiń wszystko Dassault Electronique S.A. Francja Wkład UE € 0,00 Adres 55,quai marcel dassault 92214 Saint-cloud Zobacz na mapie Środki z innych źródeł Brak danych FRAUNHOFER IAF Niemcy Wkład UE € 0,00 Adres Tullastr. 72 79108 München Zobacz na mapie Linki Strona internetowa Opens in new window Środki z innych źródeł Brak danych
