Photovoltaic module life time forecast and evaluation

Rezultaty

Report on adhesion degradation of materials produced in different manufacturing conditions
Report on simulation results of material properties and correlation to specific failure modes
Report on rate defining processes of polymers
Report on service-life model validated against indoor tests
Report on alternative techniques for identification of degradation precursors
Field-observed degradation modes based yield model validated
Report on main degradation modes and material interactions of polymers in PV modules
Report on PID tests at different static and transient conditions
Report on service life energy yield
Publication on stress acceleration due to combinatory tests
Report on figures of merit for degradation modes identification
Report on impact of climatic degradation factors
Report on degradation models and improvements
Report on suitable methods for characterization of material interactions in PV modules
PhD thesis, publication of all ESRs

PhD thesis publication of all ESRs

Report on effect of micro-climatic conditions on polymer degradation

Database of Climate--based degradation factors
Project Homepage

Design and launch of project website to present project contents, progress, partners and ESRs, publications and other info.

Publikacje

Köppen-Geiger-Photovoltaic Climate Classification

Autorzy: Julian Ascencio-Vasquez, Kristijan Brecl, Marko Topi
Opublikowane w: 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC), 2018, Strona(/y) 2270-2275, ISBN 978-1-5386-8529-7
Wydawca: IEEE
DOI: 10.1109/pvsc.2018.8547952

Training the Next Generation of PV Reliability Experts – New Marie-Sklodowska Curie (MSCA) Project SOLAR-TRAIN

Autorzy: K.-A. Weiß, S. Saile, A. Keiner, L. Pitta Bauermann, G. Oreski, R. Gottschalg, D. Moser, M. Topic, A.R. Lagunas, P. Chiantore, M. Van Iseghem
Opublikowane w: European Photovoltaic Solar Energy Conference and Exhibition, Numer 33, 2017, Strona(/y) 2917 - 2920, ISBN 3-936338-47-7
Wydawca: WIP Munich Germany
DOI: 10.4229/EUPVSEC20172017-7DV.1.48

A setup for in-situ measurements of potential and UV induced degradation of PV modules inside a climatic chamber

Autorzy: Stefan Mitterhofer, Marko Jankovec, Marko Topič
Opublikowane w: International Conference on Microelectronics, Devices and Materials, Numer 53, 2017, Strona(/y) 65-70, ISBN 978-961-92933-7-9
Wydawca: MIDEM Society for Microelectronics, Electronic Components and Materials

An Overall Data Analysis Methodology for PV Energy Systems

Autorzy: Julián Ascencio Vásquez, Marko Topič
Opublikowane w: International Conference on Microelectronics, Devices and Materials, Numer 53, 2017, Strona(/y) 59-64, ISBN 978-961-92933-7-9
Wydawca: MIDEM Society for Microelectronics, Electronic Components and Materials

Evaluation of uncertainty sources and propagation from irradiance sensors to PV energy production

Autorzy: Francesco Mariottini, Tom R. Betts, Jiang Zhu, Ralph Gottschalg
Opublikowane w: Photovoltaic Science, Applications and Technology Conference (PVSAT-14), Numer 14, 2018
Wydawca: The Solar Energy Society

One- and two-dimensional finite element analysis of humidity ingress in polymeric materials

Autorzy: Stefan Mitterhofer, Marko Jankovec, Marko Topič
Opublikowane w: International Conference on Microelectronics, Devices and Materials, Numer 54, 2018, Strona(/y) 93-98, ISBN 978-961-92933-8-6
Wydawca: MIDEM

The impact of acetic acid corrosion on the front-side contacts and the finger electrodes of c-Si PV cells

Autorzy: Nikoleta Kyranaki, Jiang Zhu, Thomas R. Betts, Ralph Gottschalg
Opublikowane w: Photovoltaic Science, Applications and Technology Conference (PVSAT-14), Numer 14, 2018
Wydawca: The Solar Energy Society

Evaluation of Technology-Dependent Maximum Power Point Current and Voltage Degradation in a Temperate Climate

Autorzy: Sascha Lindig, P. Ingenhoven, G. Belluardo, David Moser, Marko Topic
Opublikowane w: European Photovoltaic Solar Energy Conference and Exhibition, Numer 35, 2018, Strona(/y) 1081 - 1086, ISBN 3-936338-50-7
Wydawca: EU PVSEC
DOI: 10.4229/35thEUPVSEC20182018-5BO.12.5

Single Diode Model Applied to PV Module Aging

Autorzy: Nikola Hrelja, Mike Van Iseghem, Eric Lajoie-Mazenc, Eric Moulines, Eloide Vernet
Opublikowane w: European Photovoltaic Solar Energy Conference and Exhibition, Numer 35, 2018, Strona(/y) 1290 - 1293, ISBN 3-936338-50-7
Wydawca: EU PVSEC
DOI: 10.4229/35thEUPVSEC20182018-5CV.3.16

Using UV LEDs for PV Module Aging and Degradation Study

Autorzy: Stefan Mitterhofer, Marko Jankovec, Marko Topic
Opublikowane w: European Photovoltaic Solar Energy Conference and Exhibition, Numer 35, 2018, Strona(/y) 1323 - 1327, ISBN 3-936338-50-7
Wydawca: EU PVSEC
DOI: 10.4229/35thEUPVSEC20182018-5CV.3.24

Nanoindentation analysis of PV module polymeric components after accelerated aging

Autorzy: Djamel Eddine Mansour, F. Swientek, Ismail Kaaya, Daniel Philipp, Luciana Pitta Bauermann
Opublikowane w: European Photovoltaic Solar Energy Conference and Exhibition, Numer 35, 2018, Strona(/y) 1333 - 1336, ISBN 3-936338-50-7
Wydawca: EU PVSEC
DOI: 10.4229/35thEUPVSEC20182018-5CV.3.28

Investigating the Degradation of Front and Rear Sides of c-Si PV Cells Exposed to Acetic Acid

Autorzy: Nikoleta Kyranaki, Jiang Zhu, Ralph Gottschalg, Tom R. Betts
Opublikowane w: European Photovoltaic Solar Energy Conference and Exhibition, Numer 35, 2018, Strona(/y) 1372 - 1375, ISBN 3-936338-50-7
Wydawca: EU PVSEC
DOI: 10.4229/35thEUPVSEC20182018-5CV.3.47

Uncertainty in calibration and characterisation of pyranometers

Autorzy: Francesco Mariottini, Tom R. Betts, Giorgio Belluardo
Opublikowane w: Photovoltaic Science, Applications and Technology Conference (PVSAT-15), Numer 15, 2019, Strona(/y) 105-108, ISBN 0904-963853
Wydawca: The Solar Energy Society

Degradation of power output of photovoltaic modules due to accelerated ageing

Autorzy: Ashenafi Weldemariam Gebregioris, Tom R. Betts
Opublikowane w: Photovoltaic Science, Applications and Technology Conference (PVSAT-15), Numer 15, 2019, ISBN 0904-963853
Wydawca: The Solar Energy Society

Investigation of moisture ingress and egress in polymer – Glass laminates for PV encapsulation

Autorzy: Nikoleta Kyranaki, Marko Jankovec, Marko Topic, Ralph Gottschalg, Tom R. Betts
Opublikowane w: Photovoltaic Science, Applications and Technology Conference (PVSAT-15), Numer 15, 2019, Strona(/y) 41-44, ISBN 0904-963853
Wydawca: The Solar Energy Society

Los servicios digitalizados de O&M de BayWa r.e. análisis mejorado de rendimiento mediante inspecciones aéreas termográficas y software especializado. Caso de estudio.

Autorzy: Guillermo Oviedo Hernandez
Opublikowane w: Digitalización y Energía Solar. Edición México, 2019, Strona(/y) 46
Wydawca: SolarPower Europe, ASOLMEX

European Photovoltaic Solar Energy Conference and Exhibition

Autorzy: Nikoleta Kyranaki, David C. Whalley, David A. Hutt, Ralph Gottschalg, Tom R. Betts
Opublikowane w: European Photovoltaic Solar Energy Conference and Exhibition, Numer 36, 2019, Strona(/y) 1045 - 1049, ISBN 3-936338-60-4
Wydawca: EU PVSEC
DOI: 10.4229/eupvsec20192019-4av.1.24

Assessment and Improvement of Thermoelectric Pyranometer Measurements

Autorzy: Francesco Mariottini, Giorgio Belluardo, Martin Bliss, Patrick J.M. Isherwood, Ian R. Cole, Tom R. Betts
Opublikowane w: European Photovoltaic Solar Energy Conference and Exhibition, Numer 36, 2019, Strona(/y) 1384 - 1387, ISBN 3-936338-60-4
Wydawca: EU PVSEC
DOI: 10.4229/eupvsec20192019-5do.1.3

Optimization of the Cost Priority Number (CPN) Methodology to the Needs of a Large O&M Operator

Autorzy: Guillermo Oviedo Hernández, Sascha Lindig, David Moser, Paolo V. Chiantore
Opublikowane w: European Photovoltaic Solar Energy Conference and Exhibition, Numer 36, 2019, Strona(/y) 1613 - 1617, ISBN 3-936338-60-4
Wydawca: EU PVSEC
DOI: 10.4229/eupvsec20192019-5cv.4.19

Analysis of ethylene vinyl acetate degradation under UV-A LED light

Autorzy: Stefan Mitterhofer, Chiara Barretta, Luis Castillon, Gernot Oreski, Marko Topič, Marko Jankovec
Opublikowane w: International Conference on Microelectronics, Devices and Materials, Numer 55, 2019, Strona(/y) 40-43, ISBN 978-961-92933-9-3
Wydawca: MIDEM - Society for Microelectronics, Electronic Components and Materials

Application of the full thermal model for PV devices

Autorzy: Julian Ascencio-Vasquez, Kristijan Brecl, Franc Smole, Marco Topic
Opublikowane w: International Conference on Microelectronics, Devices and Materials, Numer 55, 2020
Wydawca: MIDEM - Society for Microelectronics, Electronic Components and Materials

Photovoltaic Energy Production Forecasting using LightGBM

Autorzy: Kristjan Reba, Jakob Bevc, Julian Ascencio-Vasquez, Marko Jankovec, Marko Topic
Opublikowane w: International Conference on Microelectronics, Devices and Materials, Numer 55, 2020
Wydawca: MIDEM - Society for Microelectronics, Electronic Components and Materials

Review of Statistical and Analytical Degradation Models for Photovoltaic Modules and Systems as Well as Related Improvements

Autorzy: Sascha Lindig, Ismail Kaaya, Karl-Anders Weis, David Moser, Marko Topic
Opublikowane w: IEEE Journal of Photovoltaics, Numer 8/6, 2018, Strona(/y) 1773-1786, ISSN 2156-3381
Wydawca: IEEE Electron Devices Society
DOI: 10.1109/jphotov.2018.2870532

Modeling Outdoor Service Lifetime Prediction of PV Modules: Effects of Combined Climatic Stressors on PV Module Power Degradation

Autorzy: Ismail Kaaya, Michael Koehl, Amantin Panos Mehilli, Sidrach de Cardona Mariano, Karl Anders Weiss
Opublikowane w: IEEE Journal of Photovoltaics, Numer 9/4, 2019, Strona(/y) 1105-1112, ISSN 2156-3381
Wydawca: IEEE Electron Devices Society
DOI: 10.1109/jphotov.2019.2916197

Methodology of Köppen-Geiger-Photovoltaic climate classification and implications to worldwide mapping of PV system performance

Autorzy: Julián Ascencio-Vásquez, Kristijan Brecl, Marko Topič
Opublikowane w: Solar Energy, Numer 191, 2019, Strona(/y) 672-685, ISSN 0038-092X
Wydawca: Pergamon Press Ltd.
DOI: 10.1016/j.solener.2019.08.072

Global Climate Data Processing and Mapping of Degradation Mechanisms and Degradation Rates of PV Modules

Autorzy: Julián Ascencio-Vásquez, Ismail Kaaya, Kristijan Brecl, Karl-Anders Weiss, Marko Topič
Opublikowane w: Energies, Numer 12/24, 2019, Strona(/y) 4749, ISSN 1996-1073
Wydawca: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/en12244749

A Dual-Transport Model of Moisture Diffusion in PV Encapsulants for Finite-Element Simulations

Autorzy: Stefan Mitterhofer, Chiara Barretta, Luis F. Castillon, Gernot Oreski, Marko Topic, Marko Jankovec
Opublikowane w: IEEE Journal of Photovoltaics, Numer 10/1, 2020, Strona(/y) 94-102, ISSN 2156-3381
Wydawca: IEEE Electron Devices Society
DOI: 10.1109/jphotov.2019.2955182

The Development of Thermal Coefficients of Photovoltaic Devices

Autorzy: Stefan Mitterhofer, Boštjan Glažar, Marko Jankovec, Marko Topič
Opublikowane w: Informacije MIDEM - Journal of Microelectronics, Electronic Components and Materials, Numer 49, 2019, Strona(/y) 219-227, ISSN 0352-9045
Wydawca: Strokovno Drustvo za Mikroelektroniko
DOI: 10.33180/infmidem2019.404

Effect of Backsheet Properties on PV Encapsulant Degradation during Combined Accelerated Aging Tests

Autorzy: Djamel Eddine Mansour, Chiara Barretta, Luciana Pitta Bauermann, Gernot Oreski, Andreas Schueler, Daniel Philipp, Paul Gebhardt
Opublikowane w: Sustainability, Numer 12/12, 2020, Strona(/y) 5208, ISSN 2071-1050
Wydawca: MDPI Open Access Publishing
DOI: 10.3390/su12125208

Advanced PV Performance Modelling Based on Different Levels of Irradiance Data Accuracy

Autorzy: Julián Ascencio-Vásquez, Jakob Bevc, Kristjan Reba, Kristijan Brecl, Marko Jankovec, Marko Topič
Opublikowane w: Energies, Numer 13/9, 2020, Strona(/y) 2166, ISSN 1996-1073
Wydawca: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/en13092166

Scanning acoustic microscopy analysis of the mechanical properties of polymeric components in photovoltaic modules

Autorzy: Laila V. Mesquita, Djamel Eddine Mansour, Paul Gebhardt, Luciana Pitta Bauermann
Opublikowane w: Engineering Reports, Numer 2/6, 2020, ISSN 2577-8196
Wydawca: John Wiley & Sons, Ltd.
DOI: 10.1002/eng2.12222

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