Skip to main content
European Commission logo
polski polski
CORDIS - Wyniki badań wspieranych przez UE
CORDIS

NEUROmorphic energy-efficient secure accelerators based on Phase change materials aUgmented siLicon photonicS

Rezultaty

Publikacje

Visual identity, project website and social network account

Autorzy: Van Vaerenbergh, Thomas
Opublikowane w: 2023
DOI: 10.5281/zenodo.8297735

Special Session: Neuromorphic hardware design and reliability from traditional CMOS to emerging technologies

Autorzy: Pavanello, Fabio; Vatajelu, Ioana; Bosio, Alberto; van Vaerenbergh, Thomas; Bienstman, Peter; Charbonnier, Benoit; Carpegna, Alessio; Di Carlo, Stefano; Savino, Alessandro
Opublikowane w: Proceedings of 2023 IEEE 41st VLSI Test Symposium (VTS), 2023, ISSN 0000-0000
Wydawca: IEEE 2023
DOI: 10.48550/arxiv.2305.01818

Energy Efficiency of Out-of-Order CPUs: Comparative Study and Microarchitectural Hotspot Characterization of RISC-V Designs

Autorzy: Chatzopoulos, Odysseas; Papadimitriou, George; Wong, Wing Shek; Gizopoulos, Dimitris
Opublikowane w: 2023 IEEE International Symposium on Workload Characterization (IISWC), 2023
Wydawca: IEEE
DOI: 10.1109/IISWC59245.2023.00032

Photonic Physical Unclonable Function Based on Symmetric Microring Resonator Arrays

Autorzy: Jimenez, Paul; Cardoso, Raphael; Gomes de Queiroz, Mauricio; Abdalla, Mohab; Zrounba, Clément; Letartre, Xavier; Marchand, Cédric; Ruhrmair, Ulrich; Pavanello, Fabio
Opublikowane w: Frontiers In Optics (FiO) - 2023, 2023, ISBN 978-1-957171-29-6
Wydawca: Optica
DOI: 10.1364/FIO.2023.JTu4A.82

Automated Black-box Testing of Mass Assignment Vulnerabilities in RESTful APIs

Autorzy: Corradini, Davide; PASQUA, MICHELE; Ceccato, Mariano
Opublikowane w: ICSE '23: Proceedings of the 45th International Conference on Software Engineering, 2023, ISSN 1000-0153
Wydawca: IEEE/ACM
DOI: 10.1109/ICSE48619.2023.00213

Enabling Design Space Exploration of RISC-V Accelerator-rich Computing Systems on gem5

Autorzy: Odysseas Chatzopoulos; George Papadimitriou; Vasileios Karakostas; Dimitris Gizopoulos
Opublikowane w: RISC-V Sumit 2023, 2023, ISSN 0000-0000
Wydawca: RISC-V Sumit 2023

Silent Data Errors: Sources, Detection, and Modeling

Autorzy: Singh, Adit; Chakravarty, Sreejit; Papadimitriou, George; Gizopoulos, Dimitris
Opublikowane w: 2023 IEEE 41st VLSI Test Symposium (VTS), 2023
Wydawca: IEEE
DOI: 10.1109/VTS56346.2023.10139970

Remote Attestation of IoT Devices using Physically Unclonable Functions: Recent Advancements and Open Research Challenges

Autorzy: Marastoni, Niccolò; Ceccato, Mariano
Opublikowane w: CPSIoTSec '23: Proceedings of the 5th Workshop on CPS&IoT Security and Privacy, 2023, ISSN 0000-0000
Wydawca: IEEE
DOI: 10.1145/3605758.3623502

NEUROPULS: NEUROmorphic energy-efficient secure accelerators based on Phase change materials aUgmented siLicon photonicS

Autorzy: Pavanello, Fabio; Marchand, Cédric; O'Connor, Ian; Orobtchouk, Régis; Mandorlo, Fabien; Letartre, Xavier; Cueff, Sébastien; Vatajelu, Ioana; Di Natale, Giorgio; Cluzel, Benoit; Coillet, Aurélien; Charbonnier, Benoit; Noé, Pierre; Kaván, František; Zoldak, Martin; Szaj, Michal; Bienstman, Peter; van Vaerenbergh, Thomas; Rührmair, Ulrich; Flores, Paulo; Guerra E Silva, Luis; Chaves, Ricardo; Silveira, Luis Miguel; Ceccato, Mariano; Gizopoulos, Dimitris; Papadimitriou, George; Karakostas, Vasileios; Brando, Axel; Cazorla, Francisco Javier; Canal, Ramon; Closas, Pau; Gusi Amigo, Adrià; Crovetti, Paolo Stefano; Carpegna, Alessio; Tzamn, Melendez Carmona; Di Carlo, Stefano; Savino, Alessandro
Opublikowane w: 2023 IEEE European Test Symposium (ETS), 2023, ISSN 0410-3942
Wydawca: IEEE
DOI: 10.48550/arxiv.2305.03139

Silent Data Corruptions: Microarchitectural Perspectives

Autorzy: Papadimitriou, George; Gizopoulos, Dimitris
Opublikowane w: IEEE Transactions on Computers, 2023, ISSN 1557-9956
Wydawca: IEEE
DOI: 10.1109/TC.2023.3285094

Estimating the Failures and Silent Errors Rates of CPUs Across ISAs and Microarchitectures

Autorzy: Gizopoulos, Dimitris; Papadimitriou, George; Chatzopoulos, Odysseas
Opublikowane w: 2023 IEEE International Test Conference (ITC), 2023
Wydawca: IEEE
DOI: 10.1109/ITC51656.2023.00056

Wyszukiwanie danych OpenAIRE...

Podczas wyszukiwania danych OpenAIRE wystąpił błąd

Brak wyników