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Combined SIMS-SFM Instrument for the 3-Dimensional Chemical Analysis of Nanostructures

Cel

The objective of this project is to develop an innovative and novel combination of a new TOF-SIMS with substantially improved lateral resolution and sensitivity, combined with a new metrological high resolution SFM. The two techniques provide complementary information on nanoscale surface chemistry and surface morphology. In combination with a layer by layer removal of material using low energy sputtering, quantitatively measured by SFM, this combined ultra-high vacuum (UHV) instrument will be unique for the 3-dimensional chemical characterisation of nanostructured inorganic as well as organic materials with down to at least 10 nm lateral resolution and down to 1 nm depth resolution. Joint by a novel software for the calculation and display of 3-dimensional distributions of all chemical species, this leads to a totally new “3D NanoChemiscope”.

Zaproszenie do składania wniosków

FP7-NMP-2007-SME-1
Zobacz inne projekty w ramach tego zaproszenia

Koordynator

IONTOF TECHNOLOGIES GMBH
Wkład UE
€ 1 769 148,00
Adres
HEISENBERGSTRASSE 15
48149 MUNSTER
Niemcy

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Region
Nordrhein-Westfalen Münster Münster, Kreisfreie Stadt
Rodzaj działalności
Private for-profit entities (excluding Higher or Secondary Education Establishments)
Kontakt administracyjny
Ewald Niehuis (Dr.)
Linki
Koszt całkowity
Brak danych

Uczestnicy (7)